1、BRITISH STANDARD BS EN 60749-10:2002 Incorporating Corrigendum No. 1 Semiconductor devices Mechanical and climatic test methods Part 10: Mechanical shock The European Standard EN 60749-10:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-10:2002 This British Standard, having been p
2、repared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 28 August 2002 BSI 17 September 2002 ISBN 0 580 40292 4 National foreword This British Standard is the official English langua
3、ge version of EN 60749-10:2002. It is identical with IEC 60749-10:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committe
4、e can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Sear
5、ch” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal
6、obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summ
7、ary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 5 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Comments 14112 Corrigendum No.
8、1 17 September 2002 Addition of supersession details to national foreword.EUROPEAN STANDARD EN 60749-10 NORME EUROPENNE EUROPISCHE NORM August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische
9、 Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-10:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 English version Semiconduct
10、or devices - Mechanical and climatic test methods Part 10: Mechanical shock (IEC 60749-10:2002) Dispositifs semiconducteurs - Mthodes dessais mcaniques et climatiques Partie 10: Chocs mcaniques (CEI 60749-10:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 10: Mechanisches
11、 Schocken (IEC 60749-10:2002) This European Standard was approved by CENELEC on 2002-07-02. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-d
12、ate lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation unde
13、r the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, I
14、celand, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.Foreword The text of document 47/1598/FDIS, future edition 1 of IEC 60749-10, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote
15、 and was approved by CENELEC as EN 60749-10 on 2002-07-02. This mechanical and climatic test method, as it relates to mechanical shock, is a complete rewrite of the test contained in clause 4, chapter 2 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implement
16、ed at national level by publication of an identical national standard or by endorsement (dop) 2003-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this standard, an
17、nex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60749-10:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN6074910:2002 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 10: M
18、echanical shock 1 Scope This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handl
19、ing, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. In general, this mechanical shock test is in conformity with IEC 60068-2-
20、27 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest editi
21、on of the referenced document (including any amendments) applies. IEC 60068-2-27:1987, Environmental testing. Part 2: Tests Test Ea and guidance: Shock 3 Test apparatus The shock testing apparatus shall be capable of providing shock pulses of 5 000 m/s 2and 15 000 m/s 2(peak) with a pulse duration b
22、etween 0,5 ms and 1,0 ms to the body of the device. The acceleration pulse as determined from the unfiltered output of a transducer with natural frequency greater than or equal to five times the frequency of the shock pulse being established shall be a half-sine waveform with an allowable distortion
23、 not greater than 20 % of the specified peak acceleration. The pulse duration shall be measured between the points at 10 % of the peak acceleration during rise time and 10 % of the peak acceleration during decay time. Absolute tolerances of the pulse duration shall be 30 % of the specified duration.
24、 4 Procedure The shock testing apparatus shall be mounted on a sturdy laboratory table or equivalent base and levelled before use. The device shall be rigidly mounted or restrained by its case with suitable protection for the leads. Means may be provided to prevent the shock from being repeated due
25、to “bounce“ in the apparatus. Unless otherwise specified, the device shall be subject to five shock pulses of the peak level (g) specified in the selected test condition and for the pulse duration specified in each of the orientations X 1 , X 2 , Y 1 , Y 2 , Z 1 , and Z 2 . One required orientation
26、(Y 1 ) shall be defined as that one in which the internal element(s) tends to be removed from its mount. Unless otherwise specified, test condition B shall apply. Page3 EN6074910:2002 Table 1 Test conditions Test condition Acceleration level (peak) m/s 2 Duration of pulse ms A5 0 0 0 1,0 0,1 B 15 00
27、0 0,5 0,1 4.1 Test measurement Hermeticity tests, visual examination, and electrical measurements (consisting of parametric and functional tests) shall be performed. 4.2 Failure criteria A device shall be considered a failure if hermeticity cannot be demonstrated, if parametric limits are exceeded,
28、or if functionality cannot be demonstrated under the conditions specified in the applicable procurement document. Mechanical damage such as cracking, chipping, or breaking of the package will also be considered as a failure, provided such damage was not caused by fixturing or handling and the damage
29、 is critical to the component performance in the specific application. 5 Summary The following details shall be specified in the applicable procurement document: a) Test condition, if other than test condition B (see Table 1). b) Electrical measurements (see 4.1). c) Sample size and accept number. d
30、) Hermetic leak rate (if applicable) (see 4.1). _ Page4 EN6074910:2002 Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other publications. These n
31、ormative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated r
32、eferences the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-27 1987 Basic environmental test
33、ing procedures Part 2: Tests - Test Ea and guidance: Shock EN 60068-2-27 1993 Page5 EN6074910:2002 BS EN 60749-10:2002 BSI 389 Chiswick High Road London W4 4AL BSI British Standards Institution BSI is the independent national body responsible for preparing British Standards. It presents the UK view
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