1、IEEE Std 1057-2007(Revision of IEEE 1057-1994)IEEE Standard for DigitizingWaveform RecordersIEEE3 Park Avenue New York, NY 10016-5997, USA18 April 2008IEEE Instrumentation and Measurement SocietySponsored by theWaveform Generation, Measurements and Analysis Committee (TC-10)1057TMRecognized as an IE
2、EE Std 1057-2007 American National Standard (ANSI) (Revision of IEEE Std 1057-1994) IEEE Standard for Digitizing Waveform Recorders Sponsored by Waveform Generation, Measurements and Analysis Committee (TC-10) of the IEEE Instrumentation and Measurement Society Approved 15 April 2008 American Nation
3、al Standards Institute Approved 5 December 2007 IEEE-SA Standards Board Abstract: Terminology and test methods for describing the performance of waveform recorders are presented. Keywords: effective number of bits, frequency response, noise, sine fitting, step pulse response, total harmonic distorti
4、on, transitions levels, waveform recorders _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 18 April 2008. Printed in the United State
5、s of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 1057-2007, IE
6、EE Standard for Digitizing Waveform Recorders. This standard is a complete revision and modernization of the previous standard, IEEE Std 1057-1994. It presents recommended methods for the test and evaluations of digitizing waveform recorders approved by balloting committee. Notice to users Laws and
7、regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regu
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13、e at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can b
14、e accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. iv Copyright 2008 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of th
15、is standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Clai
16、ms or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or nondiscriminatory. Users of this standard are expressly advised that determination of the validity of any patent right
17、s, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Waveform Recorder Subcommittee had the
18、following membership: William Boyer, Chair Thomas Linnenbrink, TC-10 Chair Jerome Blair, Secretary Francisco Alegria, Symbols Editor Eulalia Balestrieri David Bergman Pasquale Daponte Robert Graham Donald Larson Solomon Max Nicholas Paulter Sergio Rapuano Steven Tilden Fang Xu In addition the follow
19、ing people made significant contributions to the standard: Istvan Kollar Dan Knierem The following individual members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Francisco Alegria Ali Al Awazi David Bergman Jerome Blair Willia
20、m Boyer James S. Case Keith Chow Tommy P. Cooper Pasquale Daponte Gary Engmann Chris C. Gorringe Robert Graham Randall C. Groves Scott A. Gudgel Werner Hoelzl Efthymios G. Karabetsos J. L. Koepfinger Donald Larson Yeou Song Lee Thomas Linnenbrink G. Luri Solomon Max Michael J. Maytum Edward M. Mccal
21、l Gary L. Michel Scott Misha Jerry R. Murphy Bruce Muschlitz Michael S. Newman Donald M. Parker Ulrich Pohl Sergio Rapuano Gordon D. Robinson Robert A. Robinson Bartien Sayogo Joseph J. Stanco Walter Struppler Steven Tilden John A. Vergis Fang Xu Oren Yuen Waldemar Ziomek v Copyright 2008 IEEE. All
22、rights reserved. The following people were on the working group of the original standard: Michael Souders, Chair Jerome Blair William Boyer Philip Crosby Philip Green James Hyatt Dan Knierim Robert Lawton* Thomas Linnenbrink Bruce Peetz William Sapankevych Otis Solomon Stuart Streiff Steven Tilden *
23、Chairman 1982-1986 The working group thanks the corporations, laboratories, and universities that provided significant committee support and resources during the development of this standard. When the IEEE-SA Standards Board approved this standard on 5 December 2007, it had the following membership:
24、 Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Richard DeBlasio Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Julian Forster* Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick Da
25、vid J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-MarieSahazizia Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Sa
26、tish K. Aggarwal, NRC Representative Alan H. Cookson, NIST Representative Don Messina IEEE Standards Program Manager, Document Development vi Copyright 2008 IEEE. All rights reserved. Contents 1 Overview 1 1.1 Scope .1 1.2 Purpose 2 2 Normative references2 3 Definitions, symbols, and acronyms.2 3.1
27、Definitions .2 3.2 Symbols and acronyms 8 4 Test parameters and methods11 4.1 Manufacturer supplied information .11 4.2 Test selection .13 4.3 Test setup.14 4.4 Equivalent-time sampling 18 4.5 Discrete Fourier transform (DFT)21 4.6 Sinewave testing and fitting.30 4.7 Locating code transition levels
28、36 4.8 Step function response measurements .53 4.9 Tests using a dc input.56 5 Input impedance .56 5.1 Test method .56 5.2 Alternate test method using a time domain reflectometer (TDR)56 5.3 Input impedance for out-of-range signals 57 6 Gain and offset .59 6.1 Independently based gain and offset59 6
29、.2 Terminal-based gain and offset60 7 Linearity .61 7.1 Integral nonlinearity (INL).61 7.2 Maximum static error (MSE) .61 7.3 Differential nonlinearity (DNL) and missing codes.62 7.4 Example INL and DNL data.63 7.5 Monotonicity64 7.6 Hysteresis.64 7.7 Total harmonic distortion (THD).65 7.8 Intermodu
30、lation distortion (IMD) 70 7.9 Noise power ratio (NPR)72 8 Noise.77 8.1 Comments on noise77 8.2 Ratio of signal to noise and distortion (SINAD).77 8.3 Signal to noise ratio (SNR).78 vii Copyright 2008 IEEE. All rights reserved. 8.4 Comments on SINAD and SNR79 8.5 Effective number of bits (ENOB) 80 8
