1、BRITISH STANDARD BS EN 140103:1996 Harmonized system of quality assessment for electronic components Blank detail specification: Fixed low power non-wirewound resistors (Assessment level P) The European Standard EN 140103:1996 has the status of a British Standard ICS 31.040.10BSEN 140103:1996 This B
2、ritish Standard, having been prepared under the direction of the Electrotechnical Sector Board, was published under the authority of the Standards Board and comes intoeffect on 15 September 1996 BSI 11-1998 The following BSI references relate to the work on this standard: Committee reference EPL/40/
3、2 Draft announced in BSI News Update April 1996 ISBN 0 580 26061 5 Committees responsible for this British Standard The preparation of this British Standard was entrusted by Technical Committee EPL/40, Capacitors and Resistors for Electronic Equipment, to Subcommittee EPL/40/2, Resistors, upon which
4、 the following bodies were represented: BEAMA Ltd. Federation of the Electronics Industry Ministry of Defence National Supervising Inspectorate (BSI-PC) Amendments issued since publication Amd. No. Date CommentsBS EN 140103:1996 BSI 11-1998 i Contents Page Committees responsible Inside front cover N
5、ational foreword ii Foreword 2 Text of EN 140103 3 List of references Inside back coverBSEN 140103:1996 ii BSI 11-1998 National foreword This British Standard has been prepared by SubcommitteeEPL/40/2 and is the English language version of EN140103:1996 Blank detail specification: Fixed low power no
6、n-wirewound resistors (Assessment level P), published by the Electronic Components Committee(CECC) of the European Committee for Electrotechnical Standardization (CENELEC). This standard supersedes BSCECC40103:1988 which is withdrawn. This standard lists the requirements to be included in any detail
7、 specification for this type of resistor. The requirements of this blank detail specification and BSCECC00111 Rule of Procedure 11. Specifications Part 4:1991 Regulations for CECC detail specifications apply to detail specifications. The British Standard which implements the CECC Rules of Procedure
8、is BS9000 General requirements for a system for electronic components of assessed quality Part 2:1996 Specification for the national implementation of the CECC system. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsibl
9、e for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references Publication referred to Corresponding British Standard EN 140000:1993 BS EN 140000:1995 Harmonized system of quality assessment for electronic components. G
10、eneric specification: fixed resistors EN 100014:1991 (CECC 00014:1986) BS EN 100014:1992 Harmonized system of quality assessment for electronic components. Basic specification: CECC assessed process average procedure(60 % confidence limit) IEC 68-2-20:1979 BS 2011 Environmental testing Part 2.1 Test
11、s Part 2.1T:1981 Test T. Soldering IEC 286 BS 6062 Packaging of electronic components for automatic handling Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 14, an inside back cover and a back cover. This standard has been
12、updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on theinside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 140103 February 1996 ICS 31.040.10 Supersedes CECC 40 103:1986 Descriptors: Electronic components, fixed
13、low power resistors, non-wirewound resistors, blank detail specification, assessment level P English version Blank Detail Specification: Fixed low power non-wirewound resistors (Assessment level P) Spcification particulire cadre: Rsistances fixes non-bobines faible dissipation (Niveau dassurance de
14、la qualit P) Vordruck fr Bauartspezification: Nichtdrahtgewickelte Festwiderstnde kleiner Belastbarkeit (Bewertungsstufe P) This European Standard was approved by CENELEC on 1995-11-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for g
15、iving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three officia
16、l versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committ
17、ees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europ
18、isches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1996 Copyright reserved to CENELEC members Ref. No. EN 140103:1996 EEN140103:1996 BSI 11-1998 2 Foreword This European Standard was prepared by CENELEC/TCCECC/SC40XB, Fixed resistors. The text of the
19、 draft was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN140103 on 1995-11-28. This European Standard supersedes CECC40103:1986. The following dates were fixed: Contents Page Foreword 2 1 Ratings and characteristics 4 1.1 Derating 4 2 Marking 4 3 Related documents 4 4
