1、Designation: B913 05 (Reapproved 2015)Standard Test Method forEvaluation of Crimped Electrical Connections to 16-Gaugeand Smaller Diameter Stranded and Solid Conductors1This standard is issued under the fixed designation B913; the number immediately following the designation indicates the year ofori
2、ginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method establishes the requirements for astandardize
3、d method of evaluating the quality of crimped-typeelectrical connections to solid or stranded conductors. This testmethod applies to 16-gauge and smaller diameter copper wire,coated or uncoated.1.2 This test method is applicable to connection systemsintended for indoor use, or for use in environment
4、ally protectedenclosures. Additional testing may be required to assuresatisfactory performance in applications where high humidityor corrosive environment, or both, may be present.1.3 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstand
5、ard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to become familiarwith all hazards including those identified in the appropriateSafety Data Sheet (SDS) for this product/material as prov
6、idedby the manufacturer, to establish appropriate safety and healthpractices, and determine the applicability of regulatory limi-tations prior to use.2. Referenced Documents2.1 ASTM Standards:2B8 Specification for Concentric-Lay-Stranded CopperConductors, Hard, Medium-Hard, or SoftB258 Specification
7、 for Nominal Diameters and Cross-SectionalAreas ofAWG Sizes of Solid Round Wires Usedas Electrical ConductorsB542 Terminology Relating to Electrical Contacts and TheirUse3. Terminology3.1 DefinitionsMany terms related to electrical contactsused in this test method are defined in Terminology B542.3.2
8、 Definitions of Terms Specific to This Standard:3.2.1 crimp, vto establish an electrical and mechanicalattachment between the two members by mechanically deform-ing one contact member around another. In most cases, onemember is a wire or group of wires, the other is a hollowcylinder or partial cylin
9、der that is deformed around the wires.3.2.2 crimp barrel, crimp tab, nthe portion of the crimpterminal that is deformed in the crimping operation.3.2.3 crimped connection, na mechanical and electricalconnection between a conductor and a component. The con-nection is made by compressing (crimping) th
10、e component(crimp barrel) or tab(s) of the component about the conductorusing a tool specifically designed for the purpose3.2.4 crimp terminal, nan electrical component designedto be electrically and mechanically attached to a wire bydeforming a portion of the component in a crimping operationto for
11、m an attachment to the wire. The other end of the terminalusually has a ring, fork, spade, tab, or related configurationdesigned to attach to another connection such as a screw orterminal block.4. Summary of Test Method4.1 A test lot of test specimens of the crimp terminalcrimped to a short length o
12、f wire is prepared. The wire is pulledfrom a group of the specimens in a tensile pull and the forcecompared to set requirements based on wire diameter. Aseparate group of specimens is subjected to an electrical testwhere resistance stability of the specimen is evaluated duringdeflection of the wire
13、at the exit of the crimped connection. Thegroup is then aged for 33 days at 118C and periodicallyretested in the electrical test. The electrical test results arecompared to a standard value based on wire diameter.Atest lotpasses the evaluation if it passes both the mechanical pull testand the electr
14、ical test. In Method B, additional pull tests areperformed on subgroups of parts during and after the aging testto provide information on progressive degradation in perfor-mance.1This test method is under the jurisdiction of ASTM Committee B02 onNonferrous Metals and Alloys and is the direct respons
15、ibility of SubcommitteeB02.11 on Electrical Contact Test Methods.Current edition approved Oct. 1, 2015. Published October 2015. Originallyapproved in 2000. Last previous edition approved in 2010 as B913 05 (2010).DOI: 10.1520/B0913-05R15.2For referenced ASTM standards, visit the ASTM website, www.as
16、tm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States15. Signif
17、icance and Use5.1 This test method establishes the requirements for astandardized method of evaluating the performance ofcrimped-type electrical connections having solid or strandedconductors.5.2 In order to achieve a successful crimped connection, thecrimping tool must deform the material of the cr
18、imp barrel orbarrel tab(s) around the conductor. As a consequence, theconductor surfaces are placed under compression by the crimpterminal and areas of contact are established between theconductor and the crimp barrel. These areas provide the desiredelectrical connection. A reliable crimped connecti
