1、Designation:E16100(Reapproved 2010) Designation: E161 12Standard Specification forPrecision Electroformed Sieves1This standard is issued under the fixed designation E161; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of
2、last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This specification covers the requirements for design and construction of electroformed sieves. These sieves are used
3、toperform particle-size distribution analysis and in preparing narrowly designated particle-size fractions. They may also be used asreference standards when suitably calibrated. A method of calibrating these sieves is included in Annex A1.NOTE 1Complete instructions and procedures on the use and cal
4、ibration of testing sieves are contained in ASTM Manual 32.2This publication alsocontains a list of all published ASTM Standards on sieve analysis procedures for specific materials or industries.1.2 The sieve analysis results from two testing sieves of the same sieve designation may not be the same
5、because of thevariances in sieve opening permitted by this specification. To minimize the differences in sieve analysis results, the use of testingsieves matched on a performance basis is suggested.NOTE 2For other types of sieves, see Specifications E11 and E323.1.3 The values stated in SI units sha
6、ll be considered standard for the dimensions of the electroformed mesh openings and thesize of the wires in the electroformed mesh. The values stated in inch-pound units shall be considered standard with regard to thesieve frames.1.4 This standard does not purport to address all of the safety concer
7、ns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatorylimitations prior to use.2. Referenced Documents2.1 ASTM Standards:3C430 Test Method for Fineness of Hydraulic C
8、ement by the 45-m (No. 325) SieveE11 Specification for Woven Wire Test Sieve Cloth and Test SievesE323 Specification for Perforated-Plate Sieves for Testing Purposes Specification for Perforated-Plate Sieves for TestingPurposesE1638 Terminology Relating to Sieves, Sieving Methods, and Screening Medi
9、a2.2 ISO Standard:4ISO 565 Test sievesMetal Wire Cloth, Perforated Plate and Electroformed Sheet-Nominal Aperture Sizes3. Terminology3.1 DefinitionsFor definitions of related terms, refer to Terminology E1638.3.2 Definitions of Terms Specific to This Standard:3.2.1 electroformed material, nelectrode
10、posited grid material consisting of precision openings used as the base material forelectroformed sieves.3.2.2 electroformed sieves, nsee test sieve (electroformed).3.2.3 non-standard frames (electroformed), nsieve frames other than as specified in accordance with Table 2 of SpecificationE161 that m
11、ay be circular, square, rectangular, or non-metal.3.2.3.1 DiscussionThe frame may have the electroformed sheet permanently attached, or it may be designed so theelectroformed sheet is replaceable.1This specification is under the jurisdiction of ASTM Committee E29 on Particle and Spray Characterizati
12、on and is the direct responsibility of Subcommittee E29.01Sieves, Sieving Methods, and Screening Media on Sieves, Sieving Methods, and Screening Media.Current edition approved MayApril 1, 2010.2012. Published July 2010.May 2012. Originally approved in 1960. Last previous edition approved in 20042010
13、 asE161 00 (20104). DOI: 10.1520/E0161-00R10.10.1520/E0161-12.2ASTM Manual 32, Manual on Test Sieving Methods, available from ASTM, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959.3For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at servic
14、eastm.org. For Annual Book of ASTM Standardsvolume information, refer to the standards Document Summary page on the ASTM website.4Available from International Organization for Standardization (ISO), 1, ch. de la Voie-Creuse, Case postale 56, CH-1211, Geneva 20, Switzerland, http:/www.iso.ch.1This do
15、cument is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Becauseit may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions a
16、s appropriate. In all cases only the current versionof the standard as published by ASTM is to be considered the official document.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.3.2.4 support grid, nconductive metal grid mounted to t
17、he sieve sheet.3.2.5 test sieve (electroformed), na sieve manufactured by mounting electroformed material consisting of high precisionopenings in a frame, designed for use in particle size analysis by sieving.4. Ordering Information34.1 Orders for items under this specification include the following
18、 information as necessary:34.1.1 Name of material (Electroformed Sieve),34.1.2 ASTM designation and year of issue (Specification E161 XX),34.1.3 Quantity of each item, and34.1.4 Standard sieve designation (Table 1, Column 1).3.1.5For4.1.5 For testing sieves in standard circular frames:34.1.5.1 Nomin
19、al sieve frame diameter, and34.1.5.2 Nominal sieve frame height.TABLE 1 Nominal Dimensions, Permissible Variations and Limitsfor Precision Electroformed SievesNominalOpening Size,mAToleranceon SieveOpenings,6mLimits,Openings perLinear cmBLimits,Openings perLinear in.Min Max Min Max500 2.0 15.35 16.1
20、4 39 41425 2.0 17.32 18.11 44 46355 2.0 19.29 20.87 49 53300 2.0 22.83 24.41 58 62250 2.0 25.20 26.77 64 68212 2.0 31.89 33.46 81 85180 2.0 35.04 36.61 89 93150 2.0 41.34 46.06 105 117125 2.0 46.06 51.18 117 130106 2.0 47.24 59.06 120 15090 2.0 55.12 78.74 140 20075 2.0 59.06 78.74 150 20063 2.0 66.
