1、Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSIg49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58P
2、art 6: Power suppliesICS 13.310Alarm systems Intrusion and hold-up systems BRITISH STANDARDBS EN 50131-6:2008BS EN 50131-6:2008Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSIThis British Standard was published under the authority of the Standards P
3、olicy and Strategy Committee on 29 February 2008 BSI 2008ISBN 978 0 580 55445 2Amendments/corrigenda issued since publicationDate Commentscontract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations. National forewordThi
4、s British Standard is the UK implementation of EN 50131-6:2008. It supersedes BS EN 50131-6:1998 which is withdrawn.The UK participation in its preparation was entrusted to Technical Committee GW/1, Electronic security systems.A list of organizations represented on this committee can be obtained on
5、request to its secretary.This publication does not purport to include all the necessary provisions of a EUROPEAN STANDARD EN 50131-6 NORME EUROPENNE EUROPISCHE NORM January 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europische
6、s Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 50131-6:2008 E ICS 13.310 Supersedes EN 50131-6:1997English version Alarm syste
7、ms - Intrusion and hold-up systems - Part 6: Power supplies Systmes dalarme - Systmes dalarme contre lintrusion et les hold-up - Partie 6: Alimentation Alarmanlagen - Einbruch- und berfallmeldeanlagen - Teil 6: Energieversorgungen This European Standard was approved by CENELEC on 2007-12-01. CENELEC
8、 members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on appl
9、ication to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretar
10、iat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Ne
11、therlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSIEN 50131-6:2008 - 2 - Foreword This European Standard was prepared by the Technical
12、Committee CENELEC TC 79, Alarm systems. The text of the daft was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN 50131-6 on 2007-12-01. This European Standard supersedes EN 50131-6:1997 + corrigendum April 1998. The following dates were fixed: latest date by which the
13、EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2008-12-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2010-12-01 EN 50131 will consist of the following parts, under the general tit
14、le Alarm systems - Intrusion and hold-up systems: Part 1 System requirements Part 22 Intrusion detectors Passive infrared detectors Part 23 Intrusion detectors Microwave detectors Part 24 Intrusion detectors Combined passive infrared / Microwave detectors Part 25 Intrusion detectors Combined passive
15、 infrared / Ultrasonic detectors Part 26 Intrusion detectors Opening contacts (magnetic) Part 271 Intrusion detectors Glass break detectors Acoustic Part 272 Intrusion detectors Glass break detectors Passive Part 273 Intrusion detectors Glass break detectors Active Part 3 Control and indicating equi
16、pment Part 4 Warning devices Part 53 Requirements for interconnections equipment using radio frequency techniques Part 6 Power supplies Part 7 Application guidelines Part 8 Security fog devices Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSI- 3 - E
17、N 50131-6:2008 Contents Introduction 5 1 Scope 6 2 Normative references 6 3 Definitions and abbreviations . 7 3.1 Definitions 7 3.2 Abbreviations . 9 4 Functional requirements . 9 4.1 General 9 4.2 Monitoring of PS 11 4.3 APS Capability. 14 4.4 Recharging for PS type A. 14 4.5 Over-voltage Protectio
18、n .15 4.6 Short Circuit Protection 15 4.7 Overload Protection . 15 4.8 Deep Discharge Protection 15 4.9 Automatic changeover to APS . 15 4.10 Ripple 15 4.11 Tamper Security 15 4.12 Environmental 17 4.13 Safety 17 4.14 EMC 18 4.15 Electrical 18 5 Marking. 19 6 Documentation. 19 7 Tests . 20 7.1 Gener
19、al test conditions 21 7.2 Reduced Functional Test . 21 7.3 PS Rating 22 7.4 Output Voltage Stability - Gradual Load Variation 23 7.5 Output Voltage Stability Switched Load Variation 24 7.6 Signalling: Loss of EPS 25 7.7 Signalling: Storage Device Low Voltage 26 7.8 Signalling: Storage Device Failure
20、 27 7.9 Signalling: Low Output Voltage 28 7.10 Signalling: Power Unit Failure 29 7.11 Signalling: Power Unit Failure SD Charging 29 7.12 Remote Test 30 7.13 SD Recharging 31 7.14 Over-voltage Protection .32 7.15 Short Circuit protection. 33 7.16 Overload Protection . 34 7.17 Deep Discharge Protectio
21、n 35 7.18 Automatic Changeover to APS. 36 Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSIEN 50131-6:2008 - 4 - 7.19 Tamper Protection . 36 7.20 Tamper Protection Access to the inside of the housing . 4 7.21 Tamper Detection Removal from Mounting .
