1、Designation: C 485 83 (Reapproved 2003)e1Standard Test Method forMeasuring Warpage of Ceramic Tile1This standard is issued under the fixed designation C 485; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision
2、. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.e1NOTEAdjunct references were corrected editorially in April 2006.1. Scope1.1 This test method covers procedures for measuring di-agonal and e
3、dge warpages of the following categories ofceramic tile:1.1.1 Square Tile, 2 by 2 in. (51 by 51 mm) or larger, that arenominally flat, of uniform overall thickness, and have a smoothface of one of the types: unglazed, bright glazed, matte glazed,or finely crystalline glazed.1.1.2 Oblong Tile, no fac
4、ial dimension smaller than 2 in. (51mm), that are flat, of uniform overall thickness, and have asmooth face of one of the types: unglazed, bright glazed, matteglazed, or finely crystalline glazed.1.1.3 Square and Oblong Tile, no facial dimension smallerthan 2 in. (51 mm), that are flat, but have an
5、irregular face suchas embossed, sloped, bumpy, wavy, coarsely crystalline, orwire-cut textured.1.1.4 Nonrectilinear Tile, larger than 4 in.2(26 cm2), thatare flat and of uniform body thickness with smooth or irregularface, such as hexagonal, diamond, Spanish type, and so forth.1.1.5 Trim Tile meetin
6、g one of the descriptions in 1.1.1-1.1.4 except that only a part of the tile surface is flat. (Surfacetrim tile should be treated as flat tile whenever possible.)1.1.6 Square or Oblong Tile with facial area less than 4in.2(26 cm2) and at least two straight sides equal to or greaterthan 1.0 in. (25 m
7、m) long. (Modular 1- by 1-in. tile are not inthe scope of this test method.)1.2 This test method is not applicable to tile having em-bossed surfaces that are not flat, or that have a combination ofvariable body thickness and an irregular face.1.3 The values stated in the inch-pound units are to bere
8、garded as the standard. The SI (metric) units given inparentheses are for information only.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practi
9、ces and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2C 242 Terminology of Ceramic Whitewares and RelatedProducts2.2 ASTM Adjuncts:Warpage Gage for Ceramic Tile33. Terminology3.1 Definitions:3.1.1 tilesee Definitions C 242.3.1.2 warpag
10、ecurvature of a flat tile measured as devia-tion of the tile surface from a true plane along the edges or thediagonals. The deviation is measured at the mid-length of anedge or diagonal, expressed as a percentage of the length of theedge or diagonal, and called convex or concave with respect tothe f
11、ace of the tile.4. Summary of Test Method4.1 This test method consists of measuring the deviationfrom a straight line at the midpoint between reference points onthe face or back of a tile. Measurements are made along theedges of a tile or along the diagonals, or both. The deviation isexpressed as co
12、nvex or concave warpage in relation to the tileface, and its magnitude is calculated as a percentage of thelength of the edge or diagonal.5. Significance and Use5.1 This test method provides a means for determiningwhether or not a lot of ceramic tile meets the warpagerequirements that may appear in
13、specifications to assuresatisfactory tile installations. In accordance with this testmethod, warpage is calculated as a percentage of the length of1This method is under the jurisdiction of ASTM Committee C21 on CeramicWhitewares and Related Products and is the direct responsibility of SubcommitteeC2
14、1.06 on Ceramic Tile.Current edition approved Oct. 1, 2003. Published October 2003. Originallyapproved in 1961. Last previous edition approved in 1999 as C 485 83 (1999).2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annu
15、al Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Three drawings showing construction details are available from ASTMHeadquarters. Order ADJC0485.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428
16、-2959, United States.the edge or diagonal being tested. It is realized that thepercentage values based on the overall edge length, or on theoverall diagonal length of a tile will be slightly lower thanthose based on the distance between reference points. How-ever, the ratio of the overall lengths to
17、 the distance betweenreference points will be practically constant for any particularsize of tile and, therefore, the percentage values will becomparable and equally indicative of warpage.6. Apparatus6.1 General ApparatusThe size and arrangement of theapparatus for measuring the warpages vary, depen
18、ding on thesize and shape of the tile to be measured. In general, theapparatus consists of two stationary pins (reference pins)spaced apart34 in. (19 mm) less than the length of the edge ordiagonal being tested, and a dial indicator tip midway betweenthe stationary pins and in line with them. The pi
