1、BS ISO/IEC 18745-2:2016Information technology Testmethods for machine readabletravel documents (MRTD) andassociated devices Part 2: Test methods for the contactlessinterfaceBSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06BS ISO/IEC 18745-2:2016 BRITISH STANDARDNation
2、al forewordThis British Standard is the UK implementation of ISO/IEC18745-2:2016.The UK participation in its preparation was entrusted to TechnicalCommittee IST/17, Cards and personal identification.A list of organizations represented on this committee can beobtained on request to its secretary.This
3、 publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. The British Standards Institution 2016.Published by BSI Standards Limited 2016ISBN 978 0 580 81550 8ICS 35.240.15Compliance with a British Standard cannot confer immu
4、nity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 August 2016.Amendments/corrigenda issued since publicationDate T e x t a f f e c t e dBS ISO/IEC 18745-2:2016Information technology Test methods for machine readable
5、 travel documents (MRTD) and associated devices Part 2: Test methods for the contactless interfaceTechnologies de linformation Mthodes dessai pour les documents de voyage lisibles par machine (MRTD) et dispositifs associs Partie 2: Mthodes dessai de linterface sans contactINTERNATIONAL STANDARDISO/I
6、EC18745-2Reference numberISO/IEC 18745-2:2016(E)First edition2016-08-15 ISO/IEC 2016BS ISO/IEC 18745-2:2016ii ISO/IEC 2016 All rights reservedCOPYRIGHT PROTECTED DOCUMENT ISO/IEC 2016, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part of this publication may be reprodu
7、ced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester.I
8、SO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Vernier, Geneva, SwitzerlandTel. +41 22 749 01 11Fax +41 22 749 09 47copyrightiso.orgwww.iso.orgISO/IEC 18745-2:2016(E)BS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E)Foreword vIntroduction vi1 Scope . 12 Normative references 13 Terms and definition
9、 14 Symbols and abbreviated terms . 25 Test methods for eMRTD 25.1 General test conditions 25.1.1 Test setup . 35.1.2 Values unless otherwise specified 35.1.3 Test report . 45.1.4 Applicant declaration . 55.2 Test of ISO/IEC 14443-1 parameters 65.2.1 “Class 1” verification test (optional) . 65.2.2 S
10、tatic electricity test . 65.2.3 Alternating magnetic field test 75.3 Test of ISO/IEC 14443-2 parameters 75.3.1 eMRTD transmission 75.3.2 Operating field strength. 85.3.3 eMRTD reception . 95.3.4 eMRTD resonance frequency (optional) . 95.3.5 eMRTD maximum loading effect . 105.4 Test of ISO/IEC 14443-
11、3 and ISO/IEC 14443-4 parameters 105.5 List of the test command sequences . 105.5.1 Test commands for eMRTD without access control (plain) .105.5.2 Test commands for eMRTD supporting BAC .125.5.3 Test commands for eMRTD supporting PACE 155.6 Functionality check test . 175.6.1 General. 175.6.2 Option
12、al procedure 1: Application functionality check test175.6.3 Optional procedure 2: Electrical functionality check test .186 Test methods for eMRTD reader .196.1 General test requirements . 196.1.1 Test setup 196.1.2 Values unless otherwise specified .196.1.3 Test report 206.1.4 Applicant declaration
13、206.1.5 Definition of measurement points .216.2 Test of ISO/IEC 14443-1 parameters . 216.2.1 Purpose . 216.2.2 Test procedure 226.2.3 Test report 226.3 Test of ISO/IEC 14443-2 parameters . 226.3.1 eMRTD reader field strength 226.3.2 Modulation index and waveform 226.3.3 Load modulation reception . 2
14、36.4 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters 246.5 List of test command sequences . 246.5.1 Test commands sequence for scenarios without eMRTD reader chaining .246.5.2 Test commands sequence for scenarios dealing with eMRTD reader chaining .256.6 Measurement positions 257 Additional e
15、MRTD test methods .27 ISO/IEC 2016 All rights reserved iiiContents PageBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E)7.1 Test conditions . 277.2 Test of ISO/IEC 14443-2 parameters for eMRTD .287.2.1 Operating field strength for bit rates higher than fc/16 287.2.2 eMRTD reception for bit rates higher
16、 than fc/16 .297.2.3 eMRTD EMD level and low EMD time test (optional) .307.3 Test of ISO/IEC 14443-2 parameters for eMRTD reader .317.3.1 eMRTD reader field strength for additional classes .317.3.2 Modulation index and waveform for bit rates higher than fc/16 or additional classes .317.3.3 Load modu
