1、BRITISH STANDARD BS EN ISO 3497:2001 Metallic coatings Measurement of coating thickness X-ray spectrometric methods The European Standard EN ISO 3497:2000 has the status of a British Standard ICS 17.040.20; 25.220.40 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBS EN ISO 349
2、7:2001 This British Standard, having been prepared under the direction of the Sector Committee for Materials and Chemicals, was published under the authority of the Standards Committee and comes into effect on 15 March 2001 BSI 03-2001 ISBN 0 580 37054 2 National foreword This British Standard is th
3、e official English language version of EN ISO 3497:2000. It is identical with ISO 3497:2000. It supersedes BS 5411-8:1991 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee STI/37, Methods of test for metallic and related coatings, which has the responsi
4、bility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative references to international publications with their correspondi
5、ng European publications. The British Standards which implement these international or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogu
6、e. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text;
7、present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover,
8、 an inside front cover, the EN ISO title page, the EN ISO foreword page, the ISO title page, pages ii to iv, pages 1 to 18, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. N
9、o. Date CommentsEUROPEANSTANDARD NORMEEUROPENNE EUROPISCHENORM ENISO3497 December2000 ICS25.220.40 Englishversion MetalliccoatingsMeasurementofcoatingthicknessXray spectrometricmethods(ISO3497:2000) RevtementsmtalliquesMesuragedelpaisseurdu revtementMthodesparspectromtriederayonsX(ISO 3497:2000) Thi
10、sEuropeanStandardwasapprovedbyCENon15December2000. CENmembersareboundtocomplywiththeCEN/CENELECInternalRegulationswhichstipulatetheconditionsforgivingthisEurope an Standardthestatusofanationalstandardwithoutanyalteration.Uptodatelistsandbibliographicalreferencesconcernings uchnational standardsmaybe
11、obtainedonapplicationtotheManagementCentreortoanyCENmember. ThisEuropeanStandardexistsinthreeofficialversions(English,French,German).Aversioninanyotherlanguagemadebytra nslation undertheresponsibilityofaCENmemberintoitsownlanguageandnotifiedtotheManagementCentrehasthesamestatusasthe official version
12、s. CENmembersarethenationalstandardsbodiesofAustria,Belgium,CzechRepublic,Denmark,Finland,France,Germany,Greece, Iceland,Ireland,Italy,Luxembourg,Netherlands,Norway,Portugal,Spain,Sweden,SwitzerlandandUnitedKingdom. EUROPEANCOMMITTEEFORSTANDARDIZATION COMITEUROPENDENORMALISATION EUROPISCHESKOMITEEFR
13、NORMUNG ManagementCentre:ruedeStassart,36B1050Brussels 2000CEN Allrightsofexploitationinanyformandbyanymeansreserved worldwideforCENnationalMembers. Ref.No.ENISO3497:2000EForeword ThetextoftheInternationalStandardISO3497:2000hasbeenpreparedby TechnicalCommitteeISO/TC107“Metallicandotherinorganiccoat
14、ings“in collaborationwithTechnicalCommitteeCEN/TC262“Metallicandotherinorganic coatings“,thesecretariatofwhichisheldbyBSI . ThisEuropeanStandardshallbegiventhestatusofanationalstandard,eitherby publicationofanidenticaltextorbyendorsement,atthelatestbyJune2001,and conflictingnationalstandardsshallbew
15、ithdrawnatthelatestbyJune2001 . AccordingtotheCEN/CENELECInternalRegulations,thenationalstandards organizationsofthefollowingcountriesareboundtoimplementthisEuropean Standard:Austria,Belgium,CzechRepublic,Denmark,Finland,France,Germany, Greece,Iceland,Ireland,Italy,Luxembourg,Netherlands,Norway,Port
16、ugal,Spain, Sweden,SwitzerlandandtheUnitedKingdom. NOTEFROMCMC: Theforewordissusceptibletobeamendedonreceptionofthe Germanlanguageversion.Theconfirmedoramendedforeword,andwhen appropriate,thenormativeannexZAforthereferencestointernationalpublications withtheirrelevantEuropeanpublicationswillbecircul
17、atedwiththeGermanversion. Endorsementnotice ThetextoftheInternationalStandardISO3497:2000wasapprovedbyCENasa EuropeanStandardwithoutanymodification. ENISO3497:2000 Reference number ISO 3497:2000(E) INTERNATIONAL STANDARD ISO 3497 Third edition 2000-12-15 Metallic coatings Measurement of coating thic
