1、Designation: E1143 05 (Reapproved 2010)Standard Test Method forDetermining the Linearity of a Photovoltaic DeviceParameter with Respect To a Test Parameter1This standard is issued under the fixed designation E1143; the number immediately following the designation indicates the year oforiginal adopti
2、on or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method determines the degree of linearity of aphotovoltaic devic
3、e parameter with respect to a test parameter,for example, short-circuit current with respect to irradiance.1.2 The linearity determined by this test method appliesonly at the time of testing, and implies no past or futureperformance level.1.3 This test method applies only to non-concentrator ter-res
4、trial photovoltaic devices.1.4 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.5 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this
5、 standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E772 Terminology Relating to Solar Energy ConversionE948 Test Method for Electrical Performance of Photovol-taic Cells Us
6、ing Reference Cells Under Simulated SunlightE1036 Test Methods for Electrical Performance of Noncon-centrator Terrestrial Photovoltaic Modules and ArraysUsing Reference CellsE1328 Terminology Relating to Photovoltaic Solar EnergyConversion3. Terminology3.1 DefinitionsFor definitions of terms used in
7、 this testmethod, see Terminologies E772 and E1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 photovoltaic device parametera characteristic of aphotovoltaic device, such as short-circuit current or open-circuit voltage.3.2.2 test parametera characteristic of the test conditionsto which
8、 the photovoltaic device is exposed, such as irradianceor temperature.3.3 Symbols:Meaning SymbolTest parameter XDevice parameter YNumber of data pairs taken nSlope of the linear function mFit to the dataEstimated variance of the slope s24. Summary of Test Method4.1 This test method requires the meas
9、urement of theparameters in question at or near the anticipated deviceoperating conditions. The number of measurements made mustbe sufficient to cover the range of operating conditions ex-pected.4.2 Device electrical parameters shall be measured in ac-cordance with Test Methods E948 or Methods E1036
10、, which-ever is applicable.4.3 A linear function that passes through the origin is fit tothe data, and the deviation of these data from the function isused as the criterion for determining linearity.5. Significance and Use5.1 This test method is used to evaluate the applicability ofother ASTM test m
11、ethods to a photovoltaic device.5.2 The procedure described in this test method is intendedto be used to determine the degree of linearity between theshort-circuit current of a photovoltaic device and the irradiancelevel incident on the device. This test method can be used forother device parameters
12、, provided the function passes throughthe origin.6. Procedure6.1 Measure the device parameter for at least five values ofthe test parameter. Choose the values of the test parameter suchthat they span the expected operating range in approximately1This test method is under the jurisdiction of ASTM Com
13、mittee E44 on Solar,Geothermal and Other Alternative Energy Sources and is the direct responsibility ofSubcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved June 1, 2010. Published September 2010. Originallyapproved in 1987. Last previous edition approved in 2005 as
14、E1143-05. DOI:10.1520/E1143-05R10.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM Internation
15、al, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.equal intervals. For determining the linearity of short-circuitcurrent with respect to irradiance, use four equally spacedirradiance intervals over the range of approximately 750 to1100 W/m2.6.1.1 All applicable
16、electrical measurements must be per-formed in accordance with Test Methods E948 or MethodsE1036, whichever is applicable.7. Calculation37.1 The slope, m, of the linear function is calculated usingthe following equation:m 5(i 5 1nXiYi/(i 5 1nXi2(1)7.2 The estimated variance of the slope is given as f
17、ollows:s25(i 5 1nYi2 mXi!2/n 2 1!(i 5 1nXi2(2)7.3 Device electrical parameters may be considered linearwith respect to the test parameter if the criterion is met asfollows:s/m #| 0.027.3.1 For other device parameters, other criteria may need tobe defined.8. Precision and Bias8.1 The precision and bi
18、as of this test method is limited bythe precision and bias of the parameter measurements. Esti-mates of the precision and bias of these electrical measure-ments are given in Test Methods E948 and Methods E1036.8.2 The limit on s/m of 2 % will limit any electric currentmeasurement error due to a nonl
19、inear current versus irradiancerelationship to 2 %.9. Keywords9.1 linearity; photovoltaic device; photovoltaics; testingASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are express
20、ly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised,
21、either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may att
22、end. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States.
23、Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the ASTM website (www.astm.org/COPYRIGHT/).3Natrella, Mary, “Characterizing Linear Relationships Between Two Variables,”NBS Handbook, Vol 91, 1966.E1143 05 (2010)2
