1、raising standards worldwide NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW BSI Standards Publication BS ISO/IEC 10373-9:2011 Identification cards T e s t m e t h o d s Part 9: Optical memory cards Holographic recording methodBS ISO/IEC 10373-9:2011 BRITISH STANDARD National f
2、oreword This British Standard is the UK implementation of ISO/IEC 10373-9:2011. The UK participation in its preparation was entrusted to T e c h n i c a l C o m m i t t e e I S T / 1 7 , C a r d s a n d p e r s o n a l i d e n t i f i c a t i o n . A list of organizations represented on this committ
3、ee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. BSI 2011 ISBN 978 0 580 72213 4 ICS 35.240.15 Compliance with a British Standard cannot confer immunity from leg
4、al obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2011. Amendments issued since publication Date T e x t a f f e c t e dBS ISO/IEC 10373-9:2011Reference number ISO/IEC 10373-9:2011(E) ISO/IEC 2011INTERNATIONAL STANDARD
5、 ISO/IEC 10373-9 First edition 2011-08-01 Identification cards Test methods Part 9: Optical memory cards Holographic recording method Cartes didentification Mthodes dessai Partie 9: Cartes mmoire optique Mthode denregistrement holographique BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) COPYRIGHT P
6、ROTECTED DOCUMENT ISO/IEC 2011 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or
7、 ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2011 All rights reservedBS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) I
8、SO/IEC 2011 All rights reserved iiiContents Page Foreword iv Introduction.v 1 Scope1 2 Normative references1 3 Terms and definitions .1 4 Default items applicable to the test methods.2 4.1 Test environment.2 4.2 Pre-conditioning 2 4.3 Selection of test methods.2 4.4 Default tolerance .2 4.5 Total me
9、asurement uncertainty .2 5 Test methods .3 5.1 Location of accessible optical area and reference track 3 5.1.1 Procedure.3 5.1.2 Test report3 5.2 Skew3 5.2.1 Apparatus for skew measurement.4 5.2.2 Procedure for skew measurement.4 5.2.3 Test report5 5.3 Hologram size5 5.3.1 Apparatus for hologram siz
10、e measurement .5 5.3.2 Procedure for hologram size measurement .5 5.3.3 Test report5 5.4 Arrangement of multiple holograms .5 5.4.1 Apparatus for measuring the arrangement of multiple holograms .6 5.4.2 Procedure for measuring the arrangement of multiple holograms .6 5.4.3 Test report6 5.5 Optical p
11、roperties of the media .6 5.5.1 Apparatus for measuring the optical properties of the media7 5.5.2 Procedure for measuring the optical properties of the media7 5.5.3 Test report8 Bibliography9 BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) iv ISO/IEC 2011 All rights reservedForeword ISO (the Intern
12、ational Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees establish
13、ed by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the fie
14、ld of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prepare International Standards. Draft
15、 International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility that some of the elements of this d
16、ocument may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. ISO/IEC 10373-9 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Cards and personal identification. ISO/IEC 10373
17、consists of the following parts, under the general title Identification cards Test methods: Part 1: General characteristics Part 2: Cards with magnetic stripes Part 3: Integrated circuit cards with contacts and related interface devices Part 5: Optical memory cards Part 6: Proximity cards Part 7: Vi
18、cinity cards Part 8: USB-ICC Part 9: Optical memory cards Holographic recording method BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) ISO/IEC 2011 All rights reserved vIntroduction ISO/IEC 10373 defines test methods in support of ISO/IEC 11695, which specifies optical holographic memory cards and t
19、he use of such cards for the storage and interchange of digital data. The International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) draw attention to the fact that it is claimed that compliance with this document may involve the use of patents. ISO and
20、the IEC take no position concerning the evidence, validity and scope of these patent rights. The holders of these patent rights have assured ISO and the IEC that they are willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throughout the world.
21、In this respect, the statements of the holders of these patent rights are registered with ISO and the IEC. Information may be obtained from: Certego GmbH Lichtenbergstrasse 8 85748 Garching Germany Attention is drawn to the possibility that some of the elements of this document may be the subject of
22、 patent rights other than those identified above. ISO and the IEC shall not be held responsible for identifying any or all such patent rights. BS ISO/IEC 10373-9:2011BS ISO/IEC 10373-9:2011 INTERNATIONAL STANDARD ISO/IEC 10373-9:2011(E) ISO/IEC 2011 All rights reserved 1Identification cards Test met
23、hods Part 9: Optical memory cards Holographic recording method 1 Scope This part of ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. It is specific to optical memory cards that use the holographic recording method techn
24、ology. Each test method is cross-referenced to one or more base standards, i.e. ISO/IEC 7810 or one or more of the supplementary International Standards that define the information storage technologies employed in identification card applications. NOTE 1 Criteria for acceptability do not form part o
25、f ISO/IEC 10373, but will be found in the International Standards mentioned above. NOTE 2 Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately. A given card is not required to pass through all the tests sequentially. 2 Normative references The following referenc
26、ed documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 11695-2, Identification cards Optical memory cards Holographic
27、recording method Part 2: Dimensions and location of accessible optical area ISO/IEC 11695-3, Identification cards Optical memory cards Holographic recording method Part 3: Optical properties and characteristics 3 Terms and definitions For the purposes of this document, the following terms and defini
28、tions apply. 3.1 test method method for testing characteristics of identification cards for the purpose of confirming their compliance with International Standards 3.2 testably functional surviving the action of some potentially destructive influence to the extent that: any magnetic stripe present o