18、kness X-ray spectrometric methods Revtements mtalliques Mesurage de lpaisseur du revtement Mthodes par spectromtrie de rayons X ENISO3497:2000 ii ENISO3497:2000 ISO 7943:(0002)Eiii Contents Page Foreword.iv 1 Scope 1 2 Terms and definitions .1 3 Principle3 4 Apparatus .7 5 Factors that influence the
19、 measurement results10 6 Calibration of instrument 14 7 Procedure .16 8 Measurement uncertainty .17 9 Test report 17 Annex A (informative) Typical measuring ranges for some common coating materials 18 ENISO3497:2000 ISO 7943:(0002)E iv Foreword ISO (the International Organization for Standardization
20、) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be repr
21、esented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards ar
22、e drafted in accordance with the rules given in the ISO/IEC Directives, Part 3. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a
23、 vote. Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. International Standard ISO 3497 was prepared by Technical Committee ISO/TC 107,
24、Metallic and other inorganic coatings, Subcommittee SC 2, Test methods. This third edition cancels and replaces the second edition (ISO 3497:1990), which has been technically revised. Annex A of this International Standard is for information only. ENISO3497:2000 INTENRATIONAL TSANDADR ISO 7943:(0002
25、)E1 Metallic coatings Measurement of coating thickness X-ray spectrometric methods 1 Scope WARNING Problems concerning protection of personnel against X-rays are not covered by this International Standard. For information on this important aspect, reference should be made to current international an
26、d national standards, and to local regulations, where these exist. 1.1 This International Standard specifies methods for measuring the thickness of metallic coatings by the use of X-ray spectrometric methods. 1.2 The measuring methods to which this International Standard applies are fundamentally th
27、ose that determine the mass per unit area. Using a knowledge of the density of the coating material, the results of measurements can also be expressed as linear thickness of the coating. 1.3 The measuring methods permit simultaneous measurement of coating systems with up to three layers, or simultan
28、eous measurement of thickness and compositions of layers with up to three components. 1.4 The practical measurement ranges of given coating materials are largely determined by the energy of the characteristic X-ray fluorescence to be analysed and by the acceptable measurement uncertainty and can dif
29、fer depending upon the instrument system and operating procedure used. 2 Terms and definitions For the purposes of this International Standard, the following terms and definitions apply. 2.1 X-ray fluorescence XRF secondary radiation occurring when a high intensity incident X-ray beam impinges upon
30、a material placed in the path of the incident beam NOTE The secondary emission has wavelengths and energies characteristic of that material. 2.2 intensity of fluorescent radiation radiation intensity, x, measured by the instrument, expressed in counts (radiation pulses) per second 2.3 saturation thi
31、ckness thickness that, if exceeded, does not produce any detectable change in fluorescent intensity NOTE Saturation thickness depends upon the energy or wavelength of the fluorescent radiation, density and atomic number of the material and on the angle of incident and fluorescent radiation with resp
32、ect to the surface of the material. ENISO3497:2000 ISO 7943:(0002)E 2 2.4 normalized intensity x n ratio of the difference in intensity obtained from a coated specimen, x, and an uncoated substrate material, x 0 ,a n d the difference obtained from a material of thickness equal to or greater than the
33、 saturation thickness, x s (see 2.3) and an uncoated substrate material, x 0 , all measured under the same conditions NOTE 1 The mathematical relationship is given by: 0 n s0 xx x xx where x is the intensity obtained from the coated specimen; x 0 is the intensity obtained from uncoated substrate mat
34、erial; x s is the intensity obtained from a material of thickness equal to or greater than the saturation thickness. NOTE 2 The normalized intensity is independent of measurement and integration time, and intensity of the excitation (incident radiation). The geometric configuration and the energy of
