1、 IEEE Standard for High-Voltage Testing Techniques Sponsored by the Power System Instrumentation and Measurements Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 10 May 2013 IEEE Power and Energy Society IEEE Std 4-2013 (Revision of IEEE Std 4-1995) IEEE Std 4-2013 (Revision of IEEE Std 4-1
2、995) IEEE Standard for High-Voltage Testing Techniques Sponsor Power System Instrumentation and Measurements Committee of the IEEE Power and Energy Society Approved 6 March 2013 IEEE-SA Standards Board Recognized as an American National StandardAbstract: Standard methods and basic techniques for hig
3、h-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combin
4、ed in this revision to organize the technical content for ease of use. In addition, the concept of measurement uncertainty in evaluation of high-voltage and high-current tests is introduced in this version. Keywords: atmospheric corrections, high-current testing, high-voltage measurements, high-volt
5、age testing, IEEE 4TM, impulse currents, impulse voltages, testing The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 May 2013. Printed
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19、urther information may be obtained from the IEEE Standards Association. Participants At the time this IEEE standard was completed, the High Voltage Test Techniques Working Group had the following membership: William Larzelere, Chair Frank Blalock Jeffrey A. Britton Larry Coffeen Ross Daharsh Frank D
20、eCesaro Dana Dufield Jari Hallstrom Jeffrey G. Hildreth Harold Kirkham Jack Kise John Kuffel William Larzelere Yi Li Kevin P. Loving James McBride Terry McComb Nigel P. McQuin Arthur Molden Randy Newnam Johannes Rickmann Juris Rungis Daniel Schweickart Stephen A. Sebo Mel Smith Eddy So May Wang Yixi
21、n Zhang The following members of the Standards Association balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Michael Adams S. Aggarwal Roy Alexander Saleman Alibhay Stephen Antosz Anthony Baker Peter Balma Paul Barnhart Ea
22、rle Bascom III Thomas Basso Martin Baur Barry Beaster W.J. (Bill) Bergman Steven Bezner Wallace Binder Thomas Bishop Thomas Blackburn Frank Blalock Anne Bosma Kenneth Bow Harvey Bowles Jeffrey A. Britton Chris Brooks Gustavo Brunello Ted Burse Carl Bush William Bush Mark Bushnell William Byrd Paul C
23、ardinal Michael Champagne Arvind K. Chaudhary Weijen Chen Robert Christman Larry Coffeen Michael Comber John Crouse Matthew Davis Frank DeCesaro Larry Dix Dieter Dohnal Carlo Donati Gary Donner Randall Dotson Louis Doucet Dana Dufield Denis Dufournet James Dymond Douglas Edwards Kenneth Edwards Fred
24、 Elliott Gary Engmann C. Erven Leslie Falkingham Jorge Fernandez Daher Keith Flowers Joseph Foldi Marcel Fortin Rostyslaw Fostiak Fredric Friend Paul Gaberson Robert Ganser George Gela Saurabh Ghosh David Giegel David Gilmer Douglas Giraud Mietek Glinkowski Waymon Goch Jalal Gohari Edwin Goodwin Jam
25、es Graham William Griesacker J. Travis Griffith Randall Groves Bal Gupta Ajit Gwal Said Hachichi Charles Hand Richard Harp David Harris Jeffrey Hartenberger Wolfgan Haverkamp Jeffrey Helzer Steven Hensley Lee Herron Scott Hietpas Lauri Hiivala Raymond Hill Werner Hoelzl David Horvath John Houdek A.
