1、American National StandardDeveloped byfor Information Technology Card Durability Test MethodsANSI INCITS 322-2008ANSIINCITS322-2008Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-
2、,-Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-ANSIINCITS 322-2008Revision ofANSI INCITS 322-2002American National Standardfor Information Technology Card Durability Test Met
3、hodsSecretariatInformation Technology Industry CouncilApproved July 30, 2008 American National Standards Institute, Inc.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Approval
4、of an American National Standard requires review by ANSI that therequirements for due process, consensus, and other criteria for approval havebeen met by the standards developer.Consensus is established when, in the judgement of the ANSI Board ofStandards Review, substantial agreement has been reach
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8、should beaddressed to the secretariat or sponsor whose name appears on the titlepage of this standard.CAUTION NOTICE: This American National Standard may be revised orwithdrawn at any time. The procedures of the American National StandardsInstitute require that action be taken periodically to reaffi
9、rm, revise, orwithdraw this standard. Purchasers of American National Standards mayreceive current information on all standards by calling or writing the AmericanNational Standards Institute.American National StandardPublished byAmerican National Standards Institute, Inc.25 West 43rd Street, New Yor
10、k, NY 10036Copyright 2008 by Information Technology Industry Council (ITI)All rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwise,without prior written permission of ITI, 1250 Eye Street NW, Washington, DC 20005. Printed in the Uni
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12、ywhich, if any, patents may apply to this standard. As of the date of publication of this standardand following calls for the identification of patents that may be required for the implementation ofthe standard, no such claims have been made. No further patent search is conducted by the de-veloper o
13、r publisher in respect to any standard it processes. No representation is made or impliedthat licenses are not required to avoid infringement in the use of this standard.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networkin
14、g permitted without license from IHS-,-,-iContentsPageForeword .iv1 Scope . 12 Normative References 13 Default Test Environment and Conditioning . 24 Definitions. 35 Test Methods 45.1 Peel Strength - 180 peel angle 45.2 Peel Strength - 90 peel angle 75.3 Adhesion Crosshatch Tape Test 105.4 ID-1 Card
15、 Flexure . 135.5 ID-1 Card Static Stress. 165.6 ID-1 Card Stress and Plasticizer Exposure 195.7 Impact Resistance 215.8 Elevated Temperature and Humidity Exposure . 245.9 Surface Abrasion . 255.10 Bar Code Abrasion (1D) . 275.11 Magnetic Stripe Abrasion . 295.12 Image Abrasion . 315.13 Temperature-
16、and Humidity-Induced Dye Migration. 335.14 Plasticizer Induced Dye Migration 365.15 Ultraviolet (UV) Light Exposure 385.16 Daylight Exposure Image Stability - Xenon Arc 395.17 Laundry Test. 415.18 Embossed Character Retention - Pressure 425.19 Embossed Character Retention - Heat. 455.20 Corner Impac
17、t Test. 475.21 Wet Abrasion Test 495.22 IC Card with Contacts Micromodule Adhesion . 505.23 Water Soak Test. 525.24 Linear Dimensional Change at Elevated Temperature. 535.25 Three Roller IC Card Test 555.26 Hole Tear Test 57Copyright American National Standards Institute Provided by IHS under licens
18、e with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-iiPage6 Test Sequences . 596.1 Card Structure Integrity Test Sequence . 596.2 Card Flexure and Peel Strength Sequence 606.3 Elevated Temperature/Humidity and Peel Strength Sequence 616.4 Wet Abrasion and P
19、eel Strength Sequence. 626.5 Card Flexure, Wet Abrasion and Peel Strength Sequence 636.6 Ultraviolet Light Exposure and Corner Impact Sequence. 64AnnexA Bibliography 65Tables1 Rating Diagrams. 122 Full flex dimensions 13Figures1 Card preparation . 52 Card preparation (Alternative) 53 Card preparatio
20、n for peel test. 64 Card mounted in tensile tester . 65 Examples of peel strength chart recordings . 66 Card mounted in tensile tester . 97 Tape peel angle 108 Full flex condition 139 Cross section - calibration plate . 1310 Jaw details . 1311 Calibration plate inside jaws. 1312 Card orientation 141
21、3 Stress fixture - Axis A . 1614 Stress fixture - Axis B . 1615 Card impact fixture . 1816 Impact Test Data Point example 2217 Impact apparatus 2318 Test card notch location . 2619 1D Bar code test location (abrasion) 2820 Mag stripe read area and hole location 3021 Image test location . 3222 Temp/h
22、umidity dye migration test pattern 34Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-iiiPage23 Bar code print location 3724 Guage collar . 4225 Embossed character height guage .
