1、BRITISH STANDARD BS EN 190102:1994 Incorporating Amendment Nos. 1 and 2 Specification for Harmonized system of quality assessment for electronic components Family specification Digital integrated TTL-SCHOTTKY circuits Series 54S, 64S, 74S, 84S The European Standard EN190102:1994 has the status of a
2、British StandardBSEN190102:1994 BSI 10-1999 ISBN 0 580 35669 8 Amendments issued since publication Amd. No. Date of issue Comments 8116 February 1994 8369 September 1994 Indicated by a sideline in the marginBSEN190102:1994 BSI 10-1999 i Contents Page National foreword ii Foreword 2 Foreword iii Text
3、 of CECC 90102 1BSEN190102:1994 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee. It is identical with CENELEC Electronic Components Committee CECC 90102:1989 “Harmonized system of quality assessment
4、for electronic components. Family specification: TTL SCHOTTKY digital integrated circuits: Series 54S, 64S, 74S, 84S”. This standard is a harmonized specification within the CECC System. BS CECC 90102:1980 remains valid for existing qualification approvals until further notice. In 1994 the CENELEC E
5、lectronic Components Committee (CECC) accepted CECC 90102:1989 with Amendment1 as European Standard EN190102:1994. Cross-references. The British Standard which implements CECC00100 is BS9000 General requirements for a system for electronic components of assessed quality Part2:1983 Specification for
6、national implementation of CECC basic rules and rules of procedure. The Technical Committee has reviewed the provisions of IEC747, IEC 748 andIEC 749, to which reference is made in the text, and has decided that they are acceptable for use in conjunction with this standard. Scope. This standard list
7、s the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC90100 in any detail specification for these devices. Detail specification layout. The front page of detail specifications released to BS CECC family or blank detail
8、specification will be in accordance with BS9000 Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer im
9、munity from legal obligations. International Standards a Corresponding British Standards IEC 68-2-30:1980 BS 2011 Environmental testing Part 2.1 Db: 1981 Test Db and guidance: Damp heat, cyclic 12 + 12 hour cycle (Identical) CECC 90000:1985 BS CECC 90000:1985 Harmonized system of quality assessment
10、for electronic components. Generic specification: Monolithic integrated circuits (Identical) CECC 90100:1986 BS CECC 90100:1986 Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits (Identical) a Undated in text. Summary of
11、 pages This document comprises a front cover, an inside front cover, pages i and ii, theEN title page, page 2, the CECC title page, pages ii to iv, pages 1 to 5 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in t
12、he amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 190102 May 1994 UDC Supersedes CECC 90102 Issue 2:1989 Descriptors: Quality, electronic components, TTL Schottky digital integrated circuits English version Family Specification: TTL Schottky Digital In
13、tegrated Circuits Series 54S, 64S, 74S, 84S Spcification de famille: Circuits intgrs logiques TTL Schottky Sries 54S, 64S, 74S, 84S Familienspezifikation: Digitale integrierte TTL-Schottky-Schaltungen Serien 54S, 64S, 74S, 84S This European Standard was approved by the CENELEC Electronic Components
14、Committee (CECC) on30April1994. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such nationa
15、l standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its ow
16、n language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain
17、, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisch
18、es Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1994 Copyright reserved to CENELEC members Ref. No. EN 190102:1994 EEN190102:1994 BSI 10-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the Eu
19、ropean Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for e
20、lectronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG9, “Integrated Circuits”. The te
21、xt of the draft based on document CECC90102 Issue 2:1989 (with A1) was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC(Secretariat)3535 it was approved by CECC as EN190102 on30April1994. The following dates were fixed:
22、latest date of announcement of the EN at national level (doa) 1994-09-01 latest date of publication of an identical national standard a (dop) 1995-03-01 latest date of withdrawal of conflicting national standards a (dow) 1996-03-01 a National Standard (excluding National implementation of IECQ Speci
23、fications)EN190102:1994 ii BSI 10-1999 Contents Page Foreword iii 1 Limiting conditions of use for the family 1 2 Recommended operating conditions and associated characteristics for the family 1 3 Test methods and procedures 2 4 Inspection requirements 5 Figure 1 Diagram for switching parameters 2 F
24、igure 2 Signal waveform at the input of the component under test 3EN190102:1994 BSI 10-1999 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmon
25、ized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of
26、Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specificat
27、ions for TTL SCHOTTKY DIGITAL INTEGRATED CIRCUITS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherland
28、s, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom, and copies of it can be obtained from the addresses shown on the blue fly sheet. Preface This Family Specification was prepared by CECC WG9 “INTEGRATED CIRCUITS”. It is based, wherever possible, on the Publications of the Inter
29、national Electrotechnical Commission and in particular on IEC747: Semiconductor devices: Discrete devices and integrated circuits, IEC748: Semiconductor devices: Integrated circuits, IEC 749: Semiconductor devices: Mechanical and climatic test methods. It contains general information on TTL Schottky
30、 digital integrated circuits and defines the common characteristics for this family of integrated circuits. Together with the device type detail specification (DS) of a component usually prepared nationally, this family specification forms a complete detail specification. The text of this second Iss
