1、AN AMERICAN NATIONAL STANDARDASME B46.1-2009(Revision of ASME B46.1-2002)Surface Texture (Surface Roughness,Waviness, and Lay)INTENTIONALLY LEFT BLANKASME B46.1-2009(Revision of ASME B46.1-2002)Surface Texture(Surface Roughness,Waviness, and Lay)AN AMERICAN NATIONAL STANDARDThree Park Avenue New Yor
2、k, NY 10016 USADate of Issuance: August 20, 2010This Standard will be revised when the Society approves the issuance of a new edition. There willbe no addenda issued to this edition.ASME issues written replies to inquiries concerning interpretations of technical aspects of thisdocument. Periodically
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9、reproduced in any form,in an electronic retrieval system or otherwise,without the prior written permission of the publisher.The American Society of Mechanical EngineersThree Park Avenue, New York, NY 10016-5990Copyright 2010 byTHE AMERICAN SOCIETY OF MECHANICAL ENGINEERSAll rights reservedPrinted in
10、 U.S.A.CONTENTSForeword viiiCommittee Roster . xCorrespondence With the B46 Committee xiExecutive Summary . xiiSection 1 Terms Related to Surface Texture . 11-1 General 11-2 Definitions Related to Surfaces . 21-3 Definitions Related to the Measurement of Surface Texture by ProfilingMethods 21-4 Defi
11、nitions of Surface Parameters for Profiling Methods . 71-5 Definitions Related to the Measurement of Surface Texture by AreaProfiling and Area Averaging Methods . 131-6 Definitions of Surface Parameters for Area Profiling and Area AveragingMethods 15Section 2 Classification of Instruments for Surfac
12、e Texture Measurement . 192-1 Scope 192-2 Recommendation 192-3 Classification Scheme 19Section 3 Terminology and Measurement Procedures for Profiling, Contact, SkidlessInstruments 223-1 Scope 223-2 References . 223-3 Terminology . 223-4 Measurement Procedure 28Section 4 Measurement Procedures for Co
13、ntact, Skidded Instruments 294-1 Scope 294-2 References . 294-3 Purpose . 294-4 Instrumentation 29Section 5 Measurement Techniques for Area Profiling . 345-1 Scope 345-2 References . 345-3 Recommendations . 345-4 Imaging Methods 345-5 Scanning Methods . 34Section 6 Measurement Techniques for Area Av
14、eraging 356-1 Scope 356-2 Examples of Area Averaging Methods 35Section 7 Nanometer Surface Texture and Step Height Measurements by Stylus ProfilingInstruments 367-1 Scope 367-2 Applicable Documents . 367-3 Definitions . 367-4 Recommendations . 367-5 Preparation for Measurement . 38iii7-6 Calibration
15、 Artifacts . 397-7 Reports 39Section 8 Nanometer Surface Roughness as Measured With Phase MeasuringInterferometric Microscopy 418-1 Scope 418-2 Description and Definitions: Noncontact Phase Measuring Interferometer 418-3 Key Sources of Uncertainty . 418-4 Noncontact Phase Measuring Interferometer In
16、strument Requirements . 418-5 Test Methods 438-6 Measurement Procedures . 438-7 Data Analysis and Reporting . 448-8 References . 44Section 9 Filtering of Surface Profiles 459-1 Scope 459-2 References . 459-3 Definitions and General Specifications 459-4 2RC Filter Specification for Roughness 469-5 Ph
17、ase Correct Gaussian Filter for Roughness 489-6 Filtering for Waviness 509-7 Filtering of Surfaces With Stratified Functional Properties . 53Section 10 Terminology and Procedures for Evaluation of Surface Textures Using FractalGeometry. 5410-1 General 5410-2 Definitions Relative to Fractal Based Ana
18、lyses of Surfaces . 5410-3 Reporting the Results of Fractal Analyses . 5610-4 References . 59Section 11 Specifications and Procedures for Precision Reference Specimens 6111-1 Scope 6111-2 References . 6111-3 Definitions . 6111-4 Reference Specimens: Profile Shape and Application 6111-5 Physical Requ
19、irements . 6211-6 Assigned Value Calculation 6211-7 Mechanical Requirements 6211-8 Marking . 6711-9 Calibration Interval 67Section 12 Specifications and Procedures for Roughness Comparison Specimens. 6812-1 Scope 6812-2 References . 6812-3 Definitions . 6812-4 Roughness Comparison Specimens . 6812-5
20、 Surface Characteristics . 6812-6 Nominal Roughness Grades 6812-7 Specimen Size, Form, and Lay 6812-8 Calibration of Comparison Specimens 6912-9 Marking . 69Figures1-1 Schematic Diagram of Surface Characteristics . 21-2 Measured Versus Nominal Profile 31-3 Stylus Profile Displayed With Two Different
21、 Aspect Ratios 41-4 Examples of Nominal Profiles 41-5 Filtering a Surface Profile 51-6 Profile Peak and Valley . 51-7 Surface Profile Measurement Lengths . 6iv1-8 Illustration for the Calculation of Roughness Average Ra 71-9 Rt, Rp, and Rv Parameters . 81-10 Surface Profile Containing Two Sampling L
