1、Designation: C485 16Standard Test Method forMeasuring Warpage of Ceramic Tile1This standard is issued under the fixed designation C485; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parenthe
2、ses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers procedures for measuring thecorner, diagonal, and edge warpages of the following catego-ries of ceramic tile:1.1.1 Square Tile, 2
3、 by 2 in. (51 by 51 mm) or larger, thatare nominally flat, of uniform overall thickness, and have asmooth face of one of the types: unglazed, bright glazed, matteglazed, or finely crystalline glazed.1.1.2 Oblong Tile, no facial dimension smaller than 2 in. (51mm), that are flat, of uniform overall t
4、hickness, and have asmooth face of one of the types: unglazed, bright glazed, matteglazed, or finely crystalline glazed.1.1.3 Square and Oblong Tile, no facial dimension smallerthan 2 in. (51 mm), that are flat, but have an irregular face suchas embossed, sloped, bumpy, wavy, coarsely crystalline, o
5、rwire-cut textured.1.1.4 Nonrectilinear Tile, larger than 4 in.2(26 cm2), thatare flat and of uniform body thickness with smooth or irregularface, such as hexagonal, diamond, Spanish type, and so forth.1.1.5 Trim Tile meeting one of the descriptions in 1.1.1 1.1.4 except that only a part of the tile
6、 surface is flat. (Surfacetrim tile should be treated as flat tile whenever possible.)1.1.6 Square or Oblong Tile with facial area less than 4in.2(26 cm2) and at least two straight sides equal to or greaterthan 1.0 in. (25 mm) long. (Modular 1- by 1-in. tile are not inthe scope of this test method.)
7、1.2 This test method is not applicable to tile having em-bossed surfaces that are not flat, or that have a combination ofvariable body thickness and an irregular face.1.3 The values stated in inch-pound units are to be regardedas standard. The values given in parentheses are mathematicalconversions
8、to SI units that are provided for information onlyand are not considered standard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and d
9、etermine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2C242 Terminology of Ceramic Whitewares and RelatedProducts2.2 ASTM Adjuncts:Warpage Gage for Ceramic Tile33. Terminology3.1 Definitions:3.1.1 contact warpage device, nconsisting of a fixture
10、 thathas reference pins, contact gauges, and zero blank plates. Thedevice can be specific to a tile size or adjustable. Typically thetile rests on the pins and the zero plane is fixed from thesecontact points.3.1.2 non-contact warpage device, na device that usessome form of non-contact method to tak
11、e measurements. Anexample would be laser measurement. These devices can useda fixed reference plane (zero with flat blanks) or calculate atheoretical reference plane.3.1.3 reference plane, nthe zero plane from which tileplanar deviations are measured.3.1.4 tile, nsee Definitions C242.3.1.5 warpage,
12、ncurvature of a flat tile measured asdeviation of the tile surface from a true plane along the edges,at the corners, or the diagonals. The deviation is measured atthe mid-length of an edge or diagonal, or at a corner, expressedas a percentage of the length of the edge, diagonal, or corner,and called
13、 convex or concave with respect to the face of thetile.4. Summary of Test Method4.1 This method calculates the deviation of a ceramic tilefrom a flat plane. Measurements are made along the edges,1This method is under the jurisdiction of ASTM Committee C21 on CeramicWhitewares and Related Productsand
14、 is the direct responsibility of SubcommitteeC21.06 on Ceramic Tile.Current edition approved Dec. 1, 2016. Published January 2017. Originallyapproved in 1961. Last previous edition approved in 2009 as C485 09. DOI:10.1520/C0485-16.2For referenced ASTM standards, visit the ASTM website, www.astm.org,
15、 orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Three drawings showing construction details are available from ASTMHeadquarters. Order ADJC0485.Copyright ASTM International, 100
16、 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for theDevelopment of International Standards, Guides and Re
17、commendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.1diagonals, and corners of a tile. The deviation is expressed asconvex (positive) or concave (negative) warpage in relation tothe tile face.5. Significance and Use5.1 This test method provides a means fo
18、r determiningwhether or not a lot of ceramic tile meets the warpagerequirements that may appear in specifications to assuresatisfactory tile installations. In accordance with this testmethod, warpage is calculated as a percentage of the length ofthe edge or diagonal being tested. It is realized that
19、 thepercentage values based on the overall edge length, or on theoverall diagonal length of a tile will be slightly lower thanthose based on the distance between reference points.However, the ratio of the overall lengths to the distancebetween reference points will be practically constant for anypar
20、ticular size of tile and, therefore, the percentage values willbe comparable and equally indicative of warpage.6. Apparatus6.1 Edge and Diagonal ApparatusThe size and arrange-ment of the apparatus for measuring the warpages vary,depending on the size and shape of the tile to be measured. Theapparatu
