1、BSI Standards Publication BS ISO/IEC 10373-5:2014 Identification cards Test methods Part 5: Optical memory cardsBS ISO/IEC 10373-5:2014 BRITISH STANDARD National foreword This British Standard is the UK implementation of ISO/IEC 10373-5:2014. It supersedes BS ISO/IEC 10373-5:2006 which is withdrawn.
2、 The UK participation in its preparation was entrusted to Technical Committee IST/17, Cards and personal identification. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a c
3、ontract. Users are responsible for its correct application. The British Standards Institution 2014. Published by BSI Standards Limited 2014 ISBN 978 0 580 82560 6 ICS 35.240.15 Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under
4、 the authority of the Standards Policy and Strategy Committee on 31 October 2014. Amendments issued since publication Date Text affectedBS ISO/IEC 10373-5:2014 Identification cards Test methods Part 5: Optical memory cards Cartes didentification Mthodes dessai Partie 5: Cartes mmoire optique INTERNA
5、TIONAL STANDARD ISO/IEC 10373-5 Reference number ISO/IEC 10373-5:2014(E) Third edition 2014-10-01 ISO/IEC 2014 BS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E)ii ISO 2014 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO 2014 All rights reserved. Unless otherwise specified, no part of this publicat
6、ion may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country
7、of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in SwitzerlandBS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E)Contents Page Foreword iv 1 Scope .1 2 Normative references 1 3 Terms an
8、d definitions .1 4 Default items applicable to the test methods . 2 4.1 Test environment 2 4.2 Pre-conditioning 2 4.3 Selection of test methods . 2 4.4 Default tolerance . 2 4.5 Total measurement uncertainty . 2 5 Test methods . 2 5.1 Location of accessible optical area and reference track 2 5.2 Ske
9、w . 3 5.3 Defects 5 5.4 Optical properties of the media 6 Bibliography .14 ISO 2014 All rights reserved iiiBS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E) Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized sys
10、tem for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees c
11、ollaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Stand
12、ards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prepare International Standards. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publicatio
13、n as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such pat
14、ent rights. ISO/IEC 10373-5 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Cards and Personal Identification. This third edition cancels and replaces the second edition (ISO/IEC 10373-5:2006), which has been technically revised. ISO/IEC 10373 con
15、sists of the following parts, under the general title Identification cards Test methods: Part 1: General characteristics tests Part 2: Cards with magnetic stripes Part 3: Integrated circuit cards with contacts and related interface devices Part 5: Optical memory cards Part 6: Proximity cards Part 7:
16、 Vicinity cards Part 8: USB-ICC Part 9: Optical memory cards Holographic recording methodiv ISO 2014 All rights reservedBS ISO/IEC 10373-5:2014Identification cards Test methods Part 5: Optical memory cards 1 Scope This International Standard defines test methods for characteristics of identification
17、 cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification cards applications. NOTE 1
18、 Criteria for acceptability do not form part of this International Standard but will be found in the International Standards mentioned above. NOTE 2 Test methods described in this International Standard are intended to be performed separately. A given card is not required to pass through all the tes
19、ts sequentially. This part of ISO/IEC 10373 deals with test methods which are specific to optical memory card technology. ISO/IEC 10373-1 deals with test methods which are common to one or more card technologies and other parts deal with other technology-specific tests. 2 Normative references The fo
20、llowing documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 11694
21、-4, Identification cards Optical memory cards Linear recording method Part 4: Logical data structures 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 test method method for testing characteristics of identification cards for the purpose of co
22、nfirming their compliance with International Standards 3.2 testably functional surviving the action of some potentially destructive influence to the extent of the following: a) any magnetic stripe present on the card shows a relationship between signal amplitudes before and after exposure that is in
23、 accordance with the base standard; b) any integrated circuit(s) present in the card continues to show an answer to reset response which conforms to the base standard; Note 1 to entry This International Standard does not define any test to establish the complete functioning of integrated circuit(s)
24、cards. The test methods require only that the minimum functionality (testably functional) be verified. This may, in appropriate circumstances, be supplemented by further application specific functionality criteria, which are not available in the general case. INTERNATIONAL ST ANDARD ISO/IEC 10373-5:
25、2014(E) ISO 2014 All rights reserved 1BS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E) c) any contacts associated with any integrated circuit(s) present in the card continue to show electrical resistance and impedance which conform to the base standard; d) any optical memory present in the card contin
26、ues to show optical characteristics which conform to the base standard 3.3 normal use use as an identification card, involving equipment processes appropriate to the card technology and storage as a personal document between equipment processes Note 1 to entry: See ISO/IEC 7810, Clause 4. 4 Default
27、items applicable to the test methods 4.1 Test environment Unless otherwise specified, testing shall take place in an environment of temperature 23C 3C (73F 5F) and of relative humidity 40% to 60%. 4.2 Pre-conditioning Where pre-conditioning is required by the test method, the identification cards to
28、 be tested shall be conditioned to the test environment for a period of 24h before testing. 4.3 Selection of test methods Unless otherwise specified, the tests in this part of ISO/IEC 10373 shall be applied exclusively to optical memory cards defined in ISO/IEC 11693 and ISO/IEC 11694. 4.4 Default t
