1、Recognized as an SM 393-1991 American National Standard (ANSI) (Redon of JEEE Std 3931977) IEEE Standard for Test Procedures for Magnetic Cores IEEE Power Electronics Society Sponsored by the Electronics Transformer Technical Committee Published by the Institute of Electrical and Electronics Enginee
2、rs, Inc., 345 East 47th Street, New York, Ny 1w1z U=. March 10, 1992 SH14514 Recognized as anAmerican National Standard (ANSI)IEEE Std 393-1991(R2007)(Revision of IEEE Std 393-1977)IEEE Standard for Test Procedures forMagnetic CoresSponsorElectronics Transformer Technical Committeeof the IEEE Power
3、Electronics SocietyReaffirmed 26 September 2007Approved 27 June 1991IEEE-SA Standards BoardApproved December 9, 1991American National Standards InstituteAbstract: Test methods useful in the design, analysis, and operation of magnetic cores in many types of applications are presented. Tests for speci
4、fying and/or measuring permeability, core loss, apparent core loss, induction, hysteresis, thermal characteristics, and other properties are given. Most of the test methods described include specific parameter ranges, instrument accuracies, core sizes, etc., and may be used in the specification of m
5、agnetic cores for industrial and military applications. More generalized test procedures are included for the benefit of the R equivalent CGS and English units are included in some definitions. Whenever possible, all definitions and symbols are in accordance with those of the International Electrote
6、chnical Commission (IEC). The revision of this standard was prepared by the Working Group on Magnetic Cores-Test Codes Subcommittee of the Electronics Transformer Technical Committee of the IEEE Power Electronics Society. John Silgailis, Chair J. S. Andresen R. P. Carey Charles J. Elliott Herman Fic
7、kenscher P. K. Goethe Harold E. Lee Robert L. Sell John Tardy - The following persons were on the balloting committee that approved this standard for submission to the IEEE Standards Board: E. D. Belanger R. P. Carey Charles J. Elliott Herman Fickenscher R. Fisher Rolf Frantz P. K. Goethe Nathan Gro
8、ssner 0. Kiltie L. Kirkwood Harold E. Lee Rueben Lee H. W. Lord William Lucarcz R. G. Noah David N. Ratliff Robert L. Sell John Silgailis John Tardy Ray Taylor Bruce Thackwray H. Tillinger R. G. Wolpert R. M. Wozniak When the IEEE Standards Board approved this standard on June 27,1991, it had the fo
9、llowing membership: Marco W. Migliaro, Chair Donald C. Loughry, Vice Chair Andrew G. Salem, Secretary Dennis Bodson Paul L. Borrill Clyde Camp James M. Daly Donald C. Fleckenstein Jay Forster; David F. Franklin Ingrid Fromm Thomas L. Hannan Donald N. Heirman Kenneth D. Hendrix John W. Horch Ben C. J
10、ohnson Ivor N. Knight Joseph Koepfinger* Irving Kolodny Michael A. Lawler *Member Emeritus Kristin M. Dittmann IEEE Standards Department Project Editor John E. May, Jr. Lawrence V. McCall T. Don Michael* Stig L. Nilsson John L. Rankine Ronald H. Reimer Gary S. Robinson Terrance R. Whittemore SECTION
11、 PAGE 1 . Scope . 9 Specific Types of Magnetic Cores to Which this Standard Applies 9 Specific Applications to Which this Standard Is Directed 9 References and Related Standards . 9 1.3.1 References 9 1.3.2 General Related Standards . 9 1.1 1.2 1.3 2 . Definitions . 10 3 . Configurations 10 Basic Co
12、re Shapes 11 Epstein Strip Core 11 3.1 3.2 3.3 Effect of the Configuration or Geometry of the Core Material on Finished Product 10 4 . Materials . 11 4.1 Ferromagnetic . 11 4.2 Ferrites 11 5 . Symbols and Terms 12 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 Effective Parameters 12 Permea
13、bility 12 5.2.1 Initial Permeability 12 5.2.2 Amplitude Permeability . 12 5.2.3 Maximum Permeability . 12 5.2.4 Incremental Permeability . 13 5.2.5 Pulse Permeability . 13 5.2.6 Complex Permeability . 13 5.2.7 Differential Permeability . 13 5.2.8 Impedance Permeability . 13 5.2.9 Peak Permeability 1