19、ns and the dialindicator are mounted firmly on the same rigid metal bar. Thepins may have a hemispherical tip, as described in 6.2.2,orthey may be conical to a point. A more versatile apparatus forstandard sizes of tile consists of a metal plate having threemovable reference pins, three movable regi
20、stry stops, and thenecessary number of dial indicators. See Fig. 1 and Fig. 2.6.2 Apparatus for Square Tile:36.2.1 Metal PlateAflat metal plate, 6 by 6 in. (152 by 152mm) square and14 in. (6.4 mm) thick, with a716-in. (11-mm)wide slot starting at the midpoint of one side and running atright angles t
21、o that side for a distance of 258 in. (67 mm)toward the center of the plate. The plate also has a716-in.diameter hole in the exact center of the plate. One side of theplate has two18-in. (3.2-mm) thick,12-in. (13-mm) wide, and1-in. (25-mm) high projections, located not more than12 in.from the corner
22、s, and a similar projection located on anadjacent side and not more than12 in. from one of the cornersof the first side. These projections serve as permanent registrystops for 6- by 6-in. tile during measurement.6.2.1.1 In addition, the plate has a series of tapped holes forinsertion of removable re
23、ference pins and removable registrystops. The centers of the holes for the reference pins are locatedfor each nominal size of tile near three of its corners,38 in. (9.5mm) in from each side, when the tile is centered on the plate,except that for 2- by 2-in. (51- by 51-mm) tile the distance infrom th
24、e edges is14 in. (6.4 mm). To receive the three registrystops, the centers of two holes are located for each nominal sizeof tile12 in. (13 mm) from the corners of one side and18 in.(3.2 mm) from the edge of the tile, while the center of a thirdhole is located on an adjacent side,12 in. from one of t
25、hecorners of the first side and18 in. from the edge of the tile.6.2.2 Reference PinsThree movable reference pins58 in.(16 mm) high and14 in. (6.4 mm) in diameter, with the free endground to a hemispherical tip and the other end threaded for adistance of14 in. The reference pins are inserted in the m
26、etalplate to support the tile during measurement.6.2.3 Registry StopsThree14-in. (6.4-mm) diameter and114-in. (32-mm) high, movable, flat top registry stops with a116-in. (1.6-mm) wide and18-in. (3.2-mm) deep slot on oneend for the insertion of a screwdriver and threaded on the otherend for a distan
27、ce of14 in. The registry stops are inserted in themetal plate to fix the horizontal position of the tile duringmeasurement.6.2.4 Dial IndicatorsTwo adjustable dial indicators, read-ing in 0.001-in. (0.025-mm) increments and accurate to60.001 in. One is inserted from the bottom through the716-in.(11-
28、mm) hole in the center of the plate, permanently fastenedto the underside of the metal plate, and used for measuringdiagonal warpage. The other is inserted into the slot in the plateand fastened in any one of four positions which representFIG. 1 Apparatus for Square Tile, Set Up for Measurement of 4
29、14-by 414-in. (108- by 108-mm) TileFIG. 2 Apparatus as Shown in Fig. 1, Showing Arrangement ofStem ExtenderC 485 83 (2003)e12midpoints between reference pins on one side of each of thedifferent nominal sizes of tile. This dial indicator is used fordetermining edge warpage.6.2.5 True Reference Plates
30、Four38-in. (9.5-mm) thickplates of true plane surface, made of steel or polished glass, oneeach of the same dimensions as the four nominal sizes of tilewhich can be measured on this apparatus.6.3 Apparatus for Oblong Tile:36.3.1 Metal PlateAflat rectangular metal plate 812 by 414in. (216 by 108 mm)
31、and14 in. (6.4 mm) thick, having two716-in. (11-mm) wide slots. One slot should start at themidpoint of one 414-in. side and run at right angles to that sidefor a distance of 234 in. (70 mm) towards the center of theplate. The other slot should start at the midpoint of one 812-in.side and run at rig
32、ht angles to that side for a distance of 134 in.(45 mm) towards the center of the plate. These slots are usedfor inserting the two dial indicators necessary to measure theedge warpage of one long and one short dimension of the tilesimultaneously. There is also a716-in. hole in the exact centerof the
33、 plate for insertion of the third dial indicator, which isused for measuring diagonal warpage. One side of the plate hastwo18-in. (3.2-mm) thick,12-in. (13-mm) wide, and 1-in.(25-mm) high projections, located not more than12 in. fromthe corners and a similar projection located on an adjacent sideand
34、 not more than12 in. from one of the corners of the firstside. These projections serve as permanent registry stops for812 by 414-in. tile during measurement.6.3.1.1 In addition, the plate has a series of tapped holes forinsertion of movable reference pins and movable registry stops.The center of the
