1、 STD-BSI BS EN b0444-5-ENGL 1797 m Lb2YbbS Ob48L3L 7TO m BRITISH STANDARD Measurement of quartz crystal unit parameters Part 5. Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction The European Standard EN 604443 : 1997 ha
2、s the status of a British Standard ICs 31.140 NO COPYING WITHOUT BSl PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW BS EN 60444-5 : 1997 LEC 444-5 : 1995 rncorpomting 4mendment No. 1 to SS 7681 : Part 5 : 1995 (renumbers #.e BS US BS EN 60444-5 ; 1997) COPYRIGHT British Standards Institution on ERC
3、 Specs and StandardsLicensed by Information Handling Services STD-BSI BS EN b0444-5-ENGL 1997 1b24bb7 Ob48132 837 BS EN 60444-5 : 1997 Issue 2, October 1997 This British Standard, having been prepared under the didon of the Electrotechnicai Standards Board, was published under the authority of the S
4、tandards Board and comes into effect on 15 October 1995 O MI 1997 Committees responsible for this British Standard “he preparation of this British Standard was entrusted to Technicai Committee EPU49, Piezoelectric devices for frequency control and reduction, upon which the following boies were repre
5、sented: Federalion of Electronics Industry Institute of Physics instution of Electrid Engineers Muiistry of Defence National Supeivisig Inspectorate (BSI PC) Amendments issued since publication I Te* Iffected Amd. No. Date 9661 1y;yber I BS renumbered as BS EN 60444-5 : 1997 and new annex ZA inserte
6、d The following BSI references relate to the work on this standard: Committee reference EPU49 Special announcement in KV Neus, July 1995 ISBN O 680 24737 6 COPYRIGHT British Standards Institution on ERC Specs and StandardsLicensed by Information Handling ServicesSTD.BS1 BS EN b444-5-ENGL 1997 9 Lb24
7、bb Ob48133 773 9 hue 1, October 1997 BS EN 60444-5 : 1997 Page Front cover Inside front cover b ii EN title page a 1 Summary of pages Issue 2 2 1 blank 2 2 1 The following table identifies the current issue of each page. Issue 1 indicates that a page has been introduced for the first time by amendme
8、nt. Subsequent issue numbers indicate an updated page. Vertical sidelining on replacement pages indicates the most recent changes (amendment, addition, deletion). Page iv Issue 1 ltO48 49 50 Inside back cover Back cover original 1 1 blank Change of identifier Wherever BS 7681 : Part 5 : 1995 appears
9、 in this standard, it should be read as BS EN 644.4-5 : 1997. O BSI 1997 a COPYRIGHT British Standards Institution on ERC Specs and StandardsLicensed by Information Handling Services* * vi STD-BSI BS EN b0444-5-ENGL 1997 M Lb24bb7 Ob48134 bOT Issue 2, October 1997 BS EN 60444-5 : 1997 Contents page
10、ConuniUees responsible inside front cover National foreword ii Methods 1 scope 1 2 ntrouction 1 3 Measurementprocedures 5 4 Choice of admiance measurement method 7 6 calibratontechniques 9 6 Low-frequency measurements 10 7 10 8 Measurement errors, inshumentation and test nxhues 18 Annexes A (nohe) C
11、alibration 33 B (informative) Low-kequency measurement 44 C (iionnave) Bibliography 48 Figures Admittance analysis and estimation of the equivaent circuit parameters 1 2 3 4 6 6 7 8 9 10 11 12 13 14 16 A. 1 A.2 A.3 A.4 A.6 A.6 A. 7 B.l B.2 B.3 Measurement sequence Measurement methods, admiance analy
12、sis and parameter estimaon techniques ne-port equivaient circuit of a singe-mode quariz crystal unit Tiveport equivaent circuit of a singie-mode quartz crystal unit Admittance and impedance circle of a quartz CrJStal unit for tiequencies near an isolated mode of vibration Genera oneport equivalent c
13、ircuit for multiple resonances ?tKcqmt equivalent circuit for multiple resonances procedure for the detemination of the equivalent circuit parameters of a Calibration veecaon for S-parameter measurement APG3.5 lhmmlsl * on fixture APC-7 lhmsmlm . onxture APG7 Refledion xture ApG3.5 Onepost fixture A
14、pG3.5 wo-port fixture Direct transmission measurement fixture Simpiied oneport network analyzer Simplied tweport, three-chel network analyzer Signai flowgraph representation for proposed 12-term error model #A direct transmissi on system Equivalent circuit for direct transmission method “hin-m calib
15、mtion resistor Mded SMA termhting resistor Siplie network anayzer test system for low-frequency measurements 1 : 2 Directional bridge for low-frequency measurements 1 : 1 Directional bridge for low-hquency measurements -crystalunit 22 23 24 24 25 26 26 27 28 29 29 30 30 31 32 39 39 40 41 41 42 43 46
16、 47 47 Annex ZA (normative) Nonuative references to international publications with their corresponding European publications 49 O BSI 1997 i COPYRIGHT British Standards Institution on ERC Specs and StandardsLicensed by Information Handling Services STD.BS1 BS EN b444-5-ENGL 1997 Lb24bb9 Ob48135 54b