35、 the excitation radiation can influence the normalized count rate. The value of x n isv al idbe t w een0a nd1 . 2.5 intermediate coatings coatings that lie between the top coating and the basis material and are of thicknesses less than saturation for each of the coatings NOTE Any coating lying betwe
36、en the top coating and the basis material (substrate) and having a thickness above saturation should itself be considered the true substrate since the material under such a coating will not affect the measurement and can be eliminated for measurement purposes. 2.6 count rate number of radiation puls
37、es recorded by the instrument per unit time (see 2.2). 2.7 basis material basis metal material upon which coatings are deposited or formed ISO 2080:1981, definition 134 2.8 substrate material upon which a coating is directly deposited NOTE For a single or first coating the substrate is identical wit
38、h the basis material; for a subsequent coating the intermediate coating is the substrate. ISO 2080:1981, definition 630 ENISO3497:2000 ISO 7943:(0002)E3 3P r i n c i p l e 3.1 Basis of operation A relationship exists between mass per unit area of the coating (and thus the linear coating thickness if
39、 the density is known) and the secondary radiation intensity. This relationship, for any practical instrument system, is first established by calibrating using calibration standards having coatings of known mass per unit area. If the coating material density is known, such standards can have coating
40、s given in linear thickness units, provided that the actual density value is also given. NOTE The coating material density is the density as-coated, which may or may not be the theoretical density of the coating material at the time the measurement is made. If this density differs from the density o
41、f the calibration standards, a factor that reflects this difference is used and documented in the test report. The fluorescent intensity is a function of the atomic number of the elements. Providing the top coating, intermediate coating (if present) and the substrate are of different elements or a c
42、oating consists of more than one element, these elements will generate radiation characteristics for each of them. A suitable detector system can be adjusted to select either one or more energy bands, enabling the equipment to measure thickness and/or composition of either the top coating or the top
43、 and some intermediate coatings simultaneously. 3.2 Excitation 3.2.1 General The measurement of the thickness of coatings by X-ray spectrometric methods is based on the combined interaction of the coating (or coatings) and substrate with an intense, often narrow, beam of polychromatic or monochromat
44、ic X-radiation. This interaction results in generating discrete wavelengths or energies of secondary radiation which are characteristic of the elements composing the coating(s) and substrate. The generated radiation is obtained from a high voltage X-ray tube generator or from suitable radioisotopes.
45、 3.2.2 Generation by a high voltage X-ray tube Suitable excitation radiation will be produced by an X-ray tube if sufficient potential is applied to the tube and stable conditions apply. Applied voltages are in the order of 25 kV to 50 kV for most thickness requirements but voltages down to 10 kV ma
46、y be necessary in order to measure low atomic number coating materials. For some applications the use of a primary filter, located between the X-ray tube and the specimen, decreases the measurement uncertainty. The chief advantages of this method of excitation are the ability to create, by collimati
47、on, a very high intensity beam on a very small measurement area; the ease of control for personnel safety requirements; the potential stability of emission obtainable by modern electronic methods. 3.2.3 Generation by a radioisotope Only a few radioisotopes emit gamma radiation in the energy band sui
48、table for coating thickness measurement. Ideally, the excitation radiation is of slightly higher energy (shorter in wavelength) than the desired characteristic X-rays. The advantages of radioisotope generation include the possibility of a more compact construction of the instrument, due mainly to there being no need for cooling. In addition, the radiation, unlike that from high voltage X-ray generators, is essentially monochromatic and