17、lation reception for bit rates higher than fc/16 or additional classes 317.3.4 eMRTD reader EMD immunity test (optional) 327.3.5 eMRTD reader EMD recovery test (optional) 327.4 Additional tests of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters for PICC 337.5 Additional tests of ISO/IEC 14443-3 and I
18、SO/IEC 14443-4 parameters for PCD 338 Specific access control test sequences 338.1 General 338.2 List of the test command sequences with EAC for eMRTD 338.2.1 Test commands for eMRTD supporting EAC .338.2.2 Test commands for eMRTD supporting PACE and EAC .34Bibliography .37iv ISO/IEC 2016 All rights
19、 reservedBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E)ForewordISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the
20、 development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-gov
21、ernmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC
22、 Directives, Part 1. In particular the different approval criteria needed for the different types of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention is drawn to the possibility that s
23、ome of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of pate
24、nt declarations received (see www.iso.org/patents). Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as infor
25、mation about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary informationThe committee responsible for this document is ISO/IEC JTC 1, Information technology, SC 17, Cards and personal identification.ISO/IEC 18745 consists
26、of the following parts, under the general title, Test methods for machine readable travel documents (MRTD) and associated devices: Part 1: Physical test methods for passport books (durability) Part 2: Test methods for the contactless interface ISO/IEC 2016 All rights reserved vBS ISO/IEC 18745-2:201
27、6ISO/IEC 18745-2:2016(E)IntroductionThis part of ISO/IEC 18745 defines the test plan regarding contactless interface for eMRTDs and eMRTD associated readers compliant to ICAO Doc 9303.vi ISO/IEC 2016 All rights reservedBS ISO/IEC 18745-2:2016Information technology Test methods for machine readable t
28、ravel documents (MRTD) and associated devices Part 2: Test methods for the contactless interface1 ScopeThis part of ISO/IEC 18745 defines the test plan, based on ISO/IEC 10373-6, for the contactless interface of eMRTDs and eMRTD associated readers compliant with ICAO Doc 9303.Application requirement
29、s for eMRTD and eMRTD reader are outside of the scope of this part of ISO/IEC 18745.2 Normative referencesThe following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the
30、 referenced document (including any amendments) applies.ISO/IEC 7810:2003/Amd 1:2009, Identification cards Physical characteristicsISO/IEC 10373-6:2016, Identification cards Test methods Part 6: Proximity card s1)ISO/IEC 14443-1:2016, Identification cards Contactless integrated circuit cards Proximi
31、ty cards Part 1: Physical characteristics1)ISO/IEC 14443-2:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 2: Radio frequency power and signal interface1)ISO/IEC 14443-3, Identification cards Contactless integrated circuit cards Proximity cards Part 3: Initializa
32、tion and anticollision1)ISO/IEC 14443-4:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 4: Transmission protocol1)ICAO Doc 9303, Machine Readable Travel Documents Seventh Edition, 20153 Terms and definitionFor the purposes of this document, the following terms an
33、d definitions apply.3.1test methodmethod for testing the characteristics of eMRTDs and eMRTD associated readers for the purpose of assessing their conformance with International Standards1) If ISO/IEC 10373 or ISO/IEC 14443 series are referred, read with replacing PICC with eMRTD and PCD with eMRTD
34、associated reader.INTERNATIONAL STANDARD ISO/IEC 18745-2:2016(E) ISO/IEC 2016 All rights reserved 1BS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E)3.2sampleone piece of the total number of eMRTDs or eMRTD associated readers required and presented for testing according to this specification3.3room temp
35、eratureconvenient temperature within the range of 23 C 3 C (73 F 5 F)4 Symbols and abbreviated termsFor the purposes of this document, the following abbreviations apply.AA active authenticationBAC basic access controlCVCA country verifying certification authorityDV document verifierEAC extended acce