21、93 98.43 170 25053 2.0 78.74 110.24 200 28045 2.0 90.55 118.11 230 30038 2.0 98.43 137.80 250 35032 2.0 110.24 157.48 280 40025 2.0 118.11C196.85C300C500C20 2.0 157.48C295.28C400C750C15 2.0 157.48C295.28C400C750C10 2.0 196.85C393.70C500C1000C5 2.0 196.85C590.55C500C1500CAThese nominal size openings
22、are from the preferred number series R40/3 andR10. (Openings on apertures 32 m and less are series R10.) These standarddesignations correspond to the values for test sieve apertures recommended bythe International Standards Organization, Geneva, Switzerland, in ISO 565. Otheropening sizes are not pr
23、ecluded.BThese limits permit at least two adjacent sieves to be formed with the samenumber of openings per cm. The percent open area must in no case be so greatthat the width of metal between openings is less than 13 m.CBecause of their greater durability in routine testing, sieves made close to the
24、minimum limit are normally supplied. Sieves made close to the maximum limit maybe obtained only on special order but are preferable from the standpoint of logicalprogression and better test completion time.TABLE 2 Dimensions of Standard Circular FramesCurrent Nominal Diameter, in.Proposed Revision M
25、ean DiameterComments Typical FrameANominal HeightBInside at TopCOutside on Skirt3 3.000 in. + 0.030/0.000 3.000 in. + 0.000/0.030 1 in. (25.4 mm)(76.20 mm + 0.76/0.00) (76.20 mm + 0.00/0.76)8 8.000 in. + 0.030/0.000 8.000 in. + 0.000/0.030 2 in. (50.8 mm) FHD(203.20 mm + 0.76/0.00) (203.20 mm + 0.00
26、/0.76) 1 in. (25.4 mm) HHE12 12.00 in. + 0.030/0.000 12.00 in. + 0.000/0.030 2 in. (50.8 mm) FH(304.80 mm + 0.76/0.00) (304.80 mm + 0.00/0.76)AOther frame heights are not precluded.BDistance from the top of the frame to the sieve cloth surface.CMeasured 0.2 in. (5 mm) below the top of the frame.DFH
27、= Full height.EHH = Half height.E161 1223.1.6For4.1.6 For sieve cloth not in frames or in non-standard frames:34.1.6.1 Lateral dimension of sieve mesh, and34.1.6.2 Description of non-standard frame.3.1.7For4.1.7 For sieves requiring supporting grid:34.1.7.1 Support grid desired,34.1.7.2 Support grid
28、 mounted up or down, and34.1.8 Compatible sieve pans and covers.4.5. Sieve Sheet Requirements4.1The5.1 The material used in the manufacture of the sieve sheet shall be nickel or a metal suitable for electrodeposition ina firm crystalline structure. The sheet shall have square or round openings with
29、straight uniform sides and smooth, flat surfacesexcept for a slight bevel along the edges of the openings. The thickness of the sheet (exclusive of the supporting grid, see 4.25.2),is governed by the method of manufacture, the size of the openings and the width of material between openings, but in n
30、o caseshall the thickness of material between the openings be less than 10 m (0.0004 in.).4.25.2 If a supporting grid is required for durability, the sieve sheet shall be mounted to the supporting metal grid in such a mannerthat the sheet is firmly bonded to the grid. The supporting grid shall be of
31、 suitable thickness and strand width to provide adequatesupport to the sheet. The sheet shall be mounted on the supporting grid with the openings running in the same direction as thoseof the supporting grid.4.35.3 The finished and mounted sieve sheet from which the sieves are constructed, shall conf
32、orm to the requirements for openingsize and spacing as outlined in Table 1. Extraneous metal formed in or near the corners which does not restrict the passage of aspheroidal particle shall be disregarded. The mean dimension of these openings as defined in Table 1 establishes the designatedsize of th
33、e sieve.NOTE 3In instances where a support grid is required for durability, opening sizes smaller than the allowable tolerances will be observed. This occurswhere the support grid overlaps the sieve openings in such a way as to either block a portion of the opening or to create several smaller openi
34、ngs. Thisis an unavoidable situation and has been determined to have little measurable effect on the sieving open area or sieve performance.45.3.1 There shall be no punctures, missing or deformed areas, or other obvious defects in the sieve sheet.5.6. Test Sieve Frames5.16.1 General RequirementsFram
35、es for precision electroformed sieves shall be made from non-corrosive material such as brassor stainless steel, and constructed in such a manner as to be rigid.5.1.1The6.1.1 The sieve sheet shall be mounted on the frame without distortion, looseness, or waviness.5.1.2To6.1.2 To prevent the material