29、n the card shows a relationship between signal amplitudes before and after exposure that is in accordance with the base standard; BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) 2 ISO/IEC 2011 All rights reserved any integrated circuit(s) present in the card continues to show an Answer to Reset resp
30、onse 1)which conforms to the base standard; any contacts associated with any integrated circuit(s) present in the card continue to show electrical resistance and impedance which conform to the base standard; any optical memory present in the card continues to show optical characteristics which confo
31、rm to the base standard 3.3 normal use use as an identification card (see ISO/IEC 7810:2003, 4.1), involving equipment processes appropriate to the card technology and storage as a personal document between equipment processes 4 Default items applicable to the test methods 4.1 Test environment Unles
32、s otherwise specified, testing shall take place in an environment of temperature 23 C 3 C (73 F 5 F) and of relative humidity 40 % to 60 %. 4.2 Pre-conditioning Where pre-conditioning is required by the test method, the identification cards to be tested shall be conditioned to the test environment f
33、or a period of 24 h before testing. 4.3 Selection of test methods Unless otherwise specified, the tests in this part of ISO/IEC 10373 shall be applied exclusively to optical memory cards using the holographic recording method, as defined in ISO/IEC 11693 and ISO/IEC 11695 (all parts). 4.4 Default to
34、lerance Unless otherwise specified, a default tolerance of 5 % shall be applied to the quantity values given to specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment adjustments). 4.5 Total measurement uncertainty The total mea
35、surement uncertainty for each quantity determined by these test methods shall be stated in the test report. 1)This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality (testably
36、functional) be verified. This may, in appropriate circumstances, be supplemented by further, application-specific functionality criteria which are not available in the general case. BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) ISO/IEC 2011 All rights reserved 35 Test methods 5.1 Location of acces
37、sible optical area and reference track The purpose of this test is to measure the location of the accessible optical area and the reference track in the card. Refer to ISO/IEC 11695-2. 5.1.1 Procedure Construct two perpendicular axes of reference x and y intersecting at O. Mark three reference point
38、s on the axes: points P2 and P3, measured 11,25 mm and 71,25 mm from O are marked on the x axis and point P1, 27,00 mm from O, on the y axis. Place the card to be tested, accessible optical area side up, on a flat hard surface. The card shall be held down by a load of 2,2 0,2 N. Apply force F 1(1 N
39、to 2 N) and F 2(2 N to 4 N) so that the reference edge of the card touches points P2 and P3 and the right edge touches P1 (see Figure 1). Measure dimensions X a , X b , Y, C and D with equipment having an accuracy of 0,05 mm. Figure 1 Location of accessible optical area and reference track 5.1.2 Tes
40、t report The test report shall give the values of the dimensions measured. 5.2 Skew The purpose of this test is to measure the skew of the reference track to the bottom edge of the optical memory card. Refer to ISO/IEC 11695-2. BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) 4 ISO/IEC 2011 All right
41、s reserved5.2.1 Apparatus for skew measurement The apparatus is shown in Figure 2. It comprises an xy stage with an xy position indicator, and an optical microscope. Microscope Eyepiece Card XY position indicator xy stage 12345Figure 2 Apparatus for the skew measurement 5.2.2 Procedure for skew meas
42、urement Place the sample card to be tested, flat, accessible optical area side up, on the xy stage. Look into the eyepiece of the microscope, move the xy stage so that the reference track on the left side of the card can be seen. (see Figure 3), and adjust the xy stage so that the xy cross-point in
43、the eyepiece is on the reference track. Then record the xy coordinate value (X 0 ,Y 0 ). Next, move the stage in the y direction so that the bottom edge of the card can be seen, adjust the stage and record the value (X 0 ,Y 2 ) similarly. Then move the stage so that the reference track in the right
44、part of the card can be seen, adjust the stage and record the coordinate value (X 1 ,Y 1 ). However the value of |X 0 -X 1 | shall be not less than 60 mm. Lastly move the stage in the y direction so that the bottom edge of the card can be seen, and record the value (X 1 ,Y 3 ) in the same way. The s
45、kew, , is calculated by the following expression: = ABSarctan(Y 1 -Y 0 )/(X 1 -X 0 )-arctan(Y 3 -Y 2 )/(X 1 -X 0 ) BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) ISO/IEC 2011 All rights reserved 5O(X 0 ,Y 0 ) (X 0 ,Y 2 ) (X 1 ,Y 3 ) (X 1 ,Y 1 ) more than 60 mm Reference track Bottom edgeDrawing not
46、 to scale Figure 3 Procedure for the skew measurement 5.2.3 Test report The test report shall give the value of the angle measured. 5.3 Hologram size The hologram size is not fixed, but shall be left to each industry user group to specify for those applications requiring interchange. Refer to ISO/IE
47、C 11695-2. 5.3.1 Apparatus for hologram size measurement The hologram size shall be measured with a microscope. 5.3.2 Procedure for hologram size measurement The hologram size shall be measured using a microscope. 5.3.3 Test report The test report shall give the hologram size measured. 5.4 Arrangeme
48、nt of multiple holograms The optical area can contain data in form of one or more holograms. The location of the reference hologram is at location X, Y relative to the reference edges of the card, while additional holograms are arranged on the reference track or on tracks parallel to the reference t
49、rack; see Figure 1 and Figure 4. Refer also to ISO/IEC 11695-2. A minimum distance between the holograms has to be considered to avoid crosstalk from neighbouring holograms when reading out one hologram. The distance (d x , d y ) depends on the size of holograms; refer to ISO/IEC 11695-2. BS ISO/IEC 10373-9:2011 ISO/IEC 10373-9:2011(E) 6 ISO/IEC 2011 All rights reservedFigure 4 Arrangement of multiple holograms 5.4.1 Apparatus for measuring the
