1、Identification cards Optical memory cards Holographic recording method Part 3: Optical properties and characteristics BS ISO/IEC 116953:2017 BSI Standards Publication WB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06Identification cards Optical memory cards Holographic recording method Part 3
2、: Optical properties and characteristics Cartes didentification Cartes mmoire optique Mthode denregistrement holographique Partie 3: Proprits et caractristiques optiques INTERNATIONAL STANDARD ISO/IEC 11695-3 Reference number ISO/IEC 11695-3:2017(E) Second edition 2017-04 ISO/IEC 2017 National forew
3、ord This British Standard is the UK implementation of ISO/IEC 116953:2017. It supersedes BS ISO/IEC 116953:2008, which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee IST/17, Cards and personal identification. A list of organizations represented on this com
4、mittee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017 ISBN 978 0 580 88133 6 ICS 35
5、.240.15 Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 July 2017. Amendments/corrigenda issued since publicationDate Text affected BRITISH STANDARD BS ISO/I
6、EC 116953:2017Identification cards Optical memory cards Holographic recording method Part 3: Optical properties and characteristics Cartes didentification Cartes mmoire optique Mthode denregistrement holographique Partie 3: Proprits et caractristiques optiques INTERNATIONAL STANDARD ISO/IEC 11695-3
7、Reference number ISO/IEC 11695-3:2017(E) Second edition 2017-04 ISO/IEC 2017 BS ISO/IEC 116953:2017 ii ISO/IEC 2017 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2017, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced o
8、r utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester. ISO c
9、opyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.org ISO/IEC 11695-3:2017(E) BS ISO/IEC 116953:2017 ii ISO/IEC 2017 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2017, Published in Switzerla
10、nd All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be reques
11、ted from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.org ISO/IEC 11695-3:2017(E)ISO/IEC 11695-3:2017(E)For
12、eword iv Introduction v 1 Scope .1 2 Normative references 1 3 Terms and definitions .1 4 Reading/writing test conditions 2 4.1 Test methods . 2 4.2 Default test environment and conditioning . 2 5 Optical properties and characteristics 2 5.1 Surface roughness/scattering 2 5.2 Reflectivity of blank ac
13、cessible optical area 2 5.2.1 Spatial resolution 2 Bibliography 3 ISO/IEC 2017 All rights reserved iii Contents Page BS ISO/IEC 116953:2017 ISO/IEC 11695-3:2017(E) Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the speci
14、alized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical co
15、mmittees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. The proce
16、dures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of document should be noted. This document was drafted in accordance with the editorial rul
17、es of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Details of any patent r
18、ights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www .iso .org/ patents). Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement. For
19、an explanation on the meaning of ISO specific terms and expressions related to conformit y assessment, as well as information about ISOs adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www .iso .org/ iso/ foreword .html. The
20、committee responsible for this document is ISO/IEC JTC 1, Information technology, SC 17, Cards and personal identification. This second edition cancels and replaces the first edition (ISO/IEC 11695-3:2008), which has been technically revised. A list of all the parts in the ISO/IEC 11695 series can b
21、e found on the ISO website.iv ISO/IEC 2017 All rights reserved BS ISO/IEC 116953:2017 ISO/IEC 11695-3:2017(E) Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National
22、bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Oth
23、er international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. The procedures used to develop this document and those intended
24、 for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .or
25、g/ directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the documen
26、t will be in the Introduction and/or on the ISO list of patent declarations received (see www .iso .org/ patents). Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement. For an explanation on the meaning of ISO specific terms an
27、d expressions related to conformit y assessment, as well as information about ISOs adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www .iso .org/ iso/ foreword .html. The committee responsible for this document is ISO/IEC JTC
28、 1, Information technology, SC 17, Cards and personal identification. This second edition cancels and replaces the first edition (ISO/IEC 11695-3:2008), which has been technically revised. A list of all the parts in the ISO/IEC 11695 series can be found on the ISO website.iv ISO/IEC 2017 All rights
29、reserved ISO/IEC 11695-3:2017(E) Introduction This document is one of a series of standards describing the parameters for optical holographic memory cards and the use of such cards for the storage and interchange of digital data. The standards recognize the existence of different methods for recordi
30、ng and reading information on optical memory cards, the characteristics of which are specific to the recording method employed. In general, these different recording methods will not be compatible with each other. Therefore, the standards are structured to accommodate the inclusion of existing and f
