1、BSI Standards PublicationBS EN 16602-70-02:2014Space product assurance Thermal vacuum outgassingtest for the screening of spacematerialsBS EN 16602-70-02:2014 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of EN16602-70-02:2014. It supersedes BS EN 14091:2002 which i
2、swithdrawn.The UK participation in its preparation was entrusted to TechnicalCommittee ACE/68, Space systems and operations.A list of organizations represented on this committee can beobtained on request to its secretary.This publication does not purport to include all the necessaryprovisions of a c
3、ontract. Users are responsible for its correctapplication. The British Standards Institution 2014. Published by BSI StandardsLimited 2014ISBN 978 0 580 84422 5ICS 49.140Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the autho
4、rity of theStandards Policy and Strategy Committee on 31 October 2014.Amendments issued since publicationDate Text affectedBS EN 16602-70-02:2014EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 16602-70-02 October 2014 ICS 49.140 Supersedes EN 14091:2002 English version Space product assurance -
5、 Thermal vacuum outgassing test for the screening of space materials Assurance produit des projets spatiaux - Essai de dgazage sous vide thermique pour slection des matriaux dun projet spatial Raumfahrtproduktsicherung - Thermo-Vakuum-Ausgasungstest fr die Auswahl von RaumfahrtmaterialienThis Europe
6、an Standard was approved by CEN on 13 March 2014. CEN and CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical refe
7、rences concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN and CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibi
8、lity of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, Cz
9、ech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.
10、CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2014 CEN/CENELEC All rights of exploitation in any form and by any means reserved worldwide for CEN national Members and for CENELEC Members. Ref. No. EN 16602-70-02:2014 EBS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 2 Table of conten
11、ts Foreword 4 Introduction 5 1 Scope . 6 2 Normative references . 7 3 Terms, definitions and abbreviated terms 8 3.1 Terms defined in other standards . 8 3.2 Terms specific to the present standard . 8 3.3 Abbreviated terms. 9 4 Test overview 11 4.1 Test process description . 11 4.2 Acceptance limits
12、 14 5 Requirements 15 5.1 General requirements . 15 5.2 Preparatory conditions 15 5.2.1 Hazards, health and safety precautions 15 5.2.2 Material samples . 16 5.2.3 Facilities 18 5.2.4 Equipment . 18 5.3 Test procedure . 20 5.3.1 General requirements . 20 5.3.2 Test process for general spacecraft app
13、lication 20 5.4 Reporting of test data . 23 5.5 Acceptance limits 24 5.5.1 General requirements . 24 5.5.2 Acceptance limits for a retest of the material . 24 5.5.3 Acceptance limits for application of a material . 25 5.6 Quality assurance . 27 5.6.1 Data 27 5.6.2 Calibration . 27 BS EN 16602-70-02:
14、2014EN 16602-70-02:2014 (E) 3 5.7 Audit of the Micro-VCM test apparatus . 27 5.7.1 General . 27 5.7.2 Initial audit of the system (acceptance) . 28 5.7.3 Annual regular review (maintenance) of the system 29 5.7.4 Special review . 30 Annex A (normative) Materials identification card (MIC) - DRD . 31
15、Annex B (normative) Micro-VCM worksheet - DRD . 34 Annex C (normative) Micro-VCM datasheet - DRD 37 Annex D (normative) Thermal vacuum outgassing test report - DRD . 40 Annex E (normative) Certificate of conformity for Micro-VCM - DRD 42 Bibliography . 44 Figures Figure 4-1: Flow chart of preparatio
16、n and initial measurements 11 Figure 4-2: Flow chart of test process . 12 Figure 4-3: Parameters for sample . 13 Figure 4-4: Parameters for collector plate . 13 Figure 5-1: Micro-VCM equipment 20 Figure A-1 : Example of filled MIC 33 Figure B-1 : Example of filled in Micro-VCM worksheet 36 Figure C-
17、1 : Example of filled in Micro-VCM datasheet . 39 Figure E-1 : Example of a certificate of conformity for Micro-VCM 43 Tables Table B-1 : Outgassing screening properties 35 BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 4 Foreword This document (EN 16602-70-02:2014) has been prepared by Technical Com
18、mittee CEN/CLC/TC 5 “Space”, the secretariat of which is held by DIN. This standard (EN 16602-70-02:2014) originates from ECSS-Q-ST-70-02C. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by April 20
19、15, and conflicting national standards shall be withdrawn at the latest by April 2015. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights.
