1、BSI Standards PublicationExpression of performance of gas analyzersPart 7: Tuneable semiconductor laser gas analyzersBS EN 61207-7:2013Incorporating corrigendum June 2015National forewordThis British Standard is the UK implementation of EN 61207-7:2013. It isidentical to IEC 61207-7:2013, incorporat
2、ing corrigendum June 2015.The UK participation in its preparation was entrusted by Technical Com-mittee GEL/65, Measurement and control, to Subcommittee GEL/65/2,Elements of systems.A list of organizations represented on this subcommittee can be obtained onrequest to its secretary.This publication d
3、oes not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 90946 7ICS 19.040; 71.040.40Compliance with a British Standard cannot confer immunity
4、fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 January 2014.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 61207-7:2013Implementation of IEC corrigendum June 2015. 31 July 2015Fi
5、gure B.1 updatedEUROPEAN STANDARD EN 61207-7 NORME EUROPENNE EUROPISCHE NORM December 2013CENELEC European Committee for Electrotechnical StandardizationComit Europen de Normalisation ElectrotechniqueEuropisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B
6、- 1000 Brussels 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61207-7:2013 E ICS 19.040; 71.040.40 English version Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers(IEC 61207-7:
7、2013) Expression des performances des analyseurs de gaz - Partie 7: Analyseurs de gaz laser semi-conducteurs accordables(CEI 61207-7:2013) Angabe zum Betriebsverhalten von Gasanalysatoren - Teil 7: Gasanalysatoren mit abstimmbarenHalbleiterlasern (IEC 61207-7:2013) This European Standard was approve
8、d by CENELEC on 2013-10-30. CENELEC members are bound to complywith the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standardthe status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
9、standards may be obtained onapplication to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any otherlanguage made by translation under the responsibility of a CENELEC member into its own lang
10、uage and notifiedto the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France
11、, Germany,Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. EN 61207-7:2013 - 2 - Foreword The text of document 65B/876/FDIS, future edition
12、 1 of IEC 61207-7, prepared by SC 65B “Measurement and control devices” of IEC/TC 65 “Industrial-process measurement, control and automation“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61207-7:2013. The following dates are fixed: latest date by which the document ha
13、s to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2014-07-30 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-10-30 This Standard is to be used in conjunction with EN 61207-1:2010. A
14、ttention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61207-7:2013 was approved
15、 by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: ISO 9001 NOTE Harmonized as EN ISO 9001. BS EN 61207-7:2013- 3 - EN 61207-7:2013 Annex ZA (normative) Normative references to interna
16、tional publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of
17、the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60654-1 1993 Industrial-process measurement and control equipment - Oper
18、ating conditions - Part 1: Climatic conditions EN 60654-1 1993 IEC 60654-2 + A1 1979 1992 Operating conditions for industrial-process measurement and control equipment - Part 2: Power EN 60654-2 1) 1997 IEC 60654-3 1983 Operating conditions for industrial-process measurement and control equipment -
19、Part 3: Mechanical influences EN 60654-3 1997 IEC 60825-1 2007 Safety of laser products - Part 1: Equipment classification and requirements EN 60825-1 2007 IEC 61207-1 2010 Expression of performance of gas analyzers - Part 1: General EN 61207-1 2010 1) EN 60654-2 includes A1 to IEC 60654-2. BS EN 61
20、207-7:2013 2 61207-7 IEC:2013 CONTENTS INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 7 4 Procedure for specification . 10 4.1 General . 10 4.2 In situ analyzers 10 4.2.1 Additional operation and maintenance requirements 10 4.2.2 Additional terms related to the spe
