1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationQuartz crystal controlled oscillators of assessed qualityPart 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators Application guidelinesBS EN 60
2、679-6:2011National forewordThis British Standard is the UK implementation of EN 60679-6:2011. It isidentical to IEC 60679-6:2011. It supersedes DD IEC/PAS 60679-6:2008 whichis withdrawn.The UK participation in its preparation was entrusted to Technical CommitteeEPL/49, Piezoelectric devices for freq
3、uency control and selection.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2011ISBN 978 0 580 64877 9ICS 31
4、.140Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 30 June 2011.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 60679-6:2011EU
5、ROPEAN STANDARD EN 60679-6 NORME EUROPENNE EUROPISCHE NORM April 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC -
6、 All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60679-6:2011 E ICS 31.140 English version Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillator
7、s - Application guidelines (IEC 60679-6:2011) Oscillateurs pilots par quartz sous assurance de la qualit - Partie 6: Mthode de mesure de la gigue de phase pour les oscillateurs quartz et les oscillateurs SAW - Lignes directrices pour lapplication (CEI 60679-6:2011) Quarzoszillatoren mit bewerteter Q
8、ualitt -Teil 6: Phasenjitter-Messverfahren fr Quarzoszillatoren und OFW-Oszillatoren - Leitfaden fr die Anwendung (IEC 60679-6:2011) This European Standard was approved by CENELEC on 2011-04-18. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditi
9、ons for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in thre
10、e official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnica
11、l committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerl
12、and and the United Kingdom. BS EN 60679-6:2011EN 60679-6:2011 - 2 - Foreword The text of document 49/935/FDIS, future edition 1 of IEC 60679-6, prepared by IEC TC 49, Piezoelectric, Dielectric and Electrostatic Devices and Associated Materials for FrequencyControl, Selection and Detection, was submi
13、tted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60679-6 on 2011-04-18. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent ri
14、ghts. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-01-18 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2014-04-18 Anne
15、x ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60679-6:2011 was approved by CENELEC as a European Standard without any modification. _ BS EN 60679-6:2011- 3 - EN 60679-6:2011 Annex ZA (normative) Normative references to international publications with
16、 their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE W
17、hen an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60679-1 2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification EN 60679-1 2007 BS EN 60679-6:2011
18、2 60679-6 IEC:2011 CONTENTS INTRODUCTION . 6 1 Scope . 8 2 Normative references . 8 3 Terms, definitions and general concepts . 8 3.1 Terms and definitions 8 3.2 General concepts 8 3.2.1 Phase jitter 8 3.2.2 r.m.s jitter 9 3.2.3 Peak-to-peak jitter . 10 3.2.4 Random jitter . 10 3.2.5 Deterministic j
19、itter . 11 3.2.6 Period (periodic) jitter 11 3.2.7 Data-dependent jitter . 11 3.2.8 Total jitter 11 3.3 Points to be considered for measurement 12 3.3.1 Measurement equipment . 12 3.3.2 Factors of measurement errors 12 4 Measurement method . 13 4.1 General . 13 4.2 Frequency range and the measuremen
20、t method 13 4.3 Method using the phase noise measurement value 13 4.3.1 Overview . 13 4.3.2 Measurement equipment and system . 13 4.3.3 Measurement item . 13 4.3.4 Range of detuning frequency . 14 4.3.5 Phase noise measurement method 14 4.4 Measurement method using the specially designed measurement
21、 equipment 14 4.4.1 Overview . 14 4.4.2 Measurement equipment and system . 14 4.4.3 Measurement items . 14 4.4.4 Number of measurements 14 4.5 Block diagram of the measurement 14 4.6 Input and output impedance of the measurement system. 15 4.7 Measurement equipment . 15 4.7.1 General . 15 4.7.2 Jitt
22、er floor 15 4.7.3 Frequency range . 15 4.7.4 Output waveform . 15 4.7.5 Output voltage . 16 4.8 Test fixture 16 4.9 Cable, tools and instruments . 16 5 Measurement and the measurement environment . 16 5.1 Set-up before taking measurements 16 5.2 Points to be considered and noted at the time of measu
23、rement . 16 5.3 Treatment after the measurement 17 BS EN 60679-6:201160679-6 IEC:2011 3 6 Measurement . 17 6.1 Reference temperature 17 6.2 Measurement of temperature characteristics . 17 6.3 Measurement under vibration 17 6.4 Measurement at the time of impact 17 6.5 Measurement in accelerated agein
24、g 17 7 Other points to be noted . 17 8 Miscellaneous 17 Annex A (normative) Calculation method for the amount of phase jitter 18 Bibliography 21 Figure 1 Voltage versus time . 9 Figure 2 Explanatory diagram of the amount of jitter applied to r.m.s. jitter 10 Figure 3 Explanatory diagram of random ji
25、tter, deterministic jitter, and total jitter . 11 Figure 4 Equivalent block diagram . 15 Figure A.1 Concept diagram of SSB phase noise . 19 BS EN 60679-6:2011 6 60679-6 IEC:2011 INTRODUCTION The study of phase jitter measurement methods was conducted in accordance with the agreement during the IEC T
26、C 49 Berlin international meeting in 2001. At this meeting, the decision was made that Japan should assume the responsibilities of this study. Then, the technical committee of the Quartz Crystal Industry Association of Japan (QIAJ) proceeded with this study. This study was substantially conducted du
27、ring the years 2002 to 2005 and can be referred to as the first stage of the study. The second stage is being continued at present. Phase jitter has become one of the essential measurement items by digitization of electronic devices. However, theoretically, some ambiguity is still left in the phase