20、 This document supersedes EN 14091:2002. This document has been prepared under a mandate given to CEN by the European Commission and the European Free Trade Association. This document has been developed to cover specifically space systems and has therefore precedence over any EN covering the same sc
21、ope but with a wider domain of applicability (e.g. : aerospace). According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Est
22、onia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 16602-70-02:2014
23、EN 16602-70-02:2014 (E) 5 Introduction The kinetics of an outgassing process is influenced by vacuum and temperature conditions. The method described in this Standard gives reliable data for material screening use exclusively. The nominal temperature for the screening test, as described in this stan
24、dard is 125 C. Results from the nominal screening test can be used for the screening of materials that have an operational temperature below 50 C, especially if they are exposed for an extended period of time (in the order of weeks and above). BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 6 1 Scope
25、This Standard describes a thermal vacuum test to determine the outgassing screening properties of materials proposed for use in the fabrication of spacecraft and associated equipment, for vacuum facilities used for flight hardware tests and for certain launcher hardware. This Standard covers the fol
26、lowing: critical design parameters of the test system; critical test parameters such as temperature, time, pressure; material sample preparation; conditioning parameters for samples and collector plates; presentation of the test data; acceptance criteria; certification of test systems and their oper
27、ators by audits and round robin tests. The test described in this Standard is applicable for all unmanned spacecraft, launchers, payloads, experiments. The test is also valid for external hardware of inhabited space systems and for hardware to be used in terrestrial vacuum test facilities. The outga
28、ssing and condensation acceptance criteria for a material depend upon the application and location of the material and can be more severe than the standard requirements as given in clause 5.5.3.1. This standard may be tailored for the specific characteristics and constrains of a space project in con
29、formance with ECSS-S-ST-00. BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 7 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this ECSS Standard. For dated references, subsequent amendments to, or revision of a
30、ny of these publications do not apply, However, parties to agreements based on this ECSS Standard are encouraged to investigate the possibility of applying the more recent editions of the normative documents indicated below. For undated references, the latest edition of the publication referred to a
31、pplies. EN reference Reference in text Title EN 16601-00-01 ECSS-S-ST-00-01 ECSS system Glossary of terms EN 16602-10 ECSS-Q-ST-10 Space product assurance Product assurance management EN 16602-10-09 ECSS-Q-ST-10-09 Space product assurance Nonconformance control system BS EN 16602-70-02:2014EN 16602-
32、70-02:2014 (E) 8 3 Terms, definitions and abbreviated terms 3.1 Terms defined in other standards For the purpose of this Standard, the terms and definitions from ECSS-S-ST-00-01 and ECSS-Q-ST-70 apply. 3.2 Terms specific to the present standard 3.2.1 bakeout activity of increasing the temperature of
33、 hardware to accelerate its outgassing rates with the intent of reducing the content of molecular contaminants within the hardware NOTE Bakeout is usually performed in a vacuum environment but may be done in a controlled atmosphere. 3.2.2 cleanroom room in which the concentration of airborne particl
34、es is controlled, and which is constructed and used in a manner to minimize the introduction, generation, and retention of particles inside the room, and in which other relevant parameters, e.g. temperature, humidity, and pressure, are controlled as necessary ISO 14644-6 3.2.3 collected volatile con
35、densable material (CVCM) quantity of outgassed matter from a test specimen that condenses on a collector maintained at a specific temperature for a specific time NOTE CVCM is expressed as a percentage of the initial specimen mass and is calculated from the condensate mass determined from the differe