29、olerance Unless otherwise specified, a default tolerance of 5% shall be applied to the quantity values given to specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment adjustments). 4.5 Total measurement uncertainty The total mea
30、surement uncertainty for each quantity determined by these test methods shall be stated in the test report. 5 Test methods 5.1 Location of accessible optical area and reference track The purpose of this test is to measure the location of the accessible optical area and the reference track in the car
31、d (see ISO/IEC 11694-2). 5.1.1 Procedure Construct two perpendicular axes of reference x and y intersecting at O. Mark three reference points on the axes, points P2 and P3, measured 11,25 mm and 71,25 mm from O are marked on the x axis and point P1, 27,00 mm from O, on the y axis. Place the card to
32、be tested, accessible optical area side up, on a flat hard surface. The card shall be held down by a load of 2,2 0,2 N.2 ISO 2014 All rights reservedBS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E) Apply force F 1(1 N to 2 N) and F 2(2 N to 4 N) so that the reference edge of the card touches points P2
33、 and P3 and the left edge touches at P1 (see Figure 1). Measure dimensions X a , X b , Y, C and D, with equipment having an accuracy of 0,05 mm. Dimensions in millimetres F 2 F 1 Accessible optical area Reference track C 27,00 DY P1 P2 P3 y x 71,25 11,25 X b X a O Figure 1 Location of accessible opt
34、ical area and reference track 5.1.2 Test report The test report shall give the values of the dimensions measured. 5.2 Skew The purpose of this test is to measure the skew of the reference track to the bottom edge of the optical memory card (see ISO/IEC 11694-2:2000). 5.2.1 Apparatus for skew measure
35、ment The apparatus is shown in Figure 2. It comprises an xy stage with an xy position indicator, and an optical microscope. ISO 2014 All rights reserved 3BS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E) 12345 1 2 3 5 Key 1 microscope 2 eyepiece 3 card 4 xy stage 5 XY position indicator Figure 2 Appara
36、tus for the skew measurement 5.2.2 Procedure for skew measurement Place the sample card to be tested, flat, accessible optical area side up, on the xy stage. Look into the eyepiece of the microscope, move the xy stage so that the reference track on the left side of the card can be seen. (see figure
37、3), and adjust the xy stage so that the xy cross-point in the eyepiece is on the reference track. Then record the xy coordinate value(X 0 ,Y 0 ). Next, move the stage in the y direction so that the bottom edge of the card can be seen, adjust the stage and record the value (X 0 ,Y 2 ) similarly. Then
38、 move the stage so that the reference track in the right part of the card can be seen, adjust the stage and record the coordinate value (X 1 ,Y 1 ). However the value of |X 0 -X 1 | shall be not less than 60 mm. Lastly move the stage in the y direction so that the bottom edge of the card can be seen
39、, and record the value (X 1 ,Y 3 ) in the same way. The skew is calculated by the expression as: / (1)4 ISO 2014 All rights reservedBS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E) O(X 0 ,Y 0 ) (X 0 ,Y 2 ) (X 1 ,Y 3 ) (X 1 ,Y 1 ) more than 60 mm 1 2 Key 1 reference track 2 bottom edge Figure 3 Procedu
40、re for the skew measurement 5.2.3 Test report The test report shall give the value of the angle measured. 5.3 Defects The purpose of this test is to measure defects of a card test sample (see ISO/IEC 11694-3). 5.3.1 Apparatus for defect measurement Defects at the accessible optical area shall be mea
41、sured by optical microscope. 5.3.2 Procedure for defect measurement Count the number of defects whose cross-section exceeds 2.5 m at the optical layer of accessible optical area and calculate the total defect area of these defects. Divide the total defect area by the total area of the accessible opt
42、ical area to obtain the density of the raw uncorrected defect ratio within the accessible optical area. At the transparent layer of the accessible optical area, the presence of defects whose cross-section exceeds 100 m shall be noted. 5.3.3 Test report The test report shall give the density of defec
43、ts at the optical layer of the accessible optical area and the existence of defects at the transparent layer. ISO 2014 All rights reserved 5BS ISO/IEC 10373-5:2014ISO/IEC 10373-5:2014(E) 5.4 Optical properties of the media 5.4.1 Apparatus for testing optical cards conforming to ISO/IEC 11694-4 The p
44、roduction media tester (PMT) is based upon a commercially available optical card drive modified for the purpose 1 . The illumination source of the card tester shall be a semiconductor laser diode having a wavelength of 78015nm and shall deliver a focussed elliptic spot of 1.8 2% X 2.25 2% (1/e 2 ) a
45、t the surface of the optical layer. The major axis of the beam shall be 90 degrees30 minutes of arc to the track direction. When not writing, the beam power (read power) is 200W at the card surface and is controlled via detector external to the laser. A data bit is written with a write pulse of 13mW
46、 power and 2sec0.2sec duration at a 1meter/second10% scan rate. This results in a circular data bit of 3.350.05 diameter on the calibration card 2 . A pattern of data bits are written across a track of the calibration card. The diameters of the 8500 bits are measured by the optical head and the test
47、er computer calculates the average diameter across the card track. The dimensions of the bit are set through the laser power and pulse length controls. Calibration cards shall conform to ISO/IEC 11694-4. An additional computer board and connector are installed as a modification to the commercial dri
48、ve to provide trigger signals and an analog signal back from the read photoreceptor of the laser optical head. The main board of the commercial drive is also modified to route the optical head signals to the additional computer board in the optical card drive. The additional computer board is the ma
49、jor departure of the test drive from a standard commercial drive. The drive is controlled via the normal SCSI cable and an interface card in the computer. The optical head trigger signals are routed to the serial port on the computer through an interface box. The interface box provides RF protection and conditions the signals from the optic
