1、BSI BSwCECC 90L04 01 m 3b24bb O433298 563 m BRITISH STANDARD BS CECC 90104 : December 1990 Specification for Harmonized system of quality assessment for electronic components Family specification C. MOS digital integrated circuits Series 4000 B and 4000 UB Systme harmonis dassurance de la qualit des
2、 composants lectroniques Spcification de famille Circuits integres digitaux C. MOS SSries 4000 B et 4000 UB Harmonisiertes Gtebesttigungssystem fr Bauelemente der Elektronik Familien - Spezifikation C. MOS DigitaJ-e integrierte Schaltungen Serien 4000 B und 4000 UB CopYn9ht Users of British Standard
3、s are reminded that copyright subsists in all BSI publications. No part of this publication may be reproduced in any form without the prior permission in writing of BSI. This does not preclude the reproduction and free use of the pro forma pages in the course of preparing BSKECC detail specification
4、s. Enquiries should be addressed to the Publications Manager, British Standards Uelephone 0908 220022; Telex 825777). + Institution, Linford Wood, Milton Keynes MK14 6LE. BSI BSrCECC 90104 O1 3624669 0433299 4TT BS CECC 90104 : 1990 National foreword This British Standard has been prepared under the
5、 direction of the Electronic Components Standards Policy Committee. It is identical with CENELEC Electronic Components Committee (CECC) 90104 : 1990 Harmonized system of quality assessment for electronic components. Family specification : C.MOS digital integrated circuits. Amendment No.1 published i
6、n 1994 This standard is a harmonized specification within the CECC system. A Series 4000 B and 4000 mas amended by BS CECC 90104 : 1981 remains valid for existing qualification approvals until further notice. Cross-references. The British Standard which implements CECC O0100 is BS 9000 General requi
7、rements for a system for electronic components of assessed quality Part 2 : 1983 Specification for national implementation of CECC basic rules and rules of procedure. International standard* Correspondinu British Standard IEC 68-2-30 : 1980 - BS 2011 Environmental testing Part 2.1Db : 1981 Test Db a
8、nd guidance: Damp heat, cyclic (12 + 12 hour cycle) (Identical) CECC 90000 : 1985 CECC 90100 : 1986 BS CECC 90000 : 1985 Harmonized system of quality assessment for electronic components. Generic specification: Monolithic integrated circuits (Identical) BS CECC 90100 : 1986 Harmonized system of qual
9、ity assessment for electronic components: Sectional specification: Digital monolithic integrated circuits (Identical) BS 3934 : 1965 and Addendum No. 6 to BS 3934 : 1965 are related British Standards to IEC 191-2. ScoDe. This standard lists the ratings, characteristics and inspection requirements wh
10、ich shall be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for these devices. Detail sDecification lavout. The front page layout of detail specifications released to BS CECC family or blank detail specifications will be in accordance with BS 9000 Cir
11、Cular Letter No. 15 Issue 8 1989. ComDliance with a British Standard does not of itself confer immunitv from leaa obliuations. * Undated in text. ES1 BSSCECC 90104 01 W 162Vhh9 O433300 T4L CECC 90 104 CECC Frderverein fr Elektrotechnische Normung (FEN) e. V. Cenelec Electronic Components Committee S
12、ystme Harmonis dAssurance de ia Qualit des Composants Electroniquec SPECIFICATION DE FAMILLE: CIRCUITS INTEGRES DIGITAUX C. MOS SERIES 4000 B ET 4000 UB Harmonized System of Quality Assessment for Electronic Components FAM 1 LY SPEC1 FI CATI ON : C. MOS DIGITAL INTEGRATED Ci RCU ITS SERIES 4 B AND 4
13、000 UB Harmonisiertes Gtebesttigungssystem fr Bauelemente der Elektronik FAM ILIENSPEZIFI KATION: C. MOS DIGITALE INTEGRIERTE SCHALTUNGEN SERIEN 4000 B UND 4000 UB Edition Issue 2 Ausgabe CECC 90 104 1990 BSI BSxCECC 90104 O1 = LbZYbb7 OV31301 788 W The CENELEC Eleamnic Components Committee (CECC) i
14、s composed of those member counmes of the . European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a . hannonimi System for electronic components of assessed quality. The object of the System is to facilitate intemational trade by the hamionization of the Specific
15、ations and quaiity assessment procedm far electronic components, and by the grant of an inmationaliy recognized Ma 10 and 15 V) - 9- CECC 90 104 Issue 2 BSI BSmCECC 90104 O1 1624bb9 0431310 790 2.13 Propagation and transit ion times Load networks: Symbol For normal outputs: output kQ DDW V 5, 10 and
16、 15 see relevant detail For three state outputs: 2.14 Supplementary information 2.14.1 nused inputs: nused inputs shall be connected to the appropriate logic voltage (e.g. either Vss or VDD or associated input). Unit ns - 10 - CECC 90 104 Issue 2 BSI BS+CECC 90104 O1 m 1624669 0431311 827 = 2.14.2 T
17、ransient energy protection C.MOS circuits have built-in protection circuits on all inputs to reduce the possibility of damage to the input gate oxide of the device by the transfer of electrostatic charge. protected. A schematic may be given, for example: Output gates may be similarly vss Generally u
