1、BRITISH STANDARD BS CECC 90202:1985 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Integrated operational amplifiersBSCECC90202:1985 BSI03-2000 ISBN 0 580 35846 1 Amendments issued since publication Amd. No. Date CommentsBSCECC90202:198
2、5 BSI 03-2000 i Contents Page National foreword ii Foreword ii 1 Front page 1 2 Ratings (limiting values) 3 3 Recommended conditions of use and associated characteristics 3 4 Test conditions and inspection requirements 4BSCECC90202:1985 ii BSI 03-2000 National foreword This BritishStandard has been
3、prepared under the direction of the Electronic Components Standard Committee. It is identical with CENELEC Electronic Components Committee (CECC)90202:1985 “Harmonized system of quality assessment for electronic components. Blank detail specification: Integrated voltage regulators”. Terminology and
4、conventions. The text of the CECC specification has been approved as suitable for publication as a BritishStandard without deviation. Some terminology and certain conventions are not identical with those used in BritishStandards; attention is drawn especially to the following. The comma has been use
5、d as a decimal marker. In BritishStandards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The BritishStandard which implements CECC00100 is BS9000 “General requirements for a system for electronic components of assessed quality” Part2: “Specificat
6、ion for national implementation of CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC90000 in any detail specification for these devices. Detail spe
7、cification layout. The front page layout of detail specifications released to BSCECC family or blank detail specifications will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards ar
8、e responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard CECC90000:1982 BS CECC90000:1982. Harmonized system of quality assessment for electronic components: Generi
9、c specification for monolithic integrated circuits (Identical) CECC90200:1983 BS CECC90200:1983. Harmonized system of quality assessment for electronic components: Sectional specification: Analogue monolithic integrated circuits (Identical) Summary of pages This document comprises a front cover, an
10、inside front cover, pagesi andii, theCECC title page, pageii, pages1 to7 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.CECC90202:1985 ii BSI 03-2000 Foreword The
11、CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate internat
12、ional trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without fur
13、ther testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for INTEGRATED OPERATIONAL AMPLIFIERS. Itshould be read in conjunction with the current regulations for th
14、e CECCSystem. At the date of printing of this specification the member countries of the CECCare Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, theNetherlands, Norway, Portugal, Spain, Sweden, Switzerland, and theUnitedKingdom. Preface This blank detail specification (BDS) was p
15、repared by CECCWG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC147: Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. The text of this BDS
16、 was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification. It is recognized that the layout proposed cannot apply to all detail specifications based on this document. For example when several similar devi
17、ces are covered by the same detail specification, it may be convenient to give the limiting values in a table. Notice In accordance with the decision of the CECC Management Committee this specification is published initially in French and English. The German text will follow as soon as it has been p
18、repared. Documents Date of voting Report on the voting CECC(Secretariat)1428 September1983 CECC(Secretariat)1551CECC90202:1985 BSI 03-2000 1 1 Front page The front page of the DS shall be laid out as shown on the following page. The numbers between square brackets correspond to the following indicat
19、ions which shall be given: Identification of the DS and of the component: For5 and6 the text to be given in the DS should be suitable for an entry in CECC00200 or CECC00300. Identification of the component and supplementary information: Description of the materials for the package (for example, glas
20、s, ceramic, silicone) and information relating to the mounting (welding, soldering), lead material and finish. Inside the sketch of the package, the terminal connections to the inputs, outputs or other important points of the circuit shall be identified. This can be shown by a functional block diagr
21、am. Description of the numbering of the terminals with the identification of pin number1. Marking on the device in accordance with the GS(see2.5 of CECC90000). 1 The name of the National Standards Organization under whose authority the DS is published and, ifapplicable, the organization from whom th
22、e DS is available. 2 The CECC Symbol and the CECC number allotted to the DS by the CECC General Secretariat. 3 The number and issue number of the CECC generic or sectional specification as relevant; also national reference if different. 4 If different from the CECC number, the national number of the
23、 DS, date of issue and any further information required by the national system, together with any amendment numbers. 5 Type number, a short description of the type by: function (for example differential inputs operational amplifier) number of independent circuits per package number and kind of input
24、s and outputs material and type of construction (silicon, monolithic, multichip, bipolar, MOS) performance, for example high output power, high speed, low power consumption electrostatic sensitivity (where appropriate). 6 Information on typical construction (if applicable) 7 An outline drawing with
25、main dimensions which are of importance for interchangeability, and/or reference to the appropriate national or international document for outlines. Alternatively, this drawing may be given in an appendix to the DS. 8 Quality assessment level(s) 9 Reference data giving information on the most import
26、ant properties of the component, which allow comparison between the various component types intended for the same, or for similar, applications.CECC90202:1985 2 BSI 03-2000 Layout for front page of detail specificationCECC90202:1985 BSI 03-2000 3 2 Ratings (limiting values) (Not for inspection purpo
27、ses) These apply over the operating temperature range, unless otherwise stated (see SS90200). 2.1 Maximum (and where appropriate minimum) value of voltage between the reference terminal and each other terminal 2.2 Any other limiting value(s) of voltage between any specified terminals as appropriate.
