1、Designation: E 1171 04Standard Test Methods forPhotovoltaic Modules in Cyclic Temperature and HumidityEnvironments1This standard is issued under the fixed designation E 1171; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year
2、 of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods provide procedures for stressingphotovoltaic modules in simulated temperature and humidityenvi
3、ronments. Environmental testing is used to simulate agingof module materials on an accelerated basis.1.2 Three individual environmental test procedures are de-fined by these test methods: a thermal cycling procedure, ahumidity-freeze cycling procedure, and an extended durationdamp heat procedure. El
4、ectrical biasing is utilized during thethermal cycling procedure to simulate stresses that are knownto occur in field-deployed modules.1.3 These test methods define mounting methods for mod-ules undergoing environmental testing, and specify parametersthat must be recorded and reported.1.4 These test
5、 methods do not establish pass or fail levels.The determination of acceptable or unacceptable results isbeyond the scope of these test methods.1.5 Any of the individual environmental tests may beperformed singly, or may be combined into a test sequencewith other environmental or non-environmental te
6、sts, or both.Certain pre-conditioning tests such as annealing or lightsoaking may also be necessary or desirable as part of such asequence. The determination of any such sequencing andpre-conditioning is beyond the scope of this test method.1.6 These test procedures are limited in duration and there
7、-fore the results of these tests cannot be used to determinephotovoltaic module lifetimes.1.7 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practic
8、es and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E 772 Terminology Relating to Solar Energy ConversionE 1036 Methods of Testing Electrical Performance of Non-concentrator Terrestrial Photovoltaic Modules and ArraysUsing Reference C
9、ellsE 1328 Terminology Relating to Photovoltaic Solar EnergyConversionE 1462 Test Methods for Insulation Integrity and GroundPath Continuity of Photovoltaic ModulesE 1799 Practice for Visual Inspections of PhotovoltaicModules3. Terminology3.1 DefinitionsDefinitions of terms used in this standardmay
10、be found in Terminology E 772 and in TerminologyE 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 module ground pointthe terminal or lead identifiedby the manufacturer as the grounding point of the module.4. Significance and Use4.1 The useful life of photovoltaic modules may depend ont
11、heir ability to withstand repeated temperature cycling withvarying amounts of moisture in the air. These test methodsprovide procedures for simulating the effects of cyclic tem-perature and humidity environments. An extended durationdamp heat procedure is provided to simulate the effects of longterm
12、 exposure to high humidity.4.2 MountingTest modules are mounted so that they areelectrically isolated from each other, and in such a manner toallow free air circulation around the front and back surfaces ofthe modules.4.3 Current Biasing:1These test methods are under the jurisdiction of ASTM Committ
13、ee E44 onSolar, Geothermal, and Other Alternative Energy Sources and is the directresponsibility of Subcommittee E44.09 on Photovoltaic Electrical Power Conver-sion.Current edition approved March 1, 2004. Published April 2004. Originallyapproved in 1996. Last previous edition approved in 2001 as E 1
14、17101.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandardsvolume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO
15、 Box C700, West Conshohocken, PA 19428-2959, United States.4.3.1 During the thermal cycling procedure, test modulesare operated without illumination and with a forward-biascurrent equal to the maximum power point current at standardreporting conditions (SRC, see Test Methods E 1036) flowingthrough t
16、he module circuitry.4.3.2 The current biasing is intended to stress the moduleinterconnections and solder bonds in ways similar to those thatare believed to be responsible for fill-factor degradation infield-deployed modules.4.4 Effects of Test ProceduresData generated using thesetest methods may be
17、 used to evaluate and compare the effectsof simulated environment on test specimens. These test meth-ods require determination of both visible effects and electricalperformance effects.4.4.1 Effects on modules may vary from none to significantchanges. Some physical changes in the module may be visib