23、 4326 Embossed character test locations. 4327 Card corner impact fixture 4828 Paint shaker 4929 Micromodule adhesion fixture. 5130 Three roller arrangement 5531 Hook diagram . 5732 Card mounted for hole tear. 58Copyright American National Standards Institute Provided by IHS under license with ANSI N
24、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ivForeword (This foreword is not part of American National Standard ANSI INCITS 322-2008.)This standard provides an agreed upon set of test methods that contain specific pro-cedures to be followed. The acceptance or re
25、jection criteria of identification cards,based on test results from these durability test methods, are not within the scope ofwork of this standard.The precision and bias of test results obtained from a given test method are influ-enced by a host of variables. The major sources of this variation are
26、 contributed bytest method, test design, operator, measurement technique, equipment, calibration,environment and materials variation. Round robin test results from many of the testmethods are available upon request.The test method development has attempted to minimize the variation that the testmeth
27、ods might contribute. The test design should consider randomization of test ma-terials, replication and the skillful grouping of test materials. Each operator must bediligent in the use of good testing practices in order to minimize the operators contri-butions to the test variability.Durability acc
28、eptance criteria as stated in ISO/IEC 7810 3rd edition -2003 Physical characteristics - subclause 8.7: “Durability of the cardis not established in this International Standard. It is based on a mu-tual agreement between the card issuer and the supplier.“ Accord-ingly, the card issuer and supplier ne
29、ed to agree to which durabilitytest method, contained herein, is relevant for the given card applica-tion.INCITS B10.3 Task Force on Card Durability Test Methods has established the fol-lowing process steps for generating this standard:Step 1: Identify existing ID card durability problems experience
30、d in field perfor-mance.Step 2: Identify potential test methods that relate to the durability concern.Step 3: Select a team leader, with other experts, to coordinate proposed testmethods in given categories (i.e. abrasion resistance, Peel Strength, and ad-hesion).Step 4: Present new Test Method for
31、consideration. (A simple read-through ofthe test method proposal in ISO 10373 format.)Step 5: Task Force discussion of the proposal. Determination of whether it fitswithin the Scope of Work.Step 6: Proposal is given Pending Status for determination at the next meeting.At the next meeting the proposa
32、l is either Accepted in Principal or rejected. Ifaccepted, the proposal is incorporated into the working paper for further dis-cussion and possible modification at succeeding meetings.Step 7: Testing is conducted and results reported to validate the test techniqueand/or to resolve technical issues.S
33、tep 8: The Test Method status becomes Accepted for Publication after all is-sues have been resolved.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-vThese test methods may sugge
34、st use of materials or test equipment,which are trade-names of a product supplied by a specific manufac-turer. This information is given for the convenience of users of thisANSI standard and does not constitute an endorsement by ANSI orINCITS of the product named. Equivalent products may be used ift
35、hey can be shown to lead to the same result This standard was developed by Technical Committee B10 of Accredited Stan-dards Committee INCITS during 2002 - 2006. The standards approval processstarted in 2006. This document includes annexes that are informative and arenot considered part of the standa