36、nce in mass of the collector plate before and after the test. 3.2.4 outgassing release of gaseous species from a specimen under high vacuum conditions BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 9 3.2.5 quartz crystal microbalance (QCM) device for measuring small quantities of mass deposited on a
37、quartz crystal using the properties of a crystal oscillator 3.2.6 recovered mass loss (RML) total mass loss of the specimen itself without the absorbed water NOTE 1 The following equation holds: RML = TML - WVR. NOTE 2 The RML is introduced because water is not always seen as a critical contaminant
38、in spacecraft materials. 3.2.7 sticking coefficient probability that a molecule, colliding with a surface, stays on that surface before thermal re-evaporation of that molecule occurs 3.2.8 total mass loss (TML) total mass loss of material outgassed from a specimen that is maintained at a specific co
39、nstant temperature and operating pressure for a specified time NOTE TML is calculated from the mass of the specimen as measured before and after the test and is expressed as a percentage of the initial specimen mass. 3.2.9 water vapour regained (WVR) mass of the water vapour regained by the specimen
40、 after the optional reconditioning step NOTE WVR is calculated from the differences in the specimen mass determined after the test for TML and CVCM and again after exposure to atmospheric conditions and 65 % relative humidity at room temperature (22 3) C. 3.3 Abbreviated terms For the purpose of thi
41、s Standard, the abbreviated terms from ECSS-S-ST-00-01 and the following apply: Abbreviation Meaning CVCM collected volatile condensable material EOL end-of-life IR infrared MIC materials identification card PTFE polytetrafluorethylene QCM quartz crystal microbalance RH relative humidity BS EN 16602
42、-70-02:2014EN 16602-70-02:2014 (E) 10 RML recovered mass loss RT room temperature TML total mass loss VCM volatile condensable material WVR water vapour regained BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 11 4 Test overview 4.1 Test process description Figure 4-1 and Figure 4-2 are included as a
43、guide to the test procedures. The sequence for the test is given in the flow chart (Figure 4-2). Figure 4-1: Flow chart of preparation and initial measurements BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 12 Figure 4-2: Flow chart of test process BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 13 Fig
44、ure 4-3: Parameters for sample Figure 4-4: Parameters for collector plate Bakeout Temp 125 C Time 16 h Vacuum 10-3Pa Outgassing test 24 h at 125 C Vacuum 10-3Pa Collector 25 C Mass collectorTime (hours) CVCM Wp Wg Conditioning RT in desiccator 0 % RH Time 24 h 0 24 48 -16 Conditioning (22 3) C at (5
45、5 10) % RH Outgassing test 24 h at 125 C Vacuum 10-3Pa Conditioning (22 3) C at (55 10) % RH Mass sampleTime (hours) 0 24 48 72 WVR RML TML Wr Wf Wo BS EN 16602-70-02:2014EN 16602-70-02:2014 (E) 14 4.2 Acceptance limits The validity of this screening test as a means for determining the suitability o
46、f a material for a specific application depends on the environmental conditions during the lifetime of the material as well as the vicinity of critical or sensitive surfaces. Especially, in cases were the expected maximum temperature of a material during the lifetime is exceeding 50 C for an extende
47、d period of time, the use of such material are evaluated further through a test programme, mutually agreed between customer and supplier. Such programme ensures that the characteristics of the material at the EOL are still within the specified requirements. BS EN 16602-70-02:2014EN 16602-70-02:2014
48、(E) 15 5 Requirements 5.1 General requirements a. For those materials that are subjected, during the mission, to temperature above 125 C for short period of time (in the order of hours) or above 50 C for an extended period of time (in the order of weeks or above), dedicated tests shall be performed
49、at conditions representative of the real application (i.e. higher temperature tests). b. Limits for elevated temperature testing shall be specified case by case. NOTE 1 For example, limits are specified by the requesting project. NOTE 2 For accelerated tests (i.e. higher temperature testing to take into account long exposures) there can be a limit, above which, the phenomenon is governed by different mechanisms other than those that really interest the material during its on-orbit phase; in such a case, a different kind of
