1、Copyright ASME International Provided by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license from IHS-,-The American Society of Mechanical Engineers AN AMERICAN NATIONAL STANDARD SURFACE TEXTURE (SURFACE ROUGHNESS WAVINESS, AND 1Ad ASME B46.1-2002 (Revisi
2、on of ASME B46.1-liN5) Copyright ASME International Provided by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license from IHS-,-Date of Issuance: lune 12, 2003 The 2002 edition of i is Standard is being issued with an automatic addenda subscription service
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10、ectronic retrieval system or otherwise, without the prior written permission of the publisher. The American Society of Mechanical Engineers Three Park Avenue, New York, NY 10016-5990 Copyright O 2003 by THE AMERICAN SOCIEW OF MECHANICAL ENGINEERS All rights reserved Printed in U.S.A. Copyright ASME
11、International Provided by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license from IHS-,-Foreword vii Committee Roster . ix Correspondence with the B46 Committee . x Section 1 1.1 1.2 1.3 1.4 1.5 1.6 Section 2 2.1 2.2 2.3 Section 3 3.1 3.2 3.3 3.4 Section
12、 4 4.1 4.2 4.3 4.4 Section 5 5.1 5.2 5.3 5.4 5.5 Section 6 6.1 6.2 Section 7 7.1 7.2 7.3 7.4 7.5 7.6 7.7 Terms Related to Surface Texture General Definitions Related to Surfaces . Definitions Related to the Measurement of Surface Texture by Profiling Methods Definitions of Surface Parameters for Pro
13、filing Methods . Definitions Related to the Measurement of Surface Texture by Area Profiling and Area Averaging Methods . Definitions of Surface Parameters for Area Profiling and Area Averaging Methods Classification of Instruments for Surface Texture Measurement Recommendation Classification Scheme
14、 Terminology and Measurement Procedures for Profiling. Contact. Skidless Instruments Scope of Section 3 . References . Terminology . Measurement Procedure Measurement Procedures for Contact. Skidded Instruments . Scope of Section 4 . References . Purpose . Instrument at ion Measurement Techniques fo
15、r Area Profiling . Scope of Section 5 . Scope of Section 2 . References . Recommendations . Imaging Methods Scanning Methods . Measurement Techniques for Area Averaging . Scope of Section 6 . Examples of Area Averaging Methods Nanometer Surface Texture And Step Height Measurements By Stylus Profilin
16、g Instruments Scope of Section 7 . Applicable Document Definitions . Recommendations . Preparation for Measurement . Calibration Artifacts . Reports 1 1 1 2 6 12 13 16 16 16 16 19 19 19 19 23 25 25 25 25 25 30 30 30 30 30 30 31 31 31 32 32 32 32 32 34 34 35 . 111 Copyright ASME International Provide
17、d by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license from IHS-,-Section 8 8.1 8.2 8.3 8.4 8.5 8.6 8.7 8.8 Section 9 9.1 9.2 9.3 9.4 9.5 9.6 Nanometer Surface Roughness as Measured with Phase Measuring Interferometric Microscopy Scope of Section 8 . Ke
18、y Sources of Uncertainty . Description and Definitions: Noncontact Phase Measuring Interferometer Noncontact Phase Measuring Interferometer Instrument Requirements . Test Methods Measurement Procedures . References . Data Analysis and Reporting . Filtering of Surface Profiles . Scope of Section 9 .
19、Definitions and General Specifications 2RC Filter Specification for Roughness Phase Correct Gaussian Filter for Roughness Filtering for Waviness References . Section 10 Terminology and Procedures for Evaluation of Surface Textures Using Fractal Geometry General 10.1 10.2 Definitions Relative to Frac
20、tal Based Analyses of Surfaces . 10.3 Reporting the Results of Fractal Analyses . 10.4 References . Section 11 Specifications and Procedures for Precision Reference Specimens 11.2 References . 11.3 Definitions . 11.4 Reference Specimens: Profile Shape and Application 11.5 Physical Requirements . 11.
