BS EN 132102-1997 Blank detail specification - Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ《空白详细规范 多层陶瓷表面镶嵌固定电容器 评定等级DZ》.pdf

上传人:progressking105 文档编号:571255 上传时间:2018-12-13 格式:PDF 页数:18 大小:456.06KB
下载 相关 举报
BS EN 132102-1997 Blank detail specification - Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ《空白详细规范 多层陶瓷表面镶嵌固定电容器 评定等级DZ》.pdf_第1页
第1页 / 共18页
BS EN 132102-1997 Blank detail specification - Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ《空白详细规范 多层陶瓷表面镶嵌固定电容器 评定等级DZ》.pdf_第2页
第2页 / 共18页
BS EN 132102-1997 Blank detail specification - Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ《空白详细规范 多层陶瓷表面镶嵌固定电容器 评定等级DZ》.pdf_第3页
第3页 / 共18页
BS EN 132102-1997 Blank detail specification - Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ《空白详细规范 多层陶瓷表面镶嵌固定电容器 评定等级DZ》.pdf_第4页
第4页 / 共18页
BS EN 132102-1997 Blank detail specification - Fixed multilayer ceramic surface mounting capacitors - Assessment level DZ《空白详细规范 多层陶瓷表面镶嵌固定电容器 评定等级DZ》.pdf_第5页
第5页 / 共18页
点击查看更多>>
资源描述

1、BRITISH STANDARD BS EN 132102:1997 Blank detail specification Fixed multilayer ceramic surface mounting capacitors Assessment level DZ The European Standard EN 132102:1996 has the status of a British Standard ICS 31.060.20BSEN132102:1997 This British Standard, having been prepared under the directio

2、nof the Electrotechnical Sector Board, was published underthe authority of the Standards Board and comes into effect on 15 March 1997 BSI 07-1999 The following BSI references relate to the work on this standard: Committee reference EPL/40/1 Draft for comment 95/213009 DC ISBN 0 580 27307 5 Committee

3、s responsible for this British Standard The preparation of this British Standard was entrusted by Technical Committee EPL/40, Capacitors and resistors for electronic equipment, to Subcommittee EPL/40/1, Capacitors and EMI suppression components for electronic equipment, upon which the following bodi

4、es were represented: FEI (Federation of the Electronics Industry) Ministry of Defence National Supervising Inspectorate (BSI PC) Society of British Aerospace Companies Ltd. Amendments issued since publication Amd. No. Date CommentsBSEN132102:1997 BSI 07-1999 i Contents Page Committees responsible In

5、side front cover National foreword ii Foreword 2 Text of EN 132102 5 List of references Inside back coverBSEN132102:1997 ii BSI 07-1999 National foreword This British Standard has been prepared by Subcommittee EPL/40/1, and is the English language version of EN132102:1996 Blank detail specification:

6、 Fixed multilayer ceramic surface mounting capacitors Assessment level DZ, published by the Electronic Committee (CECC) of the European Committee for Electrotechnical Standardization (CENELEC). This standard lists the ratings, characteristics and inspection requirements which need to be included as

7、mandatory requirements in any detail specification for this type of capacitor. Detail specifications have to conform to the requirements of the blank detailspecification and BSCECC00111 Rule of Procedure 11. Specifications Part4:1991 Regulations for CECC detail specifications. The British Standard w

8、hich implements the CECC Rules of Procedure is BS9000 General requirements for a system for electronic components of assessed quality Part 2:1996 Specification for the national implementation of the CECC system. A British Standard does not purport to include all the necessary provisions of a contrac

9、t. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references Publication referred to Corresponding British Standard EN 130000:1993 BS EN 130000:1994 Harmonized system of qua

10、lity assessment for electronic components. Generic specification: fixed capacitors EN 132100:1996 BS EN 132100:1997 aHarmonized system of quality assessment for electronic components. Sectional specification: fixed multilayer ceramic surface mounting capacitors Assessment levels EZ and DZ EN 100014:

11、1991 (CECC00014:1986) b BS EN 100014:1992 Harmonized system of quality assessment for electronic components. Basic specification: CECC assessed process average procedure (60%confidencelimit) a In preparation. b The text does not stipulate year of publication. Summary of pages This document comprises

12、 a front cover, an inside front cover, pagesi andii, theEN title page, pages2to12, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STA

