1、IEEE Guide for Performing Arc-Flash Hazard Calculations Amendment 2: Changes to Clause 4 IEEE Industry Applications Society Sponsored by the Petroleum and Chemical Industry Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 25 August 2011 IEEE Std 1584b-2011 (Amendment to IEEE Std 1584-2002) I
2、EEE Std 1584b-2011 (Amendment to IEEE Std 1584-2002) IEEE Guide for Performing Arc-Flash Hazard Calculations Amendment 2: Changes to Clause 4 Sponsor Petroleum and Chemical Industry Committee of the IEEE Industry Applications Society Approved 31 March 2011 IEEE-SA Standards Board Abstract: Technique
3、s for designers and facility operators to apply in determining the arc-flash hazard distance and the incident energy to which employees could be exposed during their work on or near electrical equipment are provided in IEEE Std 1584-2002 and IEEE Std 1584a-2004. Changes in Clause 4 (the analysis pro
4、cess), based on the experience of persons who have conducted many of these studies, are provided in this amendment. Keywords: arc fault currents, arc-flash hazard, arc-flash hazard analysis, arc-flash hazard marking, arc-flash protection boundary, arc in enclosures, arc in open air, bolted fault cur
5、rents, electrical hazard, IEEE 1584b, incident energy, personal protective equipment, protective device coordination study, short-circuit study, working distances The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2011 by the Institute o
6、f Electrical and Electronics Engineers, Inc. All rights reserved. Published 25 August 2011. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also b
7、e obtained through the Copyright Clearance Center. iv Copyright 2011 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1584b-2011, IEEE Guide for Performing Arc-Flash Hazard CalculationsAmendment 2: Changes to Clause 4. It is hoped that the changes to Clause 4 will he
8、lp improve the quality of the arc-flash studies being prepared for owners and other users by clarifying the wording to allow users to better understand the process. This amendment revises Clause 4 dealing with the process of performing an arc-flash hazard calculations study. The revisions are based
9、on the experiences of users of the guide with extensive experience in performing these studies since IEEE Std 1584-2002 was published in 2002. When the guide was written, there was little experience in performing these studies. Now the Working Group members have more experience applying the guide an
10、d can enable more accurate studies by others by incorporating their knowledge into the guide. Some of the existing wording in the guide has been found to be vague or open to interpretation. It is the intent of this amendment that the changes will improve the wording and make the standard easier to f
11、ollow. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or
12、referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made availab
13、le for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorit
14、ies and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of a
15、mendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended t
16、hrough the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development pr
17、ocess, visit the IEEE-SA web site at http:/standards.ieee.org. v Copyright 2011 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this
18、 URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent r
19、ights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity
20、or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validi
21、ty of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this guide was completed, the Arc-Flash Hazard Calculations Working Group had the following me
22、mbership: Craig M. Wellman, Chair L. Bruce McClung, Vice Chair Daleep C. Mohla, Secretary Kevin Lippert, Task Group Co-Leader T. David Mills, Task Group Co-Leader D. Edwin Scherry, Technical Editor Jean Y. Ayoub James Babcock Ilanchezhian Balasubramanian Louis Barrios Terry Becker Waylon Bowers Fred
23、erick C. Brockhurst Eric Campbell D. Ray Crow Kenneth Cybart Chet Davis Daniel Doan Paul Dobrowsky Mike Doherty Gary Donner Tom Fjerstad John Jennings Kenneth S. Jones Mike Lang Robert G. Lau Wei-Jen Lee Kevin Lippert Albert Marroquin John McAlhaney Ben McClung L. Bruce McClung David Mills James Mit
24、chem Aleen Mohammed Daleep C. Mohla John Morrow John Nelson Valeri Oganezoy Wheeler OHarrow Lowell Oriel David A. Pace Sergio A. Panetta Anthony Parsons Jim Phillips Melvin K. Sanders Vincent Saporita D. Edwin Scherry Robert Seitz P. K. Sen Peter Sutherland Marcelo Valdes Craig M. Wellman Matt Weste
25、rdale Kenneth P. White Shawn Worthington Alex Wu vi Copyright 2011 IEEE. All rights reserved. The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Michael Adams Steven Alexanderson Michael Anderson Ilanche
26、zhian Balasubramanian Robert Barnett Louis Barrios Michael Bayer Frederick C. Brockhurst Chris Brooks William Brumsickle Gustavo Brunello David Burns Keith Chow Kurt Clemente L. McClung Donald Colaberardino Jerry Corkran Robert Damron Alireza Daneshpooy Daniel Doan Paul Dobrowsky Gary Donner Randall
27、 Dotson Donald Dunn Carl Fredericks Manjinder Gill Randall Groves Steven Haacke Lee Herron Scott Hietpas Werner Hoelzl Richard Hulett Ben Johnson John Kay Gael Kennedy Yuri Khersonsky Jim Kulchisky Saumen Kundu Ed Larsen Wei-Jen Lee Duane Leschert Kevin Lippert William Lockley William McBride Wade M
28、idkiff James Mitchem Daleep Mohla Charles Morse Daniel Mulkey Paul Myers Daniel Neeser Dennis Neitzel Arthur Neubauer Michael S. Newman Wheeler OHarrow T. Olsen Mirko Palazzo Donald Parker David Parman Anthony Parsons Howard Penrose Iulian Profir Charles Rogers Tim Rohrer Vincent Saporita Bartien Sa
29、yogo D. Edwin Scherry Gil Shultz James Smith Jerry Smith Gary Stoedter Peter Sutherland Wayne Timm James Tomaseski Marcelo Valdes Arthur Varanelli John Webb Craig M. Wellman Kenneth P. White When the IEEE-SA Standards Board approved this guide on 31 March 2011, it had the following membership: Richa
30、rd H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Judith Gorman, Secretary Masayuki Ariyoshi William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olse
31、n Gary Robinson Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Phil Winston Howard L. Wolfman Don Wright *Member Emeritus Also included are the following non-voting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic
32、, NIST Representative Lisa Perry IEEE Standards Program Manager, Document Development Patricia A. Gerdon IEEE Standards Program Manager, Technical Program Development vii Copyright 2011 IEEE. All rights reserved. Contents 2. Normative rReferences2 4. Analysis process 2 4.1 Cautions and disclaimers .