14、3 Core Loss 13 5.3.1 Specific Core Loss . 13 Apparent Core Loss 13 5.4.1 Specific Apparent Core Loss . 14 Equivalent Series Circuit Elements . 14 Equivalent Parallel Circuit Elements 14 Loss Angle (Dissipation Factor) . 14 5.7.1 Relative Dissipation Factor . 14 5.7.2 Quality Factor, Q 14 Leggs Equat
15、ion Parameters . 14 Saturation Induction, B, . 15 5.9.1 Peak Induction, B, . 15 Residual Induction, B, 15 5.10.1 Remanent Induction . 15 5.10.2 Squareness Ratio . 15 Coercive Field or Force, H, . 15 HI and H2 Reset Field Strengths . 15 5.12.1 AH . 15 5.12.2 Reset Gain, G 15 Temperature Coefficient 1
16、5 SECTION PAGE . 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 Temperature Factor of Permeability 15 Curie Temperature or Curie Point. T. . 15 Disaccommodation 15 5.16.1 Disaccommodation Factor . 16 Magnetic Aging 16 Turns Factor . 16 Induction Factor. AL . 16 Volt-Second.Area . 16 Hysteresis Constant. q6
17、 16 5.21.1 Hysteresis Core Constant. qi 16 6 . Test Methods . 17 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 Permeability Measurements . 17 Reference Pulse Shape . 17 Pulse Magnetization Characteristics 18 Tests for Evaluating Cores With Pulsed Excitation . 17 6.2.1 6.2.2 6.2.3 Pulse Permeability . 24 6.2.4
18、 Tests for Computer-Type Cores Used in Switching and Memory Applications . 24 Bridge Measurements . 29 6.3.1 Series Bridge, Low Impedance 30 6.3.2 Series Bridge (Low Q 30 6.3.3 Parallel Bridge (High Q) 31 6.3.4 Parallel Bridge (Low Q) . 31 Core Loss and Apparent Core Loss . 31 6.4.1 Core-Loss Measur
19、ements With SinusoidaWoltage Excitation 31 6.4.2 Core-Loss Measurements in Core Excited by Nonsinusoidal Signals . 31 Saturing Core Tests 36 6.5.1 Constant-Current Flux-Reset (CCFR) Core Test Method . 36 6.5.2 Sine-Current-Excitation Core Test Method 39 6.5.3 Methods to Obtain Hysteresis Loops and M
20、agnetization Curves . 44 6.6.1 General Considerations . 44 Direct Measurement of Flux Density 48 6.7.1 Hall-Effect Gaussmeter 48 Dynamic Hysteresis Loop Measurement . 49 6.8.1 Oscilloscope Techniques . 49 Voltmeter-hmeter Methods . 50 6.9.1 Impedance Permeability . 50 6.9.2 Sine-Flux Test 50 6.9.3 S
21、ine-Current Test . 52 6.9.4 Calculation of Mean Path Length . 53 6.9.5 Calculation of Flux-Path Cross-Sectional Area . 53 6.9.6 Standard Test Conditions 53 6.9.7 Calculations of Induced Voltage 53 6.9.8 Test Procedure 53 Presenting Magnetic Data on Core Materials . 44 7 . Bibliography . 53 . . . FIG
22、URES Fig 1 Fig 2 Fig 3 Fig 4 Fig 5 Fig 6 Fig 7 Fig 8 Fig 9 Fig 10 Fig 11 Fig 13 Fig 14 Fig 15 Fig 16 Fig 17 . Fig 12 Fig 18 Fig 19 Fig 20 Fig 21 PAGE Reference Pulse Shape 18 Pulse Magnetization Characteristic . 19 Test Circuit A . 20 Test Circuit B .!U Pulse Magnetization Characteristics on Major a
23、nd Minor Loops .!U Pulse Magnetization Characteristics With Reset !U Pulse Magnetization Characteristics With and Without Bias . 22 Core Pulse Magnetization Characteristic . 23 Pulse Permeability Test Circuit . 24 Read Response Pulses . a6 Typical Test Circuit . !27 Bridge Circuits .3 2-33 Block Dia
24、gram of Wattmeter 35 Test Points for the Constant-Current Flux-Reset Core Test Method 36 Circuit for the Constant-Current Flux-Reset Core Test Method . 36 Basic Circuit for Sine-Current Excitation Core Tester . 40 Oscilloscope Presentation of E-I Loop of Test Core, Showing Calibrating and Measuring
25、Marker Traces . 43 Elementary DC Hysteresis Loop Tester . 46 Simplified Hysteresigraph . 47 Sine-Flux Impedance Permeability Test . 51 Sine-Current Impedance Permeability Test . 52 APPENDIX Methods to Obtain Hysteresis Loops and Magnetization Curves With Older Equipment . 56 A1 . Determination of th
