1、 IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices Sponsored by the Waveform Generation, Measurement, and Analysis Technical Committee (TC-10) IEEE 3 Park Avenue New York, NY 10016-5997 USA 10 February 2012 IEEE Instrumentation and Measurement SocietyIEEE Std 1658
2、-2011IEEE Std 1658-2011 IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices Sponsor Waveform Generation, Measurement, and Analysis Technical Committee (TC-10) of the IEEE Instrumentation and Measurement Society Approved 31 October 2011 IEEE-SA Standards Board Approv
3、ed 10 December 2012 American National Standards Institute Abstract: Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover syste
4、ms encompassing DACs. Keywords: DAC, digital-to-analog converter, IEEE 1658, SFDR, SNR, spectrum, test terminology, test methods The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2012 by the Institute of Electrical and Electronics Engin
5、eers, Inc. All rights reserved. Published 10 February 2012. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright
6、 Clearance Center. Introduction This introduction is not part of IEEE Std 1658-2011, IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices. This standard defines the terms, definitions, and test methods used to specify, characterize, and test digital-to-analog convert
7、ers (DACs). It is intended for the following: Individuals and organizations who specify DACs to be purchased Individuals and organizations who purchase DACs to be applied in their products Individuals and organizations whose responsibility is to characterize and write reports on DACs available for u
8、se in specific applications Suppliers interested in providing high-quality and high-performance DACs to acquirers This standard is designed to help organizations and individuals: Incorporate quality considerations during the definition, evaluation, selection, and acceptance of supplier DACs for oper
9、ational use in their equipment Determine how supplier DACs should be evaluated, tested, and accepted for delivery to end users This standard is intended to satisfy the following objectives: Promote consistency within organizations in acquiring third-party DACs from component suppliers Provide useful
10、 practices on including quality considerations during acquisition planning Provide useful practices on evaluating and qualifying supplier capabilities to meet user requirements Provide useful practices on evaluating and qualifying supplier DACs Assist individuals and organizations judging the qualit
11、y and suitability of supplier DACs for referral to end users Several standards have previously been written that address the testing of DACs either directly or indirectly. These include the following: IEEE Std 1057, which describes the testing of waveform recorders. IEEE Std 1241, which addresses th
12、e testing of Analog-to-Digital Converters. IEEE Std 746, which addresses the testing of Analog-to-Digital and Digital-to-Analog Converters, used for PCM television video signal processing. JEDEC Standard 99, addendum number 1, which deals with the terms and definitions used to describe Analog-to-Dig
13、ital and Digital-to-Analog Converters. This standard does not include test methods. IEC 60748-4 Semiconductor DevicesIntegrated CircuitsPart 4: Interface integrated circuitsSec. 2: Blank detail specification for linear analogue-to-digital converters. IEEE Std 1658 for digital-to-analog converters is
14、 intended to focus specifically on terms and definitions as well as test methods for DACs for a wide range of applications. Copyright 2012 IEEE. All rights reserved. ivNotice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with th
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21、he following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/findstds/interps/index.html. Patents Attention is called to th
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25、 2012 IEEE. All rights reserved. vCopyright 2012 IEEE. All rights reserved. viParticipants At the time this IEEE standard was completed, the Working Group for Digital-to-Analog Converters had the following membership: Steven J. Tilden, Chair Solomon Max, Vice Chair and Secretary Jerry Blair, Editor
26、Pasquale Daponte, Past Editor Francisco Alegria Eulalia Balestrieri David Bergman Niclas Bjorsell Bill Boyer John C. Calvin Paolo Carbone Dominique Dallet Luca De Vito Donald Greer Richard Liggiero Tom Linnenbrink (Chair, TC-10) Sergio Rapuano Daniel Rosenthal Fang Xu The following additional people
27、 contributed to this standard: Robert Graham Vladimir Haasz Linus Michaeli Milos Sedlacek David Slepicka The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Martin J. Bishop Niclas Bjorsell Jerry Blair
28、 Bill Boyer William Byrd Pasquale Daponte Sourav Dutta Ron Greenthaler Donald Greer Randall Groves Werner Hoelzl Piotr Karocki Jim Kulchisky Geoff Ladwig Thomas Linnenbrink Greg Luri Solomon Max Edward Mccall Michael S. Newman Sergio Rapuano Robert Robinson Bartien Sayogo Gil Shultz Roger Sowada Jos
29、eph Stanco Walter Struppler Steven Tilden John Vergis Stephen Webb Fang Xu When the IEEE-SA Standards Board approved this standard on 31 October 2011, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Judith Gorman, Secretary Masayuki Ariyos
30、hi William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alex Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Rosdahl Sam Sciacca Mike Seavey Curtis Siller Phil Winston Howard Wolfman Don Wright * Member Emeri
31、tus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Project Editor Erin Spiewak IEEE Standards Program Manager, Technical Program
32、DevelopmentCopyright 2012 IEEE. All rights reserved. viiContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 Discussion of scope and purpose. 2 1.4 Digital-to-analog converter and analog-to-digital converter differences and similarities 2 1.5 Digital-to-analog converter background 4 1.6 Guidance t
33、o the user 11 1.7 Manufacturer supplied information . 15 2. Normative references 17 3. Definitions, symbols, acronyms, and abbreviations . 18 3.1 Definitions . 18 3.2 Symbols . 26 3.3 Acronyms and abbreviations . 29 4. Test methods. 30 4.1 General comments on test methods . 30 4.2 Test setup. 30 4.3
34、 Static testing 31 4.4 Dynamic testing. 32 4.5 Taking a record of data 34 5. Fitting sine waves. 34 5.1 Curve fitting test method . 34 5.2 Choice of frequencies and record length . 35 5.3 Fine-scale frequency selection. 35 5.4 Medium-scale frequency selection 36 5.5 Coarse-scale frequency selection.