22、engths, l1and l2, AlsoShowing the Rpiand RtiParameters 81-11 The Rt and Rmax Parameters 91-12 The Waviness Height, Wt 91-13 The Mean Spacing of Profile Irregularities, RSm . 101-14 The Peak Count Level, Used for Calculating Peak Density . 101-15 Amplitude Density FunctionADF(z) or p(z) . 111-16 The
23、Profile Bearing Length . 111-17 The Bearing Area Curve and Related Parameters . 121-18 Three Surface Profiles With Different Skewness . 121-19 Three Surface Profiles With Different Kurtosis 131-20 Topographic Map Obtained by an Area Profiling Method . 141-21 Area Peaks (Left) and Area Valleys (Right
24、) 141-22 Comparison of Profiles Measured in Two Directions on a UniaxialPeriodic Surface Showing the Difference in Peak Spacing as a Functionof Direction . 161-23 Indication of Surface Lay . 182-1 Classification of Common Instruments for Measurement of SurfaceTexture 203-1 Profile Coordinate System
25、233-2 Conical Stylus Tip . 233-3 Other Stylus Tip Geometries . 243-4 Aliasing . 264-1 Schematic Diagrams of a Typical Stylus Probe and Fringe-Field CapacitanceProbe . 304-2 Effects of Various Cutoff Values 314-3 Examples of Profile Distortion Due to Skid Motion . 334-4 Examples of Profile Distortion
26、 337-1 The Radius of Curvature for a Surface Sine Wave . 377-2 Stylus Tip Touching Bottom and Shoulders of Groove . 387-3 The Stylus Tip Contact Distance, x . 388-1 A Typical Phase Measuring Interferometer System 428-2 Demonstration of the Detector Array With Element Spacing H9004 and theMeasurement
27、 of the Longest Spatial Wavelength, H9261L Covering the TotalNumber (N) Pixels . 428-3 Demonstration of the Detector Array With Element Spacing H9004 and theMeasurement of the Smallest Spatial Wavelength, H9261R Covering FivePixels . 439-1 Wavelength Transmission Characteristics for the 2RC Filter S
28、ystem 469-2 Gaussian Transmission Characteristics Together With the UncertainNominal Transmission Characteristic of a 2 H9262m Stylus Radius 479-3 Weighting Function of the Gaussian Profile Filter . 479-4 Gaussian Transmission Characteristic for the Waviness Short-WavelengthCutoff (H9261sw) or for D
29、eriving the Roughness Mean Line Having CutoffWavelengths (H9261c) of 0.08 mm, 0.25 mm, 0.8 mm, 2.5 mm, and 8.0 mm . 509-5 Gaussian Transmission Characteristic for the Roughness Long-Wavelength Cutoff Having Cutoff Wavelengths H9261c p 0.08 mm,0.25 mm, 0.8 mm, 2.5 mm, and 8.0 mm . 519-6 Example of a
30、Deviation Curve of an Implemented Filter From the IdealGaussian Filter as a Function of Spatial Wavelength 5110-1 Self-Similarity Illustrated on a Simulated Profile 5410-2 An Idealized Log-Log Plot of Relative Length (of a Profile) or RelativeArea (of a Surface) Versus the Scale of Observation . 54v
31、10-3 An Idealized Log-Log Plot of Relative Length or Area Versus the Scale ofObservation (Length-Scale or Area-Scale Plot), Showing Multi-FractalCharacteristics and Crossover Scales . 5510-4 Three Stepping Exercises From a Length-Scale Analysis on a SimulatedProfile . 5710-5 Four Tiling Exercises Fr
32、om an Area-Scale Analysis 5710-6 An Area-Scale Plot Including the Results of the Tiling Series in Fig. 10-5 . 5811-1 Type A1 Groove . 6111-2 Type A2 Groove . 6111-3 Allowable Waviness Height Wt for Roughness Calibration Specimens . 6211-4 Assessment of Calibrated Values for Type A1 . 6311-5 Type B1
33、Grooves: Set of Four Grooves 6411-6 Type B2 or C2 Specimens With Multiple Grooves . 6411-7 Use of Type B3 Specimen 6511-8 Type C1 Grooves . 6511-9 Type C3 Grooves . 6611-10 Type C4 Grooves . 6611-11 Unidirectional Irregular Groove Specimen Having Profile Repetition at5H9261c Intervals (Type D1 With
34、H9261c p 0.8 mm) . 67Tables3-1 Cutoff Values for Periodic Profiles Using RSm 273-2 Cutoff Values for Nonperiodic Profiles Using Ra 284-1 Measurement Cutoffs and Traversing Lengths for ContinuouslyAveraging Instruments Using Analog Meter Readouts 304-2 Measurement Cutoffs and Minimum Evaluation Lengt
35、hs for InstrumentsMeasuring Integrated Roughness Values Over a Fixed EvaluationLength 309-1 Limits for the Transmission Characteristics for 2RC Long-Wavelength CutoffFilters . 499-2 Typical Cutoffs for Gaussian Filters and Associated Cutoff Ratios . 529-3 Typical Values for the Waviness Long-Wavelen