20、 Ordering information 4 5 Certified test records 4 6 Additional information (Not for inspectionpurposes) 4 6.1 Packaging 4 6.2 General 4 7 Inspection requirements 4 8 Assessed process average procedures 4 Table 1 3 Table 2 5 latest date by which the EN has to be implemented at national level by publ
21、ication of an identical national standard or by endorsement (dop) 1996-06-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 1996-12-01EN 140103:1996 BSI 11-1998 3 (1) (2) Specification available from: CECC 40 103-XXX (3) (4) ELECTRONIC COMPONENTS OF AS
22、SESSED QUALITY IN ACCORDANCE WITH: (7) (5) Outline and dimensions (see Table 1) (First angle projection) FIXED LOW POWER NON-WIREWOUND RESISTORS (6) (8) ASSESSMENT LEVEL “P” NOTE 1Other shapes are permitted within the dimensions given. NOTE 2These resistors are (not) suitable for printed wiring appl
23、ications. Table 1 (9) Style Rated Dissipation (W at 70 C Limiting element voltage (V d.c. or a.c. rms.) Isolation voltage (V d.c. or a.c. peak) Maximum Dimensions d L D min nom All dimensions are in millimetersEN140103:1996 4 BSI 11-1998 1 Ratings and characteristics NOTEInspection parameters. Vario
24、us parameters have been precisely specified for this component. It should not be assumed that any parameter not specified will remain unchanged from one component to another. Should, for any reason, it be necessary for further parameter(s) to be not specified will remain unchanged from one component
25、 to another. The additional test method(s) shall be fully described, and appropriate limits, AQLs and Inspection levels specified. 1.1 Derating Resistors covered by this specification are derated according to the curve: NOTEthe preferred values are those of the E- series of IEC63. Where the use of i
26、ntermediate values is essential, they should, wherever possible, be chosen from a series in that document. 2 Marking The marking of the component and package shall be in accordance with the requirements of2.4.ofEN140000. 3 Related documents National Authorized Institutions will complete this section
27、, making reference to any documents, recommendations or specifications directly referred to in their national equivalent of this document. 4 Ordering information Orders for resistors covered by this specification shall contain the following information: Resistance value Tolerance CECC detail specifi
28、cation number and, if necessary, the national reference number of the detail specification. 5 Certified test records The writers of detail specifications shall indicate in this clause whether certified test records shall be prepared in accordance with 3.9 ofEN140000. 6 Additional information (Not fo
29、r inspection purposes) 6.1 Packaging Resistors supplied to this detail specification are normally packed in a manner suitable for use with automatic insertion equipment, reference should therefore be made to the appropriate Parts of IEC286. Packaging of components on continuous tapes. 6.2 General Th
30、e detail specification may include information (which is not required to be verified by the inspection procedure), such as circuit diagrams, curves, drawings and notes for the clarification of the detail specification. 7 Inspection requirements (SeeTable 2) 7.1 When drying is called for, ProcedureIo
31、f4.3.of EN140000 shall be used. 7.2 When the manufacturer desires to obtain qualification approval by adopting the fixed sample size procedure (See3.5.3 ofEN140000) use shall be made of the test schedule given in AnnexA.1 orA.2 toEN140000. The conditions of test and the performance requirements shal
32、l be identical to those prescribed for the quality conformance inspection in the detail specification. 8 Assessed process average procedures When the assessed process average procedure as specified in CECC00014 is used, the detailed specification shall give the limits as required in clause3.12 ofEN1
33、40000. The detail specification shall prescribe at relevant places that non-operatives have to be recorded. Resistance range* The range of values in each style is given in the Qualified Products List. Standard tolerances % Temperature characteristic of resistance (20 C to 70 C) Dr: ( % R) (D R/ RD T
34、: 10 6 /C Climatic category 25 / 070 / Limits of resistance change (after 1000 h) electrical endurance test ( % R + W)EN 140103:1996 BSI 11-1998 5 Table 2 (See Notes 1 and 2) Clause number and test Conditions of test IL AQL Performance requirements Group A Inspection To be conducted on a sampling ba
