1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationSalt mist corrosion testing of photovoltaic (PV) modulesBS EN 61701:2012National forewordThis British Standard is the UK implementation of EN 61701:2012. It is identical to IEC 6
2、1701:2011. It supersedes BS EN 61701:2000 which is with-drawn.The UK participation in its preparation was entrusted to Technical CommitteeGEL/82, Photovoltaic Energy Systems.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not pur
3、port to include all the necessary provisions of acontract. Users are responsible for its correct application. The British Standards Institution 2012Published by BSI Standards Limited 2012ISBN 978 0 580 69180 5ICS 27.160Compliance with a British Standard cannot confer immunity fromlegal obligations.T
4、his British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 30 April 2012.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61701:2012EUROPEAN STANDARD EN 61701 NORME EUROPENNE EUROPISCHE NORM March 2012 CENELEC European C
5、ommittee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC
6、members. Ref. No. EN 61701:2012 E ICS 27.160 Supersedes EN 61701:1999English version Salt mist corrosion testing of photovoltaic (PV) modules (IEC 61701:2011) Essai de corrosion au brouillard salin des modules photovoltaques (PV) (CEI 61701:2011) Salznebel-Korrosionsprfung von photovoltaischen (PV-)
7、Modulen (IEC 61701:2011) This European Standard was approved by CENELEC on 2012-01-19. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date l
8、ists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
9、 under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark
10、, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 61701:2012EN 61701:2012 - 2 - Foreword The tex
11、t of document 82/668/FDIS, future edition 2 of IEC 61701, prepared by IEC TC 82, “Solar photovoltaic energy systems“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61701:2012. The following dates are fixed: latest date by which the document has to be implemented at nati
12、onal level by publication of an identical national standard or by endorsement (dop) 2012-10-19 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2015-01-19 This document supersedes EN 61701:1999. EN 61701:2012 includes the following significant tech
13、nical changes with respect to EN 61701:1999: The scope has been updated to better reflect the applicability of the standard. Salt mist test is based on EN 60068-2-52 rather than EN 60068-2-11 as in EN 61701:1999 since the former standard is much more widely used in the electronic component field. Ac
14、cording to this change EN 61701:2012 includes a cycling testing sequence that combines in each cycle a salt fog exposure followed by humidity storage under controlled temperature and relative humidity conditions. This testing sequence is more suitable to reflect the corrosion processes that happen i
15、n PV modules subjected to permanent or temporary corrosive atmospheres (NaCl). In EN 61701:1999 only a salt fog exposure was considered. Additional tests have also been included to verify the effect of the salt mist test not only in the PV module output but also in some of its components. Different
16、testing sequences are considered depending on the PV module technology involved: crystalline silicon, thin-film and concentrator photovoltaic (CPV) modules. A test report clause has also been included. Attention is drawn to the possibility that some of the elements of this document may be the subjec
17、t of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61701:2011 was approved by CENELEC as a European Standard without any modification. BS EN 61701:2012- 3 - EN 61701:2012 An
18、nex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited appli
19、es. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-52 - Environme
20、ntal testing - Part 2: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution) EN 60068-2-52 - IEC 61215 2005 Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval EN 61215 2005 IEC 61646 2008 Thin-film terrestrial photovoltaic (PV) modules - Design
21、 qualification and type approval EN 61646 2008 IEC 61730-2 (mod) 2004 Photovoltaic (PV) module safety qualification -Part 2: Requirements for construction EN 61730-2 2007 IEC 62108 2007 Concentrator Photovoltaic (CPV) modules and assemblies - Design qualification and type approval EN 62108 2008 ISO/
22、IEC 17025 - General requirements for the competence of testing and calibration laboratories EN ISO/IEC 17025 - BS EN 61701:2012 2 61701 IEC:2011 CONTENTS 1 Scope and object 5 2 Normative references . 5 3 Samples . 6 4 Test procedures . 6 4.1 General . 6 4.2 Bypass diode functionality test 6 4.2.1 Pu
23、rpose . 6 4.2.2 Apparatus 6 4.2.3 Procedure 7 4.2.4 Requirements 7 5 Preconditioning 7 6 Initial measurements 7 7 Salt mist test procedure 8 8 Cleaning and recovery 8 9 Final measurements . 9 10 Requirements . 10 10.1 General . 10 10.2 Crystalline silicon 10 10.3 Thin-film technologies . 10 10.4 Con
24、centrator photovoltaic (CPV) modules . 10 11 Test report 11 Figure 1 Salt mist corrosion testing sequence for crystalline silicon PV modules 12 Figure 2 Salt mist corrosion testing sequence for thin-film PV modules 13 Figure 3 Salt mist corrosion testing sequence for concentrator photovoltaic (CPV)
25、modules 14 BS EN 61701:201261701 IEC:2011 5 SALT MIST CORROSION TESTING OF PHOTOVOLTAIC (PV) MODULES 1 Scope and object Photovoltaic (PV) modules are electrical devices intended for continuous outdoor exposure during their lifetime. Highly corrosive wet atmospheres, such as marine environments, coul
26、d eventually degrade some of the PV module components (corrosion of metallic parts, deterioration of the properties of some non-metallic materials - such as protective coatings and plastics - by assimilation of salts, etc.) causing permanent damages that could impair their functioning. Temporary cor
27、rosive atmospheres are also present in places where salt is used in winter periods to melt ice formations on streets and roads. This Standard describes test sequences useful to determine the resistance of different PV modules to corrosion from salt mist containing Cl-(NaCl, MgCl2, etc.). All tests i
28、ncluded in the sequences, except the bypass diode functionality test, are fully described in IEC 61215, IEC 61646, IEC 62108, IEC 61730-2 and IEC 60068-2-52. They are combined in this Standard to provide means to evaluate possible faults caused in PV modules when operating under wet atmospheres havi
