1、BRITISH STANDARDBS EN 61000-4-1:2007Electromagnetic compatibility (EMC) Part 4-1: Testing and measurement techniques Overview of IEC 61000-4 seriesThe European Standard EN 61000-4-1:2007 has the status of a British StandardICS 33.100.01; 33.100.20g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g
2、3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58Licensed Copy: Wang Bin, na, Tue May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSIBS EN 61000-4-1:2007This British Standard was published under
3、the authority of the Standards Policy and Strategy Committee on 30 March 2007 BSI 2007ISBN 978 0 580 50454 9National forewordThis British Standard was published by BSI. It is the UK implementation of EN 61000-4-1:2007. It is identical with IEC 61000-4-1:2006. It supersedes BS EN 61000-4-1:2001, whic
4、h will be withdrawn on 1 February 2010.The UK participation in its preparation was entrusted by Technical Committee GEL/210, EMC Policy committee, to Subcommittee GEL/210/12, EMC Basic and generic standards.A list of organizations represented on GEL/210/12 can be obtained on request to its secretary
5、. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments issued since publicationAmd. No. Date CommentsLicensed Copy: Wang B
6、in, na, Tue May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSIEUROPEAN STANDARD EN 61000-4-1 NORME EUROPENNE EUROPISCHE NORM March 2007 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Nor
7、mung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2007 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-1:2007 E ICS 33.100.01; 33.100.20 Supersedes EN 61000-4-1:2000English version Electromagnetic compatibili
8、ty (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series (IEC 61000-4-1:2006) Compatibilit lectromagntique (CEM) - Partie 4-1: Techniques dessai et de mesure - Vue densemble de la srie CEI 61000-4 (CEI 61000-4-1:2006) Elektromagnetische Vertrglichkeit (EMV) - Teil 4-1
9、: Prf- und Messverfahren - bersicht ber die Reihe IEC 61000-4 (IEC 61000-4-1:2006) This European Standard was approved by CENELEC on 2007-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status o
10、f a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A v
11、ersion in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus
12、, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Licensed Copy: Wang Bin, na, Tu
13、e May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSIEN 61000-4-1:2006 2 Foreword The text of document 77/319/FDIS, future edition 3 of IEC 61000-4-1, prepared by IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4
14、-1 on 2007-02-01. This European Standard supersedes EN 61000-4-1:2000. Changes introduced in EN 61000-4-1:2007 are for the purpose of updating the text to include reference to the latest publications of the EN 61000-4 series. The following dates were fixed: latest date by which the EN has to be impl
15、emented at national level by publication of an identical national standard or by endorsement (dop) 2007-11-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2010-02-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the Internation
16、al Standard IEC 61000-4-1:2006 was approved by CENELEC as a European Standard without any modification. _ Licensed Copy: Wang Bin, na, Tue May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSI 3 EN 61000-4-1:2006 CONTENTS INTRODUCTION 4 1 Scope and object5 2 Normative references .5 3 Terms and
17、definitions .7 4 General8 5 Structure of the IEC 61000-4 series standards8 6 Selection of tests8 7 Test report .12 Annex ZA (normative) Normative references to international publications with their corresponding European publications .16 Table 1 Applicability of immunity tests based on location (env
18、ironment)13 Table 2 Applicability of immunity tests based on EUT ports 15 Licensed Copy: Wang Bin, na, Tue May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSIEN 61000-4-1:2006 4 INTRODUCTION The IEC 61000 series is published in several parts according to the following structure: Part 1: Gener
19、al General consideration (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity test levels (in so far as they do not fall under the responsibili
20、ty of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided int
21、o several parts, published either as International Standards, technical specifications or technical reports, some of which have already been published as sections. Others will be published with the part number followed by a dash and completed by a second number identifying the subdivision (example:
22、61000-6-1). Licensed Copy: Wang Bin, na, Tue May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSI 5 EN 61000-4-1:2006 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-1: Testing and measurement techniques Overview of IEC 61000-4 series 1 Scope and object This part of IEC 61000 covers testing and mea
23、suring techniques for electric and electronic equipment (apparatus and systems) in its electromagnetic environment. The object of this part is to give applicability assistance to the technical committees of IEC or other bodies, users and manufacturers of electrical and electronic equipment on EMC st
24、andards within the IEC 61000-4 series on testing and measurement techniques and to provide general recommendations concerning the choice of relevant tests. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the
25、 edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050(161), International Electrotechnical Vocabulary (IEV) Chapter 161: Electro-magnetic compatibility IEC 61000-1-1, Electromagnetic Compatibility (EMC) Part 1-1: G
26、eneral Application and interpretation of fundamental definitions and terms IEC 61000-2-5, Electromagnetic Compatibility (EMC) Part 2: Environment Classification of electromagnetic environments IEC 61000-3-2, Electromagnetic compatibility (EMC) Part 3-2: Limits Limits for harmonic current emissions (
27、equipment input current 16 A per phase) IEC 61000-3-3, Electromagnetic compatibility (EMC) Part 3-3: Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current 16 A per phase and not subject to conditional connection