35、sis, lot-by-lot Sub-Group A1 (Non-destructive) S-4 1,0% 4.4.1 Visual Examination As in 4.4.1 4.4.1 Marking As in 4.4.1 Sub-Group A2 (Non-destructive) S-3 0,4 % (seenotes 4 & 5) As in 4.5.2. 4.5 Resistance Sub-Group A3 (Non-destructive) S-4 0,65 % 4.4.2 Dimensions (Gauging) A gauge plate of mm shall
36、be used. As specified in Table 1 Group B Inspection To be conducted on a sampling basis, lot-by-lot Sub-Group B1 (Destructive) S-4 10 % 4.7 Voltage proof Insulated resistors only As in 4.7.3 Sub-Group B2 (Destructive) S-3 0,4% 4.17.1 Soldering Solderability Method 1 (see note 5) As in 4.17 Notes on
37、page 11EN140103:1996 6 BSI 11-1998 (See Notes 1 and 2) Clause number and test Conditions of test Sample size & criterion of acceptability (seeNote 3) Performance requirements P n c Group C Inspection To be conducted on a sampling basis at the periodicity given in column “P” Sub-Group C1 (Destructive
38、) 3 20 1 4.16 Robustness of terminations Tensile, bending and torsion tests Visual examination As in 4.16.6 Resistance DR: # ( % R + W) 4.13 Overload Resistor Style Preferred load Duration (s) 0.5 1 2 5 10 20 As in 4.13.3 and 4.13.4 The applied voltage shall be 2,5 times the rated voltage or twice t
39、he limiting element voltage, whichever is the less. Visual examination As in 4.13.3 Resistance DR: # ( % R + W) Notes on page 11EN 140103:1996 BSI 11-1998 7 (See Notes 1 and 2) Clause number and test Conditions of test Sample size & criterion of acceptability (see Note 3) Performance requirements P
40、n c Sub-Group C2 (Destructive) 6 20 1 4.25.1 Endurance at 70 C Duration: 1000 h Visual inspection As in 4.25.1.7 Resistance DR: # ( % R + W) Examination at 1 000 h Insulation resistance (Insulated resistors only) R: $1 GW The tests on one sample each year shall be extended to 8 000 h duration. 12 20
41、 Examination at 2 000, 4 000, and 8 000 h Resistance DR: The results obtained are for information only Sub-Group C3 (Non-destructive) 12 20 1 4.8 Temperature characteristic of resistance LCT/ (25) /20 20 /UCT (70) D R: # % R % R Notes on page 11EN140103:1996 8 BSI 11-1998 (See Notes 1 and 2) Clause
42、number and test Conditions of test Sample size & criterion of acceptability (seeNote 3) Performance requirements P n c Sub-Group C4 (Destructive) 36 20 1 Half of the sample 4.16 Robustness of terminations Tensile, bending and torsion tests Visual examination As in 4.16.6 Resistance DR: # ( % R + W)
43、4.18 Soldering Resistance to heat (The detail specification shall state whether Method1A or Method 1B of test Tb of Test Tb IEC 68-2-20 shall apply) Visual examination As in 4.18.3 Resistance DR: # ( % R + W) Other half of the sample 4.19 Rapid change of temperature TA: lower category temperature TB
44、: Upper category temperature Visual examination As in 4.19.3 Resistance DR: # ( % R + W) Notes on page 11EN 140103:1996 BSI 11-1998 9 (See Notes 1 and 2) Clause number and test Conditions of test Sample size & criterion of acceptability (see Note 3) Performance requirements P n c 4.22 Vibration Proc
45、edure: B4 Frequency Range: Hz to Hz Amplitude: 0,75 mm or98m/s 2(whichever is the less severe) Sweep endurance: Total duration 6 h. (see Note 6) Visual examination As in 4.22.4 Resistance DR: # ( % R + W) All of the sample 4.23 Climatic sequence Dry heat Damp heat, cyclic first cycle cold low air pr
46、essure not applicable Damp heat, cyclic, remaining cycles D.C. load Final measurements Visual examination As in 4.23.8 Resistance DR: # ( % R + W) Insulation resistance (Insulated resistors only) R*: $ 100 MW Notes on page 11EN140103:1996 10 BSI 11-1998 (See Notes 1 and 2) Clause number and test Con
47、ditions of test Sample size & criterion of acceptability (seeNote3) Performance requirements P n c Sub-Group C5 (Destructive) 36 20 1 4.24 Damp heat, steady state Visual examination As in 4.24.4 Resistance DR: # ( % R + W) Insulation resistance (Insulated resistors only) R: $ 100 MW Notes on page 11
48、EN 140103:1996 BSI 11-1998 11 NOTE 1Clause numbers of tests and performance requirements refer to EN140000. NOTE 2Inspection levels and AQLs are selected from IEC410. NOTE 3In this table: P periodicity (in months) n sample size c acceptance criterion LCT Lower category temperature UCT Upper category
49、 temperature NOTE 4If the inspection is performed at the end of the resistor assembly procedure under conditions, and with personnel, approved by the ONS, the results may be used in place of the sampling procedures of this sub-group. This is acceptable provided that the assembly line final test equipment is checked at specified intervals by means of test specimens. NOTE 5When a manufacturer has declared that he wishes to give inf
