1、BS ISO/IEC 10373-6:2016 Identification cards Test methods Part 6: Proximity cards BSI Standards Publication WB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06BS ISO/IEC 10373-6:2016 BRITISH STANDARD National foreword This British Standard is the UK implementation of ISO/IEC 10373-6:2016. It su
2、persedes BS ISO/IEC 10373-6:2011+A4:2012 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee IST/17, Cards and personal identification. A list of organizations represented on this committee can be obtained on request to its secretary. This publication doe
3、s not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2016. Published by BSI Standards Limited 2016 ISBN 978 0 580 86388 2 ICS 35.240.15 Compliance with a British Standard cannot confer immunity from
4、legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 July 2016. Amendments/corrigenda issued since publication Date T e x t a f f e c t e dBS ISO/IEC 10373-6:2016 Identification cards Test methods Part 6: Proximity cards Cart
5、es didentification Mthodes dessai Partie 6: Cartes de proximit INTERNATIONAL STANDARD ISO/IEC 10373-6 Reference number ISO/IEC 10373-6:2016(E) Third edition 2016-07-15 ISO/IEC 2016 BS ISO/IEC 10373-6:2016ii ISO/IEC 2016 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2016, Published in Swit
6、zerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be r
7、equested from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.org ISO/IEC 10373-6:2016(E)BS ISO/IEC 10373-6:20
8、16 ISO/IEC 10373-6:2016(E) ISO/IEC 2016 All rights reserved iii Contents Page Foreword. v 1 Scope . 1 2 Normative references . 1 3 Terms, definitions, symbols and abbreviated terms 2 3.1 Terms and definitions 2 3.2 Symbols and abbreviated terms . 3 4 Default items applicable to the test methods 5 4.
9、1 Test environment . 5 4.2 Pre-conditioning 5 4.3 Default tolerance 5 4.4 Spurious inductance . 6 4.5 Total measurement uncertainty 6 5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters 6 5.1 Minimum requirements for measurement instruments . 6 5.1.1 Oscilloscope . 6
10、5.2 Calibration coils 6 5.2.1 Size of the calibration coil card . 6 5.2.2 Thickness and material of the calibration coil card . 7 5.2.3 Coil characteristics 7 5.3 Test PCD assembly . 7 5.3.1 Test PCD antenna . 8 5.3.2 Sense coils . 9 5.3.3 Assembly of Test PCD . 9 5.4 Reference PICC . 10 5.4.1 Dimen
11、sions of the Reference PICC 10 5.4.2 Reference PICC construction 10 5.4.3 Reference PICC resonance frequency tuning 12 5.5 EMD test setup 13 5.5.1 General description 13 5.5.2 Computation of power versus time 13 5.5.3 Noise floor precondition test 14 6 Test of ISO/IEC 14443-1 parameters . 14 6.1 PCD
12、 tests . 14 6.1.1 Alternating magnetic field . 14 6.2 PICC tests 15 6.2.1 Alternating magnetic field . 15 6.2.2 Static electricity test 16 6.3 PXD tests . 17 7 Test of ISO/IEC 14443-2 parameters . 18 7.1 PCD tests . 18 7.1.1 PCD field strength . 18 7.1.2 Void 19 7.1.3 Void 19 7.1.4 Modulation index
13、and waveform 19 7.1.5 Load modulation reception . 20 7.1.6 PCD EMD immunity test 21 7.1.7 PCD EMD recovery test 22 7.2 PICC tests 23 BS ISO/IEC 10373-6:2016 ISO/IEC 10373-6:2016(E) iv ISO/IEC 2016 All rights reserved 7.2.1 PICC transmission . 23 7.2.2 PICC EMD level and low EMD time test . 25 7.2.3
14、PICC reception 26 7.2.4 PICC resonance frequency (informative) . 27 7.2.5 PICC maximum loading effect . 28 7.3 Test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC 29 7.4 PXD tests . 29 8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters 29 8.1 PCD tests . 29 8.2 PICC tests 2
15、9 8.3 PXD tests . 29 8.3.1 PCD and PICC Modes 29 8.3.2 Automatic mode alternation . 29 Annex A (normative) Test PCD antennas 34 Annex B (informative) Test PCD Antenna tuning 43 Annex C (normative) Sense coil 45 Annex D (normative) Reference PICCs 48 Annex E (normative) Modulation index and waveform
16、analysis tool 56 Annex F (informative) Program for the evaluation of the spectrum 111 Annex G (normative) Additional PICC test methods . 117 Annex H (normative) Additional PCD test methods . 179 Annex I (normative) High bit rate selection test methods for PCD . 218 Annex J (informative) Program for
