1、Designation: E973 10 (Reapproved 2015)Standard Test Method forDetermination of the Spectral Mismatch Parameter Betweena Photovoltaic Device and a Photovoltaic Reference Cell1This standard is issued under the fixed designation E973; the number immediately following the designation indicates the year
2、oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers a procedure for the determina-tio
3、n of a spectral mismatch parameter used in performancetesting of photovoltaic devices.1.2 The spectral mismatch parameter is a measure of theerror, introduced in the testing of a photovoltaic device, causedby mismatch between the spectral responses of the photovol-taic device and the photovoltaic re
4、ference cell, as well asmismatch between the test light source and the referencespectral irradiance distribution to which the photovoltaic ref-erence cell was calibrated. Examples of reference spectralirradiance distributions are Tables E490 or G173.1.3 The spectral mismatch parameter can be used to
5、 correctphotovoltaic performance data for spectral mismatch error.1.4 This test method is intended for use with linear photo-voltaic devices.1.5 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.6 This standard does not purport
6、to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E490 St
7、andard Solar Constant and Zero Air Mass SolarSpectral Irradiance TablesE772 Terminology of Solar Energy ConversionE948 Test Method for Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated Sun-lightE1021 Test Method for Spectral Responsivity Measurementsof Photovoltaic
8、DevicesE1036 Test Methods for Electrical Performance of Noncon-centrator Terrestrial Photovoltaic Modules and ArraysUsing Reference CellsE1039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells UnderGlobal Irradiation (Withdrawn 2004)3E1125 Test Method for C
9、alibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Us-ing a Tabular SpectrumE1328 Terminology Relating to Photovoltaic Solar EnergyConversion (Withdrawn 2012)3E1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsG138 Test Method for
10、Calibration of a SpectroradiometerUsing a Standard Source of IrradianceG173 Tables for Reference Solar Spectral Irradiances: DirectNormal and Hemispherical on 37 Tilted SurfaceSI10 Standard for Use of the International System of Units(SI): The Modern Metric System3. Terminology3.1 DefinitionsDefinit
11、ions of terms used in this testmethod may be found in Terminology E772 and TerminologyE1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 test light source, na source of illumination whosespectral irradiance will be used for the spectral mismatchcalculation.3.3 SymbolsThe following symbol
12、s and units are used inthis test method:Mspectral mismatch parameter,measurement error in short-circuit current,wavelength, m or nm,Rr()spectral response of reference cell, AW1,Rt()spectral response of photovoltaic device, AW1,1This test method is under the jurisdiction of ASTM Committee E44 on Sola
13、r,Geothermal and OtherAlternative Energy Sources and is the direct responsibility ofSubcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved March 1, 2015. Published April 2015. Originallyapproved in 1983. Last previous edition approved in 2010 as E973 10. DOI:10.1520/E
14、0973-10R15.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3The last approved version of this historical stan
15、dard is referenced onwww.astm.org.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States1Eirradiance, Wm2,E ()spectral irradiance, Wm2m1or Wm2nm1,andEo()reference spectral irradiance, Wm2m1orWm2nm1.NOTE 1Following normal SI rules for compoun
16、d units (see PracticeSI10), the units for spectral irradiance, the derivative of irradiance withrespect to wavelength dE/d(), would be Wm3. However, to avoidpossible confusion with a volumetric power density unit and for conve-nience in numerical calculations, it is common practice to separate thewa
17、velength in the compound unit. This compound unit is also used inTables G173 .4. Summary of Test Method4.1 Determination of the spectral mismatch parameter Mrequires the spectral response characteristics of the photovol-taic device and the spectral irradiance distribution of the testlight source, al
18、ong with the spectral response and the referencespectral irradiance distribution used for the reference cellcalibration.4.2 Because all four spectral quantities appear in both thenumerator and the denominator in the calculation of thespectral mismatch parameter (see 8.1), multiplicative calibra-tion
19、 errors cancel, and therefore only relative quantities areneeded, although absolute spectral quantities may be used ifavailable.5. Significance and Use5.1 The calculated error in the photovoltaic device currentdetermined from the spectral mismatch parameter can be usedto determine if a measurement w
