1、MIL-E-1/171 E 30 March 1393 SUPERSEDING 17 May 1977 MIL-E-l/171D MILITARY SPECIFICATION SHEET ELECTRON TUBE, RECEIVING TYPE 5686 This specification is approved for use by all Depart- mentS.and Agencies of the Department of Defense. The complete requirements for procuring the electron tube described
2、herein shall consist of this document and the latest issue of Specification MIL-E-1. . DESCRIPTION: Pentode, minature, rf beam power Outline - 6-2 (EIA) E9-1 - Base Envelope - T6-1/2 Cathode - Coated unipotential Base connections: Pin No. - 1 -2 3 456 7 8 9 Element - k, 93 gl k, 93 h h 92 a k, 93 g2
3、 ABSOLUTE RATINGS: Parameter: Ef Eb Ec2 ECl Ehk Rgl Ib IC1 mAdc mAdc Unit : V Vdc Vdc Vdc V Meg Maximum : 6.9 275 275 O 100 (See note i) 44 3.3 - - d- Minimum: 5.7 -I- - -165 - TEST CONDITIONS: 6.3 250 250 -12.5 - - - - - Parameter: TE PP pg2 Pi Alt Maximum : 17 5 8.0 3.3 14.0 (See Minimum : Uqit :
4、OC W W W ft note 2) - - - - TEST CONDITIONS : - - - - - GENERAL : Qualification - Required Reliable tube denotes changes Page i of 5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-E- 171E 31 i ty Conformance Inspection. TABLE 1 1 - INSP EVEL OR
5、CODE - - - “1 BO 1 - Po METHOD REQUIREMENT OR TEST CONDITIONS AQL ERCENT EFECTIVE LIMITS UNIT - W - mAdc mAdc mAdc pAdc mA UAdc W - - mVac W VAdc mhos % mAdc - MIN o 1236 Qualification- Inspection Power oscillation (1) 4.3 Ecl -50 Vdc; Esig/Ib = 40 mAdc; F = 125 MHZ t = 20 See note 4 0.4 0.4 O. 4 0.
6、4 0.4 0.4 0.4 0.4 Quality confomanct inspection, part i mis sion Eb = Ec2 = Ecl : 30 Vdc See note 3 Is Ib IC2 IC1 If Ihk Po - - - EP Po ICI Sm APc Ef Ici - 1231 1256 1256 1266 1301 1336 1341 1201 1211 1031 1236 1266 1306 1341 1256 II II II II II II II II I - - - - I - Y lectrode current anode) lectr
7、ode current i) (screen) otal grid current Rg = 0.02 Meg See note 3 eater current eater-cathode eakage ower output (i) f Esig = 8.8 Vac; Rp = 9,000 ohms hort and discon- inuity detection - luality conformance mspection, part 2 hsulation of !lec trodes ,ow-?requenc y ri brat ion ower oscillation 1p =
8、2,000 ohms; .OG; F = 40 Hz :sig/Icl = ! mAdc; :b = 40 mAdc; - 5 MHz; Icl = 25,000 ohm lee note 4 :f = 7.5 v; :c1 = -45 Vdc; 1g = 0.02 Meg lee note 5 ti ;rid emission !ransconductance ower output (2) :f = 5.7 v; :Sig = 8.8 Vac; :p = 9,000 ohms lower scillation (2) :lectrode current :2) (screen) 2 Pro
9、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-E - 171 E TABLE 1 Oual i tv Conformance InsDection (Continued o IETHOD LIMITS INSPECTION LEVEL OR KIDE AQL DEFECTIVE) ( PERGTSMT REQUIREMENT OR TEST SYMBOL UNIT CONDITTONS Min MaX luality conformance L
10、nspection, part 2 -Continued 1331 1041 1031 - 1031 133 6 13 06 1266 1121 2126 lirect- interelectrode :apacitance hock hield No. 315 hield No. 315 hield No. 315 50G; hk = 100 Vdc; k = 150 ohms ee note 7 .5 G; fixed requency ; cl = -6.5 Vdc; = 25 min, 60 max ribration fatigu lost-shock and libration-f
11、atigue :est end points: Low-frequency vibration Heater cathode leakage Transconductance Total grid current Lase strain ;lass strain 7 kuality conformance .nspection, part 3 1506 - 1336 1516 - 1341 - eater-cycling life f = 7.5 Vac; hk = 135 Vdc; b = Ecl = Ec2 = O eater-cycling life :est end point: He
12、ater-cathode leakage tability life cl = -6.5 Vdc; hk= 180 Vdc; gl = 0.01 Meg; k = 150 ohms; A = room tability-life test md point: Power output (ir hange in power UtDut (1) Of ndividiai tubes Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-METHOD 1501
13、 - 1266 1236 1341 1341 1336 1211 1341 - - - 1266 1236 1341 1341 1336 1211 - 1511 - MIL-E- 171 E TABLE 1 Quality Conformance InsDection (Continuedl LMITS REQUIREMENT OR TES iuaiity conformance inspection, part 3 -Continued intermittent life ntermittent life- zest end points: (500 hours) Inoperatives