36、ss control (throughout this part of ISO/IEC 18745, the term EAC refers to EAC v1)IS inspection systemLDS logical data structurePACE password authenticated connection establishment (throughout this part of ISO/IEC 18745, the term PACE refers to PACE v2)DUT device under testHminminimum field strength
37、as defined in ISO/IEC 14443-2Hmaxmaximum field strength as defined in ISO/IEC 14443-2eMRTD electronic machine readable travel document“XY” hexadecimal notation, equal to XY in base 165 Test methods for eMRTD5.1 General test conditionsThe test methods defined in Clause 5 are in line with the test met
38、hods defined in ISO/IEC 10373-6:2001/Amd 7:2010, but updated in accordance with ISO/IEC 10373-6:2016.Test conditions and procedures in this Clause are based on ISO/IEC 10373-6 taking into account specific needs of eMRTD application.Clause 7 addresses only requirements introduced by amendments on ISO
39、/IEC 10373-6:2011 published after 2011 and integrated in the third edition of ISO/IEC 10373-6: ISO/IEC 10373-6:2011/Amd.1:2012; ISO/IEC 10373-6:2011/Amd.2:2012; ISO/IEC 10373-6:2011/Amd.3:2012;2 ISO/IEC 2016 All rights reservedBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E) ISO/IEC 10373-6:2011/Amd.4
40、:2012; ISO/IEC 10373-6:2011/Amd.5:2015;2) ISO/IEC 10373-6:2011/Amd.6:2015;2) ISO/IEC 10373-6:2011/Amd.7:2015.2)The following subclauses specify the different test setups, the values used for the tests, and a recommendation for the format of the test report.Depending on the implementation statement o
41、f the applicant, Type A or Type B tests shall be performed.For tests of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters, the minimum number of samples provided for testing is three, unless explicitly defined otherwise. The applicant may request that a larger number of samples are tested. The samples
42、provided by the applicant should be personalized and marked each with a unique serial number. Serial numbers shall be reported in the test report.It is not mandatory to use the same samples to run all the tests defined in this standard. For example, an applicant can provide: 3 samples for static ele
43、ctricity test; 3 samples for alternating magnetic field test; 3 samples for ISO/IEC 14443-2 parameters; 1 sample for ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters.For tests where mandatory field strength values are specified, a transition period for eMRTD requiring higher field strength may apply.5
44、.1.1 Test setupThe Test PCD assembly that is defined in ISO/IEC 10373-6 is the basis for the physical and electrical tests. The matching network defined in ISO/IEC 10373-6:2016, A.2.2 is used together with the Test PCD assembly.The Test PCD assembly shall be adapted to carry an eMRTD with the additi
45、onal ability to center an ID-1 sized antenna of an eMRTD in the Test PCD assembly.Some of the following tests are assuming an antenna size within ID-1 outline. If antenna is greater than ID-1 size, those tests might not generate accurate results.5.1.2 Values unless otherwise specifiedThe values defi
46、ned in Table 1 are typical values for communication parameters.Unless otherwise specified, the following environmental parameters and values defined in Table 1 shall be used.Table 1 Values unless otherwise specifiedParameter Value To be applied toParameters applicable for all bit ratesEnvironment te
47、mperature room temperature Type A and Type BRelative humidity 25 % to 75 %aType A and Type BaAny convenient relative humidity within the specified range.2) Not published but integrated in the third revision of ISO/IEC 10373-6. ISO/IEC 2016 All rights reserved 3BS ISO/IEC 18745-2:2016ISO/IEC 18745-2:
48、2016(E)Parameter Value To be applied toStart Of Frame timing (SOF) 10 etu “0” followed by 2 etu “1” Type BEnd Of Frame timing (EOF) 10 etu “0” Type BExtra Guard Time (EGT) 0 etu Type BMaximum Frame Size Code in ATTRIB8 Type BFSDI 8 Type AParameters applicable for eMRTD reader to eMRTD bit rate fc/12
49、8Modulation 100 % Type At140/fc Type At27/fc Type At312/fc Type At46/fc Type AOvershoot 0 % Type A and Type BModulation index m 12 % Type BRise time, tr, fall time, tf12/fc Type BParameters applicable for eMRTD reader to eMRTD bit rate fc/64a 0,1 Type At118/fc Type At515/fc Type At69/fc Type AOvershoot 0 % Type A and Type BModulation index m 12 % Type BRise time tr, fall time tf10/fc Type BParameters applicable for eMRTD reader to eMRTD bit rate fc/32a 0,2 Type At19/fc Type At57/fc T