18、lewhen there are no apparent electrical changes in the module.Similarly, electrical changes may occur with no visible changesin the module.4.4.2 All conditions of measurement, effects of cycling, andany deviations from this test method must be described in thereport so that an assessment of their si
19、gnificance can be made.4.5 SequencingIf these test methods are performed as partof a combined sequence with other environmental or non-environmental tests, the results of the final electrical tests (6.2)and visual inspection (6.3) determined at the end of one testmay be used as the initial electrica
20、l tests and visual inspectionfor the next test; duplication of these tests is not necessaryunless so specified.5. Apparatus5.1 In addition to the apparatus required for Test MethodsE 1036 and E 1462 the following apparatus is required.5.2 Environmental Chamber(s)Achamber or chambers inwhich modules
21、are mounted during the environmental tests.5.2.1 Air temperature throughout the working volume shallbe within 62C of that specified.5.2.2 Relative humidity shall be controlled within 65%ofthat specified. For temperatures below 80C, relative humiditycontrol is not required.5.2.3 Provisions for monito
22、ring and recording the chambertemperature and relative humidity throughout the environmen-tal testing shall be provided.5.3 Temperature Measurement EquipmentAn instrumentor instruments used to measure module temperature during theenvironmental testing with a resolution of at least 0.1C, and atotal e
23、rror of less than 62C of reading.5.3.1 Temperature sensors suitable for the test temperaturerange, such as thermocouples or thermistors, shall be attachedto the portions of the modules likely to exhibit the longestthermal time constant. For flat-plate modules, attach thesensors near the middle of th
24、e front or back surfaces of themodules.5.3.2 If more than one module of identical design andconstruction is tested simultaneously, it is not necessary tomonitor the temperature of all identical modules.5.4 Test FrameAframe inside the environmental chamberwhich supports the test modules during the te
25、st procedures.5.4.1 It is not required to mount the test modules at an anglesuch as when modules are installed as part of an array; theymay be mounted vertically to facilitate testing multiple mod-ules inside the environmental chamber.5.4.2 The test modules shall be mounted in a manner thatallows fr
26、ee air circulation around the modules.5.4.3 The test frame should be constructed such that corro-sion of the test frame during the environmental testing does notadversely affect the test modules.5.5 Current-Biasing Power SupplyA dc power supplycapable of operating a test module at a point on the dar
27、kforward current-voltage curve equal to the maximum powercurrent at SRC during the thermal cycling procedure.5.5.1 Provisions must be made for removing the current biaswhen the module temperature is less than 20C.5.5.2 The current biasing power supply should be capable ofsetting a voltage compliance
28、 limit equal to 1.25 times theopen-circuit voltage at SRC to prevent over-voltage operationof the test modules at high temperatures.6. Procedure6.1 Sample Selection and Test SequenceAlthough thetemperature cycling, humidity-freeze cycling, and damp heatprocedures may be performed individually, the r
29、equirements ofany test sequence (see 1.5 and 4.5) may determine the order inwhich the environmental tests are performed, and also mayimpose restrictions on which test modules are to be subjectedto individual procedures. The sequencing may also specifywhen modules undergo electrical testing (see 6.2)
30、 and visualinspections (see 6.3).6.1.1 A typical combined thermal and humidity-freeze cy-cling sequence is illustrated in Fig. 1.6.2 Electrical TestsPerform the following electrical testsbefore and after each of the test procedures.6.2.1 Electrical PerformanceMeasure and record theelectrical perform
31、ance of each module. A suitable method fornonconcentrator modules is Test Methods E 1036.FIG. 1 Typical Environmental Test SequenceE11710426.2.2 Ground Path ContinuityTest any module with agrounding terminal identified by the module manufacturer todetermine the maximum resistance between the groundi
32、ngterminal or lead and any accessible conductive part using theground path continuity test of Test Methods E 1462.6.2.3 Dielectric Voltage WithstandSubject each module toa test of the dielectric voltage withstand test of Test MethodsE 1462.6.2.3.1 The test voltage shall be equivalent to twice thespe