21、6 Assigned Value Calculation 11.7 Mechanical Requirements Section 12 Specifications and Procedures for Roughness Comparison Specimens 11.1 Scope of Section 11 11.8 Marking . 12.1 12.2 12.3 12.4 12.5 12.6 12.7 12.8 12.9 Figures 1-1 1-2 1-3 1-4 1-5 1-6 1-7 1-8 1-9 Scope of Section 12 References . Defi
22、nitions . Roughness Comparison Specimens . Surface Characteristics . Nominal Roughness Grades Specimen Size. Form. and Lay Calibration of Comparison Specimens Marking Schematic Diagram of Surface Characteristics . Measured vs Nominal Profile Stylus Profile Displayed With Two Different Aspect Ratios
23、Examples of Nominal Profiles Filtering a Surface Profile Profile Peak and Valley . Surface Profile Measurement Lengths Illustration for the Calculation of Roughness Average Ru Rt. Rp. and Rv Parameters . 37 37 37 37 37 38 38 39 39 41 41 41 41 42 44 47 49 49 49 52 54 55 55 55 55 55 56 56 57 59 62 62
24、62 62 62 62 62 62 63 63 2 2 3 4 5 5 6 7 7 iv Copyright ASME International Provided by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license from IHS-,-1-10 1-11 1-12 1-13 1-14 1-15 1-16 1-17 1-18 1-19 1-20 1-21 1-22 2-1 3-1 3-2 3-3 3-4 4-1 4-2 4-3 4-4 7-1 7
25、-2 7-3 8-1 8-2 8-3 9-1 9-2 9-3 9-4 9-5 9-6 10-1 10-2 10-3 10-4 Surface Profile Containing Two Sampling Lengths. 21 and Z2. Also Showing the Rp. and Rt. Parameters The Rt and Rmax Parameters . The Waviness Height. Wt The Mean Spacing of Profile Irregularities. RSm . The Peak Count Level. Used for Cal
26、culating Peak Density . Amplitude Density Function-ADF(z) or p(z) . The Profile Bearing Length . The Bearing Area Curve and Related Parameters . Three Surface Profiles With Different Skewness . Three Surface Profiles With Different Kurtosis Topographic Map Obtained by an Area Profiling Method . Area
27、 Peaks (Left) and Area Valleys (Right) Comparison of Profiles Measured in Two Directions on a Uniaxial. Periodic Surface Showing the Difference in Peak Spacing as a Function of Direction . Texture Classification of Common Instruments for Measurement of Surface Profile Coordinate System Conical Stylu
28、s Tip . Aliasing . Truncated Pyramid Tip . Schematic Diagrams of a Typical Stylus Probe and Fringe-Field Capacitance Probe . Effects of Various Cutoff Values Examples of Profile Distortion Due to Skid Motion . Example of Profile Distortion . The Radius of Curvature for a Surface Sine Wave . Stylus T
29、ip Touching Bottom and Shoulders of Groove . The Stylus Tip Contact Distance. x . A Typical Phase Measuring Interferometer System Demonstration of the Detector Array With Element Spacing A and the Measurement of the Longest Spatial Wavelength. AL Covering the Total Number (N) Pixels . Demonstration
30、of the Detector Array With Element spacing A and the Measurement of the Smallest Spatial Wavelength AR Covering 5 Pixels Wavelength Transmission Characteristics for the 2RC Filter System Gaussian Transmission Characteristics Together With the Uncertain Nominal Transmission Characteristic of a 2 pm S
31、tylus Radius Weighting Function of the Gaussian Profile Filter . Gaussian Transmission Characteristic for the Waviness Short-Wavelength Cutoff or for Deriving the Roughness Mean Line Having Cutoff Wavelengths Ac = 0.08, 0.25, 0.8, 2.5, and 8.0 mm Wavelength Cutoff Having Cutoff Wavelengths Ac = 0.08
32、, 0.25, 0.8, 2.5, and 8.0 mm . Example of a Deviation Curve of an Implemented Filter From the Ideal Gaussian Filter as a Function of Spatial Wavelength Self-similarity Illustrated on a Simulated Profile An Idealized Log-Log Plot of Relative Length (of a Profile) or Relative Area (of a Surface) Versu
33、s the Scale of Observation . An Idealized Log-Log Plot of Relative Length or Area Versus the Scale of Observation (Length-Scale or Area-Scale Plot). Showing Multi-Fractal Characteristics and Crossover Scales . Profile . Gaussian Transmission Characteristic for the Roughness Long- Three Stepping Exer
34、cises from a Length-Scale Analysis on a Simulated 8 8 8 9 9 9 10 10 10 11 13 13 14 17 20 20 21 22 26 27 28 29 33 33 34 38 39 40 42 43 44 45 46 47 49 50 50 51 V Copyright ASME International Provided by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license fr
35、om IHS-,-10-5 10-6 11-1 11-2 11-3 11-4 11-5 11-6 11-7 11-8 11-9 11-10 11-11 Tables 3-1 3-2 4-1 4-2 9-1 9-2 9-3 10-1 11-1 11-2 11-3 11-4 11-5 11-6 11-7 11-8 11-9 12-1 12-2 12-3 Four Tiling Exercises From an Area-Scale Analysis. Illustrated for a Diamond Coating on a Silicon Substrate. Fabricated and