31、.6 Random noise 82 8.7 Spurious components.84 8.8 Spurious-free dynamic range (SFDR)85 9 Step response parameters86 9.1 Settling parameters 86 9.2 Transition duration of the step response 89 9.3 Slew rate limit91 9.4 Overshoot and precursors 91 9.5 Aperture duration.91 9.6 Limitations on the use of
32、step responses92 10 Frequency response parameters94 10.1 Analog bandwidth94 10.2 Gain error (gain flatness) .95 10.3 Frequency response and gain from step response95 11 Interchannel parameters100 11.1 Crosstalk 100 11.2 Multiple input reverse coupling.100 12 Time base parameters .101 12.1 Fixed erro
33、r in sample time .101 12.2 Aperture uncertainty 101 12.3 Long-term stability 103 13 Out-of-range recovery 104 13.1 Test method for absolute out-of-range voltage recovery .105 13.2 Test method for relative out-of-range voltage recovery.105 13.3 Comments on test method105 14 Word error rate .105 14.1
34、Test method .105 14.2 Comment on the number of samples required for word error rate.106 14.3 Comments on test equipment and making measurements .106 15 Differential input specifications .106 15.1 Differential input impedance to ground.107 15.2 Common-mode rejection ratio (CMRR) and maximum common-mo
35、de signal level.107 15.3 Maximum operating common-mode signal .107 15.4 Common-mode out-of-range signal recovery time 108 16 Cycle time.108 16.1 Test method .108 16.2 Comment109 viii Copyright 2008 IEEE. All rights reserved. 17 Triggering.109 17.1 Trigger delay and trigger jitter.109 17.2 Trigger se
36、nsitivity110 17.3 Trigger minimum rate of change .111 17.4 Trigger coupling to signal111 Annex A (informative) Sine fitting algorithms.112 A.1 Algorithm for three-parameter (known frequency) least squares fit to sinewave data using matrix operations .112 A.2 Algorithm for four-parameter (general use
37、) least squares fit to sinewave data using matrix operations.113 Annex B (informative) Phase noise116 B.1 What is phase noise?116 B.2 Phase noise measurements.118 B.3 Phase noise effect on test results118 B.4 Phase noise effects on specific tests.121 Annex C (informative) Comment on errors associate
38、d with word-error-rate measurement124 Annex D (informative) Measurement of random noise below the quantization level.126 D.1 Derivation of equations126 D.2 Alternate approach using a servo loop.128 Annex E (informative) Software considerations 129 E.1 Motivation129 E.2 Test of software to fit wavefo
39、rms 129 E.3 Test of DFT software.129 E.4 Software toolkit .129 Annex F (informative) Excitation with precision source with ramp vernier: determination of the test parameters .130 F.1 Triangular wave amplitude (A) 130 F.2 DC source output voltages (Vj) 131 F.3 Number of samples (K and M) and triangul
40、ar wave frequency (f).132 Annex G (informative) Presentation of sinewave data133 G.1 ENOB presentation 133 G.2 Presentation of residuals 134 G.3 Other examples of presentations of sinewave test results135 Annex H (informative) Bibliography 140 ix Copyright 2008 IEEE. All rights reserved. IEEE Standa
41、rd for Digitizing Waveform Recorders IMPORTANT NOTICE: This standard is not intended to assure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or
42、 regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Con
43、cerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard defines specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, wavefor
44、m analyzers, and digitizing oscilloscopes with digital outputs. The standard is directed toward, but not restricted to, general-purpose waveform recorders and analyzers. Special applications can require additional manufacturer information and verification tests not covered in this standard. IEEE Std
45、 1057 has many similarities to IEEE Std 1241-2000 B24,1which applies to analog-to-digital converters (ADCs). However, IEEE Std 1057 shall be used for waveform recorders, and IEEE Std 1241-2000 shall be used for ADCs. 1The numbers in brackets correspond to those of the bibliography in Annex H. 1 Copy
46、right 2008 IEEE. All rights reserved. IEEE Std 1057-2007 IEEE Standard for Digitizing Waveform Recorders 1.2 Purpose The main purpose of this standard is to ensure that manufactures and users of waveform recorders have a well-defined set of specifications and test methods so they can understand, des
47、cribe, and compare the performance of these recorders using a common language. 2. Normative references The following referenced documents are indispensable for the application of this standard. For dated references, only the edition cited applies. For undated references, the latest edition of the re
48、ferenced document (including any amendments or corrigenda) applies. IEEE Std 181-2003, IEEE Standard on Transitions, Pulses, and Related Waveforms. 3. Definitions, symbols, and acronyms For the purposes of this standard, the following terms and definitions apply. The Authoritative Dictionary of IEEE
49、 Standards Terms B23 shall be referenced for terms not defined in this clause. 3.1 Definitions 3.1.1 ac coupled: A recorder whose input circuitry does not pass dc. Such recorders use either a series capacitance or a transformer at the input. 3.1.2 aliasing: The phenomenon in sampled data systems whereby signal components at input frequencies greater than half the sampling frequency are converted to frequencies at less than half the sampling frequency in the output data record. 3.1.3 analog bandwidth (BW): Unless otherwise specif