35、 holes for the reference pins is located for eachnominal size of tile near its four corners,38 in. (9.5 mm) infrom each side, when the tile is centered on the plate. Thecenters of two of the holes to receive the three registry stops arelocated for each size of tile12 in. (13 mm) from the corners ofo
36、ne side and18 in. (3.2 mm) from the edge of the tile, while thecenter of the third hole is located on an adjacent side,12 in.from one of the corners of the first side and18 in. from theedges of the tile.6.3.2 Reference PinsSee 6.2.2.6.3.3 Registry StopsSee 6.2.3.6.3.4 Dial IndicatorsThree adjustable
37、 dial indicators,reading in 0.001-in. (0.025-mm) increments and accurate to60.001 in. One of them, used for the determination of diagonalwarpage, is permanently fastened on the underside of the plate,with its stem projecting through the716-in. (11-mm) hole in thecenter of the plate. The other two, u
38、sed for measuring edgewarpage, are inserted, one into each of the two slots in theplate, and fastened in any one of the various positionsrepresenting midpoints between reference pins on the sameside of the various nominal sizes of tile. Because two of thedial indicators are in one line for viewing,
39、one of them must bearranged at a different elevation than the other by using a stemextender, so that both dials may be read simultaneously (Fig.2).6.3.5 True Reference PlatesSee 6.2.5.7. Test Specimens7.1 Select the required number of tile specimens at randomfor the lot to be tested.8. Procedure8.1
40、GeneralFor nominally square tile use the apparatusdescribed under 6.2. For oblong tile use the apparatus de-scribed under 6.3.8.2 Procedure for Square Tile:8.2.1 Depending upon the size of tile to be tested, insert thethree registry stops and the three reference pins into the propertapped holes in t
41、he metal plate and fasten them. Move andfasten the adjustable dial indicator in the slot so that its tip willfall at the midpoint between the two reference pins on the sameside. Insert the proper reference plate and adjust the two dialindicators to zero reading when the reference plate rests on ther
42、eference pins and is in contact with the three registry stops.8.2.2 Insert a piece of tile with its face resting upon the threereference pins and its edges in contact with the three registrystops. Read the two dial indicators, turn the tile 90 clockwise,and repeat the procedure until all four sides
43、and the twodiagonals have been measured.8.3 Procedure for Oblong Tile:8.3.1 Both diagonals of oblong tile cannot be measured forwarpage without changing one of the reference pins. Depend-ing upon the size of tile to be tested, insert the three registrystops and the three reference pins into the prop
44、er tapped holesin the metal plate and fasten them. Insert the two movable dialindicators, one in each slot of the plate and located so that thestem of one is at the midpoint between reference pins of oneshort dimension and the stem of the other at the midpointbetween reference pins of one long dimen
45、sion. Using theproper reference plate so that it rests on the three reference pinsand its sides are in contact with the registry stops, adjust thethree dial indicators to zero reading.8.3.2 Place a tile face down on the reference pins so that itsedges are in contact with the registry stops and read
46、the threedial indicators. Turn the tile 180 and read the edge warpage ofthe second short and second long dimension of the tile. In orderto determine the warpage of the second diagonal, change oneof the reference pins and read the warpage of the seconddiagonal, after first resetting the dial indicato
47、rs to zero with thereference plate. (In practice it will be found more expedient toread the edge warpage and the warpage of one diagonal of allthe tile in a sample before changing the one reference pin todetermine the warpage of the second diagonal.)8.4 Procedure for Square or Oblong Tile with an Ir
48、regularFace, as defined in 1.1.3.8.4.1 Tile with an irregular face on which accurate warpagemeasurements can not be made must be measured on the back,if possible. If the back is also unsuitable, no warpage measure-ments can be made in accordance with this test method.8.4.2 A suitable back may be fla
49、t, embossed with a pattern,or ribbed if the following criteria are satisfied:8.4.2.1 For diagonal warpage a flat area at least14 by14 in.(6.4 mm) in or near the center of the back must be in the samenominal plane and in line with similar flat areas near thecorners of the back. The points within these flat areas at whichthe stationary points and the dial indicator tip of the apparatuscontact the tile back may be chosen with reasonable latitude,but the same locations must be used on each tile in the sample.C 485 83 (2