36、rd.Requests for interpretation, suggestions for improvements or addenda, or defect re-ports are welcome. They should be sent to the INCITS Secretariat, InformationTechnology Industry Council, 1250 Eye Street, NW, Suite 200, Washington, DC20005-3922.The standards was processed and approved for submit
37、tal to ANSI by the Internation-al Committee for Information Technology Standards (INCITS). Committee approvalof the standard does not necessarily imply that all committee members voted for itsapproval. At the time it approved this standard, INCITS had the following members:Karen Higginbottom, ChairJ
38、ennifer Garner, SecretaryOrganization Represented Name of RepresentativeAdobe Systems, Inc. .Steve ZillesScott Foshee (Alt.)AIM Global Dan MullenCharles Biss (Alt.)Apple Computer, Inc. David MichaelDistributed Managment Task ForceTony DiCenzoElectronic Industries Alliance Edward Mikoski, Jr.EMC Corp
39、oration Gary RobinsonFarance, Inc. .Frank FaranceTimothy Schoechle (Alt.)Google Zaheda BhoratGS1 US.Ray DelnickiFrank Sharkey (Alt.)James Chronowski (Alt.)Mary Wilson (Alt.)Hewlett-Packard Company .Karen HigginbottomSteve Mills (Alt.)Scott Jameson (Alt.)IBM CorporationRonald F. SillettiRobert Weir (
40、Alt.)Sandy Block (Alt.)Richard Schwerdtfeger (Alt.)IEEEJudith GormanTerry DeCourcelle (Alt.)Bill Ash (Alt.)Jodi Haasz (Alt.)Bob Labelle (Alt.)Susan Tatiner (Alt.)Intel .Philip WennblomDave Thewlis (Alt.)Grace Wei (Alt.)Lexmark International .Don WrightDwight Lewis (Alt.)Paul Menard (Alt.)Copyright A
41、merican National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-viOrganization Represented Name of RepresentativeMicrosoft Corporation . Jim HughesDave Welsh (Alt.)Isabelle Valet-Harper (Alt.)National Ins
42、titute of Standards - Length and axis of fracture; - Description of which card side the fracture occurred; - Full description of card design features (printing, IC, photo, mag stripe, embossing, etc.). 5.4.5 Precision and Bias 5.4.5.1 Interlaboratory Test Program An interlaboratory study of ID-1 Car
43、d Flexure was run in 1998. Sixteen sets of samples were run by four different laboratories. 5.4.5.2 Test Results The precision information given below in the units of measurement (flex cycles until failure) is for the comparison of twelve test results for each laboratory, each of which is the averag
44、e of six test determinations. 5.4.5.3 Precision 95% confidence interval (cycles) 99% confidence interval (cycles)Repeatability limit (within laboratory) 5300 7000 Reproducibility limit (among laboratories) 6800 9000 Test measurement tolerance (overall) 8700 11000 The above terms (repeatability limit
45、 and reproducibility limit) are used as specified in ASTM Practice E177-04e1. The respective standard deviations among test results may be obtained by dividing the values in the 95% confidence interval column by 1.96 or by dividing the values in the 99% confidence interval column by 2.57. 5.4.5.4 Bi
46、as No statement of bias can be made for this test method because there is no accepted reference material or absolute test method for use as a comparison basis. 15Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permit
47、ted without license from IHS-,-,-ANSI INCITS 322-2008 5.5 ID-1 Card Static Stress The purpose of this test is to determine the structural integrity of the card after static stress. 5.5.1 Significance and Use This test method shall be used for in-process card fabrication evaluations, material selecti
48、ons and when a card type is suspected of being “brittle“ or have experienced early field fractures. Card fractures after a stress period is a function of the fabrication process conditions, the card materials and their orientation, card thickness, presence or absence of embossed characters and presence or absence of surface applied decorations. 5.5.2 Apparatus Card Impact fixture as shown in Figure 15. Stress fixture constructed such to cause the card to be stressed in the following way: 78,7 0,79 mm (3.1 0.03 in)50,8 0.51 mm (2.0 0.02 in)Figure 13 Stress fixture Axis
