1、BRITISH STANDARD BS9940-01.01: 1983 IEC115-2-1: 1982 QC400101: 1982 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed resistors for use in electronic equipment Fixed low power non-wirewound resistors Assessment levelEBS9940-01.01:198
2、3 BSI12-1999 ISBN 0 580 54151 8 Amendments issued since publication Amd. No. Date CommentsBS9940-01.01:1983 BSI 12-1999 i Contents Page National foreword Inside front cover Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting 3 1.2 Dimensions, ratings and characteristics 3 1.
3、3 Related documents 3 1.4 Marking 3 1.5 Ordering information 3 1.6 Certified records of released lots 4 1.7 Additional information (not for inspection purposes) 4 1.8 Increased severities or requirements which are additional tothosespecifiedin the generic and/or sectional specification 4 Section 2.
4、Inspection requirements 2.1 Procedures 4 Table I 3 Table II 4BS9940-01.01:1983 ii BSI 12-1999 National foreword This Part of this BritishStandard has been prepared under the direction of theElectronic Components Standards Committee. It is identical with IECPublication115-2-1 (QC40101): “Fixed resist
5、ors for use in electronic equipment. Blank detail specification: Fixed low power non-wirewound resistors. Assessment level E” published by the InternationalElectrotechnical Committee (IEC). This standard is a harmonized specification within the IECQ system of quality assessment for electronic compon
6、ents. Terminology and conventions. The text of the InternationalStandard has been approved as suitable for publication as a BritishStandard without deviation. Some terminology and certain conventions are not identical with those used in BritishStandards. Cross-references. The BritishStandard harmoni
7、zed with QC001001 and QC001002 is BS9000 “General requirements for a system for electronic components of assessed quality” Part1:1981 Specification of basic rules and procedures. In adopting the IEC text as a national standard it has been noted that there is an omission from boxes2 and4 of the speci
8、fication number in the IEC quality Assessment System for Electronic Components (IECQ). This has been drawn to the attention of the IECTC40 Secretariat and the specification number has been inserted where necessary in this standard. Scope. This standard lists the ratings, characteristics and inspecti
9、on requirements which shall be included as mandatory requirements in accordance with BS9940-01. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS9000, the latter shall take precedence except that the front page layout will b
10、e in accordance with BS9000 Circular Letter No15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obli
11、gations. InternationalStandard Corresponding BritishStandard IEC63:1963 BS2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment (Technically equivalent) IEC115-1:1982 (QC400000:1982) BS9940: Fixed resistors for use i
12、n electronic equipment Part0:1983 Generic specification (Identical) IEC115-2:1982 (QC400100:1982) BS9940: Fixed resistors for use in electronic equipment Part01:1983 Sectional specification: Fixed low power non-wirewound resistors (Identical) IEC410:1973 BS6001:1972 Sampling procedures and tables fo
13、r inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, pages1 to8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the am
14、endment table on the inside front cover.BS9940-01.01:1983 BSI 12-1999 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail
15、Specifications not complying with these requirements shall not be considered as being in accordance with IEC Specifications nor shall they be so described. In the preparation of detail specifications the content of Sub-clause1.4 of the sectional specification shall be taken into account. The numbers
16、 between brackets on page 2 correspond to the following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “InternationalElectrotechnicalCommission” or the National Standards Organization under whose authority the detail specification is d
17、rafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the
18、 resistor 5 A short description of the type of resistor. 6 Information on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimens
19、ions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessmen
20、t level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the
21、 most important properties, to allow comparison between the various resistor types.BS9940-01.01:1983 2 BSI 12-1999 1 IEC115-2-1-XXX (QC400101-XXX) 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC115-2-1 (QC400101) 4 3 FIXED LOW-POWER NON-WIREWOUND RESISTORS 5 Outline drawing: (see
22、Table I) (First angle projection) 7 Insulated/non-insulated 6 Assessment level(s):E 8 (Other shapes are permitted within the dimensions given) Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 9BS9940-01.01:1983 BSI 12-1999
23、3 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (SeeSub-clause1.4.2 of IEC Publication115-2.) 1.2 Dimensions, ratings and characteristics Table I 1.2.1 Derating Resistors covered by this specification are derated according to the following curve: (A suitable curve to
24、 be included in the detail specification) NOTESeealso Sub-clause2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the component and package shall be in accordance with the requirements of IECPublication115-1, Sub-clause2.4. NOTEThe details of the marking of the c
25、omponent and package shall be given in full in the detail specification. 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated resistance. Style Rated dissipation at70 C (W) Temperature coeffi
26、cient or temperaturecharacteristic (as applicable) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V d.c. or a.c. peak) Maximum dimensions d nom. : Tol.: L D All dimensions are in millimetres or inches and millimetres. Resistance range a . . . to. . . Tolerances on rated resistan
27、ce . . . . .% Climatic category / Low air pressure 8.5kPa(85mbar) Stability class . . .% Limits for change of resistance: for long-term tests (. . .%R +. . .7) for short-term tests (. . .%R +. . .7) Temperature characteristic of resistance (20 C to upper category temperature) for carbon composition
