ANSI IEEE C63.4A-2017 American National Standard for Methods of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to .pdf

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1、American National Standard for Methods of Measurement of Radio- Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz Amendment 1: Test Site Validation Accredited by the American National Standards Institute IEEE 3 Park Avenue New York, NY 10016-5997 US

2、A Accredited Standards Committee C63 Electromagnetic Compatibility ANSI C63.4a-2017 (Amendment to ANSI C63.4-2014) C63ANSI C63.4a-2017 (Amendment to ANSI C63.4-2014) American National Standard for Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in

3、 the Range of 9 kHz to 40 GHz Amendment 1: Test Site Validation Accredited Standards Committee C63Electromagnetic Compatibility Accredited by the American National Standards Institute Secretariat Institute of Electrical and Electronics Engineers, Inc. Approved 15 September 2017 American National Sta

4、ndards Institute ii Copyright 2017 IEEE. All rights reserved. Abstract: U.S. consensus standard methods are specified in Annex D of this amendment for validating standard test sites and alternative test sites used for measurement of radiated radio-frequency (RF) signals and noise emitted from electr

5、ical and electronic devices in the frequency range of 30 MHz to 1 GHz. In addition, various updates are made to equations in 4.5, Annex F, Annex G, and Annex N. Keywords: Annex D, ANSI C63.4, normalized site attenuation, NSA, site attenuation, site validation The Institute of Electrical and Electron

6、ics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 October 2017. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent (978) 750-8400. Per

7、mission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Errata Users are encouraged to check the IEEE Errata URL (http:/standards.ieee.org/findstds/errata/index.html), and the one for ASC C63(http:/www.c63.or

8、g/explanations_interpretations_request.htm), for errata periodically. Interpretations (ASC C63standards) Current interpretations are essential to the understanding of all ASC C63standards. To assist in the meanings of requirements, informative interpretations are available at the following URL: (htt

9、p:/www.c63.org/standards_development.htm). Users are cautioned that, although interpretations do not and can not change the requirements of a standard, they serve to clarify the meanings of requirements. All interpretations are informative rather than normative, until such time as the standard is re

10、vised (consistent with ASC C63ANSI-accredited operating procedures) to incorporate the interpretation as a normative requirement. Patents NOTEThe users attention is called to the possibility that compliance with this standard may require use of an invention covered by patent rights. By publication o

11、f this standard, no position is taken with respect to the validity of any such claim(s) or of any patent rights in connection therewith. If a patent holder has filed a statement of willingness to grant a license under these rights on reasonable and nondiscriminatory terms and conditions to applicant

12、s desiring to obtain such a license, then details may be obtained from the standards developer (http:/www.c63.org/documents/misc/patents). iv Copyright 2017 IEEE. All rights reserved. Important Notices and Disclaimers Concerning IEEE Standards Documents IEEE documents are made available for use subj

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42、lore at http:/ieeexplore.ieee.org/ or contact IEEE at the address listed previously. For more information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Webs

43、ite at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publicatio

44、n of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Webs

45、ite at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any

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47、egal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determina

48、tion of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vii Copyright 2017 IEEE. All rights reserved. Participants At the time this standard was published, A

49、ccredited Standards Committee C63Electromagnetic Compatibility had the following membership: Daniel Hoolihan, Chair Dan Sigouin, Vice Chair Jerry Ramie, Secretary Sue Vogel, Secretariat Organization Represented Name of Representative American Council of Independent Laboratories (ACIL) . Richard Reitz American Radio Relay League (ARRL) Edward F. Hare . Kermit Carlson (Alt.) Apple, Inc. . Jyun-cheng Chen Michael ODwyer (Alt.) Bay Area Compliance Laboratories Corp. . Harry H. Hodes . Lisa Tang (Alt.) Bureau Veritas . Jonathan Stewart . Yunus Faziloglu (Alt.)

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