36、gth Cutoff (H9261cw) andRecommended Minimum Values for the Waviness Traversing Length 5210-1 Example of a Report on Fractal Analysis 5811-1 Nominal Values of Depth or Height and Examples of Width for Type A1 6211-2 Nominal Values of Depth and Radius for Type A2 6311-3 Tolerances and Uncertainties fo
37、r Types A1 and A2 6311-4 Tip Size Estimation From the Profile Graph for Type B1 . 6411-5 Typical Ra and RSm Values for Type C1 6511-6 Tolerances and Uncertainties for Types C1 Through C4 6511-7 Typical Values of Ra and RSm for Type C2 6611-8 Typical Values of Ra for Type C4 . 6611-9 Tolerances and U
38、ncertainties for Types D1 and D2 6712-1 Nominal Roughness Grades (Ra) for Roughness Comparison Specimens . 6812-2 Form and Lay of Roughness Comparison Specimens RepresentingVarious Types of Machined Surfaces 6912-3 Examples of Sampling Lengths for Calibration of Comparison Specimens,mm . 70Nonmandat
39、ory AppendicesA General Notes on Use and Interpretation of Data Produced by StylusInstruments . 71B Control and Production of Surface Texture 73C A Review of Additional Surface Measurement Methods . 76D Additional Parameters for Surface Characterization . 83E Characteristics of Certain Area Profilin
40、g Methods . 86viF Descriptions of Area Averaging Methods . 93G Observations on the Filtering of Surface Profiles 96H Reference Subroutines 97I A Comparison of ASME and ISO Surface Texture Parameters . 105J Functional Standards . 107viiFOREWORDThe first standard on surface texture was issued in March
41、 1940. The dates for the subsequentchanges are as follows:Revision February 1947Revision January 1955Revision September 1962Revision August 1971Revision March 1978Revision March 1985Revision June 1995Revision October 2002The current revision is the culmination of a major effort by the ASME Committee
42、 B46 on theClassification and Designation of Surface Qualities. A considerable amount of new material hasbeen added, particularly to reflect the increasing number of surface measurement techniques andsurface parameters in practical use. Overall, our vision for the ASME B46.1 Standard is twofoldas fo
43、llows:(a) to keep it abreast of the latest developments in the regime of contact profiling techniqueswhere the degree of measurement control is highly advanced(b) to encompass a large range of other techniques that present valid and useful descriptionsof surface textureTechnical drawings referring t
44、o a specific version of the ASME B46.1 Standard (e.g., ASMEB46.1-2009) refers to the rules and definitions given in that version of the surface texture standardas indicated. For technical drawings that do not indicate a specific ASME B46.1 surface texturestandard, the rules and definitions given in
45、the ASME B46.1 revision in effect at the release dateof the drawing must be used.The ASME B46 Committee contributes to international standardization activities related tosurface texture measurement and analysis as referenced in ISO/TR 14368:1995, GeometricalProduct Specification (GPS) Masterplan.The
46、 present Standard includes 12 sections as follows:Section 1, Terms Related to Surface Texture, contains a number of definitions that are used inother sections of the Standard. Furthermore, a large number of surface parameters are definedin addition to roughness average, Ra. These include rms roughne
47、ss Rq, waviness height Wt, themean spacing of profile irregularities RSm, and several statistical functions, as well as surfaceparameters for area profiling techniques.Section 2, Classification of Instruments for Surface Texture Measurement, defines six types ofsurface texture measuring instruments
48、including several types of profiling instruments, scannedprobe microscopy, and area averaging instruments. With this classification scheme, it is possiblethat future sections may then provide for the specification on drawings of the type of instrumentto be used for a particular surface texture measu
49、rement.Section 3, Terminology and Measurement Procedures for Profiling, Contact, SkidlessInstruments, is based on proposals in ISO Technical Committee 57 to define the characteristicsof instruments that directly measure surface profiles, which then can serve as input data to thecalculations of surface texture parameters.Section 4, Measurement Procedures for Contact, Skidded Instruments, contains much of theinformation that was previously contained in ASME B46.1-1985 for specification of instrumentsprimarily intended for measurement of averaging parameters such as the