21、s may be of contact or non-contact in type capable ofbeing differentiate between the tile and a true flat plane. It mustbe able to measure the displacement (to 0.1 mm) from a trueplane at the center of the tile edges and at the corners. Thisdisplacement is relative to a plane fixed at reference poin
22、ts10 mm from each tile corner.6.2 Corner Warpage ApparatusThis device may be con-tact or non-contact in nature capable of detecting deflectionfrom a plane as indicated below. It must be able to measure thedisplacement 10 mm from corner and fixed 50 mm outside ofa plane (to 0.1 mm) as illustrated bel
23、ow.7. Test Specimens7.1 At least ten tile specimens shall be selected at randomfrom the lot to be tested. Brush the specimens to remove alladhering particles of clay or sand.8. Procedure8.1 Edge Warpage:8.1.1 Zero out the device to the reference plane (if needed).8.1.2 Align the device with the face
24、 of the tile such that theplane measured conforms to Section 6.8.1.3 Measure the displacement of the edge at the centeralong the gauge length, with positive values being convex andnegative values being concave with respect to the face of thetile.8.1.4 Record the results.8.1.5 Rotate the tile or devi
25、ce 90 degrees to measure thenext side. Re-zeroing may be necessary if the tile is not square.8.1.6 Repeat steps 8.1.2 8.1.5 until all four sides aremeasured.8.2 Diagonal Warpage:8.2.1 Zero out the device to the reference plane (if needed).8.2.2 Align the device with the face of the tile such that th
26、eplane measured conforms to Section 6.8.2.3 Measure the displacement at the center along thediagonal gauge length (center of the tile), with positive valuesbeing convex and negative values being concave with respectto the face of the tile.8.2.4 Record the results.FIG. 1 Contact Apparatus for Square
27、Tile, Set Up for Measure-ment of 414-by414-in. (108- by 108-mm) TileFIG. 2 Apparatus as Shown in Fig. 1, Showing Arrangement ofStem ExtenderC485 1628.2.5 Rotate the tile or device 90 degrees to measure thenext side. It may be necessary to re-zero to the reference planeon manual devices.8.3 Corner Wa
28、rpage (Optional):8.3.1 Zero out the device to a true, flat plane (if needed).8.3.2 Align the device with the face of the tile such that theplane measured conforms to Section 6.8.3.3 Measure the displacement of the free corner 10 mm infrom each edge, with positive values being convex andnegative valu
29、es being concave with respect to the face of thetile.8.3.4 Record the results.8.3.5 Rotate the tile or apparatus 90 degrees and measurethe next corner. Re-zeroing may be necessary.9. Calculation9.1 Calculate the percentage of warpage as follows:Warpage, % 5 A/B! 3100 (1)9.2 The actual warpage is exp
30、ressed asWarpage, actual 5 A (2)where:A = amount of warpage in inches measured to the nearest0.001 in. (in millimeters to the nearest 0.025 mm), andB = length of the edge or diagonal being measured forwarpage, expressed in inches to the nearest 0.001 in.(expressed in millimeters to the nearest 0.025
31、 mm). Forcorner warpage, use a value of 2.784 in. (70.711 mm)which is the length of the diagonal.10. Report10.1 Report the following information:10.1.1 Nominal size of the tile tested,10.1.2 The category or categories (see 1.1.1 1.1.6) intowhich the tile were placed, and10.1.3 The actual warpage con
32、vex (+) or concave (-) of eachedge, diagonal, and corner (if measured) tested, and10.1.4 The percentage warpage convex (+) or concave (-) ofeach edge, diagonal, and corner (if measured) tested.11. Precision and Bias11.1 A single lab variability study was conducted with anon-contact device. The 15 sa
33、mples used are outlined in theTable 1 below.11.1.1 The average standard deviation of the edge warpageswere found to be 0.11 mm.11.1.2 The average standard deviation of the diagonal war-pages were found to be 0.07 mm.11.1.3 The average standard deviation of the corner war-pages were found to be 0.12
34、mm.12. Keywords12.1 ceramic tile; warpageFIG. 3 Apparatus for Non-contact Measurement (Laser Sensor)TABLE 1 Sample Surfaces Used in Variability StudyDescription Nominal SizeMostly Flat 6 24Textured punch - slight corner down 6 24Smooth Quarry - mostly flat 6 6Textured punch - corners down 13 13Smoot
35、h tile - light corner up 12 12Plank - center up 6 36Average tile with slight variations 12 12At least one corner slightly up 12 12Plank - corners up 9 35Smooth tile - bowed in middle 12 24Plank - slightly bowed in middle 6 36Plank - Large bow in middle 6 36Honed stone - flat 6 36Smooth tile - middle
36、 bow 18 18Steel reference plate - flat 12 12C485 163FIG. 4 Edge and Diagonal Measurement LocationsFIG. 5 Measuring and Plane Locations for Corner WarpageC485 164ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this sta
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39、le technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Co
40、nshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the Copyright Clearance Center, 222Rosewood Drive, Danvers, MA 01923, Tel: (978) 646-2600; http:/ 6 Example of Contact Corner Warpage ApparatusC485 165