29、ng high concentration of dissolved salt (NaCl). Depending on the specific nature of the surrounding atmosphere to which the module is exposed in real operation several testing severities can be applied, as defined in IEC 60068-2-52. For example severity (1) is intended to be used for PV modules used
30、 in a marine environment, or in close proximity to the sea. Severities (3) to (6) are intended for PV modules operating in locations where there could be a change between salt-laden and dry atmospheres, for examples in places where salt is used to melt ice formations. Severity (2) is not suitable fo
31、r PV modules as testing conditions are too weak (this severity is originally intended for products exposed to corrosive environments from time to time that are normally protected by an enclosure) and should be avoided when applying this Standard. This Standard can be applied to both flat plate PV mo
32、dules and concentrator PV modules and assemblies. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest editi
33、on of the referenced document (including any amendments) applies. IEC 60068-2-52, Environmental testing Part 2-52: Tests Test Kb: Salt mist, cyclic (sodium chloride solution) IEC 61215:2005, Crystalline silicon terrestrial photovoltaic (PV) modules Design qualification and type approval IEC 61646:20
34、08, Thin-film terrestrial photovoltaic (PV) modules Design qualification and type approval IEC 61730-2:2004, Photovoltaic (PV) module safety qualification Part 2: Requirements for testing IEC 62108:2007, Concentrator photovoltaic (CPV) modules and assemblies Design qualification and type approval BS
35、 EN 61701:2012 6 61701 IEC:2011 ISO/IEC 17025, General requirements for the competence of testing and calibration laboratories 3 Samples Three identical samples of the model of PV module or assembly of interest shall be subjected to any of the testing sequences included in Figures 1, 2 or 3, dependi
36、ng on the PV technology considered, namely crystalline silicon, thin-film or concentrator photovoltaic (CPV) respectively. As the figures indicate one of these samples should be used as a control. The control sample should be used as a check every time the test samples are measured to evaluate the e
37、ffect of the salt mist test. In the case of CPV different situations for choosing the sample may occur. For non-field-adjustable focus-point CPV systems or modules, 3 modules are required to complete the testing sequence included in Figure 3. For field-adjustable focus-point CPV systems or assemblie
38、s, 3 receivers (including secondary optics sections, if applicable) and 3 primary optics sections are required to complete the testing sequence included in Figure 3. A complete description of the different types and components of CPV modules and assemblies can be found in IEC 62108. If a full-size s
39、ample is too large to fit into the environmental chambers required for the salt mist test then a smaller representative sample may be specially designed and manufactured for this test. The representative sample should be carefully designed so that it can reveal similar failure mechanisms as the full
40、-size one, and the fabrication process of the representative sample should be as identical as possible to the process of the full-size ones. The fact that the test has been made on representative samples and not on the full-size samples has to be indicated and reported in the test report under item
41、g), see Clause 11. If the PV module is provided with means for grounding then they constitute a part of the test sample. 4 Test procedures 4.1 General All tests included in Figures 1, 2 or 3, except the bypass diode functionality test, are fully described (including purpose, apparatus, procedure and
42、 requirements) in the IEC Standards from where the specific tests are taken (see notes in the Figures). Tests included in Figures 1, 2 or 3 shall be performed in the specified order. In the case of CPV if some test procedures included in this Standard are not applicable to a specific design configur
43、ation, the manufacturer should discuss this with the testing agency to develop a comparable test program, based on the principles described in this Standard. Any changes and deviations shall be recorded and reported in detail, as required in Clause 11, item l). 4.2 Bypass diode functionality test 4.
44、2.1 Purpose To verify that the bypass diode(s) of the test samples remains functional following the salt fog exposure. NOTE If in the test sample there are no bypass diodes or the bypass diodes do not have any metallic parts then this test is omitted. 4.2.2 Apparatus a) DC power source capable of ap
45、plying a current up to 1,25 times the standard test conditions (STC) short-circuit current of the sample under test and means for monitoring the flow of current through the test sample during the test period. BS EN 61701:201261701 IEC:2011 7 b) Equipment for measuring the voltage drop across the tes
46、t sample at an accuracy of 0,5 % of reading. c) Equipment for measuring test current at an accuracy of 0,5 % of reading. 4.2.3 Procedure This procedure can be conducted in any ambient within 25 C 10 C. During the test the sample shall not be subjected to illumination. a) Electrically short any block
47、ing diodes incorporated to the test sample. b) Determine the rated STC short-circuit current of the test sample from its label or instruction sheet. c) Connect the DC power sources positive output to the test sample negative lead, and the DC power sources negative output to the test sample positive
48、lead by using wires of the manufacturers minimum recommended wire gauge. Follow the manufacturers recommendations for wire entry into the wiring compartment. With this configuration the current shall pass through the cells in the reverse direction and through the diode(s) in the forward direction. N
49、OTE Some modules have overlapping bypass diode circuits. In this case it may be necessary to install a jumper cable to ensure that all of the current is flowing through one bypass diode. d) Apply a current equal to of 1,25 times ( 5 %) the STC short-circuit current of the test sample for a period of 1 h. 4.2.4 Requirements After the 1 h of current flow check that the bypass diode(s) remains operational. A possible method is to again pass a forward current through the diode(s) by passing a revers