28、IEC/TS 61000-3-4, Electromagnetic compatibility (EMC) Part 3-4: Limits Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A IEC/TR 61000-3-5, Electromagnetic compatibility (EMC) Part 3-5: Limits Limitation of voltage fluct
29、uations and flicker in low-voltage power supply systems for equipment with rated current greater than 16 A IEC 61000-3-6, Electromagnetic compatibility (EMC) Part 3: Limits Section 6: Assessment of emission limits for distorting loads in MV and HV power systems Licensed Copy: Wang Bin, na, Tue May 2
30、9 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSIEN 61000-4-1:2006 6 IEC 61000-3-11, Electromagnetic compatibility (EMC) Part 3-11: Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems Equipment with rated current 75 A and subject to conditi
31、onal connection IEC 61000-3-12, Electromagnetic compatibility (EMC) Part 3-12: Limits Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current 16 A and 75 A per phase IEC 61000-4-2, Electromagnetic compatibility (EMC) Part 4-2: Testing and measure
32、ment techniques Electrostatic discharge immunity test IEC 61000-4-3, Electromagnetic compatibility (EMC) Part 4-3: Testing and measurement techniques Radiated, radio-frequency, electromagnetic field immunity test IEC 61000-4-4, Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement te
33、chniques Electrical fast transient/burst immunity test IEC 61000-4-5, Electromagnetic compatibility (EMC) Part 4-5: Testing and measurement techniques Surge immunity test IEC 61000-4-6, Electromagnetic compatibility (EMC) Part 4-6: Testing and measurement techniques Immunity to conducted disturbance
34、s, induced by radio-frequency fields IEC 61000-4-7, Electromagnetic compatibility (EMC) Part 4-7: Testing and measurement techniques General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto IEC 61000-4-8, Electromagnetic
35、 compatibility (EMC) Part 4-8: Testing and measurement techniques Power frequency magnetic field immunity test IEC 61000-4-9, Electromagnetic compatibility (EMC) Part 4-9: Testing and measurement techniques Pulse magnetic field immunity test IEC 61000-4-10, Electromagnetic compatibility (EMC) Part 4
36、-10: Testing and measurement techniques Damped oscillatory magnetic field immunity test IEC 61000-4-11, Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity test IEC 61000-4-12, Electromagnetic compatibili
37、ty (EMC) Part 4-12: Testing and measurement techniques Oscillatory waves immunity test IEC 61000-4-13, Electromagnetic compatibility (EMC) Part 4-13: Testing and measurement techniques Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests IEC 61000-
38、4-14, Electromagnetic compatibility (EMC) Part 4-14: Testing and measurement techniques Voltage fluctuation immunity test IEC 61000-4-15, Electromagnetic compatibility (EMC) Part 4-15: Testing and measurement techniques Flickermeter Functional and design specifications 1IEC 61000-4-16, Electromagnet
39、ic compatibility (EMC) Part 4-16: Testing and measurement techniques Test for immunity to conducted common mode disturbances in the frequency range 0 Hz to 150 kHz immunity test _ 1 Revision of IEC 60868. Licensed Copy: Wang Bin, na, Tue May 29 06:49:33 GMT+00:00 2007, Uncontrolled Copy, (c) BSI 7 E
40、N 61000-4-1:2006 IEC 61000-4-17, Electromagnetic compatibility (EMC) Part 4-17: Testing and measurement techniques Ripple on d.c. input power port immunity test IEC 61000-4-18, Electromagnetic Compatibility (EMC) Part 4-18: Testing and measurement techniques Oscillatory wave immunity test IEC 61000-
41、4-20, Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides IEC 61000-4-21, Electromagnetic compatibility (EMC) Part 4-21: Testing and measurement techniques Reverberation chamber test methods IE
42、C 61000-4-23, Electromagnetic compatibility (EMC) Part 4-23: Testing and measurement techniques Test methods for protective devices for HEMP and other radiated disturbances IEC 61000-4-24, Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 24: Test methods for pro
43、tective devices for HEMP conducted disturbance IEC 61000-4-25, Electromagnetic compatibility (EMC) Part 4-25: Testing and measurement techniques HEMP immunity test methods for equipment and systems IEC 61000-4-27, Electromagnetic compatibility (EMC) Part 4-27 : Testing and measurement techniques Unb
44、alance, immunity test IEC 61000-4-28, Electromagnetic compatibility (EMC) Part 4-28: Testing and measurement techniques Variation of power frequency, immunity test IEC 61000-4-29, Electromagnetic compatibility (EMC) Part 4-29: Testing and measurement techniques Voltage dips, short interruptions and
45、voltage variations on d.c. input power port immunity tests IEC 61000-4-30, Electromagnetic compatibility (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods IEC 61000-4-32, Electromagnetic compatibility (EMC) Part 4-32: Testing and measurement techniques High-altitu
46、de electromagnetic pulse (HEMP) simulator compendium IEC 61000-4-33, Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high power transient parameters IEC 61000-4-34, Electromagnetic compatibility (EMC) Part 4-34: Testing and measurement techni
47、ques Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase 3 Terms and definitions For the purposes of this document, the definitions in IEC 60050(161) apply. Licensed Copy: Wang Bin, na, Tue May 29 06:49:33 GMT+00:00 2007,
48、Uncontrolled Copy, (c) BSIEN 61000-4-1:2006 8 4 General In the past, electromechanical devices and systems were generally not sensitive to electromagnetic disturbances (i.e. conducted and radiated electromagnetic disturbances and electrostatic discharge). The electronic components and equipment now
49、in use are much more sensitive to these disturbances, particularly to “high-frequency“ and “transient“ phenomena. The tremendous expansion in the use of electronic components and equipment has increased the danger and importance of malfunctioning, damage, etc. which can arise from electric and electromagnetic disturbances. The product committees (o