21、cification of performance 10 4.2.3 Additional limits of uncertainties 11 4.3 Extractive analyzers 11 4.3.1 Additional operation and maintenance requirements 11 4.3.2 Additional terms related to the specification of performance 12 4.4 Recommended standard values and range of influence quantities . 12
22、 4.5 Laser safety 12 5 Procedures for compliance testing 12 5.1 In situ analyzers 12 5.1.1 General . 12 5.1.2 Apparatus to simulate measurement condition . 13 5.1.3 Apparatus to generate test gas mixture . 13 5.1.4 Apparatus to investigate the attenuation induced by opaque dust, liquid droplets and
23、other particles 13 5.1.5 Testing procedures 14 5.2 Extractive analyzers 16 5.2.1 General . 16 5.2.2 Apparatus to generate test gas mixture . 16 5.2.3 Testing procedures 16 Annex A (informative) Systems of tuneable semiconductor laser gas analyzers . 18 Annex B (normative) Examples of the test appara
24、tus . 19 Bibliography 23 Figure A.1 Tuneable semiconductor laser gas analyzers 18 Figure B.1 Example of a test apparatus to simulate measurement condition for across-duct and open-path analyzers 19 Figure B.2 Example of a test apparatus to simulate measurement condition for probe type analyzers 19 F
25、igure B.3 Example of apparatus to generate the test gas mixture . 20 Figure B.4 Delay time, rise time and fall time . 21 Figure B.5 Example of a grid to simulate the attenuation by the dust in optical path . 22 BS EN 61207-7:201361207-7 IEC:2013 5 INTRODUCTION This part of IEC 61207 includes the ter
26、minology, definitions, statements and tests that are specific to tuneable semiconductor laser gas analyzers, which utilize tuneable semiconductor laser absorption spectroscopy (TSLAS). Tuneable semiconductor laser gas analyzers utilize tuneable semiconductor lasers (e.g. diode lasers, quantum cascad
27、e lasers, interband cascade lasers) as light sources, whose wavelength covers ultraviolet, visible and infrared part of the electromagnetic spectrum, to detect the absorption spectra and thus determine the concentration of gases to be analyzed. These analyzers may employ different TSLAS techniques s
28、uch as direct absorption spectroscopy, frequency modulation spectroscopy (FMS), wavelength modulation spectroscopy (WMS), etc. Multi-pass absorption spectroscopy, photoacoustic spectroscopy (PAS), and cavity-enhanced absorption spectroscopy (CEAS) such as cavity-ringdown spectroscopy (CRDS) are also
29、 used to take advantage of their high detection sensitivity. Tuneable semiconductor laser gas analyzers are usually used to measure concentration of small molecule gases, such as oxygen, carbon monoxide, carbon dioxide, hydrogen sulfide, ammonia, hydrogen fluoride, hydrogen chloride, nitrogen dioxid
30、e, water vapour etc. There are two main types of tuneable semiconductor laser gas analyzers: extractive and in situ analyzers. The extractive analyzers measure the sample gas withdrawn from a process or air by a sample handling system. The in situ analyzers measure the gas in its original place, inc
31、luding across-duct, probe and open-path types. Across-duct analyzers either have a laser source and a detector mounted on opposite sides of a duct, or both the laser and the detector are mounted on the same side and a retroreflector on the opposite side of a duct. Probe analyzers comprise a probe mo
32、unted into the duct, and the measured gas either passes through or diffuses into the measuring optical path inside the probe. And open-path analyzers measure the gas in an open environment with a hardware approach similar to across duct analyzers (source and detector on opposite sides of the open ar
33、ea or a retroreflector on one side and the source and detector on the opposite side), except the sample is in an open path and not contained in a duct. NOTE 1 Traditionally, only diode lasers were employed, and thus tuneable diode laser gas analyzers and tuneable diode laser absorption spectroscopy
34、(TDLAS) are widely used terms. However, with the development of laser technology, many other types of semiconductor lasers, such as quantum cascade lasers (QCLs) and interband cascade lasers (ICLs) have been developed and employed in laser gas analyzers. Therefore, the term of semiconductor laser ra
35、ther than diode laser is used in this standard to reflect this technology advancement. NOTE 2 Though tuneable semiconductor laser photoacoustic spectroscopy (PAS) is in principle different from absorption spectroscopy typically used in tuneable semiconductor laser gas analyzers, the hardware and dat