28、types . . .% Temperature coefficient : . . .10 6 / C (for all other resistors) a The preferred values are those of the E-series of IEC Publication63: Preferred Number Series for Resistors and Capacitors. Generic Specification: IEC Publication115-1:1982: Fixed Resistors for Use in Electronic Equipmen
29、t, Part1: Generic Specification. Sectional Specification: IEC Publication115-2:1982: Part 2: Sectional Specification: Fixed Low-power Non-wirewound Resistors.BS9940-01.01:1983 4 BSI 12-1999 b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style r
30、eference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Increased severities or requirements which are additional to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements shou
31、ld be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedure shall be in accordance with the Sectional Specification, IEC Publication115-2, Sub-clause3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) i
32、ncludes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification. NOTEWhen drying is called for, ProcedureI of Sub-clause4.3 of the Generic Specification, IEC Publication115-1, shall be used. Table II NOTE 1Sub-
33、clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication115-1, except for resistance change requirements, which have to be selected from Table I and Table II of the sectional specification, asappropriate. NOTE 2Inspection Levels and AQLs are selected fr
34、om IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p =periodicity (in months) n =sample size c =acceptance criterion (permitted number of defectives) D =destructive ND =non-destructive IL =inspection level IEC Publication410 AQL =acceptable qualit
35、y level Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote1) (seeNote2) Group A Inspection (lot-by-lot) Sub-group A1 ND S-4 1.0% 4.4.1 Visual examination As in4.4.1. Legible marking and as specified in1.4 of this specification Sub-gro
36、up A2 ND S-4 1.0% 4.4.2 Dimensions A gauge-plate of.mm shall be used As specified in Table I of this specification (gauging) 4.5 Resistance As in4.5.2 Group B Inspection (lot-by-lot) Sub-groupB1 ND S-3 1.0% 4.7 Voltage proof (insulated resistors only) Method:. . . No breakdown or flashover BS9940-01
37、.01:1983 BSI 12-1999 5Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) IL AQL Performance requirements (seeNote1) (seeNote2) Sub-group B2 D S-3 2.5% 4.17 4.13 Solderability Overload Without ageing Method:. . . Good tinning as evidenced by free flowing of the solde
38、r with wetting of the terminations or solder shall flow within.s, as applicable Test aduration Rated adissipation The applied voltage shall be2.5times the rated voltage or twice the limiting element voltage, whichever is the less severe Visual examination Resistance No visible damage Legible marking
39、 %Ru (. . .%R+. . .7) Sub-group B3 ND 4.8.4.2 Temperature coefficient of resistance This test is applicable only when a temperature coefficient of resistance of less than50.10 6 / C is claimed. One cycle of20 C to70 C to20 C only :. . .10 6 / C a SeeSub-clause2.3.4 of the sectional specification.BS9
40、940-01.01:1983 6 BSI 12-1999Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Group C Inspection (periodic) Sub-group C1A Half of the sample of Sub-groupC1 D 3 10 4.16 4
41、.18 Robustness of terminations Resistance to soldering heat Tensile, bending and torsion tests as applicable Visual examination Resistance Method:. . . Visual examination Resistance No visible damage %Ru (. . .%R+.7) No visible damage Legible marking %Ru (. . .%R+.7) Sub-group C1B Other half of the
42、sample of Sub-groupC1 D 3 10 4.19 Rapid change of temperature A=Lower category, temperature 4.22 Vibration B=Upper category temperature Visual examination Resistance Method of mounting: see1.1 of this specification Procedure: B4 Frequency range:10Hz to500Hz Amplitude:0.75mm or acceleration98m/s 2(wh
43、ichever is the less severe) Total duration:6h Visual examination Resistance No visible damage %Ru (. . .%R+. . .7) No visible damage %Ru (. . .%R+. . .7)BS9940-01.01:1983 BSI 12-1999 7Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1) Sample size and criterion of ac
44、ceptability (seeNote3) Performance requirements (seeNote1) p n c Sub-group C1 D 3 20 1 Combined sample of specimens of Sub-groupsC1A andC1B 4.23 Climatic sequence Dry heat Damp heat, cyclic, TestDb, first cycle Cold Low air pressure Damp heat, cyclic, TestDb, remaining cycles D.C. load 8.5kPa(85mbar
45、) Visual examination Resistance Insulation resistance (Insulated resistors only) No visible damage Legible marking %Ru (. . .%R +. . .7) RW 100M7 Sub-group C2 D 3 20 1 4.25.1 Enduranceat70 C Duration:1000h Examination at48h,500h and1000h: Visual examination Resistance Examination at1000h: Insulation
46、 resistance (Insulated resistors only) No visible damage %Ru (. . .%R +. . .7) RW 1G7 If required by the detail specification, the test shall be extended to8000h Examination at2000h,4000h and8000h: Resistance 12 20 %Ru (. . .%R +. . .7) (The results obtained are for information only) Sub-group C3 ND
47、 3 20 1 4.8 Variation of resistance with temperature Lower category temperature/20 C 20 C/upper category temperatureu . . . % or :. . .10 6 / Cu . . . % or :. . .10 6 / C %R R - %R R -BS9940-01.01:1983 8 BSI 12-1999Table II Sub-clause number and Test (seeNote1) D or ND Conditions of test (seeNote1)
48、Sample size and criterion of acceptability (seeNote3) Performance requirements (seeNote1) p n c Group D Inspection (periodic) Sub-groupD1 D 12 20 1 4.24 Damp heat, steady state 1) Sub-clause4.24.2.1 1st group6 specimens 2nd group7 specimens 3rd group7specimens 2) Sub-clause4.24.2.2 1st group10specim
49、ens 2nd group10specimens Visual examination Resistance Insulation resistance (Insulated resistors only) No visible damage Legible marking %Ru (. . .%R+. . .7) RW 100M7 Sub-group D2 D 36 20 1 4.4.3 4.25.3 Dimensions (detail) Endurance at upper category temperature Duration:1000h Examination at48h,500h and1000h: Visual examination Resistance Examination at1000h: Insulation resistance (Insulated resistors only) As specified in Table I