22、38 7.22 Tamper Detection Penetration of the housing . 39 7.23 Environmental and EMC 39 7.24 Marking and Documentation 40 Annex A (informative) Determination of Storage device failure . 41 Figure 1 Power Supply Types 10 Table 1 Power Supply Functions 11 Table 2 Power Supply Signalling 12 Table 3 Maxi
23、mum Time to Detect and Signal Storage Device Low Voltage. 13 Table 4 Tamper Detection 16 Table 5 Removal from Mounting 16 Table 6 Environmental and EMC Tests and Severity . 17 Table 7 Tests for PS according to type 20 Table A.1 Minimum Load times for Common Storage Devices in Use in I b) brief descr
24、iption of operation including characteristics of monitoring functions provided; c) type of PS (A, B or C); d) for types A and B, voltage rating and frequency requirements of the EPS; e) rated output of the power supply and maximum rated output of each independent power output; f) the power requireme
25、nt for any integrated component e.g. CIE, or the PS control circuitry; g) output voltage range under normal operating conditions; h) for PS with dc outputs, the maximum output peak to peak ripple voltage; i) type of SD, its maximum capacity and maximum time to recharge to 80 %; j) the SD voltage bel
26、ow which the APS Fault: Low Voltage SD signal or message will be generated; k) the voltage at any independent power output below which the Power Output Fault signal or message will be generated; l) the SD voltage below which the Deep Discharge Protection function will operate; m) over-voltage protec
27、tion trigger voltage; n) connection details, including sufficient detail to enable effective interface and operation as part of the I o) electrical and logical characteristics of monitoring signals and messages e.g. volt-free contact, message protocols supported; p) operating temperature and humidit
28、y range; q) weights and dimensions; r) fixing details; s) details of type and value for any user serviceable components e.g. fuses; t) details (e.g. frequency and procedure) of any required calibration checks and adjustments. Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, U
29、ncontrolled Copy, (c) BSIEN 50131-6:2008 - 20 - 7 Tests Where products are to be tested for compliance with this standard, the following tests shall be applied to PS types A, B and C according to Table 7 below for the appropriate grade as defined in Table 1. These tests are intended to be primarily
30、concerned with verifying the correct operation of the power supply to the requirements of this standard and the specification provided by the manufacturer. All the test parameters specified shall carry a general tolerance of 10 % unless otherwise stated. Table 7 Tests for PS according to type Test T
31、itle Test no.Type A Type B Type C 1 Reduced Functional Test 7.2 ! ! ! 2 PS Rating 7.3 ! ! ! 3 Output Voltage Stability Gradual Load Variation 7.4 ! ! ! 4 Output Voltage Stability Switched Load Variation 7.5 ! ! ! 5 Signalling: Loss of EPS 7.6 ! ! 6 Signalling: Storage Device Low Voltage 7.7 ! ! ! 7
32、Signalling: Storage Device Failure 7.8 ! 8 Signalling: Low Output Voltage 7.9 ! ! 9 Signalling: Power Unit Failure 7.10 ! ! 10 Signalling: Power Unit Failure SD Charging 7.11 ! 11 Remote Test 7.12 ! 12 SD Recharging 7.13 ! 13 Over-voltage Protection 7.14 ! ! 14 Short Circuit Protection 7.15 ! ! ! 15
33、 Overload Protection 7.16 ! ! ! 16 Deep Discharge Protection 7.17 ! ! ! 17 Automatic Changeover to APS 7.18 ! ! 18 Tamper Protection 7.19 ! ! ! 19 Tamper Detection Access to the inside of the housing 7.20 ! ! ! 20 Tamper Detection Removal from mounting 7.21 ! ! ! 21 Tamper Detection Penetration of t
34、he housing 7.22 ! ! ! 22 Environmental and EMC 7.23 ! ! ! 23 Marking and Documentation 7.24 ! ! ! ! = Test applicable for PS type. Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSI- 21 - EN 50131-6:2008 7.1 General test conditions 7.1.1 Standard labo
35、ratory conditions for testing The general atmospheric conditions in the measurement and tests laboratory shall be those specified in EN 60068-1, 5.3.1, unless stated otherwise. Temperature: 15 C to 35 C Relative humidity: 25 % RH to 75 % RH Air pressure: 86 kPa to 106 kPa 7.1.2 General detection tes