20、ill be within specified limitsbefore the actual measurement is performed.5.2 The spectral mismatch parameter also provides a meansof correcting the error in the measured device current due tospectral mismatch.5.2.1 The spectral mismatch parameter is formulated as thefractional error in the short-cir
21、cuit current due to spectraldifferences.4,55.2.2 Error due to spectral mismatch can be corrected bydividing the measured photovoltaic cell current by M,aprocedure used in Test Methods E948 and E1036.6. Apparatus6.1 In addition to the apparatus required by Test MethodsE1021, the following apparatus i
22、s required.6.1.1 Spectral Irradiance Measurement InstrumentAspectroradiometer, defined in Test Method G138, calibratedaccording to Test Method G138.6.1.1.1 The wavelength resolution shall be no greater than10 nm.6.1.1.2 The wavelength pass-bandwidth shall be no greaterthan 6 nm.6.1.1.3 The wavelengt
23、h range shall be wide enough toinclude the spectral response of the photovoltaic device and thephotovoltaic reference cell.6.1.1.4 The spectral irradiance measurement instrumentmust be able to scan the required wavelength range in a timeperiod short enough such that the spectral irradiance at anywav
24、elength does not vary more than6 5 % during the entirescan.7. Procedure7.1 Determine the spectral response Rt() of the photovol-taic device using Test Methods E1021.7.2 Obtain the spectral response Rr() of the photovoltaicreference cell.NOTE 2Test Methods E1039, E1125, and E1362 require the spectral
25、response to be provided as part of the reference cell calibration certificate.7.3 Measure the spectral irradiance E() of the test lightsource, using the spectral irradiance measurement instrument(see 6.1.1).7.4 Obtain the reference spectral irradiance distributionEo() that corresponds to the calibra
26、tion of the photovoltaicreference cell, such as Tables E490 or G173.8. Calculation of Results8.1 Calculate the spectral mismatch parameter with:4,5M 5*21E!Rt!d*43E!Rr!d3*43Eo!Rr!d*21Eo!Rt!d(1)using a suitable numerical integration scheme such as thosedescribed in Tables G173.8.1.1 The wavelength int
27、egration limits 1 and 2 shallcorrespond to the spectral response limits of the photovoltaicdevice.8.1.2 The wavelength integration limits 3 and 4 shallcorrespond to the spectral response limits of the photovoltaicreference cell.8.2 Calculate the measurement error due to spectral mis-match using: 5?M
28、 2 1?(2)9. Precision and Bias9.1 PrecisionImprecision in the spectral irradiance andthe spectral response measurements will introduce errors in thecalculated spectral mismatch parameter.9.1.1 It is not practicable to specify the precision of thespectral mismatch test method using results of an inter
29、labora-tory study, because such a study would require circulating atleast six stable test light sources between all participatinglaboratories.4Seaman, C., “Calibration of Solar Cells by the Reference Cell MethodTheSpectral Mismatch Problem,” Solar Energy, Vol 29, 1982, pp. 291298.5Osterwald, C. R.,
30、“Translation of Device Performance Measurements toReference Conditions,” Solar Cells, Vol 18, 1986, pp. 269279.TABLE 1 Estimated Limits of Imprecision in SpectralMeasurementsSource of Imprecision Estimated Limit, %Spectral response measurement 2.0Spectral irradiance measurement 5.0E973 10 (2015)29.1
31、.2 Monte-Carlo perturbation simulations6using precisionerrors as large as 5 % in the spectral measurements have shownthat the imprecision associated with the calculated spectralmismatch parameter is no more than 1 %.9.1.3 Table 1 lists estimated maximum limits of imprecisionthat may be associated wi
32、th spectral measurements at any onewavelength.9.2 BiasBias associated with the spectral measurementsused in the spectral mismatch calculation can be either inde-pendent of wavelength or can vary with wavelength.9.2.1 Numerical calculations using wavelength-independentbias errors of 2 % added to the
33、spectral quantities show theerror introduced in the spectral mismatch parameter to be lessthan 1 %.9.2.2 Estimates of maximum bias that may be associatedwith the spectral measurements are listed in Table 2. Theselimits are listed for guidance only and in actual practice willdepend on the calibration
34、 of the spectral measurements.10. Keywords10.1 cell; mismatch; photovoltaic; reference; solar; spectral;testingASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advise
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37、ou feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individua
38、l reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from
39、the Copyright Clearance Center, 222Rosewood Drive, Danvers, MA 01923, Tel: (978) 646-2600; http:/ K. A., Osterwald, C. R., and Wells, C. V., “Uncertainty Analysis ofPhotovoltaic Efficiency Measurements,” Proceedings of the 19th IEEE Photovolta-ics Specialists Conference1987, pp. 153159, Institute of Electrical and Electron-ics Engineers, New York, NY, 1987.TABLE 2 Estimated Limits of Bias in Spectral MeasurementsSource of Bias Estimated Limit, %Spectral response measurement 3.0Spectral irradiance measurement 5.0E973 10 (2015)3