31、uture recording methods in a consistent manner. This document is specific to optical memory cards using the holographic recording method. Characteristics which apply to other specific recording methods are found in separate standards. This document defines the optical properties and characteristics
32、and the extent of compliance with, addition to, and/or deviation from the relevant base document, ISO/IEC 11693. ISO/IEC 2017 All rights reserved v BS ISO/IEC 116953:2017BS ISO/IEC 116953:2017 Identification cards Optical memory cards Holographic recording method Part 3: Optical properties and chara
33、cteristics 1 Scope This document specifies the optical properties and characteristics of optical memory cards using the holographic recording method. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of
34、 this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 10373-9, Identification cards Test methods Part 9: Optical memory cards Holographic recording method ISO/IEC 11693-1
35、, Identification cards Optical memory cards Part 1: General characteristics 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO/IEC 11695-1, ISO/IEC 11695-2 and the following apply. ISO and IEC maintain terminological databases for use in standardization
36、 at the following addresses: IEC Electropedia: available at h t t p :/ www .electropedia .org/ ISO Online browsing platform: available at h t t p :/ www .iso .org/ obp 3.1 reflectivity ratio of reflected light to the light incident at a specified wavelength measured at a normal incidence on the holo
37、graphic memory card Note 1 to entry: Reflectivity is generally expressed as a percentage. 3.2 scattering deviation of reflected radiation from the angle predicted by the law of reflection Note 1 to entry: Reflections that undergo scattering are called diffuse ref lections. Diffuse ref lections are m
38、easured by means of an integration sphere, while properly averaging over all angles of illumination and observation. 3.3 spatial resolution ability of the storage material to distinguish and/or record physical details by electromagnetic means Note 1 to entry: The (spatial) resolution is typically ex
39、pressed in line pairs per millimetre. INTERNATIONAL ST ANDARD ISO/IEC 11695-3:2017(E) ISO/IEC 2017 All rights reserved 1 BS ISO/IEC 116953:2017 ISO/IEC 11695-3:2017(E) 3.4 contrast transfer function CTF mathematical function that expresses the ability of an optical device to transfer signals faithfu
40、lly as a function of the spatial or temporal frequency of the signal Note 1 to entry: The CTF is the ratio of percentage modulation of a square wave signal leaving to that entering the device over the range of frequencies of interest. The CTF is usually presented as a graph of CTF versus log (freque
41、ncy). 4 Reading/writing test conditions 4.1 Test methods The test methods specified in ISO/IEC 10373-9 shall apply. 4.2 Default test environment and conditioning The default test environment and conditioning parameters specified in ISO/IEC 11693-1 shall apply. 5 Optical properties and characteristic
42、s 5.1 Surface roughness/scattering The substrate shall provide a flat and smooth surface as the carrier for the reflective and optical storage layers. The surface roughness shall be less than Ra = 100 nm; higher values can cause substantial scattering of the read-out beam. Scattered light shall be l
43、ess than 10 % for wavelengths between 500 nm and 1 000 nm. 5.2 Reflectivity of blank accessible optical area The reflective layer enables reading of holographic memory cards in reflection mode. The reflectivity of the blank accessible optical area (not containing holograms) shall be greater than 90
44、% for wavelengths between 500 nm and 1 000 nm. 5.2.1 Spatial resolution The limiting resolution of the holographic memory card is measured by determining the smallest group of bars, both vertically and horizontally, for which the correct number of bars can be recorded and/or seen. By calculating the
45、 contrast between the black and white areas at several different frequencies, points of the contrast transfer function (CTF) can be determined with the contrast equation; see Formula (1). Contrast cc cc maxm in maxm in(1) whereC max is the normalized value of the maximum (for example, the voltage or
46、 grey value of the white area);C min is the normalized value of the minimum (for example, the voltage or grey value of the black area). When the system can no longer resolve the bars, the black and white areas have the same value, so Contrast = 0. At very low spatial frequencies, C max= 1 and C min=
47、 0, so Contrast = 1. For the holographic memory card, the minimum Contrast shall be 1 up to a density of 1 000 line pairs per millimetre.2 ISO/IEC 2017 All rights reserved BS ISO/IEC 116953:2017 ISO/IEC 11695-3:2017(E) 3.4 contrast transfer function CTF mathematical function that expresses the abili
48、ty of an optical device to transfer signals faithfully as a function of the spatial or temporal frequency of the signal Note 1 to entry: The CTF is the ratio of percentage modulation of a square wave signal leaving to that entering the device over the range of frequencies of interest. The CTF is usu
49、ally presented as a graph of CTF versus log (frequency). 4 Reading/writing test conditions 4.1 Test methods The test methods specified in ISO/IEC 10373-9 shall apply. 4.2 Default test environment and conditioning The default test environment and conditioning parameters specified in ISO/IEC 11693-1 shall apply. 5 Optical properties and characteristics 5.1 Surface roughness/scattering The substrate shall provide a flat and smooth surface as the carrier for the