13、NDARD NORME EUROPENNE EUROPISCHE NORM EN 132102 August 1996 ICS 31.060.20 Descriptors: Fixed capacitors, ceramic, surface mounting, multilayer, quality assessment, test and measurement, assessment level DZ English version Blank Detail Specification: Fixed multilayer ceramic surface mounting capacito

14、rs Assessment level DZ Vordruck fr Bauartspezifikation: Oberflchenmontierbare Vielschichtkeramik-Festkondensatoren Qualittsbewertungsstufe DZ This European Standard was approved by CENELEC on 1996-03-05. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate th

15、e conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exist

16、s in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electr

17、otechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and UnitedKingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Elect

18、rotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1996 Copyright reserved to CENELEC members Ref. No. EN 132102:1996 EEN132102:1996 BSI 07-1999 2 Foreword This European Standard was prepared by CENELEC/TCCECC/SC40XA, Capacitors. The

19、 text of the draft was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN132102 on 1996-03-05. The following dates were fixed: Contents Page Foreword 2 1 General Data 5 1.1 Method of mounting 5 1.2 Dimensions 5 1.3 Ratings and characteristics 5 1.4 Related documents 5 1.5

20、 Marking 5 1.6 Ordering information 6 1.7 Certified test records of released lots 6 1.8 Additional information 6 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification 6 2 Inspection requirements 6 2.1 Procedures 6 Annex A Marking of c

21、apacitors 11 Table 1 5 Table 2A Values of capacitance related tovoltages and case sizes 5 Table 3 Other characteristics 6 Table 4A Test schedule for quality conformance inspection Lot-by-lot tests Assessment level DZ 7 Table 4B Test schedule for conformance (periodic) inspection Assessment level DZ

22、8 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 1997-03-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 1997-03-01EN132102:1996 BSI 07-1999 3 Identificatio

23、n of the detail specification and the component The first page of the detail specification should have the layout recommended on page4 of this blank detail specification. The numbers in square brackets correspond to the following information which shall be inserted at the position indicated: 1 The n

24、ame of the National Standards Organization under whose authority the detail specification is published and, if applicable, the organization from whom the detail specification is available 2 The CECC symbol and number allotted to the detail specification by the CENELEC Central Secretariat 3 The numbe

25、r and issue number of the CECC generic and sectional specification as relevant; also national reference if different 4 If different from the CECC number, the national number of the detail specification, date of issue and any further information required by the national system, together with any amen

26、dment numbers 5 A brief description of the component or range of components 6 Information on typical construction when applicable For 5 and 6 the text to be given in the detail specification should be suitable for an entry in CECC00200 (Register of Approvals) and CECC00300 (Register of National Docu

27、ments). 7 An outline drawing with main dimensions which are of importance for interchangeability and/or reference to the appropriate national or international document for outlines. Alternatively, the drawing may be given in an annex to the detail specification but 7 should always contain an illustr

28、ation of the general outer appearance of the component 8 The level(s) of quality assessment covered by the detail specification 9 Reference data giving information on the most important properties of the component which allow comparison between the various component types intended for the same, or f

29、or similar, applications.EN132102:1996 4 BSI 07-1999 1 2 CECC 32 102- . . . 4 3 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH: EN 130000:1993 EN 132100:1996 7 5 Outline drawing (1 stangle projection): DETAIL SPECIFICATION FOR FIXED MULTILAYER CERAMIC SURFACE MOUNT

30、ING CAPACITORS 6 TYPICAL CONSTRUCTION (Examples): strip terminations (if applicable) 8 (Other shapes are permitted within the dimensions given, seeTable 1.) ASSESSMENT LEVEL: DZ 9 REFERENCE DATA: Rated capacitance range, capacitance tolerance, d.c. rated voltage range, climatic category, performance

31、 grade Information about manufacturers who have components qualified to this detail specification is available in the current CECC00200: Register of Firms, Products and Services Approved under the CECC System (Register of Approvals).EN132102:1996 BSI 07-1999 5 1 General data 1.1 Method of mounting S

32、ee1.3.2 of the sectional specification. 1.2 Dimensions Table 1 1.3 Ratings and characteristics Table 2A Values of capacitance related to voltages and case sizes 1.4 Related documents 1.5 Marking The marking of the capacitor, if any, and the packing shall be in accordance with1.5 of EN132100. NOTE 1T