26、e Basic Symmetrical Hysteresis Loop 56 A2 . Determination of the Normal Magnetization Characteristic . 58 A3 . Determination of the Virgin Magnetization Curve 58 r APPENDIX FIGURES Fig Al Fig A2 Hysteresis Loop Test Circuit 56 Hysteresis Loop 57 IEEE Standard for Test Procedures for Magnetic Cores T
27、his standard specifies applicable tests to describe the significant properties of magnetic cores used in electronic applications. It is primarily concerned with magnetic cores of the type used in electronics transformers, magnetic amplifiers, inductors, and related devices. However, many of the test
28、s specified herein are general in scope and adaptable to magnetic cores used in many other applica- tions. Standards covered by this publication include tests for specifying or measuring, or both, permeability, core loss, apparent core loss, induction, hysteresis, thermal character- istics, and othe
29、r properties of all commonly used types of magnetic cores. - 1.1 Specific Types of Magnetic Cores to Which this standard Applies (1) Wound strip cores (2) Die-stamped laminated cores (3) Cores using laminations formed by chemical milling or photoetching tech- niques (4) Pressed or molded cores 1.2 S
30、pecific Applications to Which this Standard Is Directed 1.2.1 Linear applications as in power supply transformers, audio transformers, control system transformers, many pulse transform- ers, capacitor reversing inductors, instrument transformers, etc. 1.2.2 Nonlinear or saturating applications, incl
31、uding magnetic amplifiers, saturable in- 1.3 References and Related Standards 1.3.1 References. The following publica- tions shall be used in conjunction with this standard: ll ANSVASTM A-343-82 (861, Test Method for Alternating Current Magnetic Properties of Materials at Power Frequencies Using the
32、 Wattmeter-Ammeter-Voltmeter Method and 250 cm Epstein Test Frame. 2 IEEE Std 100-1988, IEEE Standard Dictionary of Electrical and Electronics Terms-4th ed.2 31 IEEE Std 390-1987, IEEE Standard for Pulse Transformers (ANSI). 141 Hamburg, D. R. and L. E. Unnewehr, “An electronic wattmeter for nonsinu
33、soidal low power factor power measurements,” IEEE Transactions on Magnetics, vol. MAG-7, no. 3, pp. 438-442, Sept. 1971. 51 Toppetto, A. A. and D. A. Henry, “Pulse In- ductance-Problems and Peculiarities.” Elec- tronic Components Conference, 1972. 1.3.2 General Related Standards. The fol- lowing sta
34、ndards may be consulted for addi- tional guidance: ANSIJASTM A-34-83 (88)el, Practice for Magnetic Materials. ductors, ferroresonant devices, current rise delay inductors, and saturating inductors. 1.2.3 Specific applications not covered by this publication: magnetic cores for power distribution ind
35、ustry; cores for microwave aP- - ASTM publications are available from the Customer Service Department, American Society for Testing and Materials, 1916 Race Street, Philadelphia, PA 19103, USA. zIEEE publications are available fmm the Institute of Electrical and Electronics Engineers, Service Center
36、, 445 H Lane, p.0. BOX 1331, Piscataway, NJ 08855-1331, plications. USA. 9 IEEE std 3931991 JEEE STANDARD FOR TEST PROCEDURES ANSVASTM A-340-90, Definition of Terms- IEC 367-2A (19761, Cores for inductors and Terms, Symbols, and Conversion Factors Re- transformers for telecommunications. Part 2: lat
37、ing to Magnetic Testing. Guides for the drafting of performance - - specifications. First supplement. ANSI/ASTM A-346-74 (881, Test Method for Alternating-Current Mabetic Performance IEC 723-1 (1 982), Inductor and transformer of Laminated Core Specimens Using the cores for telecommunications. Part