36、a reduction software are almost the same for analyzers utilizing these two spectroscopy technologies, and thus PAS is considered a variant of absorption spectroscopy and this standard also applies to the analyzers based on PAS. BS EN 61207-7:2013 6 61207-7 IEC:2013 EXPRESSION OF PERFORMANCE OF GAS A
37、NALYZERS Part 7: Tuneable semiconductor laser gas analyzers 1 Scope This part of IEC 61207 applies to all aspects of analyzers utilizing TSLAS for the concentration measurement of one or more gas components in a gaseous mixture or vapour. It applies to analyzers utilizing tuneable semiconductor lase
38、rs as sources and utilizing absorption spectroscopy, such as direct absorption, FMS, WMS, multi-pass absorption spectroscopy, CRDS, ICOS, PAS and CEAS techniques, etc. It applies both to in situ or extractive type analyzers. This standard includes the following, it specifies the terms and definition
39、s related to the functional performance of gas analyzers, utilizing tuneable semiconductor laser gas absorption spectroscopy, for the continuous measurement of gas or vapour concentration in a source gas, unifies methods used in making and verifying statements on the functional performance of this t
40、ype of analyzers, specifies the type of tests to be performed to determine the functional performance and how to carry out these tests, provides basic documents to support the application of the standards of quality assurance with in ISO 9001 2 Normative references The following documents, in whole
41、or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60654-1:1993, Industrial-process meas
42、urement and control equipment Operating conditions Part 1: Climatic conditions IEC 60654-2:1979, Operating conditions for industrial-process measurement and control equipment Part 2: Power Amendment 1:1992 IEC 60654-3:1983, Operating conditions for industrial-process measurement and control equipmen
43、t Part 3: Mechanical influences IEC 60825-1:2007, Safety of laser products Part 1: Equipment classification and requirements IEC 61207-1:2010, Expression of performance of gas analyzers Part 1: General BS EN 61207-7:201361207-7 IEC:2013 7 3 Terms and definitions For the purposes of this document, th
44、e following terms and definitions apply. 3.1 semiconductor laser solid-state laser, in which the semiconductor material is used as active media 3.2 diode laser semiconductor laser which is formed from a p-n junction and powered by injected electric current 3.3 quantum cascade laser semiconductor las
45、er whose laser emission is achieved through the use of intersubband transitions in a repeated stack of semiconductor multiple quantum structure, and typically emits in the mid- to far-infrared portion of the electromagnetic spectrum 3.4 interband cascade laser semiconductor laser whose laser emissio
46、n is achieved through the use of interband transitions between electrons and holes in a repeated stack of semiconductor multiple quantum structure, but, instead of losing an electron to the valence band, the valence electron can tunnel into the conduction band of the next quantum structure, and this
47、 process can be repeated throughout the multiple quantum structure 3.5 extractive analyzer analyzer which receives and analyzes a continuous stream of gas withdrawn from a process by a sample handling system 3.6 in situ analyzer analyzer which measures the gas in its original place, including across
48、-duct, probe and open-path types 3.7 tuneable semiconductor laser absorption spectroscopy TSLAS spectroscopy which utilizes a tuneable semiconductor laser as radiation source, tunes the emission wavelength of the laser over the characteristic absorption lines of measured species in the laser beam pa
49、th, detects the reduction of the measured signal intensity, and then determines the gas concentration 3.8 tuneable semiconductor laser gas analyzer gas analyzer which utilizes TSLAS to measure the concentration of one or more gas components in a gaseous mixture or vapour 3.9 wavelength modulation spectroscopy laser gas absorption spectroscopy, in which the wavelength of the laser beam is continuously modulated across the absorption line and the signal is detected at a harmonic of the modulation frequency Note 1