33、he details of the marking of the component and packing shall be given in full in the detail specification. NOTE 2If coded marking is employed, the code as given inAnnex A shall be used. Case size Dimensions mm reference D L H d . . . . . NOTE 1When there is no case size reference, Table 1 may be omi

34、tted and the dimensions shall be given inTable 2A, which then becomesTable 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. Capacitance range (seeTable 2A) Tolerance on rated capacitance Rated voltage (seeTable 2A) Climatic category Rated temper

35、ature Tangent of loss angle (tan$) Insulation resistance Temperature coefficient (Class 1) !: . . . 10 6 / C Temperature characteristics of capacitance (Class 2) . . . % Type of termination material Rated voltage V Category voltage V a Case size Case size Case size Case size Rated capacitance pF a I

36、f different from the rated voltage Generic specification: EN 130000 Sectional specification: EN 132100EN132102:1996 6 BSI 07-1999 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or coded form, the following minimum of information: 1) Rated capacit

37、ance 2) Tolerance on rated capacitance 3) Rated voltage 4) Number and issue reference of the detail specification and style reference 5) Packaging instructions. 1.7 Certified test records of released lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional

38、or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditional or increased requirements should be specified only when essential. Table 3 Other characteristics 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the proce

39、dures shall be in accordance with3.4 of EN132100. 2.1.2 For Quality Conformance Inspection the test schedule (Table4) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by3.5.1 of EN132100. This table is to be used for defining characteristics wh

40、ich are additional to or more severe than those given in the sectional specification.EN132102:1996 BSI 07-1999 7 Table 4A Test schedule for quality conformance inspection Lot-by-lot tests Assessmentlevel DZ NOTESSee end of table Clause number and test 1) Conditions of test 1) IL n c Performance requ

41、irements 1) 2) GROUP A0 Non-destructive 100 % 5) 4.6.1 Capacitance Frequency: . . . Hz 3)Measuring voltage: . . . V 3) Within specified tolerance 3) 4.6.2 Tangent of loss angle Frequency and measuring voltage as in4.6.1 As in4.6.2 4.6.4 Voltage proof Test point 1a Method: . . . 3) No breakdown or fl

42、ashover 4.6.3 Insulation resistance Test point 1a Method: . . . 3) As in4.6.3 3) GROUP A1 Non-destructive S-4 2) 0 4.5 Visual examination As in4.5.2 Marking legible and as specified in1.5 of this specification GROUP A2 Non-destructive S-3 2) 0 4.2 Dimensions 6)(gauging) As specified inTable 1 of thi

43、s specification GROUP A3 Destructive S-3 2) 0 Annex D Destructive physical analysis (DPA) SeeAnnexD SeeAnnexD GROUP B1 Destructive S-3 2) 0 4.11 Solderability Accelerated ageing: Dryheat 155 C for 4h or steam for 4h Soldering temperature: (215 5) C Soldering time: (3+1)s 4.11.2 Final measurements Vi

44、sual examination As in4.11.2 wetted area U 95%EN132102:1996 8 BSI 07-1999 Table 4A Test schedule for quality conformance inspection Lot-by-lot tests Assessment level DZ Table 4B Test schedule for conformance (periodic) inspection Assessment level DZ Clause number and test 1) Conditions of test 1) IL

45、 n c Performancerequirements 1) 2) GROUP B2 4) Non-destructive S-3 2) 0 4.7.1 Temperature coefficient and cyclic drift (class1only) Preliminary drying: 16h to 24h Capacitance As in 2.2.5 2) Temperature cyclic drift As in 4.7.1 3) 4.7.2 Temperature characteristic of capacitance (class2only) Special p

46、re-conditioning as in4.1 Capacitance As in2.2.6 GROUP B3 Destructive S-3 2) 0 4.18 Solvent resistance of the marking (if applicable) Method 1 Rubbingmaterial:cotton wool Recovery:. . . 3) Marking legible NOTES 1)Refer to Section4 of the sectional specification EN132100. 2) Number to be tested: Sampl

47、e size as directly alloted to the code letter for IL in Table2Aof IEC410 (Single sample plan for normal inspection). The acceptance numberc is the number of non-conforming items. 3)To be specified in the detail specification. 4)Group B2 may be omitted if a corresponding test is carried out on each m