36、 being sieved from catching in the joint between the sieve sheet and the frame, the jointshall be filled smoothly or constructed so that the material will not be trapped.5.26.2 Standard Circular FramesSieve frames shall be circular, of seamless construction, with nominal diameters of 3, 3.94,7.87, 8
37、, and 12 in. (76.2, 100, 200, 203.2, and 304.8 mm) as may be specified. The dimensions shall conform to the requirementsin Table 2.5.2.1The6.2.1 The bottom of the frames shall be constructed so as to provide an easy sliding fit with any sieve frames of thesame nominal diameter conforming to the spec
38、ified dimensions.5.2.2The6.2.2 The joint or fillet at the connection of the sieve sheet to the frames will provide a minimum clear sieving surfacewith a diameter equal to the nominal diameter less 0.5 in. (13 mm).5.36.3 Non-Standard FramesOther sieve frames may be either square, rectangular, or circ
39、ular.5.3.1The6.3.1 The frame may have the sieve sheet permanently installed or may be designed to permit replacement.NOTE 4Refer to Test Method C430, which contains requirements for 3-in. (76.2-mm) diameter by 3-in. (76.2-mm) high sieves used in the mineralindustries, especially the cement group.5.3
40、.2The provisions of 5.16.3.2 The provisions of 6.1 apply, except that the frames may also be made of other materials.NOTE 5Exercise care to prevent loss of material when using non-standard sieve frames.5.46.4 Pans and CoversPans and covers for use with sieves shall be made so as to nest with the sie
41、ves. Pans with extended rims(stacking skirts) shall be furnished when specified. The pans and covers shall conform to the dimensions in Table 2.6.Product Marking6.1Each sieve shall bear a label marked with the following information:6.1.1This ASTM designation,E161 1236.1.2The nominal size of the open
42、ings in micrometres,6.1.3The mean size in m, and6.1.4The name of the manufacturer or the responsible distributor.7. Product Marking7.1 Each sieve shall bear a label marked with the following information:7.1.1 This ASTM designation,7.1.2 The nominal size of the openings in micrometres,7.1.3 The mean
43、size in m, and7.1.4 The name of the manufacturer or the responsible distributor.8. Keywords78.1 opening; particle size; sieve; sieve analysis; sieve designation; sieve sheet; test sieveANNEXES(Mandatory Information)A1. METHOD OF CALIBRATING PRECISION ELECTROFORMED SIEVESA1.1 The unique manner of for
44、ming the sieve sheet makes it easier and more precise to measure the openings rather than thenominal width of metal between adjacent openings as is frequently done in the case of wire-cloth sieves. In some cases,electrodeposition produces small spurs or bulges of metal which project several m into t
45、he open area in the plane of the sheet,thereby restricting the passage of spheroidal particles which would go through a normally perfect opening.A1.2 Scan the entire area with a wide-angle binocular microscope having a magnifying power of approximately 503 todetermine if the sheet conforms to the sp
46、ecifications given in 4.35.3, and if the edges between the sheet and frame are sealedcompletely.A1.2.1 Most microscopes will accommodate the 76.2-mm (3-in.) sieve on the existing stage without modifications. Amicroscope fitted with a 203 or 403 objective and a filar micrometer eyepiece of 10 or 12.5
47、 power is sufficient for most of thesieves.A1.2.2 Measurements must be sensitive to 0.5 m. Bottom illumination of preferably monochromatic light with essentiallyparallel rays is necessary. It is also a distinct advantage to have vertical illumination through the objective. The magnification ofthe ap
48、paratus, and filar micrometer if used, is determined by means of a calibrated-stage micrometre certified to 60.5 m for the0.01 mm scale divisions and not greater than 60.5 m accumulated error for the complete scale.A1.2.3 Calibration is accomplished by focusing the microscope at the narrowest point
49、of the open area, aligning the cross hairof the micrometer with the edges of the opening, and measuring across the opening to the opposite edge. By turning the micrometerin only one direction any instrument backlash is avoided. Only openings with straight sides (no spurs or bulges projecting morethan 1 m into the opening from the center portion of the side) are measured. The number of openings actually measured and thenumber of openings that would have been measured except for the presence of spurs or bulges are noted. It is recommended