18、sed values: (see also relevant detail specification) RIS = 200 to 2000 R nom ROS = 10 to 1000 3 nom BVDl = 50 to (80) to 120 V BVD2 = 20 to 50 V BVD3 = 20 to 50 V BVD4 = 20 to 50 V BVD5 = 20 to 50 V BVD = 50 to (80) to 120 V BVD7 = 20 to 50 V - li - CECC 90 104 Issue 2 BSI BS*CECC 90104 01 II624669
19、0431312 763 2.14.3 Variation of parameters with temperature should be given in the format shown below; the curves given here show the general trend (Normiaze to 25 OC- values) o, 5 C -1 o0 -50 O +25 +50 +lo0 - 12 - CECC 90 104 Issue 2 BSI BSxCECC 90104 01 = Lb24bb 0431313 bTT W A 2.14.4 Variation of
20、 switching times with load capacitance shall be given in the detail specification. Due to the very low input current requirements for C.HOS, there is practically no DC output loading capability limitation when driving other C.MOS inputs. The actual fan-out of the C.HOS device is limited by a capacit
21、ance load consideration based on the desired system operating frequency. The effects of capacitive load on the dynamic characteristics shall be given. The curves shown below give the general trend of transition times versus load capacitance, which implies the general trend of propagation times versu
22、s load capacitance. 2 1 O O r ID = 15V 100 CL 50 1% PF Normalized to CL = 50 pF value I - - 13 -* CECC 90 104 Issue 2 ES1 BSvCECC 90304 O3 m Lb24669 0433334 536 m 3 INSPECTION REQUIREMENTS See 3.6 of CECC 90 O00 with the following special requirements: EXAMINATION OR TEST LIMITS TO BE I SPECIFIED 1
23、tD 1 CONDITIONS OF TEST GROUP A INSPECTION Dynamic characteristics at 25 OC See SSl4.1.3 GROUP 8 INSPECTION Electrical endurance 168 h . See GShote 11 See SSl4.2 NO End point tests: See GSInote 10 Electrical tests: GROUP C INSPECTION Sub-Grouo C8 Electrical endurance 2 O00 h . See SS14.2 End point t
24、ests: See GS/note 10 Electrical tests: Sub-Groups A2 and A3 GROUP D INSPECTION. Sub-GrouD O1 Electrical endurance 8 O00 h . See SW.2 End point tests: Electrical tests: Sub-Groups A2, A3 and A5 0 See Sl2.13 and relevant DS See relevant DS iamb 125 Oc See SS14.2.2 As for Sub-Groups A2 and A3 T,b = 125
25、 Oc See SSf4.2.2 As for Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 As for Sub-Groups A2, A3 and A5 As for Sub-Groups A2, I A3 and A5 -14- CECC 90 104 Issue 2 Amendment 1 BSI BSrCECC 90304 OL m 3b246b 0433335 472 m AMD 8290 Amendment No.1 to CECC 90104, Issue 2 (1990
26、) Amendment No.1 published and effective from 15 Aiigiist 1994 to BS CECC 90104 : 1990 Specification for harmonized system of quality assessment for electronic componeiits Family specification: C.MOS digit.al integrated circuits, series 4000 B and 4000 UB NOTE. This amendment implements Amendment No
27、.1 to CECC 90104; Issue 2 (1990). The national foreword has been amended accordingly. Revised text National foreword In line 6, after the title of CECC 90104, insert as amended by Amendment No.1 published in 1994. AMD 8290/August 1994 Instructions for the insertion of new and revised pages Delete pa
28、ges 13/14 and substitute revised pages 13/14. AMD 8290/August 1994 Delete pages 15 to 22 entirely. AMD 8290/August 1994 9408-2-0.04k-B 4 - -i ECL/ 2 4 d I 2.14.4 Variation of switching times with load capacitance shall be given in the detail specification. Due to the very low input current requireme
29、nts for C.HOS, there is practically no DC output loading capability limitation when driving other C.MOS inputs. The actual fan-out of the C.HOS device is limited by a capacitance load consideration based on the desired system operating frequency. “he effects of capacitive load on the dynamic charact
30、eristics shall be given. The curves shown below give the general trend of transition times versus load capacitance, which implies the general trend of propagation times versus load capacitance. 2 tTLH tTRL 1 C O = v, 50 100 CL Normalized to CL = 50 pF value 150 PF - 13 - CECC 90 104 Issue 2 BSI BSmC
31、ECC 90104 O1 1b24hkFE Kl431n3DF AJAY 3 INSPECTION REQUIREMENTS See 3.6 of CECC 90 O00 with the following special requirements: EXAMI NATION OR TEST LIMITS TO BE I SPECIFIED I :D I CONDITIONS OF TEST GROUP A INSPECTION Sub-GrouD A5 Dynamic characteristics at 25 OC See SSi4.1.3 ND See FS12.13 and rele
32、vant DS - See relevant OS GROUP B INSPECTION Sub-GrouD B5 Electrical endurance 168 h . See GSInote 11 See SSi4.2 End point tests: See GS/note 10 Electrical tests: Sub-Groups A2 and A3 ND GROUP C INSPECTION Sub-Grouo C8 Electrical endurance 2 O00 h . See SS14.2 ND End point tests: See GSlnote 10 Elec
33、trical tests: Sub-Groups A2 and A3 GROUP D INSPECTION. Sub-Grouo Dl Electrical endurance 8 O00 h . See SSi4.2 End point tests: Electrical tests: Sub-Groups A2, A3 and A5 D T,b = 125 Oc See SSi4.2.2 As for Sub-Groups A2 and A3 Tarnt, = 125 Oc See SS14.2.2 As for Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 Tarnt, 125 Oc Se0 SSi4.2.2 As for Sub-Groups A2, A3 and A5 As for Sub-Groups A2, A3 and A5 l - 14- CECC 90 104 Issue 2 Amendment 1
