BS EN 143001-1984 Specification for harmonized system of quality assessment for electronic components - Blank detail specification directly heated negative temperature coefficient .pdf

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1、BRITISH STANDARD BS EN 143001:1992 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blankdetail specification Directly heated negative temperature coefficient thermistors (Beads in solid glass or vitreous enamel) The European Standard

2、EN 143001:1991 has the status of a British StandardBSEN143001:1992 BSI 03-2000 ISBN 0 580 35965 4 Amendments issued since publication Amd. No. Date of issue Comments 7378 December 1992 Indicated by a sideline in the marginBSEN143001:1992 BSI 03-2000 i Contents Page National foreword ii Foreword 2 Te

3、xt of CECC 43001 1BSEN143001:1992 ii BSI 03-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee CECC 43001: “Blank detail specification: Directly heated negat

4、ive temperature coefficient thermistors (Beads in glass or vitreous enamel)”. This standard is a harmonized specification within the CECC system. In 1991 the CENELEC Electronic Components Committee (CECC) accepted CECC 43001:1983 as European Standard EN 143001:1991. Terminology and conventions The t

5、ext of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Attention is especially drawn to the following. The comma has been used throughout as

6、a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references The British Standard harmonized with CECC 00100 is BS9000 “General requirements for a system for electronic components of assessed quality”. Scope This standard l

7、ists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 43000. Detail specification layout In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take pr

8、ecedence except that the front page layout will be in accordance with BS9000 Circular Letter No 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard

9、does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard CECC 43000:1982 BS CECC 43000:1982 Harmonized system of quality assessment for electronic components: Generic specification: Directly heated negative temperature coefficient thermistors (

10、Identical) IEC 68-2-20A:1970 BS 2011: Basic environmental testing procedures: Part2.1Tb:1977 Test Tb Resistance to soldering heat (Identical) IEC 410:1973 BS 6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a fron

11、t cover, an inside front cover, pagesi andii, theENtitle page, page2,the CECC title page, pages ii to iv, pages 1 to 6 and aback cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cove

12、r.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN143001 October1991 UDC: Descriptors: Quality, electronic components, thermistors English version Blank Detail Specification: Directly heated negative temperature coefficient thermistors (Beads in solid glass or vitreous enamel) Spcification Parti

13、culire Cadre: Thermistances coefficient de temprature ngatif chauffage direct (perles enrobes de verre solide ou dmail vitrifi) Vordruck fr Bauartspezifikation: Direkt geheizte temperaturabhngige Widerstnde mit negativen Temperatur- Koeffizienten (Perlen in massivem Glas oder glasartiger Emaille) Th

14、is European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 14 October 1991. The text of this standard consists of the text of CECC 43001 Issue 1 1983 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations whi

15、ch stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. T

16、his European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC

17、 members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the

18、 national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Copyrig

19、ht reserved to CENELEC members Ref. No. EN 143001:1991 EEN143001:1991 BSI 03-2000 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System

20、for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognised Mark, or Certificate, of Conformity. The

21、components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC and has been prepared for those countries taking part in the System who wish to wish to issue national harmonized specifications for DI

22、RECTLY HEATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORS. It should be read in conjunction with document CECC 00100: Basic Rules (1974). Preface This blank detail specification was prepared by CECC Working Group 4: “RESISTORS”. It is one of a series of blank detail specifications for directly heat

23、ed negative temperature coefficient thermistors, all relating to the generic specification CECC 43000. Voting The text of this blank detail specification was circulated to the CECC for voting in the documents listed below and was ratified by the President of the CECC for printing as a CECC Specifica

24、tion: Document Date of Vote Report on the Voting CECC (Secretariat)883 April 1980 CECC (Secretariat)995EN143001:1991 ii BSI 03-2000 Key for page 3 The numbers between square brackets on page iii correspond to the following indications which shall be given: For 5 and 6 the text to be given in the DS

25、should be suitable for an entry in CECC 00200 (QPL) or CECC00300. Identification of the detail specification (DS) 1 The name of the National Standards Institution under whose authority the detail specification (DS) is published and, if applicable, the organization from whom the DS is available. 2 Th

26、e CECC symbol and the number allotted to the DS by the CECC General Secretariat. 3 The number and issue number of the CECC generic or sectional specification as relevant; also national reference if different. 4 If different from the CECC number, the national number of the DS, date of issue and any f

27、urther information required by the national system, together with any amendment numbers. Identification of the thermistor 5 A short description of the type of thermistor. 6 Information on typical construction (whereapplicable). 7 Outline drawing with main dimensions which are of importance for inter

28、changeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered, or, preferably, the level of quality assessment covered by the detail specifica

29、tion. 9 Reference data on the most important properties, to allow comparison between the various thermistor types.EN143001:1991 BSI 03-2000 iii NOTE 1Other shapes are permitted within the dimensions given. NOTE 2The non-dimensioned details do not affect the performance of the device. NOTE 3The leads

30、 are (not) suitable for soldering. NOTE 4The leads are (not) suitable for printed wiring applications. Specification available from: 1 CECC 43001 XXX 2 Page of 4 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: 3 Outline and dimensions: (See Table 1) (Firstangle projection) 7 DIRECTLY H

31、EATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORS PRIMARILY INTENDED FOR TEMPERATURE SENSING 5 BEADS IN SOLID GLASS OR VITREOUS ENAMEL 6 INSULATED/NON-INSULATED HUMIDITY PROOF/NON-HUMIDITY PROOF Reference temperature: - C ASSESSMENT LEVEL “S” 8 Table 1 9 Style B-value -/- a Range of rated resistanc