28、 3 Recommended conditions of use and associated characteristics (Notforinspection purpose) The following characteristics shall apply over the full ambient operating temperature range unless otherwise specified. Where the stated performance of the circuit varies over the ambient operating temperature
29、 range the values of the input and output voltages and their associated currents shall be stated at25 C and at the extremes of the operating temperature range. Where it is necessary to use external elements to ensure stable operation of the amplifier, the values of the characteristics specified refe
30、r to the amplifier with such elements connected. 2.3 Maximum continuous output current I O 2.4 Maximum continuous internal power dissipation with reference to a derating curve or factor related to the reference point temperature or ambient temperature P D 2.5 Maximum common mode input voltage V IC 2
31、.6 Maximum differential mode input voltage V ID 2.7 Maximum and minimum ambient or reference point operating temperature T amb 2.8 Maximum and minimum storage temperature T stg 2.9 Any specific mechanical or environmental ratings peculiar to the device 2.10 Any interdependence of limiting conditions
32、 2.11 Maximum value of output short-circuit current and duration, where appropriate I OS , t OS Characteristics Symbol Method (See SS90200, 4.1.1) 3.1 Input voltage(s) V I 3.2 Output voltage V O 3.3 Output current I O 3.4 Power supply currents I S A-01 3.5 Small signal input impedance Z i A-02 3.6 O
33、utput impedance Z o A-03 3.7 Input offset voltage of a differential input integrated amplifier V IO A-04 3.8 Bias voltage of a single ended input integrated amplifier V IB A-04 3.9 Input offset current I IO A-05 3.10 Input bias current I IB A-06 3.11 Input offset voltage temperature coefficient ! VI
34、O A-07 3.12 Input offset current temperature coefficient ! IIO A-08 3.13 Open-loop voltage amplification A V A-09 3.14 Open-loop differential mode voltage amplification A VD A-09 3.15 Cut-off frequency (frequencies, high and low) f a , f b A-10 3.16 Common mode rejection ratio k CMR A-11 3.17 Supply
35、 voltage(s) rejection ratio k SVR A-12 3.18 Output voltage range for differential amplifiers (d.c. measurement only) V OPP A-13CECC90202:1985 4 BSI 03-2000 4 Test conditions and inspection requirements These are given in the following tables, where the values and exact test conditions to be used sha
36、ll be specified as required in the detail specification relevant to a given type, in line with the indications given in CECC90200 for the relevant test. NOTE 1All tests are performed at T amb =25 5 C, unless otherwise prescribed. NOTE 2In the tables the paragraph numbers refer to the generic or sect
37、ional specifications with the following code: External elements necessary to ensure stable operations shall be specified and shall be connected for all electrical tests. 4.1 Explanation of quality assessment levels R, T and V. See S2/5.7.1. 4.2 Key of abbreviations See S2/5.7.2. Characteristics Symb
38、ol Method (See SS90200, 4.1.1) 3.19 Response times A-14 delay time t d rise time t r fall time t f ripple time t rip total response time t tot 3.20 Noise A-15 noise voltage V n noise current I n and burst noise V bn 3.21 Average rate of change of the output voltage (Slew-rate) S VOAV A-16 3.22 Real
