1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationIEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XMLBS IEC 61671:2012National forewordThis British Standar
2、d is the UK implementation of IEC 61671:2012.The UK participation in its preparation was entrusted to Technical CommitteeGEL/93, Design automation.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the nec
3、essary provisions of acontract. Users are responsible for its correct application. The British Standards Institution 2012Published by BSI Standards Limited 2012ISBN 978 0 580 77676 2ICS 25.040.01; 35.060Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Stan
4、dard was published under the authority of the StandardsPolicy and Strategy Committee on 31 August 2012.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS IEC 61671:2012IEC 61671Edition 1.0 2012-06INTERNATIONAL STANDARD Automatic Test Markup Language (ATML) for Exchangin
5、g Automatic Test Equipment and Test Information via XML INTERNATIONAL ELECTROTECHNICAL COMMISSION XNICS 25.040; 35.060 PRICE CODEISBN 978-2-83220-104-6Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671BS IEC 61671:2012IEC 61671:2012 ii IEEE Std 1671-2
6、010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 General 1 1.2 Scope . 2 1.3 Purpose 2 1.4 Application 3 1.5 Conventions used in this document . 4 2. Normative references 6 3. Definitions, acronyms, and abbreviations. 7 3.1 Definitions . 7 3.2
7、Acronyms and abbreviations . 10 4. Automatic test system (ATS) architecture 12 4.1 Automatic test equipment (ATE) . 12 4.2 Test program set (TPS) 15 4.3 Automatic diagnosis and testing 18 5. Automatic test markup language (ATML) . 19 5.1 ATS architecture elements addressed by ATML . 20 6. The ATML f
8、ramework . 22 6.1 External interfaces . 22 6.2 Internal models 23 6.3 Services 23 7. ATML specification techniques . 25 7.1 ATML common element partitioning 25 7.2 ATML XML schemas 28 7.3 XML schemas and their use in ATML 28 7.4 UML models 28 8. The ATML framework subdomains . 29 8.1 The ATML framew
9、ork and ATML family component standards . 29 8.2 ATML subdomains 29 9. ATML XML schema names and locations . 36 10. ATML XML schema extensibility . 39 11. Conformance 40 11.1 ATML family XML schemas 40 11.2 The ATML framework 40 Annex A (normative) XML schema style guidelines . 46 A.1 Naming convent
10、ions . 46 A.2 XML declaration . 48 A.3 ATML namespaces . 48 A.4 Versioning. 50 A.5 Documentation 51 A.6 Design . 52 BS IEC 61671:2012IEC 61671:2012 IEEE Std 1671-2010 iii Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Annex B (normative) ATML common element schemas . 55 B.
11、1 Common element schemaCommon.xsd 55 B.2 Common element schemaHardwareCommon.xsd 136 B.3 Common element schemaTestEquipment.xsd 227 Annex C (normative) ATML internal model schemas . 258 C.1 ATML internal model schemaCapabilities.xsd . 258 C.2 ATML internal model schemaWireLists.xsd 260 Annex D (norm
12、ative) ATML runtime services 267 D.1 Messages . 267 D.2 Executive system service 267 D.3 Example WSDL service definition . 268 Annex E (informative) Pins, ports, connectors, and wire lists in ATML . 269 E.1 Introduction . 269 E.2 Overview of the base types . 270 E.3 Using ports, pins, and connectors
13、 together 273 E.4 Ports, pins, and capabilities . 275 E.5 Wire lists . 278 Annex F (informative) ATML capabilities . 283 F.1 Introduction . 283 F.2 Overview . 285 F.3 Describing instrument capabilities 289 F.4 Describing ATS capabilities 328 F.5 Capability information in ATML Test Description . 332
14、Annex G (informative) IEEE download Web site material associated with this document . 339 Annex H (informative) ATS architectures 340 H.1 ATS architectures utilization of published standards 340 H.2 ATS architectural relationships to IEEE SCC20-based standards 343 H.3 ATS architectural ATML subdomai
15、n relationship to SIMICA standards. 343 Annex I (informative) Architecture examples 347 I.1 Instruments . 347 I.2 Test descriptions . 348 I.3 Complete testing scenario 350 I.4 Integrated ATML system . 363 Annex J (informative) UML models 367 J.1 Generic ATS testing of a UUT . 367 J.2 ATML XML schema
16、 relationships 369 Annex K (informative) Glossary 372 Annex L (informative) Bibliography 375 Annex M (informative) IEEE List of Participants . 380 BS IEC 61671:2012IEC 61671:2012 iv IEEE Std 1671-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Automatic Test Markup Lan