26、Jones Andrew Jones Harry Josten Gael Kennedy Sheldon Kennedy Vladimir Khalin Yuri Khersonsky Gary King Harold Kirkham Jack Kise J. Koepfinger Boris Kogan Neil Kranich Jim Kulchisky Saumen Kundu John Lackey Donald Laird Chung-Yiu Lam William Larzelere Michael Lauxman Aleksandr Levin Paul Lindemulder
27、Gerald Liskom Hua Liu Copyright 2013 IEEE. All rights reserved. viAlbert Livshitz William Lockley Larry Lowdermilk Greg Luri Arturo Maldonado Richard Marek J. Dennis Marlow Lee Matthews Michael Maytum Omar Mazzoni James McBride William McBride Thomas McCarthy Terry McComb William McCown William McDe
28、rmid Nigel P. McQuin Joseph Melanson James Michalec Michael Miller Arthur Molden Georges Montillet Jerry Murphy R. Murphy Ryan Musgrove K.R.M. Nair Dennis Neitzel Arthur Neubauer Michael S. Newman Joe Nims T. Olsen Carl Orde Lorraine Padden Mirko Palazzo Donald Parker Bansi Patel David Peelo Brian P
29、enny Christopher Petrola Donald Platts Alvaro Portillo Bertrand Poulin Lewis Powell Ulf Radbrandt Reynaldo Ramos Johannes Rickmann Pierre Riffon Michael Roberts Stephen Rodick John Rossetti Marnie Roussell Thomas Rozek Dinesh Sankarakurup Daniel Sauer Bartien Sayogo Gil Shultz Hyeong Sim Douglas Smi
30、th James Smith Jerry Smith Steve Snyder Eddy So John Spare Nagu Srinivas David Stankes Gary Stoedter David Stone James Swank David Tepen Malcolm Thaden Peter Tirinzoni John Toth Remi Tremblay Eric Udren John Vergis Jane Verner Martin Von Herrmann Mark Walton Barry Ward Daniel Ward Joe Watson Peter W
31、erelius Steven Whalen Kenneth White Ernesto Jorge Wiedenbrug Matthew Wilkowski Larry Yonce Jian Yu Dawn Zhao Tiebin Zhao Hugh Zhu Xi Zhu J. Zimnoch When the IEEE-SA Standards Board approved this standard on 6 March 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Ri
32、chard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary
33、 Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE Standards Progr
34、am Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program DevelopmentCopyright 2013 IEEE. All rights reserved. viiIntroduction This introduction is not part of IEEE Std 4-2013, IEEE Standard for High-Voltage Testing Techniques. The current revision of this standa
35、rd is the eighth edition of this document as a separate standard. The subject had been addressed in the earliest standardization report of the American Institute of Electrical Engineers (AIEE) in 1889 and had been substantially elaborated upon in the subsequent reports issued from 1902 to 1933. When
36、 it was decided, in 1922, to reorganize the AIEEs standards into separate sections, the measurement of test voltages became one of the first subjects to be designated for a separate publication. The first edition was published in 1928. This standard establishes standard methods and basic techniques
37、for high-voltage testing. The standard is applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents. The following standards have been used to prepare this document: IEC 60052, Recommendations for volt
38、age measurement by means of standard air gaps. IEC 60060-1, High-voltage test techniquesPart 1: General definitions and test requirements. IEC 60060-2, High-voltage test techniquesPart 2: Measuring systems. IEC 60060-3, High-voltage test techniquesPart 3: Definitions and requirements for on-site tes
39、ting. IEC 60270, Partial discharge measurements. IEC 60507, Artificial pollution tests on high-voltage insulators to be used on a.c. systems. IEC 61083-1, Instruments and software used for measurement in high-voltage impulse testsPart 1: Requirements for instruments. IEC 61083-2, Digital recorders f
40、or measurements in high-voltage impulse testsPart 2: Evaluation of software used for the determination of parameters of impulse waveforms. IEC 61245, Artificial pollution tests on high-voltage insulators to be used on d.c. systems. IEC 62475, High-current test techniques: Definitions and requirement
41、s for test currents and measuring systems. ISO/IEC Guide 98-3, Uncertainty of measurementPart 3: Guide to the expression of uncertainty in measurements (GUM). For ease of use, this revision organizes the technical content in such a way as to combine sections that deal with alternating voltage, direct voltage, and impulse voltage testing. In addition, this version introduces the concept of measurement uncertainty in evaluation of high-voltage and high-current tests. Copyright 2013 IEEE. All rights reserved. viii