17、EMD level measurements . 232 Annex K (normative) Test methods for bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC . 245 Annex L (normative) Frame with error correction test methods 331 Bibliography . 340 BS ISO/IEC 10373-6:2016 ISO/IEC 10373-6:2016(E) ISO/IEC 2016 All rights reserved v Forewo
18、rd ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical co
19、mmittees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in th
20、e work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval c
21、riteria needed for the different types of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of
22、patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents). Any tra
23、de name used in this document is information given for the convenience of users and does not constitute an endorsement. For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the T
24、echnical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information The committee responsible for this document is ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Cards and personal identification. This third edition cancels and replaces the second edition (ISO/IE
25、C 10373-6:2011), which has been technically revised. It also incorporates the Amendments ISO/IEC 10373-6:2011/Amd 1:2012, ISO/IEC 10373-6:2011/Amd 2:2012, ISO/IEC 10373-6:2011/Amd 3:2012, ISO/IEC 10373-6:2011/Amd 4:2012, and the Technical Corrigendum ISO/IEC 10373-6:2011/Cor 1:2013. ISO/IEC 10373 co
26、nsists of the following parts, under the general title Identification cards Test methods: Part 1: General characteristics Part 2: Cards with magnetic stripes Part 3: Integrated circuit cards with contacts and related interface devices Part 5: Optical memory cards Part 6: Proximity cards BS ISO/IEC 1
27、0373-6:2016 ISO/IEC 10373-6:2016(E) vi ISO/IEC 2016 All rights reserved Part 7: Vicinity cards Part 8: USB-ICC Part 9: Optical memory cards Holographic recording method BS ISO/IEC 10373-6:2016 INTERNATIONAL STANDARD ISO/IEC 10373-6:2016(E) ISO/IEC 2016 All rights reserved 1 Identification cards Test
28、 methods Part 6: Proximity cards 1 Scope ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary
29、 standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part of ISO/IEC 10373, but will be found in the International Standards mentioned above. NOTE 2 Test methods defined in this part of ISO/IEC 10373 a
30、re intended to be performed separately. A given proximity card or object, or proximity coupling device, is not required to pass through all the tests sequentially. This part of ISO/IEC 10373 defines test methods which are specific to proximity cards and objects, and proximity coupling devices and pr
31、oximity extended devices, defined in ISO/IEC 14443-1, ISO/IEC 14443-2, ISO/IEC 14443-3, and ISO/IEC 14443-4. ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card technologies and other parts deal with other technology-specific tests. 2 Normative references The
32、 following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 78
33、10, Identification cards Physical characteristics ISO/IEC 14443-1:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 1: Physical characteristics ISO/IEC 14443-2:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 2: Radio frequency p
34、ower and signal interface ISO/IEC 14443-3:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 3: Initialization and anticollision ISO/IEC 14443-4:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 4: Transmission protocol IEC 61000-4
35、-2:2008, Electromagnetic compatibility (EMC) Part 4-2: Testing and measurement techniques Electrostatic discharge immunity test BS ISO/IEC 10373-6:2016 ISO/IEC 10373-6:2016(E) 2 ISO/IEC 2016 All rights reserved 3 Terms, definitions, symbols and abbreviated terms 3.1 Terms and definitions For the pur
36、poses of this document, the terms and definitions given in ISO/IEC 14443-1, ISO/IEC 14443-2, ISO/IEC 14443-3, and ISO/IEC 14443-4, and the following apply. NOTE Elements in bold square brackets are optional definitions. 3.1.1 base standard standard which the test method is used to verify conformance
