1、BS ISO 9344:2016 Microscopes Graticules for eyepieces BSI Standards Publication WB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06BS ISO 9344:2016 BRITISH STANDARD National foreword This British Standard is the UK implementation of ISO 9344:2016. It supersedes BS ISO 9344:2011 which is withdra
2、wn. The UK participation in its preparation was entrusted to Technical Committee CPW/172, Optics and Photonics. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract.
3、Users are responsible for its correct application. The British Standards Institution 2016. Published by BSI Standards Limited 2016 ISBN 978 0 580 92684 6 ICS 37.020 Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authori
4、ty of the Standards Policy and Strategy Committee on 30 November 2016. Amendments/corrigenda issued since publication Date T e x t a f f e c t e dBS ISO 9344:2016 ISO 2016 Microscopes Graticules for eyepieces Microscopes Rticules pour oculaires INTERNATIONAL STANDARD ISO 9344 Third edition 2016-11-1
5、5 Reference number ISO 9344:2016(E)BS ISO 9344:2016ISO 9344:2016(E)ii ISO 2016 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO 2016, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by an
6、y means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 40
7、1 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.orgBS ISO 9344:2016ISO 9344:2016(E)Foreword iv 1 Scope . 1 2 Normative references 1 3 T erms and definitions . 1 4 Requirements 1 4.1 Dimensions . 1 4.2 Permissible material defects and process
8、ing faults 2 5 Marking 2 ISO 2016 All rights reserved iii Contents PageBS ISO 9344:2016ISO 9344:2016(E) Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is norma
9、lly carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in th
10、e work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the
11、 different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention is drawn to the possibility that some of the elements of this docum
12、ent may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org
13、/patents). Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement. For an explanation on the meaning of ISO specific terms and expressions related to conformit y assessment, as well as information about ISOs adherence to the Worl
14、d Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www.iso.org/iso/foreword.html. The committee responsible for this document is ISO/TC 172, Optics and photonics, Subcommittee SC 5 Microscopes and endoscopes. This third edition cancels and replaces
15、the second edition (ISO 9344:2011), which has been technically revised to add ISO 10110-7 and ISO 10110-8 in the normative references; see also Table 2.iv ISO 2016 All rights reservedBS ISO 9344:2016INTERNATIONAL ST ANDARD ISO 9344:2016(E) Microscopes Graticules for eyepieces 1 Scope This document s
16、pecifies dimensions and permissible material defects and processing faults for graticules with diameters of 19 mm, 21 mm and 26 mm to be used in microscope eyepieces for the purposes of measurement, assessment and comparison. 2 Normative references The following documents are referred to in the text
17、 in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 10110-1, Optics and photonics Preparation of
18、 drawings for optical elements and systems Part 1: General ISO 10110-3, Optics and optical instruments Preparation of drawings for optical elements and systems Part 3: Material imperfections Bubbles and inclusions ISO 10110-4, Optics and optical instruments Preparation of drawings for optical elemen
19、ts and systems Part 4: Material imperfections Inhomogeneity and striae ISO 10110-5, Optics and photonics Preparation of drawings for optical elements and systems Part 5: Surface form tolerances ISO 10110-7, Optics and photonics Preparation of drawings for optical elements and systems Part 7: Surface
20、 imperfection tolerances ISO 10110-8, Optics and photonics Preparation of drawings for optical elements and systems Part 8: Surface texture; roughness and waviness 3 T erms a nd definiti ons No terms and definitions are listed in this document. ISO and IEC maintain terminological databases for use i
21、n standardization at the following addresses: IEC Electropedia: available at http:/ /www.electropedia.org/ ISO Online browsing platform: available at http:/ /www.iso.org/obp 4 Requirements 4.1 Dimensions Table 1 specifies the dimensions for Type 1 and Type 2 graticules. ISO 2016 All rights reserved
22、1BS ISO 9344:2016ISO 9344:2016(E) Table 1 Dimensions of graticules Dimensions in millimetres Parameter Type 1 Type 2 Diameter a , d , , , , , ,Thickness 1,0 1,5 1,0 1,5 Protective chamfer in accordance with ISO 101101 0,1 to 0,3 0,1 to 0,3 aOther diameters are also permitted if they comply with the
23、specified thickness and the requirements listed in Table 2. 4.2 Permissible material defects and processing faults Table 2 specifies the permissions for Type 1 and Type 2 graticules. 5 Marking To differentiate the commonly used Type 1 graticule form the smaller tolerance Type 2 graticule, the markin
24、g “Type 2 conforming to ISO 9344” shall be placed on the graticule itself or on the graticule packaging.2 ISO 2016 All rights reservedBS ISO 9344:2016ISO 9344:2016(E) Table 2 Permissible material defects and processing faults Criterion Reference for s p e c i f ic a t ion Test region a Minimum requi
25、rement Bubbles ISO 101103 1 2 1/2 0,016 b1/2 0,025 b Striae ISO 101104 2/; 3 c Surface form tolerances ISO 101105 3/6 (3) d Surface imperfections for each side ISO 101107 1 2 5/2 0,016 b ; L2 0,002 5 e5/2 0,025 b ; L2 0,004 e Surface quality ISO 101108 f Parallelism tolerance 10 aFor an illustration
26、 of the test regions, see Figure 1. bCode for defect/permissible number of defects multiplied by the square root of the maximum area of the largest defect, in mm 2 . EXAMPLE 1/2 0,1 indicates two bubble defects with a maximum area of 0,01 mm 2per bubble. cThe dash following the defect code indicates
27、 that the inhomogeneities are unspecified; the digit 3 indicates the class of striae, which may have the following effective areas, in reference to the diameter of the graticule plate:Diameter, mm 19 21 26 Striae class 3 3 3 Striae area, mm 2 5 6 10 dIn accordance with ISO 10110-5, the first number
28、after the defect code represents the maximum per- missible sagitta deviation, whereas the number in brackets gives the maximum permissible value of irregulari- ty. The number of fringe spacings is only used as the unit in this document. eTwo scratches of unspecified length and the maximum width with
29、 the grade number 0,002 5 mm (0,004 mm for one scratch) are permissible. The symbol L indicates long scratch longer than 2 mm in ISO 10110-7. However, it means merely scratch with unspecified length in this document. fPolished surface with less than 16 microdefects per 10 mm scan line. ISO 2016 All
30、rights reserved 3BS ISO 9344:2016ISO 9344:2016(E) Dimensions in millimetres 1 2 Key 1 test region 1 2 test region 2 Figure 1 Test regions4 ISO 2016 All rights reservedBS ISO 9344:2016BS ISO 9344:2016ISO 9344:2016(E) ISO 2016 All rights reserved IC S 37.020 Price based on 4 pagesThis page deliberatel
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