33、2 4.2 Step 1: Collect the system and installation data.4 4.3 Step 2: Determine the system modes of operation.5 4.4 Step 3: Determine the bolted fault currents 6 4.5 Step 4: Determine the arc fault currents.6 4.6 Step 5: Find the overcurrent protective device characteristics and the duration of the a
34、rcs 6 4.7 Step 6: Document the system voltages and classes of equipment8 4.8 Step 7: Select the working distances8 4.9 Step 8: Determine the incident energy for all equipment.8 4.10 Step 9: Determine the flash-protection boundary for all equipment 9 Annex F (informative) Bibliography.10 1 Copyright
35、2011 IEEE. All rights reserved. IEEE Guide for Performing Arc-Flash Hazard Calculations Amendment 2: Changes to Clause 4 IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appro
36、priate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the headi
37、ng “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe editing instructions contained in this amendment define how to merge the material contained there
38、in into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make corrections in existing text or tables. The editing instruction
39、 specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If
40、so, renumbering instructions are given in the editing instruction. Replace is used to make changes in figures or equations by removing the existing figure or equation and replacing it with a new one. Editing instructions, change markings, and this NOTE will not be carried over into future editions b
41、ecause the changes will be incorporated into the base standard. The editing instructions contained in this amendment define how to merge the material contained therein into the existing base standard and its amendments to form the comprehensive standard. IEEE Std 1584b-2011 IEEE Guide for Performing
42、 Arc-Flash Hazard CalculationsAmendment 2: Changes to Clause 4 2 Copyright 2011 IEEE. All rights reserved. 2. Normative rReferences Change the Clause 2 title as shown above. Delete the following reference: IEEE Std 141-1993, IEEE Recommended Practice for Electric Power Distribution for Industrial Pl
43、ants (IEEE Red Book) Insert the following reference alphabetically as it should appear in Clause 2: IEEE Std 551-2006, IEEE Recommended Practice for Calculating Short-Circuit Currents in Industrial and Commercial Power Systems (IEEE Violet Book) 4. Analysis process Change Clause 4 as follows: An arc
44、-flash hazard analysis should be performed in association with or as a continuation of the short-circuit study and protective-device coordination study. The process and methodology of calculating short-circuit currents and performing protective-device coordination is covered in IEEE Std 551-2006 (IE
45、EE Violet Book)141-1993 (IEEE Red Book) and IEEE Std 242-2001 (IEEE Buff Book), respectively. Although it is possible to perform a short-circuit study manually, using the rationale presented in these references, electrical system analysis software may be used to simplify the calculations for complex
46、 distribution systems. Programs provide for much more of the necessary information and may be accurate as long as network details are specifically modeled. They usually improve calculation accuracy, consistency of results, and facilitate the simulation of multiple configuration iterations. Results o
47、f the short-circuit study enable calculation of the arc-flash currents at potential fault points and in overcurrent protective devices. are used to determine the fault current momentary duty, interrupting rating, and short-circuit (withstand) rating of electrical equipment. Results of the protective
48、-device coordination study are used to determine the time required for electrical circuit protective devices to isolate overload or short-circuit conditions. Results of both short-circuit and protective-device coordination studies provide information needed to perform an arc-flash hazard analysis. R
49、esults of the arc-flash hazard analysis calculation are used to identify the arc-flash flash-protection boundary and the arc-flash incident energy at defined assigned working distances at the location specified in the electrical power system. throughout any position or level in the overall electrical generation, transmission, distribution, or utilization system. 4.1 Cautions and disclaimers As an IEEE guide, this document suggests approaches for conducting an arc-flash hazard analysis but does not have mandatory requirements. Following the suggestions in t