14、Total grid current Power oscilla- tion (2) Power output (2) Power output (1) Heater-cathode leakage Insulation of electrodes Power output (1) rota1 defectives Intermittent life- test end points: (1,000 hours) Inoperatives Total grid current Power oscilla- tion (2) Power output (2) Power output (1) H
15、eater -ca t hod e leakage Insulation of electrodes Total defectives Cathode-interface life - Cathode-interf ace life-test end points : CONDITIONS tability life- .est conditions; E = 175OC (min) ee note 8 !hange in power .ndividual tubes iutput (1) of .verage change Jhange in power 3utput (1) of indi
16、vidual See note 9 Ef = 5.7 20.05 Vdc ; Eb = 80 Vdc; Ec/Ib = 5.0 mAdc See note 10 I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I MIL+ -Vi71 E NOTES : 1. The following Rgl values shall apply: Class Al, amplifier Class CI rf amplifier With fixed bi
17、as With cathode bias 0.10 O. 05 0.50 O. 05 2. See “Reduced pressure (altitude) rating“ , and altitude , maximum peak voltage. 3. 4. 5. This test is to be performed at the conclusion of the holding period. In a class C amplifier circuit, Po shall be useful power output. Prior to this test, tubes shal
18、l be preheated a minimum of 5 minutes with each section operating at conditions specified below. permitted. Test at specified conditions within 3 seconds after preheating. Grid emission shall be the last test performed on the sample selected for the grid-emission test. The 3-minute test is not Ef .
19、Ed Ec 2 Eb Rk Rgl V Vdc Vdc Vdc Ohms Me9 7.5 -4.5 250 250 150 o. o1 6. This test shall be conducted on the initial lot and thereafter on a lot approxi- mately every12months. When one lot has passed, the12lmonth rule shall apply. In the event of lot failure, the lot shall be rejected and the succeedi
20、ng lots shall be subjected to this test until a lot passes. MIL-STD-105, sample size code letter E, shall apply. be used when a thyratron-type short indicator is employed. temperature by conduction-band measurement (method 1226), will be satisfied if a tube having bogey Ib (+5 percent) under normal
21、test conditions, is determined to operate at or above mrnimum specified temperature at any position in the life-test rack. 7. A grid resistor of 0.1 megohm shall be added; however, this resistor shall not 8. Envelope temperature (TE) requirements, when measured in accordance with the 9. The life-tes
22、t sample shall consist of 10 tubes per -lot and not more than 1 tube failure shall be permitted. In the event of rejection of the first sample, due to failure of more than.l tube, a second sample of 20 cubes shall be selected from the lot. Acceptance shall then be based on the combined first and sec
23、ond samples. The total tube failures from the combined first and second samples shall not exceed two. A life-test defect is defined as a failure to meet the life-test end-point limits specified in the tube specification sheet. 10. Preheat approximately 5 minutes prior to testing, using Ef = 5.7 VI o
24、ther elec- trodes disconnected. No other test shall be made from the start of the inter- face life test until after the measurement of the end-point characteristic following completion of the indicated minimum number of life-test hours. Custodians: Navy - EC Air Force - 85 Army - ER Review activitie
25、s: Army - Air Force - gg User activities: Army - ME, WC Navy - AS, OS, MC, CG, SH Air Force - 11 *US. QOVEANMENT PAINTINO OFFICE 1883 - 034/2231 Preparing activity: Air Force - 85 (Project No. 5960-3308) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
