1、BRITISH STANDARD BS QC 400202:1992 IEC 115-4-2: 1992 Specification for Harmonized system ofquality assessment for electronic components Fixedresistors for usein electronic equipment Blankdetail specification Fixed power resistors Assessment level FBSQC400202:1992 BSI 03-2000 ISBN 0 580 35825 9 Amend
2、ments issued since publication Amd. No. Date CommentsBSQC400202:1992 BSI 03-2000 i Contents Page National foreword ii Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting 2 1.2 Dimensions, ratings and characteristics 2 1.3 Related documents 2 1.4 Marking 2 1.5 Ordering inform
3、ation 3 1.6 Certified records of released lots 3 1.7 Additional information 3 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification 3 Section 2. Inspection requirements 2.1 Procedures 3 Table I 2 Table II 4BSQC400202:1992 ii BSI 03-20
4、00 National foreword This British Standard has been prepared under the direction of the ElectronicComponents Standards Policy Committee (ECL/-). It is identical with IEC115-4-2:1992 (QC400202) “Fixed resistors for use in electronic equipment. Part 4: Blank detail specification: Fixed power resistors
5、. Assessment level F”, published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ System of quality assessment for electronic components. IEC 115-4-2 was prepared by IEC Technical Committee No.40, Capacitors and resistors for electronic equipme
6、nt, and the United Kingdom participation in the drafting was provided by Technical Committee ECL/4, Capacitors and resistors for electronic equipment. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance w
7、ith BSQC400200 in any detail specification for these components. The British Standard which implements the IECQ Rules of Procedure is BS9000 “General requirements for a system for electronic components of assessedquality” Part 3:1991 “Specification for the national implementation of theIECQ System”.
8、 The Technical Committee has reviewed the provisions of IEC410 to which reference is made in the text and has decided that they are acceptable for use in conjunction with this standard. Detail Specifications. Detail specifications shall comply with the requirements of this Blank Detail Specification
9、 and BSQC001002:1991 “Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ)”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a Brit
10、ish Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard IEC 115-1:1982 (QC 400000) BS QC 400000:1990 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipme
11、nt. Generic specification (Identical) IEC 115-4:1982 (QC 400200) BS 9940 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Part 02.0:1983 Sectional specification: fixed power resistors (Identical) Summary of pages This document compris
12、es a front cover, an inside front cover, pagesi andii, pages1 to8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSQC400202:1992 BSI 03-2000 1 Introduction Blank d
13、etail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in acc
14、ordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be i
15、nserted in the position indicated. Identification of the detail specification (1) The “International Electrotechnical Commission” or the National Standards Organisation under whose authority the detail specification is drafted. (2) The IEC or National Standards number of the detail specification, da
16、te of issue and any further information required by the national system. (3) The number and issue number of the IEC or national Generic Specification. (4) The IEC number of the blank detail specification. Identification of the resistor (5) A short description of the type of resistor. (6) Information
17、 on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. (7) Outline drawing with main dimensions which are of importance for interchangeability and/or reference
18、 to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. (8) Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected
19、from the sectional specification, Sub-clause3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. (9) Reference data on the most important properties, to allow comparison between the vari
20、ous resistor types. (1) IEC 115-4-2-XXX QC 400202-XXX (2) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-4-2 QC 400200 (4) (3) FIXED POWER RESISTORS (5) Outline drawing: (seeTable I) (. . . angle projection) (7) Insulated/non-insulated (6) (Other shapes are permitted within th
21、e dimensions given) Assessment level(s): F (8) Stability class:. . .% Information on the availability of components qualified to this detailspecification is given in the Qualified Products List. (9)BSQC400202:1992 2 BSI 03-2000 Section 1. General data 1.1 Recommended method(s) of mounting (to be ins
22、erted) (See Sub-clause1.4.2 of IEC Publication115-4.) 1.2 Dimensions, ratings and characteristics Table I All dimensions are in millimetres or inches and millimetres. 1.2.1 Derating Resistors covered by this specification are derated according to the curve: NOTESee also Sub-clause2.2.3 of the sectio
23、nal specification. 1.3 Related documents 1.4 Marking The marking of the components and packaging shall be in accordance with the requirements of IECPublication115-1, Sub-clause2.4. NOTEThe details of the marking of the component and packaging shall be given in full in the detail specification. Style
24、 Rated dissipation at 70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V d.c. or a.c. peak) Maximum dimensions d nom : L D Tol.: Resistance range a . to.7 Tolerance on rated resistance .% Climatic category / Low air pressure 8,5 kPa (85 mbar) Stability class .% Limits for
25、 change of resistance: for long-term tests (. %R + . 7) for short-term tests (. %R + . 7) Variation of resistance with temperature k .% or !:. 10 6 / C Temperature rise k . C a The preferred values are those of the E-series of IEC Publication 63: Preferred Number Series for Resistors and Capacitors.