33、cified maximum system voltage (typically open-circuitvoltage at 0C cell temperature) plus 1000 V. If the maximumsystem voltage is less than 30 V, employ a dc test voltage of500 V.6.3 Visual InspectionVisually inspect each module beforeand after each of the environmental test procedures to deter-mine
34、 the presence or absence of anomalies or defects accordingto Practice E 1799.6.4 InstrumentationAttach one or more temperature sen-sors to the exterior of the module following the requirements of5.3.6.5 Thermal Cycling Procedure:6.5.1 Mount the test modules inside the environmentalchamber according
35、to the requirements of 5.4.6.5.2 Connect the test modules to the current-biasing powersupply and verify that the biasing is interrupted when themodule temperature is less than 20C.6.5.3 Subject the module to a 40C to +85C thermalcycling test in accordance with the profile shown in Fig. 2 andthe foll
36、owing requirements.6.5.3.1 The temperature shall vary approximately linearlywith time at a rate not exceeding 100C/h and with a period notgreater than 6 h per cycle (from ambient to 40C to +85C toambient).6.5.3.2 Because the current biasing will dissipate heat in thetest module, the temperature prof
37、ile of the environmentalchamber may need to be adjusted to prevent exceeding themaximum module temperature of Fig. 2.6.5.3.3 Relative humidity in the chamber shall not exceed50 % when temperatures are above 25C.6.5.3.4 Minimum holding time at the temperature extremesshall be 0.5 h.6.5.4 Continue the
38、 thermal cycling until the required num-ber of cycles is completed.6.5.4.1 The temperature cycling may be interrupted and thechamber be opened for optional visual or electrical retest, orboth, during the time the module temperature is at 25 6 5C.Such interruptions are typically done at 50-cycle inte
39、rvals.6.5.5 Disconnect the current-biasing power supply and re-move the modules from the environmental chamber.6.6 Humidity-Freeze Cycle Procedure:6.6.1 Mount the test modules inside the environmentalchamber according to the requirements of 5.4.6.6.2 Subject the modules to a humidity-freeze cycling
40、testin accordance with the profile shown in Fig. 3.6.6.3 Continue the humidity-freeze cycling until the re-quired number of cycles is completed.6.6.4 Remove the modules from he environmental chamber.6.7 Damp Heat Exposure Procedure:6.7.1 Mount the test modules inside the environmentalchamber accordi
41、ng to the requirements of 5.4.6.7.2 Raise the chamber air temperature to 85 6 2C andthe relative humidity to 85 6 5%.6.7.3 Continue the exposure for a total of 1000 h.6.7.4 Remove the modules from the environmental cham-ber.6.7.5 Perform the post-exposure dielectric voltage with-stand test (see 6.2.
42、3) within 3 6 1 h after the modules areremoved from the chamber. To satisfy this requirement, theexposure duration may be increased by a maximum of 60 h.7. Report7.1 In addition to the reporting requirements of Test Meth-ods E 1036 and E 1462, and Practice E 1799, report as aminimum the following da
43、ta and information:7.1.1 Module manufacturer and complete test specimenidentification.7.1.2 Description of module construction.7.1.3 Aline drawing or photograph of the modules showingthe orientation during exposure and the location of temperaturesensors.7.1.4 Description of electrical measurement eq
44、uipment (in-cluding continuity and insulation integrity apparatus), andmeasurement conditions or parameters.FIG. 2 One Thermal Cycle FIG. 3 One Humidity-Freeze CycleE11710437.1.5 A brief description of the chamber used, the exactnumber of cycles performed, and the number of hours of dampheat exposur
45、e.7.1.6 Any deviations from this test method such as inter-ruptions in the test cycle.7.1.7 Any interruptions in the current biasing during ther-mal cycling caused by open circuits in the module circuitry.8. Precision and Bias8.1 The environmental exposures described by this testmethod do not produc
46、e numeric results that would be subject toASTM procedures for evaluating the precision and bias of thistest method. However, the precision and bias of the electricalperformance measurements, when performed in accordancewith Test Methods E 1036 and E 1462, are subject to theprovisions of those test m
47、ethods.9. Keywords9.1 damp heat exposure; environmental testing; humidity-freeze cycling; modules; photovoltaics; solar energy; thermalcyclingASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of thi
48、s standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five yea
49、rs andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Driv