19、on is one thatis capable of maintaining the contact between the conductorand crimp barrel so that a stable electrical connection ismaintained when it is exposed to the conditions it was designedto endure during its useful life.5.3 Evaluation testing is designed to ensure that a particulardesign crim
20、ped connection system consisting of conductor andcomponent and associated tooling is capable of achieving areliable electrical and mechanical connection. After the evalu-ation is completed, if any change in the system parts is made,the system should be reevaluated using the same procedures.5.4 After
21、 completion of the evaluation test, the tensile pullstrength results may be used to develop acceptance require-ments to be used in inspection of subsequent production lots ofcrimped connections. An example of such an acceptancerequirement is shown in Appendix X1.5.5 The aging test, 33 days exposure
22、at 118C, has beenused in the telecommunications industry to simulate 40 yearsof service at a moderately elevated temperature of 50C, anenvironment that components experience within large banks oftelephone equipment. This environment is similar to that seenin a wide range of electronic systems operat
23、ing indoorscontaining active components that dissipate power. The test isdesigned to reproduce the stress relaxation of copper alloys insuch service and has been used extensively in evaluating wirewrap connections. It also accelerates other thermally activatedprocesses such as oxidation although the
24、ir acceleration factorsmay be different from that of copper stress relaxation.5.6 The aging test accelerates stress relaxation processesand other thermally activated processes but does not addresssome other possible hazards such as corrosion. Additionaltesting may be appropriate if the intended serv
25、ice environmentpresents such hazards.6. Interferences6.1 The wire strain relief included in some crimp terminalsmay mask the performance of the crimped connection to thewire. The strain relief shall be disabled prior to testing thespecimens in this test method.7. Apparatus7.1 Tensile Test Stand, Loa
26、d cell and grips, or HoldingFixtures, adequate to measure the force required to pull thecrimp terminal off the wire at the speed specified in this testmethod.7.2 Oscilloscope, with adequate preamplifiers to measuredynamic change of 100 6 10 V. An oscilloscope with arecording device is preferred as i
27、t can provide a permanentrecord of the results.7.3 Fixture with Two Clamps, to securely hold the crimpterminal and end of the wire while making an electricalconnection to each, and allow for manual deflection of the wireat the exit of the crimp terminal through 15 in all directions.A fixture with tw
28、o vise-like clamps mounted about 80 mmapart on an insulating base has proved suitable. Spring clipsoften used with 16 to 24-gauge wire are not adequate; a higherforce clamp is needed.7.4 dc Power Supply, capable of providing 100-mA milli-amps current through the sample with noise or ripple less than
29、10 V on the measured sample7.5 Oven, capable of maintaining a temperature of 118 62C and with a working volume adequate to contain the crimptest specimens and allow air circulation around them. The ovenshall use air from the indoor environment as the air source, noother humidity control is required.
30、8. Test Specimen8.1 Prepare the following quantities of test specimens of thecrimped connection made with the wire and crimp componentto be evaluated. For Test Method A, prepare 64 specimens, forTest Method B, prepare 94 test specimens. For crimpedconnections that will be manufactured with adjustabl
31、e crimpdies, prepare 64 (Test Method A) or 94 (Test Method B) testspecimens each made with the smallest and largest die settingto which the dies will be set in the manufacture of the actualconnections. The wire length beyond the crimp barrel shall be200 mm, minimum. In each test method, the 64 or 94
32、specimens provide four extra specimens beyond those actuallyrequired for testing, the remaining four can be used in test setup or retained as examples of the manufactured test specimenssince the testing is destructive. Specifications B8 and B258define wire gauge (diameter) and wire stranding.8.2 Doc
33、ument the following items at the time that thespecimens are prepared:8.2.1 Gauge of wire,8.2.2 Wire conductor stranding,8.2.3 Wire coating or plating,8.2.4 Wire manufacturer,8.2.5 Wire manufacturers part number for the wire used,8.2.6 Type of wire insulation,8.2.7 Terminal supplier name,8.2.8 Termin
34、al suppliers part number for the terminal,8.2.9 Crimping tool supplier name,8.2.10 Crimping tool supplier part number, and8.2.11 Crimping tool die setting (if applicable).8.3 The test specimens shall meet the following require-ments:8.3.1 All strands of the conductor(s) shall be in the crimpbarrel a