36、ting environment and procedures The PS manufacturers documented instructions regarding mounting and operation shall be applied to all tests. 7.1.3 Signal or message processing time Where the PS is integrated with another I&HAS component (e.g. CIE) or another component is the only means to indicate t
37、he generation of a signal or message, allowance shall be made for the processing time of that component. 7.1.4 Load electrical characteristics The electrical characteristics of the load used in these tests shall have no reactive component. 7.1.5 SD Discharged Condition A SD shall be considered to ha
38、ve reached its fully discharged condition if it has been subject to discharge from a fully charged state using a fixed current load over a period defined according to the SD manufacturer. 7.2 Reduced Functional Test 7.2.1 Principle The principle of the reduced functional test consists of operating t
39、he PS under full load conditions to verify that the PS is operational before undergoing other tests (e.g. impact test, environmental test) and that it continues to function after these tests. For type A PS the test is carried out with a fully discharged SD and maximum EPS voltage. For a type B PS th
40、e test is carried out with a SD at any state of charge and maximum EPS voltage. For a type C PS the test is carried out with a SD of sufficient charge for its voltage at any independent power output to remain above the Storage Device - Low Voltage value. 7.2.2 Test conditions Connect a SD of the max
41、imum capacity specified for the PS. For PS type A this SD shall be discharged to the minimum level in accordance with 7.1.5. Connect a load to the PS that will demand the full rated output of the PS proportionately spread across all the independent power outputs according to the individual maximum r
42、ating of each independent power output. Licensed Copy: Wang Bin, ISO/EXCHANGE CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSIEN 50131-6:2008 - 22 - 7.2.3 Mounting Mount the PS according to the PS manufacturers instructions. 7.2.4 Procedure 7.2.4.1 Stimuli For PS types A and B apply an
43、EPS voltage of 230 V AC +10 % to the PS at a frequency specified by the PS manufacturer. Operate the PS. Open the PS housing by normal means. 7.2.4.2 Measurement Measure the voltage and ripple voltage at each independent power output. Monitor the EPS, APS, Power Output Fault and Tamper signal or mes
44、sage outputs. 7.2.5 Pass/Fail criteria Throughout the test, the voltage and ripple voltage at any independent power output shall remain within the limits specified by the manufacturer. There shall be no EPS, APS or Power Output Fault signals or messages generated during the tests. A Tamper signal or
45、 message shall be generated when the PS housing is opened by normal means. 7.3 PS Rating 7.3.1 Principle The principle of this test is to verify the continuous rated output of the PS under full load conditions and for PS types A and B, under maximum and minimum values of EPS voltage. This test is al
46、so to verify the specified power requirements of any integrated component or the PS control circuitry. 7.3.2 Test conditions Connect a SD of the maximum capacity specified for the PS. For PS type A this SD shall be discharged to the minimum level in accordance with 7.1.5. Connect a load to the PS th
47、at will demand the full rated output of the PS proportionately spread across all the independent power outputs according to the individual maximum rating of each independent power output. 7.3.3 Mounting Mount the PS according to the PS manufacturers instructions. Licensed Copy: Wang Bin, ISO/EXCHANG
48、E CHINA STANDARDS, 14/05/2008 04:07, Uncontrolled Copy, (c) BSI- 23 - EN 50131-6:2008 7.3.4 Procedure 7.3.4.1 Stimuli For PS types A and B: Apply an EPS voltage of 230 V AC -15 % to the PS at the frequency specified by the PS manufacturer and operate the PS for 30 min. Apply an EPS voltage of 230 V
49、AC +10 % to the PS and operate the PS for 24 h. For PS type C, operate the PS for 24 h. At the end of the test period, disconnect the load and for PS types A and B, disconnect the EPS. 7.3.4.2 Measurement Measure the voltage and ripple voltage during the test at each independent power output. Measure the quiescent current drawn from the SD by the PS control circuitry and any other components within the PS housing e.g. CIE. 7.3.5 Pass/Fail criteria Throughout the test, the vol