17、 BS EN 60444-6 : 1997 Issue 2, October 1997 National foreword This Part of BS EN 60444 has been prepared by Technical Committee EPU49 (formerly ECUll), and is the English language version of EN 60444-5 : 1997, published by the European Committee for Electrotechnical Standarchation (CENELEC). It is i
18、dentical with IEC 444-5 : 1995, Measurement of quartz crystal unit parameters Part 5. Methods for Uze cietennination of equivalent electrical parameters using automatic network analyzer techniques and error correction, published by the International Electrotechnical Commission (IEC). Cross reference
19、s Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative references to international publications with their corresponding European publications. The British Standards which implement these international or European publications may be found in
20、the BSI Standards Catalogue under the section entitled International Standards Correspondence Index, or using the Find faciiity of the BSI Standards Electronic Catalogue. Compliance with a British Standard does not of itself confer immunity from legal obligations. O BSI 1997 COPYRIGHT British Standa
21、rds Institution on ERC Specs and StandardsLicensed by Information Handling ServicesICs 31.140 Descriptors: Qum crystal resonators, measurement of parameters, equivalent electrical parameters, measurement procedures, calibration. instrumentation and test fwes English version Measurement of quartz cry
22、stal unit parameters Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniqpes and error correction (IEC 444-5 : 1995) Mesure des paramtres des reS0natet.m quartz Partie 5: Mthodes pour la detemination des paramtres lectriques quivalents ut
23、ilisant des analyseures automatiques de rseaux et correction des erreurs (CE1 444-5 : 1995) Messung von Schwingquarz-Kennwerten Teil 5: Mefiverfahren zur Bestimmung der elektrischen Ersatzschaltungsparameter von Schwingquarzen mit automatischer Netmverkanalysatortechnik und Fehlerkorrektur (IEC 444-
24、5 : 1995) This European Standard was approved by CENELEC on 1997-03-11. CENELEC members are bound to comply with the CENKENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Uptudate lists and bibliogra
25、phical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of
26、 a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national standards bodies of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Po
27、rtugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fur Elektrotechnische Normung Central Secretariat: rue de Stassart 36, B-1050 Brussels O 1997 CENELEC - All right
28、s of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60444-5 : 1997 E COPYRIGHT British Standards Institution on ERC Specs and StandardsLicensed by Information Handling ServicesSTD-BSI BS EN b0444-5-ENGL 1777 = Lb2qbb7 ObYBL37 319 H EN 60444-5 : 1997 Iss
29、ue 1, October 1997 Foreword The text of the International Standaxd IEC 444-5 : 1995, prepared by IEC TC 49, Piezoelectric and dielectsic devices for fkequency contsol and selection, was submitted to the formal vote and was approved by CENELEC as EN 60444-5 on 1997-03-11 without any modification. The
30、 foliowing dates were fixed latest date by which the EN has to be implemented at national level by publication of an identical national standard or by - latestdatebywhichthe national standars conflicng with the EN have to be withdrawn - endorsement (dop) 1997-12-01 (dow) 1997-12-01 Annexes designate
31、d normative are part of the body of the stancard. Annexes designated informative are given for infomation only. In this standard, annexes A and ZA are normative and annexes B and C are informative. Annex ZA has been added by CENELEC. iv O BSI 1997 COPYRIGHT British Standards Institution on ERC Specs
32、 and StandardsLicensed by Information Handling ServicesSTD-BSI ES EN b04LILI-5-ENGL 1777 H 1b24bb7 Ob48138 255 m BS 7681 : Part 6 : 1996 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniqu
33、es and error correction 1 scope nic objective of this international Standard is to give methods for detumining the best rep.escniations of modes in quartz crystal mnators by linear equivalent circuits. Chit representatbns are based on electrical parameters measured with vector network analyzer equip
34、ment using automatic emrr correction. Detamination of the equivalent paramems by the method of this standard is based on the measurement of device immittance in the vicinity of series resonance. The further problem of characterizing thc device for operation with a seris load capacitance has not been