48、anufacturing batch of dielectric material. 5)100% testing shall be followed by re-inspection by sampling in order to monitor the outgoing quality level in non-conforming items per million. The sampling level shall be established by the manufacturer. The calculation shall be carried out in accordance

49、 with CECC00014, counting any parametric failure as a non-conforming item. If one or more non-conforming items occur in a lot, this lot shall be rejected. 6) This test may be replaced by in-production testing, if the manufacturer installs SPC on dimensional measurements or other mechanisms to avoid parts exceeding the limits. NOTESSee end of table Clause number and test 1) Conditions of test 1) p n c 7) Performance requirements 1) 2) GROUP C1 Destructive 3 12 0 4.16 R

展开阅读全文
相关资源
  • BS ISO IEC 29150-2011 Information technology Security techniques Signcryption《信息技术 安全技术 签密》.pdfBS ISO IEC 29150-2011 Information technology Security techniques Signcryption《信息技术 安全技术 签密》.pdf
  • BS ISO IEC 15408-1-2009 Information technology - Security techniques - Evaluation criteria for IT Security - Introduction and general model《信息技术 安全技术 IT安全评价准则 一.pdfBS ISO IEC 15408-1-2009 Information technology - Security techniques - Evaluation criteria for IT Security - Introduction and general model《信息技术 安全技术 IT安全评价准则 一.pdf
  • BS ISO 7295-1988+A1-2014 Tyre valves for aircraft Interchangeability dimensions《飞机轮胎汽门嘴 互换性尺寸》.pdfBS ISO 7295-1988+A1-2014 Tyre valves for aircraft Interchangeability dimensions《飞机轮胎汽门嘴 互换性尺寸》.pdf
  • BS ISO 15118-1-2013 Road vehicles Vehicle to grid communication interface General information and use-case definition《道路车辆 车辆到电力通讯接口 通用信息和使用案例定义》.pdfBS ISO 15118-1-2013 Road vehicles Vehicle to grid communication interface General information and use-case definition《道路车辆 车辆到电力通讯接口 通用信息和使用案例定义》.pdf
  • BS ISO 13765-2-2004 Refractory mortars - Determination of consistency using the reciprocating flow table method《耐熔灰浆 使用往复流动表法测定一致性》.pdfBS ISO 13765-2-2004 Refractory mortars - Determination of consistency using the reciprocating flow table method《耐熔灰浆 使用往复流动表法测定一致性》.pdf
  • BS ISO 10998-2008+A1-2014 Agricultural tractors Requirements for steering《农业拖拉机 操纵要求》.pdfBS ISO 10998-2008+A1-2014 Agricultural tractors Requirements for steering《农业拖拉机 操纵要求》.pdf
  • BS Z 9-1998 Space data and information transfer systems - Advanced orbiting systems - Networks and data links - Architectural specification《空间数据和信息传输系统 高级轨道系统 网络和数据链接 结构规范》.pdfBS Z 9-1998 Space data and information transfer systems - Advanced orbiting systems - Networks and data links - Architectural specification《空间数据和信息传输系统 高级轨道系统 网络和数据链接 结构规范》.pdf
  • BS Z 7-1998 Space data and information transfer systems - ASCII encoded English《空间数据和信息传输系统 ASCII 编码英语》.pdfBS Z 7-1998 Space data and information transfer systems - ASCII encoded English《空间数据和信息传输系统 ASCII 编码英语》.pdf
  • BS Z 5-1997 Space data and information transfer systems - Standard formatted data units - Control authority procedures《航天数据和信息发送系统 标准格式数据单元 控制授权程序》.pdfBS Z 5-1997 Space data and information transfer systems - Standard formatted data units - Control authority procedures《航天数据和信息发送系统 标准格式数据单元 控制授权程序》.pdf
  • BS Z 4-1997 Space data and information transfer systems - Standard formatted data units - Structure and construction rules《航天数据和信息传输系统 标准格式数据单元 结构和构造规则》.pdfBS Z 4-1997 Space data and information transfer systems - Standard formatted data units - Structure and construction rules《航天数据和信息传输系统 标准格式数据单元 结构和构造规则》.pdf
  • 猜你喜欢
    相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > BS

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1