35、 36 5.6 Selecting signal amplitudes . 37 6. Digital input 37 6.1 Coding . 37 6.2 Clock and data feedthrough. 37 6.2.1 Clock and data feedthrough test method. 38 6.3 Static input parameters 39 6.4 Timing parameters. 39 7. Analog inputs . 39 8. Analog output (single-ended and differential) 40 8.1 Outp
36、ut impedance 41 8.2 Short-circuit current. 42 8.3 Compliance voltage for current-output DACs. 42 8.4 Load current for voltage-output DACs 42 8.5 Maximum usable dynamic range. 43 9. Gain and offset (static and dynamic) 43 9.1 Static gain and offset (independently based) . 43 9.2 Static gain and offse
37、t (terminally based) . 45 9.3 Dynamic gain and offset 45 10. Linearity (static and dynamic) 46 Copyright 2012 IEEE. All rights reserved. viii10.1 Integral nonlinearity 46 10.2 Differential nonlinearity 46 10.3 Monotonicity . 47 10.4 Spurious free dynamic range (SFDR) 47 11. Noise. 50 11.1 Signal-to-
38、noise and distortion ratio 51 11.2 Signal-to-noise ratio 55 11.3 1/f Noise. 56 11.4 Effective number of bits 57 11.5 Noise power ratio. 59 12. Harmonic and spurious distortion. 59 12.1 Total harmonic distortion 59 12.2 Intermodulation distortion . 61 12.3 Glitches 61 13. Step response parameters 64
39、13.1 General comments on step response parameters 64 13.2 Test method for acquiring an estimate of the step response 64 13.3 Slew rate limit 65 13.4 Settling time parameters 65 13.5 Transition duration 68 13.6 Overshoot and precursors 69 14. Interference-related DAC parameters. 70 14.1 Multitone pow
40、er ratio 70 14.2 Comments 71 14.3 Crosstalk (channel separation, channel isolation) 71 14.4 Channel matching 73 14.5 Channel skew. 74 15. Frequency response parameters 75 15.1 General comments on frequency response parameters 75 15.2 Reference input bandwidth 75 15.3 Digital-to-analog-conversion fre
41、quency response . 76 16. Differential gain and phase. 82 16.1 Differential gain and phase test method. 82 17. Power supply parameters 83 17.1 Power supply currents 83 17.2 Power supply voltage effects . 83 17.3 Ground currents . 85 Annex A (informative) DAC architectures. 87 A.1 Binary weighted 87 A
42、.2 Resistor string . 89 A.3 Segmented 89 A.4 R-2R 90 A.5 Delta-Sigma 91 A.6 PWM DAC . 92 A.7 Multiple DAC architecture . 93 Annex B (informative) Sine-wave fitting algorithms . 94 Copyright 2012 IEEE. All rights reserved. ixB.1 An algorithm for three-parameter (known frequency) least-squares fit to
43、sine wave data using matrix operations 94 B.2 An algorithm for four-parameter (general use) least-squares fit to sine-wave data using matrix operations 96 B.3 Comment on three-parameter versus four-parameter sine fit 98 Annex C (informative) Discrete Fourier transforms and windowing. 99 C.1 Discrete
44、 Fourier transforms and windowing. 99 C.2 Windowed DFT 101 C.3 Spectral averaging. 101 C.4 Spectral leakage 101 C.5 Coherent sampling, sine fitting, and other means of dealing with spectral leakage 103 C.6 Useful windows and their characteristics 103 C.7 Choosing a window. 104 Annex D (informative)
45、Software considerations 105 D.1 Motivation 105 D.2 Test of software to fit waveforms . 105 D.3 Test of discrete Fourier transform software 105 Annex E (informative) Base-Band Reconstruction process . 106 E.1 Motivation. 106 E.2 Data generation . 106 Annex F (informative) Bibliography 112 Copyright 2
46、012 IEEE. All rights reserved. xIEEE Standard for Terminology and Test Methods for Digital-to-Analog Converter Devices IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropr
47、iate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading
48、 “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview This standard is divided into eighteen clauses plus annexes. Clause 1 is a basic orientation. F
49、or further investigation, users of this standard can consult Clause 2, which contains references to other IEEE standards on waveform measurement and relevant International Standardization Organization (ISO) documents. The definitions of technical terms and symbols used in this standard are presented in Clause 3. Clause 4 through Clause 17 present a wide range of tests that measure the performance of a digital-to-analog converter. Annexes, containing the bibliography and informative comments on the tests presented in Clause 4 through