36、Measured With a Scanning Tunneling Microscope at UNCC Type Al Groove . Type A2 Groove . Assessment of Calibrated Values for Type Al . Type B1 Grooves: Set of 4 Grooves Type B2 or C2 Specimens With Multiple Grooves . Use of Type B3 Specimen Type C1 Grooves . Type C3 Grooves . Type C4 Grooves . An Are
37、a-Scale Plot Including the Results of the Tiling Series in Fig . 10-5 . Allowable Waviness Height Wt for Roughness Calibration Specimens . . Unidirectional Irregular Grooves Having Profile Repitions at 4 mm Intervals . Cutoff Values for Periodic Profiles Using RSm Cutoff Values for Nonperiodic Profi
38、les Using Ra Measurement Cutoffs and Traversing Lengths for Continuously Measurement Cutoffs and Minimum Evaluation Lengths for Instruments Averaging Instruments Using Analog Meter Readouts Measuring Integrated Roughness Values Over a Fixed Evaluation Length Limits for the Transmission Characteristi
39、cs for 2RC Long-Wavelength Cutoff Filters . Typical Cutoffs for Gaussian Filters and Associated Cutoff Ratios . Typical Values for the Waviness Long-Wavelength Cutoff (Am) and Recommended Minimum Values for the Waviness Traversing Length Nominal Values of Depth or Height and Examples of Width for Ty
40、pe Al Nominal Values of Depth and Radius for Type A2 Tip Size Estimation From the Profile Graph for Type 81 . Recommended Ra and RSm Values for Type C1 Specimens Tolerances for Types C1 to C4 Nominal Values of Ra and RSm for Type C2 Tolerances for Unidirectional Irregular Profiles Nominal Roughness
41、Grades (Ra) for Roughness Comparison Specimens . Form and Lay of Roughness Comparison Specimens Representing Various Types of Machined Surfaces Examples of Sampling Lengths for Calibration of Comparison Specimens. Example of a Report on Fractal Analysis Tolerances for Types Al and A2 Nominal Values
42、of Ra for Type C4 mm . 52 53 55 55 56 57 57 58 58 59 59 59 60 23 24 25 25 43 47 48 53 56 56 56 57 60 60 61 61 61 62 63 64 Nonmandatory Appendices A Instruments . 65 B Control and Production of Surface Texture 67 C A Review of Additional Surface Measurement Methods . 70 D Additional Parameters for Su
43、rface Characterization . 76 E Characteristics . of Certain Area Profiling Methods . 79 F Descriptions of Area Averaging Methods . 86 G Observations on the Filtering of Surface Profiles 89 H Reference Subroutines 90 I 97 General Notes on Use and Interpretation of Data Produced by Stylus A Comparison
44、of ACME and IS0 Surface Texture Parameters . vi Copyright ASME International Provided by IHS under license with ASMENot for ResaleNo reproduction or networking permitted without license from IHS-,-The first standard on surface texture was issued in March 1940. The dates for the subsequent changes ar
45、e as follows: Revision - February 1947 Revision - January 1955 Revision - September 1962 Revision - August 1971 Revision - March 1978 Revision - March 1985 Revision - June 1995 The current revision is the culimination of a major effort by the ACME Committee 846 on the Classification and Designation
46、of Surface Qualities. A considerable amount of new material has been added, particulary to reflect the increasing number of surface measurement techniques and surface parameters in practical use. Overall, our vision for the ACME B46.1 Standard is twofold: (u) to keep it abreast of the latest develop
47、ments in the regime of contact profiling techniques where the degree of measurement control is highly advanced, and (b) to encompass a large range of other techniques that present valid and useful descriptions of surface texture. The present Standard includes twelve sections: Section 1, Terms Relate
48、d to Surface Texture, contains a number of definitions that are used in other sections of the Standard. Furthermore, a large number of surface parameters are defined in addition to roughness average, Ru. These include rms roughness Rq, waviness height Wt, the mean spacing of profile irregularities R
49、Sm, and several statistical functions, as well as surface parameters for area profiling techniques. Section 2, Classification of Instruments for Surface Texture Measurement, defines six types of surface-texture measuring instruments including several types of profiling instruments, scanned probe microscopy, and area averaging instruments. With this classification scheme, it is possible that future sections may then provide for the specification on drawings of th