37、 to 3.1.2 CascadeLevels number of cascade levels of the PICC 3.1.3 Command Set set describing the PICC commands during initialization and anticollision Note 1 to entry: See ISO/IEC 14443-3:2016, 6.4 for PICC Type A and ISO/IEC 14443-3:2016, 7.5 for PICC Type B. 3.1.4 loading effect change in PCD ant
38、enna current caused by the presence of PICC(s) in the field due to the mutual coupling modifying the PCD antenna resonance and quality factor 3.1.5 mute no response within a specified timeout, e.g. expiration of FWT 3.1.6 PICC states different PICC states during initialization and anticollision Note
39、 1 to entry: See ISO/IEC 14443-3:2016, 6.3 for PICC Type A and ISO/IEC 14443-3:2016, 7.4 for PICC Type B. 3.1.7 scenario defined typical protocol and application specific communication to be used with the test methods defined in this part of ISO/IEC 10373 3.1.8 Test Initial State TIS element from PI
40、CC states that is the PICC state before performing a specific PICC command from Command Set 3.1.9 test method method for testing characteristics of identification cards for the purpose of confirming their compliance with International Standards BS ISO/IEC 10373-6:2016 ISO/IEC 10373-6:2016(E) ISO/IEC
41、 2016 All rights reserved 3 3.1.10 Test Target State TTS element from PICC states that is the PICC state after performing a specific PICC command from Command Set 3.2 Symbols and abbreviated terms (xxxxx)b Data bit representations XY Hexadecimal notation, equal to XY in base 16 ATA(cid) Answer to AT
42、TRIB, i.e. (mbli+cid CRC_B), with mbli an arbitrary hex value (see ISO/IEC 14443-3:2016, 7.11) ATTRIB(cid, fsdi) Default ATTRIB command with PUPI from ATQB, CID = cid and Maximum Frame Size Code value = fsdi, i.e. (1D PUPI cid fsdi 01 00 CRC_B) DUT Device under test ESD Electrostatic Discharge I(c)
43、n(inf ,CID = cid ,NAD = nad ,CRC) ISO/IEC 14443-4 I-block with chaining bit c 1,0, block number n 1,0 and information field inf. By default no CID and no NAD will be transmitted. If CID = cid 0.15 is specified, it will be transmitted as second parameter. If NAD = nad 0.FF is specified, it will be tr
44、ansmitted as third parameter (or second parameter if no CID is transmitted). If the literal CRC is not specified, a valid CRC corresponding to the type of the PICC will be transmitted by default (i.e. CRC_A or CRC_B) IUT Implementation Under Test (ISO/IEC 9646); within the scope of this part of ISO/
45、IEC 10373, IUT represents the PCD under the test LT Lower Tester (ISO/IEC 9646), the PICC-emulation part of the PCD-test- apparatus m Modulation index Mute No response within a specified timeout N/A Not applicable PPS(cid, dri, dsi) Default PPS request with CID = cid, DRI = dri and DSI = dsi, i.e. (
46、D + cid 11 dsi 4 + dri CRC_A) R(ACK ,CID = cid ,CRC) n ISO/IEC 14443-4 R(ACK) block with block number n. The definition of the optional CID and CRC symbols is as described in the I(c) n block above R(NAK ,CID = cid,CRC) n ISO/IEC 14443-4 R(NAK) block with block number n. The definition of the option
47、al CID and CRC symbols is as described in the I(c) n block above RATS(cid, fsdi) Default RATS command with CID = cid and FSDI value = fsdi i.e. (E0 fsdi 16 + cid CRC_A) READY(I) READY state in cascade level I, I 1, 2, 3; e.g. READY(2) is a PICC cascade level 2 BS ISO/IEC 10373-6:2016 ISO/IEC 10373-6
48、:2016(E) 4 ISO/IEC 2016 All rights reserved READY*(I) READY* state in cascade level I, I 1, 2, 3; e.g. READY*(2) is a PICC cascade level 2 REQB(N) REQB command with N as defined in ISO/IEC 14443-3:2016, 7.7 S(WTX)(WTXM ,CID = cid,CRC) ISO/IEC 14443-4 S(WTX) block with parameter WTXM. The definition
49、of the optional CID and CRC symbols is as described in the I(c) n block above S(DESELECT ,CID = cid ,CRC) ISO/IEC 14443-4 S(DESELECT) block. The definition of the optional CID and CRC symbols is as described in the I(c) n block above SAK(cascade) the SELECT(I) answer with the cascade bit (bit 3) set to (1)b SAK(complete) the SELECT(I) answer with the cascade bit (bit