31、ue consists of the text of CECC90102Issue1(1979) amended in accordance with the ratified new material introduced by the following document. In accordance with the decision of the CECC Management Committee this specification is published initially in French and English. The German text will follow as
32、 soon as it has been prepared. Effective date This second Issue of CECC90102 shall become effective for all new qualification approvals on15November1989. Issue1 will continue to remain effective to cover all past approvals. Document Date of Voting Report on the Voting CECC(Secretariat) 2231 April 19
33、88 CECC(Secretariat)2287EN190102:1994 iv BSI 10-1999EN190102:1994 BSI 10-1999 1 1 Limiting conditions of use for the family (Not for inspection purposes) 1.1 Maximum continuous supply voltage 1.2 Maximum input voltages 1.2.1 Max. input voltage 1.2.2 Max. input voltage between multiple emitter transi
34、stor inputs V II : + 5,5 V 1.3 Minimum and maximum operating ambient temperatures 1.4 Minimum and maximum storage temperatures 2 Recommended operating conditions and associated characteristics for the family (Not for inspection purposes) (See also relevant DS) These conditions apply to the total ope
35、rating temperature range, unless otherwise prescribed. 2.1 Positive supply voltage 2.2 Most negative low level input voltage at an input current I IK= 18 mA V IKB : 1,2 V 2.3 Minimum low level input voltage V ILB : 0 V 2.4 Maximum low level input voltage V ILA : 0,8 V 2.5 Minimum high level input vo
36、ltage V IHB : 2V 2.6 Maximum high level input voltage V IHA : 5,5 V 2.7 Most positive low level output voltage at an output current of2mA the higher fanout (unless otherwise prescribed in the DS) V OLA : 0,5 V V CC : 0,5 V + 7,0 V V I : 0,5 V + 5,5V T amb ( C) 54 S 64 S 74 S 84 S min. max. 55 + 125
37、40 + 85 0 + 70 25 + 85 T stg : 65 C min. (unless otherwise specified in the DS) + 150 C max. V CC : 4,5 to 5,5 V (54 S) 4,75 to 5,25 V (64 S, 74 S, 84 S) EN190102:1994 2 BSI 10-1999 2.8 Most negative high level output voltage at an output current of 504A the higher fanout 2.9 Most positive high leve
38、l output voltage 2.10 DC noise margin at low level (V ILA V OLA ) V NL : 0,3 V 2.11 DC noise margin at high level (V OHB V IHB ) 3 Test methods and procedures 3.1 Dynamic characteristics Unless otherwise prescribed in the relevant DS, the following dynamic measurement conditions are applicable. 3.1.
39、1 General diagram Measurements of dynamic characteristics are performed in accordance with the general diagram in Figure 1. 3.1.2 Pulse generator and driving circuit The following conditions shall be met: output impedance of pulse generator: 50 7 10% impedance of the driving circuit cable from the g
40、enerator, including the test equipment: 507 10% Signal applied to the inputs of the component under test (seeFigure 2). V OHB : 2,5 V (54 S) 2,7 V (64 S, 74 S, 84 S) V OHA : 5,5 V (54 S) 5,25 V (64 S, 74 S, 84 S) V NH : 0,5 V (54 S) 0,7 V (64 S, 74 S, 84 S) Inputs (according to the test to be perfor
41、med, see relevant DS) NOTE 1The inductances of the connections and of the components used, and the output impedances of the dc supplies shall be low enough to make the measurement error negligible. NOTE 2One or more pulse generators may be used according to the measurement to be performed. Figure 1
42、Diagram for switching parametersEN190102:1994 BSI 10-1999 3 Low level input voltage: 0 V 0,1 V High level input voltage: 3 V 0,2 V Rise time of the input signal: t r= 2,5 ns 1 ns (measured from10% to90% of the step amplitude) Fall time of the input signal: t f= 2,5 ns 1 ns (measured from90% to 10% o
43、f the step amplitude) Pulse width: t W= 0,5 4s Pulse repetition frequency: u 1 MHz 3.1.3 Component under test load circuit: (see3.1.4) not tested input(s) of the component under test are biased according to the characteristics to be tested (see DS) power supply V CC= 5 V for multiple devices the inp
44、uts of circuit(s) not under test shall be left unconnected reference point for time measurements shall be taken at a voltage of 1,5 V 3.1.4 Load circuit in accordance withFigure 1 (see3.1.1) capacitances and resistances include probe and jig capacitance and resistance the DS prescribes the load circ
45、uit(s) A Load circuit for totem pole outputs B Load circuit for open-collector outputs NOTER 1and C 1may be different from values given in the above table. In this case see DS. Figure 2 Signal waveform at the input of the component under testEN190102:1994 4 BSI 10-1999 C Load circuit for three-slate
46、 outputs NOTER Land C Lvalues may be different from the values given above. In this case see DS. 3.2 Conditions for the electrical endurance tests See SS/4.2.2. Unless otherwise specified in the relevant DS, the inputs are biased for the highest I CC . Maximum output loading capability is applied (I
47、 OHor I OLaccording to high or low level conditions). If the temperature limits of the device are exceeded, the DS shall prescribe the relevant test conditions (seeSS/4.2).EN190102:1994 BSI 10-1999 5 4 Inspection requirements See3.6 of CECC90000 with the following special requirements: Examination o
48、r test D ND Conditions of test Limits to be specified Group A Inspection Sub-Group A5 Dynamic characteristics at 25 C See FS/3.1 ND See FS/3.1 and relevant DS See relevant DS Group B Inspection Sub-Group B5 Electrical endurance 168 h See GS/note 11 See SS/4.2 ND T amb= 125 C See SS/4.2.2 and FS/3.2
49、End point tests: See GS/note 10 Electrical tests: Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 Group C Inspection Sub-Group C8 Electrical endurance 2 000 h See SS/4.2 ND T amb= 125 C See SS/4.2.2 and FS/3.2 End point tests: See GS/note 10 Electrical tests: Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 As for Sub-Groups A2 and A3 Group D Inspection Sub-Group D1 Electrical endurance 8 000 h See SS/4.2 D T amb= 125 C See SS/4.