17、guage (ATML) for Exchanging Automatic Test Equipment and Test Information via XML FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to pro
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32、he possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsibl
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34、ing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. BS IEC 61671:2012IEC 61671:2012 IEEE Std 1671-2010 v Published
35、 by IEC under license from IEEE. 2010 IEEE. All rights reserved. International Standard IEC 61671/ IEEE Std 1671-2010 has been processed through IEC technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE
36、Std FDIS Report on voting IEEE Std 1671-2010 93/323/FDIS 93/330/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publ
37、ication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. BS IEC 61671:2012IEC 61671:2012
38、 vi IEEE Std 1671-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. IEEE Std 1671-2010 (Revision of IEEE Std 1671-2006) IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Sponsor IEEE Standards Coo
39、rdinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 30 September 2010 IEEE-SA Standards Board BS IEC 61671:2012IEC 61671:2012 IEEE Std 1671-2010 vii Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Abstract: This document specifies a framework for th
40、e automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard. Keywords: ATE description, ATE test results, ATML, ATS, automatic test equipment, au
41、tomatic test markup language, automatic test system, interface test adapter, ITA, SI, synthetic instrumentation, test configuration, unit under test, UUT description, UUT maintenance, XML instance document, XML schemaIEEE is a registered trademark in the U.S. Patent isRef (1) indicates that it is a
42、reference. The term “final #all” Is an XML property that prevents all derivation. Used by the Complex Type c:Extension. The use of “” in tables Indicates that no information is associated with this table cell or, with respect to attribute usage, implies optional. The term “content simple” Indicates
43、that the XML element is not allowed to have attributes or subelements. The term “content complex” Indicates that a new complex data type is being defined, which can be used to declare elements to accept attributes and/or subelements. The use of italics Represents a XML element defined outside the su
44、bclause. The use of “1 ” and “0 ” in tables Represents the number of times an XML element may appear in an XML instance document. i.e., either one to infinity times or zero to infinity times. XML snippets of XML instance documents Are given in the Courier type font. The XML attribute “xsi:type” Expl
45、icitly declares the XML element type. The use of “|” in XML simple types descriptions Indicates a logical OR. This document uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of definitions, except for the portions quoted from standards, the following precedence shal
46、l be observed: (1) Clause 3, (2) Annex K, and (3) The IEEE Standards Dictionary: Glossary of Terms in other words, the item is functioning as it was designed to operate. An ATS includes the following: a) ATE hardware and its operating software. b) TPSs, which include the hardware, software, and docu
47、mentation required to interface with, and test, individual component items. The associated software development environments required to produce the TPS are also included. c) Automatic diagnostics and testing. 4.1 Automatic test equipment (ATE) ATE refers to the test hardware and its accompanying so
48、ftware. ATE utilizes one or more computers to control test instruments such as digital voltmeters, waveform analyzers, signal generators, and switching assemblies. This equipment operates under control of test software to provide a stimulus to a particular circuit or component in the UUT and then me
49、asure the output at various pins, ports, or connections to determine whether the UUT has performed to its specifications. The basic definition of ATE, then, is computer-controlled stimulus and measurement. ATE is widely used in the electronic manufacturing industry to test electronics components and systems, both before and after they are fabricated. These electronic components and systems include (but are not limited to) avionics systems on commercial and military aircraft, electronic modules in automobiles
