1、BRITISH STANDARD BS CECC 42200:1988 Harmonized system of quality assessment for electronic components Sectional specification: Surge suppression varistors UDC 621.38:621.315.592:621.3.015.3BSCECC42200:1988 This British Standard, having been prepared under the directionof the Electronic Components St
2、andards Committee, was published underthe authority of the BoardofBSI and comes intoeffecton 30September1988 BSI 10-1999 The following BSI references relate to the work on this standard: Committee reference ECL/4 Draft for comment 81/28139 DC ISBN 0 580 16847 6 Committees responsible for this Britis
3、h Standard The preparation of this British Standard was entrusted by the Electronic Components Standards Committee ( ECL/-) to Technical Committee ECL/4, upon which the following bodies were represented: British Telecommunications plc Electronic Components Industry Federation Electronic Engineering
4、Association Ministry of Defence National Supervising Inspectorate Society of British Aerospace Companies Ltd. Telecommunication Engineering and Manufacturing Association (TEMA) The following body was also represented in the drafting of the standard, through subcommittees and panels: BEAMA Ltd. Amend
5、ments issued since publication Amd. No. Date of issue CommentsBSCECC42200:1988 BSI 10-1999 i Contents Page Committees responsible Inside front cover National foreword ii Foreword iii Text of CECC 42200 1 Publications referred to Inside back coverBSCECC42200:1988 ii BSI 10-1999 National foreword This
6、 British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)42200:1986 “Harmonized system of quality assessment for electronic components. Sectional specification: Surge suppression varis
7、tors”. This standard is a harmonized specification within the CECC system. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used
8、 in British Standards; attention is drawn especially to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC00100 is B
9、S9000 “General requirements for a system for electronic components of assessed quality” Part 2: “Specification for national implementation of CECC basic rules and rules of procedure”. International Standard Corresponding British Standard CECC 42000:1978 BS CECC 42000:1978 Harmonized system of qualit
10、y assessment for electronic components: Generic specification: Varistors (Identical) a ISO 3:1973 BS 2045:1965 Preferred numbers (Technically equivalent) BS 2011 Basic environmental test procedures b IEC 68-1:1982 Part 1.1:1983 General and guidance (Identical) Part 2.1 Tests IEC 68-2-1:1974 Test A:
11、1977 Cold (Identical) IEC 68-2-2:1974 Tests B: 1977 Dry heat (Identical) IEC 68-2-3:1969 Test Ca: 1977 Damp heat, steady state (Identical) IEC 68-2-20:1979 Test T: 1981 Soldering (Identical) IEC 68-2-27:1987 Test Ea: 1988 Shock (Identical) IEC 68-2-29:1987 Test Eb: 1987 Bump (Identical) IEC 695-2-2:
12、1980 BS 6458 Fire hazard testing for electrotechnical products Part 2 Methods of test Section 2.2:1984 Needle-flame test (Identical) a ISO = International Organization for Standardization. b IEC = International Electrotechnical Commission.BSCECC42200:1988 BSI 10-1999 iii A British Standard does not
13、purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside fro
14、nt cover, pages i to iv, theCECC title page, pages ii to iv, pages 1 to 12, an inside back cover and abackcover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv blankBSCECC42200:1
15、988 ii BSI 10-1999 Contents Page Foreword iii Section 1. Scope 1 Section 2. Preferred characteristics, ratings and severities for environmental tests 1 2.1 Climatic severities 1 2.2 Ratings and characteristics 1 2.3 Severities for environmental tests 3 2.4 Information to be given in a detail specifi
16、cation 3 Section 3. Inspection 4 3.1 Formation of inspection lots 4 3.2 Test methods 5 3.3 Qualification approval 5 Table 1 2BSCECC42200:1988 BSI 10-1999 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnic
17、al Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of specifications and quality assessment procedures for electronic components, and by the grant
18、of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC and has been prepared for those countries taking part in the
19、System who wish to issue detail specifications for SURGE SUPPRESSION VARISTORS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, I
20、reland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the UnitedKingdom. Preface This sectional specification was prepared by CECC Working Group4:“Resistors”. This is one of a series of sectional specifications, all relating to the generic specification printed as CECC4200