28、jitter. Since no standard measurement method is proposed, suppliers and customers may be mutually exposed to a risk which could cause enormous economic losses. To avoid this risk, this document provides a standard, based on the study results during the first stage, for each company of QIAJ members t
29、o avoid anxiety as to the measurement of the phase jitter and for the purpose of giving guidance without any mistakes. In this standard, a recommendation to make r.m.s. jitter a measurement object is presented. The reason why this recommendation is submitted is because the oscillators resulting in u
30、ltra-low amount of jitter are targeted as the object to be measured. Oscillators are analogue-type electronic devices. Their sine wave output signals are more favourable than the signals obtained by electronic systems. Moreover, the output is utilized as the reference clock of the measurement equipm
31、ent, leading to a situation in which the amount of phase jitter is shown to be smaller than the amount of phase jitter of the measurement equipment. Accordingly, this may give the impression that the measured amount of phase jitter is not from the oscillators but rather the amount of phase jitter ge
32、nerated by the measurement equipment, or the measurement system. Therefore, when adopting the amount of other phase jitters as the measurement items, a recommendation is presented to select measurement equipment and a measurement system capable of being verified and confirmed sufficiently, contractu
33、ally determined between suppliers and customers. Moreover, when the phase noise method is used, the random jitter values need to be discussed after defining the jitter frequency bands from start to end of integrating the phase noise. In case of doubts related to the measurement values, refer to the
34、application of Allan Variance 11. Frequency stability was compiled into a single work by IEEE in 1966 2. Then, the definition was applied to atomic oscillators, crystal oscillators, as well as electronic systems for telecommunication, information, audio-visual, and the like. Conventional crystal osc
35、illators and electronic systems have analogue systems and their signal waveforms are sine waves. Therefore, the short-term frequency stability as one field of the frequency stability is measured as the phase noise or Allan Variance. Recently, digitization of electronic systems is progressing. Under
36、such circumstance, the short-term frequency stability has been measured as the phase jitter. On the other hand, the oscillators are analogue-type electronic devices. For the oscillators, the signals having square waves or waveforms similar thereto are demanded by users to be easily fit into the elec
37、tronic systems. Naturally, for the short-term frequency stability, the measurement as the phase jitter is frequently demanded by users. For advance application in electronic information and communication technology: (e.g.: advanced satellite communications, control circuits for electric vehicle (EV)
38、 and etc.), necessity arises for the measurement method for common guidelines of phase jitter. In these 1Numbers in square brackets refer to the Bibliography. BS EN 60679-6:201160679-6 IEC:2011 7 days, measurement method of phase jitter also becomes more important from the electromagnetic influence
39、(EMI) point of view. In that sense, international standardization as IEC 60679-6 of phase jitter measurement method is significant and timely. The measurement method of phase jitter described in this document is the newest method by which quantitative measurement was made possible from the breakthro
40、ugh of the measurement system technology, in the hope to get attention from not only a device engineer but also a system engineer and expected to be widely used. BS EN 60679-6:2011 8 60679-6 IEC:2011 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY Part 6: Phase jitter measurement method fo
41、r quartz crystal oscillators and SAW oscillators Application guidelines 1 Scope This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measure
42、ment of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules th
43、at have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity. 2 Normative references The following re
44、ferenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60679-1:2007, Quartz crystal controlled oscillators of assess
45、ed quality Part 1: Generic specification 3 Terms, definitions and general concepts 3.1 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60679-1:2007 apply. Units, drawings, codes, and characters are also based on IEC 60679-1. 3.2 General concepts 3.2.1
46、Phase jitter The phase jitter of oscillators means an electronic noise of signal waveforms in terms of time. On the other hand, the phase jitter is described as a jitter in which the frequency of signal deflection exceeds 10 Hz and as a wander in which the frequency is 10 Hz or less. It is difficult
47、 to observe the wander of oscillators. The wander is a phenomenon which is confirmed in electronic parts such as optical cables susceptible to expansion and contraction even by a small amount of temperature changes. Therefore, the wander is generally not discussed in the oscillators. In this documen
48、t also, phase jitter is targeted only to the jitter. BS EN 60679-6:201160679-6 IEC:2011 9 As for signals, an ideal cycle (t) is inversely proportional to a frequency (f). More specifically, the relation is expressed by Equation (1). ft1= (1) Actually, the cycle is varied by receiving various influen
49、ces. This phenomenon is the phase jitter and can be confirmed by thickening of edges of waveforms when using oscilloscopes or the like. Regarding the method for measuring and evaluating such phase jitter, statistical measurement techniques are utilized as shown is shown in Figure 1. The numerical values in Figure 1 are treated as a symbol. The position of 0,5 of signal waveform is defined as a reference point in the vertical axis, and the edges of the reference point are