38、1: Generic Modified Hay Bridge Method. specification. Alternating-Current Magnetic Properties of Materials Using the Modified Hay Bridge Method with 25-cm Epstein Frame. ANSVASTM A-348-84, Test Method for ANSIIMTM A-347-85 (9112 Test Method for IEEE Std 111-1984, IEEE Standard for Wide- Band Transfo
39、rmers (ANSI). IEEE Std 295-1969 (Reaff 19811, IEEE Standard for Electronics Power Transformers. IEEE Std 306-1969 (Reaff 19811, Test Ptocedures for Charging Inductors.4 Alternating-Current Magnetic Properties of Materials Using the Wattmeter-Ammeter- Voltmeter Method, 100 to 10,000 Hz and 25-cm IEEE
40、 Std 390-1987, IEEE Standard for Pulse Transformers Epstein Frame. ANSIIASTM A-598-69 (19831, Test Method for Magnetic Properties of Magnetic Amplifier Cores. ANSIIASTM A-698-74 (85)el, Test Method for Magnetic Shield Efficiency in Attenuating Alternating Magnetic Fields. ANSI/ASTM A-712-75 (91), Te
41、st Method for Electrical Resistivity of Soft Magnetic Alloys. ASTM A-717-81 (88)el, Test Method for Surface Insulation Resistivity of Single-Strip Specimens. 2. Demtions - Electrical and magnetic terms used in this standard are in accordance with those given in IEEE Std 100-1988, IEEE Standard Dicti
42、onary of Electrical and Electronics Terms 216 Certain parameters of particular significance in the application and evaluation of magnetic cores as well as certain terms not included in IEEE Std 100-1988 are further discussed in Section 5, Symbols and Terms, of ANSIIASTM A-718-75 (91), Test Method fo
43、r this standard. Surface Insulation Resisitivity of Multi-Strip Specimens. 3. Configurations 3.1 Effect of the Configuration or Geometry of ASTM A-772-89, Test Method for A-C Magnetic Permeability of Materials Using Sine Current. ASTM A-811-90, specification for soft the Core Material on the Finishe
44、d Product. Magnetic Iron Fabricated by Powder The configuration or geometry of the core ma- Metallurgy Techniques. terial has a decided effect on the magnetic properties of the finished product. For exam- IEC 367-1 (1982), Cores for inductors and transformers for telecommunications. Part 1 : Measuri
45、ng method. 41EEE Std 306-1969 has been withdrawn; however, copies can be obtained from the LEEE Standards Department, IEEE Service Center, 445 Hoes Lane, P.O. BOX 1331, Piscataway, NJ 08855-1331, USA. KThe numbers in brackets correspond to those of the references in 1.3.1; when preceded by B, they c
46、orrespond to those of the bibliography in Section 7. 31EC publications are available from IEC Sales Department, Case Postale 131,3 rue de Varemb6, CH 1211, Gentwe 20, SwitzerlandlSuisse. IEC publications are also available in the United States from the American National Standards Institute. - 10 FOR
47、 MAGNETIC CORES ple, one finds distinct differences in core loss and permeability measurements, when a core specimen is tested as strips in an Epstein frame, as a toroidal wound core, or as an E1 assembly of punched laminations. It is impor- tant, therefore, that a specified magnetic pa- rameter ref
48、er to the specific configuration on which the test measurement is to be made. h IEEE std 393-1991 3.2 Basic Core Shapes. For reference, the fol- lowing are recognized as the basic core shapes in which tests are performed: Toroid. Stack of ring stampings (no ef- fective gap); spiral wound strip (very
49、 small effective gap); pressed or molded (toroids, beads, tubes). Cut Strip-Wound (C and E cores). Cores assembled from die cut or chemi- cally etched sheet materials (stamped laminations) such as DE, DU, EE, EI, FF, LL, UI, UT, W. These have varying effective air gaps depending upon size, shape, lamination-thickness, and as- sembly technique. Pressed and molded parts, such as cup, rod, bar, slug, sleeve, strip, or assem- blies of parts such as pot cores, cross cores, half cross, H core, EE, EV, UI, RM. 3.3 Epstein Strip Core. Epstein strip core is used in a specified coil assem