32、e values Rated dissipation (W) Dissipation Factor Time Constant Dimensions (mm) Body Terminations R min R max L D l d a Values shall be chosen from the E-series of IEC 63. Where the use of intermediate values is essential, they shall be chosen from a series in that document. Information about manufa

33、cturers who have components qualified to this detail specification is available in the current CECC 00200: Qualified Products Listiv blankEN143001:1991 BSI 03-2000 1 1 Ratings and characteristics 1.1 Derating Thermistors covered by this specification are derated according to: (Derating curve to be i

34、ncluded in the detail specification.) 2 Marking The marking of the component and package shall be in accordance with the requirements of 2.4 of CECC43000. (If the thermistor is so small that it cannot be marked this shall be stated in the detail specification). 3 Related documents National Authorize

35、d Institutions (ONH) will complete this section, making reference to any documents, recommendations or specifications directly referred to in their national equivalent of this document. 4 Ordering information Orders for thermistors covered by this specification shall contain the following informatio

36、n: Resistance value Tolerance B-value Style and national specification number of this detail specification. 5 Certified test records National Authorized Institutions (ONH) shall indicate in this clause whether certified test records shall be prepared in accordance with 3.4 of CECC 43000. 6 Additiona

37、l information (not for inspection purposes) The detail specification may include information (which is not required to be verified by the inspection procedure), such as circuit diagrams, curves, drawings and notes for clarification of the detail specification. Inspection requirements (See Table 2) D

38、rying clause is not applicable to thermistors manufactured in accordance with this detail specification. Standard selection tolerances - % Climatic category -/-/- Bump or Shock 4 000 bumps at 390 m/s 2(1 333 in each of 3 directions). 490 m/s 2 , 11 ms, half sine wave Vibration 10 Hz to 55 Hz or 10 H

39、z to 500 Hz ; 0,75 mm or 98 m/s 2(whichever is the less severe) Limit of resistance change after 1 000 h endurancetest - % B-value tolerance - % Resistance ratio (The ratio shall be specified if applicable). Resistance/temperature characteristic (The applicable temperatures and resistance tolerances

40、 shall be specified.) Proof voltage (insulated thermistors only) - V a.c. peak (Voltage to be applied in Sub-Groups B1, C2 and D1 for the voltage proof test.)EN143001:1991 2 BSI 03-2000 Table 2 (See Notes 1 and 2) Clause number and test Conditions of test IL AQL Performance requirements GROUP A INSP

41、ECTION To be conducted on a sampling basis, lot-by-lot Sub-Group A1 (Non-destructive) II 1,0 % 4.3.1 Visual examination As in 4.3.1 4.3.2 Marking As in 4.3.2 Sub-Group A2 (Non-destructive) S-4 1,0 % 4.3.3 Dimensions (gauging) As specified in Table 1 Sub-Group A3 (Non-destructive) II 1,0 % 4.4 Zero-p

42、ower resistance Measurement temperature - C As in 4.4.3 GROUP B INSPECTION To be conducted on a sampling basis, lot-by-lot Sub-Group B1 (Non-destructive) S-3 1,0 % 4.7 Voltage proof (Insulated thermistors only) Method 1 or Method 2 to be used Applied voltage: - V a.c. peak As in 4.7.4 Sub-Group B2 (

43、Destructive) S-3 2,5 % 4.13.1 Soldering Solderability (Applicable only if Note 3 on page iii states that the terminations are suitable for soldering As in 4.13.1.1 The terminations shall be uniformly tinned. Sub-Group B3 (Non-destructive) II 1,5 % 4.8 Resistance/ temperature characteristic (This tes

44、t is applicable only where resistance/ temperature performance is specified other than as a tolerance on B-value.) See Ratings and Characteristics for the temperatures and resistance tolerances to be used. As in 4.8.4 Notes on page 6EN143001:1991 BSI 03-2000 3 Table 2 (See Notes 1, 2 and 3) Clause n

45、umber and test Conditions of test Sample size & criterion of acceptability Performance requirements P n c GROUP C INSPECTION To be conducted on a sampling basis at the periodicity given in column “P” Sub-Group C1 (Non-destructive) 3 20 1 4.5 B-value or resistance ratio T 1- C T 2- C The values shall

46、 be within the limits specified in the detail specification (See also 2.2.10 and 2.2.11 of CECC 43000) Sub-Group C2 (Destructive) 6 20 1 Half of the sample 4.12 Robustness of terminations Tensile, bending and torsion tests Visual examination Zero-power resistance (Temperature - C) As in 4.12.4 %R: k

47、 - %R 4.13.2 Soldering Resistance to soldering heat (The detail specification shall indicate whether Method 1A or Method 1B of test Tb of IEC 68 2-20A shall apply). Visual examination Zero-power resistance (Temperature: - C) As in 4.13.2.3 %R: k - %R Other half of the sample 4.14 Rapid change of tem

48、perature T A: Lower category temperature T B : Upper category temperature Visual examination As in 4.14.3 Zero-power resistance (Temperature: - C) %R: k - %R 4.15 Vibration Procedure: B4 Frequency range: - Hz to - Hz Amplitude: 0,75 mm or 98 m/s 2(whichever is the less severe) Sweep endurance: Total

49、 duration: 6 h (See Note 4) Measurements during test Continuity There shall be no intermittency greater than 0,5 ms Notes on page 6EN143001:1991 4 BSI 03-2000 Table 2 (See Notes 1 and 3) Clause number and test Conditions of test Sample size & criterion of acceptability Performance requirements P n c Final measurements Visual examination As in 4.15.5 Zero-power resistance (Temperature: - C) %R: k - %R 4.16 Bump (SeeNote 5) Acceleration: 390 m/s 2 No.

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