35、nd there shall be no evidence of missing, broken,damaged, or loose strands of the conductor(s).8.3.2 Conductors shall not be pre-soldered or solder-dippedprior to crimping.B913 05 (2015)28.3.3 Wire is to be stripped immediately before crimping fora distance that is proper to full insertion into the
36、crimp barrel.Strip the other end of the wire for 25 mm to allow forconnection to electrical measuring devices.8.3.4 The crimp indent shall be in the intended position andorientation on the barrel in accordance with the design intent ofthe manufacturers die set and crimp barrel.8.3.5 There shall be n
37、o cracking or rupture in any portion ofthe barrel, tabs, and so forth.8.3.6 The crimp barrel shall show no evidence of re-crimping (double crimping) in the same location. Barrels maybe crimped in more than one location in accordance with themanufactures design.8.3.7 When a terminal is equipped with
38、an insulation grip orsupport, the wire insulation shall be in its intended positionwithin the grip or support after crimping. The grip or supportshall, as designed, mechanically secure or support the wireinsulation.8.3.8 On pre-insulated terminals or splices, the insulatedsleeve shall remain in its
39、proper position on the crimp barrelafter crimping and shall not show evidence of cracking orspalling.8.3.9 When sleeving is used to insulate uninsulated crimpedbarrels, the sleeving shall be a snug fit and shall cause noevidence of damage to the wire insulation.8.3.10 The conductor must be fully sea
40、ted in the barrel andmay extend beyond the barrel but not into the tongue area orplug end of terminal lugs to the extent that it will interfere withproper connection of the terminal to another part in the mannerintended.8.3.11 If more than one conductor is crimped in a singlecrimp terminal, the wire
41、s must not be twisted together beforecrimping.9. Procedure9.1 Test Method A:9.1.1 Visual Test of SamplesVisually inspect all test speci-mens to determine if they meet the applicable requirements ofthe Test Specimens section of this test method.9.1.2 Tensile Pull Strength TestPerform the tensile (pul
42、l)strength tests on 30 test specimens in the as-received condition.For multiple wire crimped connections, test (pull) the smallestdiameter wire in the crimp terminal. Prior to applying the pulltest, inactivate any stress relief or crimp, viz. insulation grip, inthe absence of other prior agreement,
43、so that it does notinfluence the test results. Place the barrel/conductor assemblyin a standard tensile testing device and apply an axial load topull the wire conductor out of the barrel or rupture theconductor. The travel speed of the pull testing head shall beheld to a standard speed of 25 6 5 mm/
44、min. Record themaximum pull applied and failure mode, for example, pull out,wire break, and so forth.9.1.3 Dynamic Voltage Drop Tests:9.1.3.1 Subject 30 remaining specimens to the dynamicvoltage drop tests. Before making voltage drop tests, incapaci-tate any insulation strain relief, and so forth, u
45、nless otherwiseagreed upon.9.1.3.2 Clamp the crimp terminal and the other end of thewire in the measurement fixture in such a way that the wireposition incorporates enough slack that the movement de-scribed later in this section can be performed. In clamping thecrimp terminal, avoid applying clampin
46、g force to the crimpbarrel. Secure electrical connections shall be established and a100-mA current passed through the wire and crimp barrel. Setthe oscilloscope to a sweep rate of 100 ms/cm and a sensitivitysuch that 100 V provides a vertical deflection of one quarterto three quarters of full-scale.
47、 Use ac coupling of the oscillo-scope to the test specimen. While monitoring the voltageacross the connection on the oscilloscope, grasp the wire at apoint approximately 25 mm from the barrel and move itthrough approximately 30 of arc 15 either side of center threetimes. Observe and record the maxim
48、um voltage wave peak topeak observed on the oscilloscope during the wire movement.NOTE 1In the event that a failure occurs, it is recommended that alength of wire of the type in the crimped terminal be tested in the fixtureusing the same measurement system. If a failure is observed with the wirealon
49、e, the clamps at each end of the test specimen may be inadequate tohold the parts securely.9.1.3.3 Place the test specimens in an oven where thetemperature is maintained at 118 6 2C. Position them in theoven to allow free circulation of air about them.9.1.3.4 Remove the test specimens from the oven after 24 hand allow them to return to room temperature.9.1.3.5 Repeat the dynamic voltage drop measurement.Record the results.9.1.3.6 Repeat the dynamic voltage drop measurementsafter the samples are baked for 7, 15, and 33 days, cumulative.After the 33-day measurem