21、0. It is based, wherever possible, on the Publications of the International Electrotechnical Commission. The text of this sectional specification was circulated to the CECC for voting in the documents listed below and was ratified by the President of the CECC for printing as a CECC Specification. Do
22、cument Voting Date Report on the Voting CECC(Secretariat)1227 CECC(Secretariat)1228 CECC(Secretariat)1229 13 December 1982 8 October 1982 8 October 1982 CECC(Secretariat)1344 CECC(Secretariat)1344 CECC(Secretariat)1344iv blankBSCECC42200:1988 BSI 10-1999 1 Section 1. Scope This sectional specificati
23、on prescribes the preferred values for characteristics and ratings and the test severities for varistors intended to protect electronic and other sensitive equipment from surges and operating from a d.c. supply or an a.c. supply having a frequency not greater than 400Hz. Varistors which are the subj
24、ect of this sectional specification will not necessarily give primary protection against lightning surges. Section 2. Preferred characteristics, ratings and severities for environmentaltests 2.1 Climatic severities The varistors covered by this document are classified into climatic categories accord
25、ing to the general rules given in the Appendix to IEC68-1. The standard severities for the cold, dry heat, and damp heat steady state tests are within the following ranges: The severities for the cold and dry heat tests are the lower and upper category temperatures. For some varistors, these tempera
26、tures will occur between two of the preferred temperatures given in IEC68-2. In this case, the nearest preferred temperature within the category temperature range of the varistors shall be chosen for this severity. 2.2 Ratings and characteristics The values given in detail specifications shall prefe
27、rably be taken from the following: 2.2.1 Maximum voltages The maximum continuous a.c. voltage shall be selected from the values listed inTable 1 ensuring that the maximum continuous d.c. voltage, which is interdependent, is not exceeded. NOTEThe relationship between the voltages is: Cold (test A) (I
28、EC 68-2-1) 10 C to 55 C Dry heat (test B) (IEC 68-2-2) +70 C to +155 C Damp heat, steady state (test C) (IEC 68-2-3) 4, 10, 21 or 56 days (not applicable to uncoated types which have a -/-/00 category) Maximum continuous a.c. r.m.s, voltage = 1,1 supply voltage Maximum continuous d.c. voltage = (for
29、 metal oxide types) 1,1 1,3 supply voltage Maximum continuous d.c. voltage = (for silicon carbide types) 1,1 1,15 supply voltageBSCECC42200:1988 2 BSI 10-1999 Table 1 2.2.2 Surge ratings Values in amperes shall be selected from the R10 series of ISO3. 2.2.3 Voltage at class current (protection level
30、s) Values shall be selected from the R40 series of ISO3. 2.2.4 Class current Values shall be selected from the R10 series of ISO3 with decimal multiples and sub-multiples. 2.2.5 Leakage current Values shall be taken from the R10 series in ISO3. The specified voltage for leakage current shall be the
31、maximum continuous d.c. voltage. For metal oxide varistors the leakage current shall be u 315 4A. 2.2.6 Derating curves The following curves shall be applied: a) Maximum continuous a.c. or d.c. voltages Supply voltage Maximum continuous a.c.voltage Maximum continuous d.c.voltage Maximum continuous d
32、.c.voltage (V r.m.s.) (V r.m.s.) Zn O Si C 60 80 110 120 150 220 230 240 280 380 400 415 440 480 500 660 1000 66 88 121 132 165 242 253 264 308 418 440 456 484 528 550 726 1100 86 114 157 172 215 315 329 343 400 543 572 592 629 686 715 944 1430 76 101 139 152 190 278 291 304 354 481 506 525 557 607
33、633 835 1265BSCECC42200:1988 BSI 10-1999 3 b) Maximum peak current 2.3 Severities for environmental tests 2.3.1 Solderability Solder bath method: Test Ta (IEC 68-2-20) 235 5 C 2.3.2 Resistance to soldering heat As in test Tb method 1A (IEC 68-2-20) 2.3.3 Shock 2.3.4 Bump 2.3.5 Vibration 2.4 Informat
34、ion to be given in a detail specification The following information shall be given in each detail specification and the values shall preferably be selected from those given in the appropriate clause of this specification. NOTEThe information given in2.4.1 to2.4.8 may, for convenience, be presented i
35、n tabular form. 2.4.1 Maximum continuous a.c. voltage (B.2.1 of CECC 42000) (See2.2.1 andTable 1) Test Ea (IEC 68-2-27) Acceleration : 490m/s 2 Pulse duration: 11 ms Test Eb (IEC 68-2-29) Acceleration : 390 m/s 2 Number of bumps: 4000 10 Procedure : B4 Amplitude : 0,75mm or acceleration: 98 m/s 2(wh
