1、BRITISH STANDARD BS EN 60749-9:2002 Semiconductor devices Mechanical and climatic test methods Part 9: Permanence of marking The European Standard EN 60749-9:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-9:2002 This British Standard, having been prepared under the direction of
2、the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 24 September 2002 BSI 24 September 2002 ISBN 0 580 40396 3 National foreword This British Standard is the official English language version of EN 60749-9:200
3、2. It is identical with IEC 60749-9:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on request t
4、o its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electr
5、onic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to un
6、derstand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document compr
7、ises a front cover, an inside front cover, the EN title page, pages 2 to 6, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60749-9 NOR
8、ME EUROPENNE EUROPISCHE NORM August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitati
9、on in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-9:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 English version Semiconductor devices - Mechanical and climatic test methods Part 9: Permanence of marking (IEC 60749-9:2002) Dispositi
10、fs semiconducteurs - Mthodes dessais mcaniques et climatiques Partie 9: Permanence du marquage (CEI 60749-9:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 9: Bestndigkeit der Kennzeichnung (IEC 60749-9:2002) This European Standard was approved by CENELEC on 2002-07-02. C
11、ENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained o
12、n application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Se
13、cretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sw
14、eden, Switzerland and United Kingdom.EN 60749-9:2002 - 2 - Foreword The text of document 47/1604/FDIS, future edition 1 of IEC 60749-9, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-9 on 2002-07-02. This mechanica
15、l and climatic test method, as it relates to the permanence of marking, is a complete rewrite of the test contained in clause 2, chapter 4 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national sta
16、ndard or by endorsement (dop) 2003-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endor
17、sement notice The text of the International Standard IEC 60749-9:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 BSEN607499:2002067-949 EI:C0022 3 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 9: Permanence of marking 1 Scope The purpose of thi
18、s part of IEC 60749 is to test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all packa
19、ge types. It is suitable for use in qualification and/or process monitor testing. The test should be considered non-destructive. Electrical or mechanical rejects may be used for the purpose of this test. In general, this test of permanence of marking is in conformity with IEC 60068-2-45 but, due to
20、specific requirements of semiconductors, the clauses of this standard apply. NOTE 1 This procedure does not apply to laser branded packages. Many available solvents that could be used are either not sufficiently active, too stringent, or even dangerous to humans when in direct contact or when fumes
21、are inhaled. NOTE 2 The composition of solvents used in this standard, is considered typical and representative of the desired stringency as far as the usual coatings and markings are concerned. 2 Normative references The following referenced documents are indispensable for the application of this d
22、ocument. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-45, Environmental testing Part 2: Tests Test XA and guidance: Immersion in cleaning solvents Page3 BSEN607499:2002067-9
23、49 EI:C0022 4 3 Terms and definitions For the purpose of this part of IEC 60749, the following terms and definitions apply. 3.1 solvent A mixture consisting of the following: one part by volume of isopropyl alcohol; three parts by volume of volatile petroleum spirits with a flash point greater than
24、60 C, or three parts by volume of a mixture of 80 % by volume of kerosene and 20 % by volume of ethylbenzene NOTE The solvent should be maintained at a temperature of 20 C to 30 C. 3.2 solvent B semi-aqueous based solvent, (defluxer), e.g. a terpene, aliphatic hydrocarbons, high molecular weight alc
25、ohols, etc., or any equivalent national environmental agency-approved HCFC (hydrochlorofluorocarbon), terpene or demonstrated equivalent 3.3 solvent C mixture consisting of the following: a) two parts by volume of deionized water; b) one part by volume of propylene glycol monomethyl ether (laborator
26、y reagent grade); c) one part by volume of monoethanolamine (laboratory reagent grade). NOTE The solvent should be maintained at a temperature of 63 C to 70 C. 3.4 brush toothbrush with a handle made of a non-reactive material NOTE The brush should have at least three long rows of hard bristles, the
27、 free ends of which should lie substantially in the same plane. The toothbrush should be used exclusively with a single solvent and when there is any evidence of softening, bending, wear, or loss of bristles, it should be replaced. 3.5 brush stroke brush stroke for solvent resistance testing is with
28、 normal hand pressure, approximately 0,6 N to 0,8 N NOTE The brush stroke is directed in a forward direction, across the symbolized surface of the device being tested. 4 Equipment a) three brushes as defined above; b) three containers (beakers), a minimum of 400 ml to 500 ml in size, each made from
29、non- reactive materials such as stainless steel, naldene, or glass; c) an explosive-proof hot plate capable of maintaining solvents B and C at the temperatures defined above. Page4 BSEN607499:2002067-949 EI:C0022 5 5 Safety precautions Solvents listed above exhibit some potential health, environment
30、al and safety hazards. The following safety requirements and precautions are to be followed at all times: a) always work under a well-vented hood. Avoid inhalation of vapours at all times; b) safety glasses/eye protection and solvent resistant gloves must be worn at all times while performing this t
31、est; c) solvents are to be kept in covered vessels at all times when not in direct use; d) avoid contact with skin or eyes, and exposures to open flames or hot surfaces. 6 Procedure 1) Label the three vessels, three brushes, and three tweezers, A, B, and C. Divide the test specimens into three equal
32、 groups and fill the three vessels with the appropriate solvents A, B, and C, respectively. 2) Each test group, along with a brush, shall be totally immersed for 1 min in each of the solvents. 3) At the end of the exposure time, the specimens shall be removed from each solvent and brushed with norma
33、l pressure (approximately 0,6 N to 0,8 N) for ten strokes in a forwards direction on the portion of the specimen where the marking is present. 4) At the conclusion of the brushing, place the devices and the brush back into the vessel of the appropriate solvent. 5) Repeat the procedure above until a
34、total of three immersions and brushings has occurred. 6) Following the third immersion and brushing, rinse the specimens with deionized water, place them on a clean surface, and allow them to dry at room temperature for a minimum of 5 min before inspection. 7 Failure criteria After subjection to the
35、 test, evidence of damage to the device and any specified markings which are missing in whole or part, faded, smeared, blurred, or shifted (dislodged) to the extent that they cannot be readily identified from a distance of at least 15,0 cm with normal room lighting and without the aid of magnificati
36、on or with a viewer having a magnification of no greater than 3 shall constitute a failure. 8 Summary The following details shall be specified in the applicable procurement document: a) The number of parts to be tested and the acceptance number (see clause 7). b) Any exceptions or changes from stand
37、ard procedure that are required for a particular device (see clause 7). _ Page5 BSEN607499:2002- 3 - EN 60749-9:2002 Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated referenc
38、e, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated
39、 in it by amendment or revision. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Yea
40、r IEC 60068-2-45 - 1) Basic environmental testing procedures Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents EN 60068-2-45 1992 2)1)Undated reference. 2)Valid edition at date of issue. Page6 BSEN607499:2002BS EN 60749-9:2002 BSI 389 Chiswick High Road London W4 4AL BSI British S
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