26、 (A suitable curve to be included in the detail specification) Generic Specification: IEC Publication 115-1:1982: Fixed Resistors for Use in Electronic Equipment. Part 1: Generic Specification. Amendment No. 2 (1987). Sectional Specification: IEC Publication 115-4:1983: Part 4: Sectional Specificati
27、on: Fixed Power Resistors. %R R -BSQC400202:1992 BSI 03-2000 3 1.5 Ordering information Orders for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated resistance. b) Tolerance on rated resistance. c) Number and issue number re
28、ference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTE
29、Additions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IECPublication115-4, Sub-clause3.2. 2.1.2 For Quality Conformance Ins
30、pection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Sub-clause4.3 of the Generic Specification, IEC Publication11
31、5-1, shall be used.BSQC400202:1992 4 BSI 03-2000 Table II NOTE 1Sub-clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication115-1, except for resistance change requirements, which shall be selected from the Table I and Table II of the sectional specific
32、ation, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = destructive ND = no
33、n-destructive IL = inspection level IEC Publication 410 AQL = acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) I L A Q L Performance requirements (see Note 1) (see Note 2) GROUP A INSPECTION (lot-by-lot) Sub-group A1 ND S-3 1,5% 4.4.1 Visual ex
34、amination As in4.4.1 Legible marking and as specified in1.4 of this specification Sub-group A2 ND S-3 1,5% 4.5 Resistance As in 4.5.2 GROUP B INSPECTION (lot-by-lot) Sub-group B1 D S-3 2,5% 4.17 Solderability Without ageing Method:. Good tinning as evidenced by free flowing of the solder with wettin
35、g of the terminations of solder shall flow within.s, asapplicable 4.30 Solvent resistance of the marking (ifapplicable) Solvent:. Solvent temperature:. Method 1 Rubbing material: cotton wool Legible marking Recovery:. BSQC400202:1992 BSI 03-2000 5 Table II Sub-clause number and Test (see Note 1) D o
36、r ND Conditions of test (see Note 1) Sample size & criterion of acceptability (seeNote 3) Performance requirements (see Note 1) p n c GROUP C INSPECTION (periodic) Sub-group C1 D 6 20 1 4.24 Damp heat, steadystate 1) Sub-clause 4.24.2.1 1stgroup: 6 specimens 2nd group: 7 specimens 3rd group: 7 speci
37、mens 2) Sub-clause 4.24.2.2 1stgroup: 10 specimens 2nd group: 10 specimens Visual examination No visible damage Legible marking Resistance %R k (.%R +. 7) Insulation resistance (Insulated resistors only) R U 100 M7 Sub-group C2 D 6 20 1 4.25.1 Endurance at room temperature Duration: 1 000 h Examinat
38、ion at 48 h, 500hand 1 000 h: Visual examination No visible damage Resistance %R k ).%R +. 7) Examination at 1 000 h: Insulation resistance (Insulated resistors only) R U 1 G7 Sub-group C3 ND 6 20 1 4.4.2 Dimensions (gauging) As specified inTable I of this specificationBSQC400202:1992 6 BSI 03-2000
39、Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c GROUP D INSPECTION (periodic) Sub-group D1A D 36 10 Half of the sample of Sub-group D1 4.16 Robustness of termina
40、tions Tensile, bending and torsion tests (as applicable) Visual examination No visible damage Resistance %R k (.%R +. 7) 4.18 Resistance to soldering heat Method:. Visual examination No visible damage Legible marking Resistance %R k (.%R +. 7) 4.29 Component solvent resistance (if applicable) Solven
41、t:. Solvent temperature:. Method 2 See detail specification Recovery:. Sub-group D1B D 36 10 Other half of the sample of Sub-group D1 4.19 Rapid change of temperature F A : Lower category temperature F B : Upper category temperature Visual examination No visible damage Resistance %R k (.%R +. 7) 4.2
42、0 Bump (or shock see4.21) Method of mounting: see 1.1 of this specification Acceleration: 390 m/s 2 Number of bumps: 4 000 Visual examination No visible damage Resistance %R k (.%R +. 7) 4.21 Shock (or bump, see4.20) Method of mounting: see 1.1 of this specification Acceleration: 490 m/s 2 Duration
43、of pulse: 11 ms Pulse shape: half-sine Visual examination No visible damage Resistance %R k (.%R +. 7)BSQC400202:1992 BSI 03-2000 7 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements
44、(see Note 1) p n c 4.22 Vibration Method of mounting: see 1.1 of this specification Procedure B4 Frequency range: . . . Hz to. . . Hz (see 2.3.2 of the sectional specification) Amplitude: 0,75 mm or 98 m/s 2(whichever is the less severe) Total duration: 6h Visual examination Resistance No visible da
45、mage %R k (.%R +. 7) Sub-group D1 D 36 20 1 Combined sample of specimens of Sub-groups D1A and D1B 4.23 Climatic sequence Dry heat Damp heat, cyclic, Test Db, first cycle Cold Low air pressure 8,5 kPa (85 mbar) Damp heat, cyclic, Test Db, remaining cycles Visual examination No visible damage Legible
46、 marking Resistance %R k (.%R +. 7) Insulation resistance (Insulated resistors only) R U 100 M7 Sub-group D2 D 36 20 1 4.4.3 Dimensions (detail) As specified in Table I of this specification 4.25.3 Endurance at upper category temperature Duration: 1 000 h Examination at 48 h, 500hand 1 000 h: Visual
47、 examination No visible damage Resistance %R k (.%R +. 7) Examination at 1 000 h: Insulation resistance (Insulated resistors only) R U 1 G7BSQC400202:1992 8 BSI 03-2000 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (
48、seeNote 3) Performance requirements (see Note 1) p n c Sub-group D3 ND 36 20 1 4.8 Variation of resistance with temperature Lower category temperature/20 C k . % or !:. x 10 6 / C 20 C/upper category temperature k . % or !:. x 10 6 / C Sub-group D4 ND 36 20 1 4.7 Voltage proof (Insulated resistors o
49、nly) Method:. No breakdown or flashover %R R - %R R -blankBS QC 400202:1992 IEC115-4-2: 1992 BSI 389 Chiswick High Road London W4 4AL BSIBritishStandardsInstitution BSI is the independent national body responsible for preparing BritishStandards. It presents the UK view on standards in Europe and at the international level. It is incorporated by Royal Charter. Revisions BritishStandards are updated by amendment or revision. Users of BritishStandards should make sure that