39、Gain-Bandwidth product GW r A-17 (See SS90200, 4.1.3) 3.23 Crosstalk attenuation between any two channels (whereappropriate) a ct S-05 (See SS90100, 4.1) 3.24 Output short-circuit current I OS 4.1.4 G: Generic specification: Monolithic integrated circuits (CECC90000, issue2) S1: Sectional specificat
40、ion: Digital monolithic integrated circuits (CECC90100, issue2) S2: Sectional specification: Analogue integrated monolithic circuits (CECC90200, issue1) Example: S2/4.2.2 = 4.2.2 of CECC90200. or S2/A-04 =electrical test method n * 4 for an operational amplifierCECC90202:1985 BSI 03-2000 5 Examinati
41、on or test D ND Conditions of test Limits to be specified Inspection requirements Group A Inspection:The following electrical inspection requirements shall be given. Additional characteristics to be inspected may be given for specific circuit(s) in accordance with3 of this specification. Assessment
42、levels R T V IL AQL IL AQL IL AQL Sub-group A1 External visual examination SeeG/4.2.2 ND G/4.2.2 None I 1,5 I 1,5 I 1,5 Sub-group A2 Open loop voltage amplification Method S2/A-09 ND See relevant DS A VB II 0,15 II 0,25 II 0,25 Sub-group A3 Static characteristics at25 C ND II 0,65 II 0,65 II 0,65 (1
43、) Main characteristics Power supply current(s) Method S2/A-01 See relevant DS I SA Open loop voltage amplification Method S2/A-09 See relevant DS A VB Input offset voltage Method S2/A-04 See relevant DS V IOA Input offset current Method S2/A-05 See relevant DS I IOA Input bias current Method S2/A-06
44、 See relevant DS I IBA Output voltage range Method S2/A-13 See relevant DS V OPPB Output short-circuit current Method S1/4.1.4 See relevant DS I OSAif applicable: I OSB (2) Complementary characteristics: Small signal input impedance (if applicable) Method S2/A-02 See relevant DS Z iB Output impedanc
45、e (if applicable) Method S2/A-03 See relevant DS Z oA Common mode rejection ratio (if applicable) Method S2/A-11 See relevant DS k CMRBCECC90202:1985 6 BSI 03-2000 Examination or test D ND Conditions of test Limits to be specified Inspection requirements Assessment levels R T V IL AQL IL AQL IL AQL
46、Supply voltage rejection ratio Method S2/A-12 See relevant DS k SVRB Sub-group A4a Static characteristics at maximum operating temperature ND T=T amb max. S4 1,0 na na na na As in sub-groupA3(1) Main characteristics As for sub-group A3(1) Limits may be different from those of sub-groupA3 Input offse
47、t voltage temperature coefficient (if applicable) Method S2/A-07 See relevant DS ! VIOA Input offset current temperature coefficient (if applicable) Method S2/A-08 See relevant DS ! IIOA Sub-group A4b Static characteristics at minimum operating temperature ND T=T ambmin. S4 1,0 na na na na As in sub
48、-group A3(1) Main characteristics As for sub-group A3(1) Limits may be different from those of sub-group A3 Input offset voltage temperature coefficient (if applicable) Method S2/A-07 See relevant DS ! VIOA Input offset current temperature coefficient (if applicable) Method S2/A-08 See relevant DS !
49、 IIOACECC90202:1985 BSI 03-2000 7 Examination or test D ND Conditions of test Limits to be specified Inspection requirements Assessment levels R T V IL AQL IL AQL IL AQL Sub-group A5 Dynamic characteristics at25 C ND S4 1,5 S4 2,5 S4 2,5 Cut-off frequency(ies) (if applicable) Method S2/A-10 See relevant DS f aBf bA (where appropriate) Response times (if applicable) Method S2/A-14 See relevant DS t dAt rA t fA t ripA t totA (where appropriate) Noise measurements (if applicable) Method S2/A-15 See relevant DS V nI n V bn (where app