35、 directly addresse, although it is recognized that some applications require such characterization nie same measuring equipment, and fundamentally the same sa of measurement, provides the means to characterize completely the test load capacity fixture as well as the series combwon of load Capscity f
36、uture and crystal unit. 2 introduction 2.1 Gencrul 2.1.1 This standard describes meuiods for detennining the values of the electrical paramem of piczlectric qaertc crystal units using automated vector network analyzer equipment. Tht recammended pocadiins for S- parameter systems use shielded open-ci
37、rcuit, shm-circuit, and nsistix temhations, and (i the case of mmission mcuiods) thni-line connections. Coaxial open-circuit, shortcircuit and resistive taminatiasis designed for Sn systems arc readily available, and can be calibrated in terms of national srandards of impedance over very wide freque
38、ncy ranges. At the present time ihni-line connectionS suitable for caiibrating the test fmtures must be calibrated by the user or supplier, however. the techniques for doing this are quite well known Non-coaxial standard resistors for use in the direct nuismission (IC-network) method are commerciail
39、y available as well. but are not as easily traceable to National Smndards. Eiuther guidance on the applicarion of this standard may be found in IEC 1080. 2.1.2 The procedure involves the measurement of crystal resonator admittance at prescribed frequency points by OM of a number of methods followed
40、by data interpretation and evaluation of the equivalent circuit parameters (figure 1). 2.1.3 The measurement methods described are intended to provide reference values for the electrical equivalent circuit parameters. Manufacturers and users may employ other methods of measurement, but the values th
41、us obtained shall be correlated with those obtained by the reference method. 2.1.4 This standard is only concerned with the represenration of quartz crystal resonators by limear equivalent circuits which are valid over a narrow frequency band covering at most a small percentage of the resonance freq
42、U=Y. 2.1.5 In general, some degree of non-linearity will be present and the circuit parameters may have a noticeable dependence on drive levei. If non-linear effects are very large then the accepted circuit representations may be unusable. 1 COPYRIGHT British Standards Institution on ERC Specs and S
43、tandardsLicensed by Information Handling Services- _ STD-BSI BS EN b0444-5-ENGL 1777 Lb24bb7 Ob4137 171 BS 7681 : Part 6 : 19% 2.1.6 Normally, the equivalent circuit will be used to represent an isolated mode of vibration, but occasionally additional modes may occur extremely close to the main respo
44、nse; a more complex circuit representation may then be used, and consideration of this problem is included in this standard. See reference i*. 2.2 Methods of admittance measurement 2.2.1 The following terminology will be used to describe the circuit elements. See figures 3 and 4: Co is the static ca
45、pacitance (for the one-port model) Col is the electrode to can Capacitance C, is the static capacitance (for the simplified two-port model) Cos is the eltctfode to can capacitance Go is the conductance associated with Co Gol is the conductance associated with Col G, is the conductance associated wit
46、h Coz G, is the conductance associated with Co3 RI is the motional resistance Ll is the motional inductance Cl isthemotionaicapacitance 1 a, = series monance hquency (radsis) (LICI) nie transfer admittaace function, riz, for the equivalent circuits shown in figures 3 and 4, describes a circular locu
47、s in the complex admittance plane, as depicted in figure 5a nie transform of this locus to the impedance (2 = l/I,plane is also acircle as in figure 5b. nierc arc six charactgisti c fnqoencies associaicd with such a circuit: 4 is the series resonance frequency f, isthefrcqucncyofmeximumadmi(minimumi
48、m) ft is the Tcso(I fhquency (Zao phase) fp is tbe parallel resonance fiequtncy (lossless) f, fn is the anti-resonance frequency (m phase) is the fraquency of minimum admittance (maximum impedance) Of these, the Senes resonance frequency done is essentially independent of the value of static capacit
49、ance, and is therefore the parameter of choice for purposes of specification as it will be littie influenced by strays. nie relationships of the characteristic frequencies to the crystal resonator is characterized as a one-port device with one elcceode driven and all other electrodes and the crystal encIosure ded. in a reflection -ment the admittance Y can be caiculated from the measured valut of S, 2 COPYRIGHT British Standards Institution on ERC Specs and StandardsLicensed by Information Handling Services