36、ichever is less severe) Frequency range : 10 Hz to 55 Hz Sweep endurance: Total duration: 6hBSCECC42200:1988 4 BSI 10-1999 2.4.2 Supply voltage (B.2.2 of CECC 42000) (See2.2.1 andTable 1) 2.4.3 Maximum continuous d.c. voltage (B.2.2 of CECC 42000) (See2.2.1 andTable 1) 2.4.4 Leakage current (B.2.6 o
37、f CECC 42000) (See2.2.5) 2.4.5 Surge rating (B.2.5 and B.2.8 of CECC 42000) The detail specification shall specify the class current and/or the energy surge rating. (See2.2.2.) 2.4.6 Voltage at class current (Protection level) (B.2.7 of CECC 42000) (See2.2.3.) 2.4.7 Isolation voltage (Insulated vari
38、stors only.) The isolation voltage shall be 2,5 times the maximum continuous a.c. voltage. The duration of the voltage proof test shall be10s. 2.4.8 Insulation resistance (insulated varistors only) The insulation resistance shall be W 10 M7 before humidity tests and 1 M7 after the humidity tests. 2.
39、4.9 Marking The marking shall be in accordance with 2.4 of CECC42000 except that the following requirements shall replace those given in2.4.1.1. a) Supply voltage. b) Number of the detail specification and, if appropriate, style reference. c) Date of acceptance. d) Manufacturers name or trade mark.
40、2.4.10 Dimensions The numerical value in millimetres shall be given for such of the following dimensions as are applicable, and it shall be stated which dimensions are suitable for gauging. The detail specification shall state such other dimensional information as will adequately describe the varist
41、or. Section 3. Inspection 3.1 Formation of inspection lots An inspection lot shall consist of varistors of the same style. It should be representative of those extremes of rated voltages which have been produced during the period. The samples for Groups C and D shall be collected over the last 13 we
42、eks of the inspection period. Where a lot is formed from specimens of different termination variants, the lot shall contain an equal portion of each termination variant. Body diameter : D Body thickness, including terminations of styles with wire terminations: W Diameter of wire terminations : d Len
43、gth of wire termination : 1 Distance between wire terminations : ABSCECC42200:1988 BSI 10-1999 5 3.1.1 Structural similarity Varistors within the scope of this sectional specification may be grouped as structurally similar for the purpose of forming inspection lots provided that the following requir
44、ements are met: a) They have been produced by one manufacturer on one site using essentially the same design, materials, processes and methods. b) For electrical tests, devices having the same electrical characteristics may be grouped provided that the element determining the characteristics is simi
45、lar for all the devices concerned. c) For environmental tests, devices having the same encapsulation, basic internal structure and finishing processes may be grouped. d) For visual inspection (except marking) devices may be grouped if they have been made on the same production line, have the same di
46、mensions, encapsulation and external finish. The grouping may also be used for robustness of terminations and soldering tests where it is convenient to group devices with different internal structures (see “c” above). e) For endurance tests, devices may be grouped if they have been made with the sam
47、e production process in the same location using the same design and differing only in electrical characteristics. If it can be shown that one type from the group is more heavily stressed than the others then tests on this type may be accepted for the remaining members of the group. NOTEThe sample ta
48、ken shall be determined from the total lot size of the grouped devices. For periodic tests the average value of such lot size shall be used. Structurally similar devices should preferably be included in one detail specification but the details of all claims to structural similarity shall be declared
49、 in the qualification approval test reports. 3.2 Test methods Test methods shall be selected from chose given in CECC42000 or shall be described in the detail specification. 3.3 Qualification approval When it is desired to obtain qualification approval by adopting the fixed sample size procedure (see3.3.3 of CECC42000), use shall be made of the following test schedules. The conditions of test and the performance requirements shall be identical to those prescribed for quality conformance inspection in the detail specification. All specimens w
