1、 Proceedings of the CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry 30-31 August 2010 Bern, Switzerland CIE x036:2010 CD-ROM INCLUDED ISBN 978 3 901906 89 3 THE INTERNATIONAL COMMISSION ON ILLUMINATION The International Commission on Illumination (CIE) is an organi
2、sation devoted to international co-operation and exchange of information among its member countries on all matters relating to the art and science of lighting. Its membership consists of the National Committees in about 40 countries. The objectives of the CIE are: 1. To provide an international foru
3、m for the discussion of all matters relating to the science, technology and art in the fields of light and lighting and for the interchange of information in these fields between countries. 2. To develop basic standards and procedures of metrology in the fields of light and lighting. 3. To provide g
4、uidance in the application of principles and procedures in the development of international and national standards in the fields of light and lighting. 4. To prepare and publish standards, reports and other publications concerned with all matters relating to the science, technology and art in the fi
5、elds of light and lighting. 5. To maintain liaison and technical interaction with other international organisations concerned with matters related to the science, technology, standardisation and art in the fields of light and lighting. The work of the CIE is carried on by seven Divisions each with a
6、bout 20 Technical Committees. This work covers subjects ranging from fundamental matters to all types of lighting applications. The standards and technical reports developed by these international Divisions of the CIE are accepted throughout the world. A plenary session is held every four years, at
7、which the work of the Divisions and Technical Committees is reviewed, reported and plans are made for the future. The CIE is recognised as the authority on all aspects of light and lighting. As such it occupies an important position among international organisations. LA COMMISSION INTERNATIONALE DE
8、LECLAIRAGE La Commission Internationale de lEclairage (CIE) est une organisation qui se donne pour but la coopration internationale et lchange dinformations entre les Pays membres sur toutes les questions relatives lart et la science de lclairage. Elle est compose de Comits Nationaux reprsentant env
9、iron 40 pays. Les objectifs de la CIE sont : 1. De constituer un centre dtude international pour toute matire relevant de la science, de la technologie et de lart de la lumire et de lclairage et pour lchange entre pays dinformations dans ces domaines. 2. Dlaborer des normes et des mthodes de base po
10、ur la mtrologie dans les domaines de la lumire et de lclairage. 3. De donner des directives pour lapplication des principes et des mthodes dlaboration de normes internationales et nationales dans les domaines de la lumire et de lclairage. 4. De prparer et publier des normes, rapports et autres texte
11、s, concernant toutes matires relatives la science, la technologie et lart dans les domaines de la lumire et de lclairage. 5. De maintenir une liaison et une collaboration technique avec les autres organisations internationales concernes par des sujets relatifs la science, la technologie, la normalis
12、ation et lart dans les domaines de la lumire et de lclairage. Les travaux de la CIE sont effectus par 7 Divisions, ayant chacune environ 20 Comits Techniques. Les sujets dtudes stendent des questions fondamentales, tous les types dapplications de lclairage. Les normes et les rapports techniques labo
13、rs par ces Divisions Internationales de la CIE sont reconnus dans le monde entier. Tous les quatre ans, une Session plnire passe en revue le travail des Divisions et des Comits Techniques, en fait rapport et tablit les projets de travaux pour lavenir. La CIE est reconnue comme la plus haute autorit
14、en ce qui concerne tous les aspects de la lumire et de lclairage. Elle occupe comme telle une position importante parmi les organisations internationales. DIE INTERNATIONALE BELEUCHTUNGSKOMMISSION Die Internationale Beleuchtungskommission (CIE) ist eine Organisation, die sich der internationalen Zus
15、ammenarbeit und dem Austausch von Informationen zwischen ihren Mitgliedslndern bezglich der Kunst und Wissenschaft der Lichttechnik widmet. Die Mitgliedschaft besteht aus den Nationalen Komitees in rund 40 Lndern. Die Ziele der CIE sind: 1. Ein internationaler Mittelpunkt fr Diskussionen aller Frage
16、n auf dem Gebiet der Wissenschaft, Technik und Kunst der Lichttechnik und fr den Informationsaustausch auf diesen Gebieten zwischen den einzelnen Lndern zu sein. 2. Grundnormen und Verfahren der Metechnik auf dem Gebiet der Lichttechnik zu entwickeln. 3. Richtlinien fr die Anwendung von Prinzipien u
17、nd Vorgngen in der Entwicklung internationaler und nationaler Normen auf dem Gebiet der Lichttechnik zu erstellen. 4. Normen, Berichte und andere Publikationen zu erstellen und zu verffentlichen, die alle Fragen auf dem Gebiet der Wissenschaft, Technik und Kunst der Lichttechnik betreffen. 5. Liaiso
18、n und technische Zusammenarbeit mit anderen internationalen Organisationen zu unterhalten, die mit Fragen der Wissenschaft, Technik, Normung und Kunst auf dem Gebiet der Lichttechnik zu tun haben. Die Arbeit der CIE wird in 7 Divisionen, jede mit etwa 20 Technischen Komitees, geleistet. Diese Arbeit
19、 betrifft Gebiete mit grundlegendem Inhalt bis zu allen Arten der Lichtanwendung. Die Normen und Technischen Berichte, die von diesen international zusammengesetzten Divisionen ausgearbeitet werden, sind von der ganzen Welt anerkannt. Alle vier Jahre findet eine Session statt, in der die Arbeiten de
20、r Divisionen berprft, berichtet und neue Plne fr die Zukunft ausgearbeitet werden. Die CIE wird als hchste Autoritt fr alle Aspekte des Lichtes und der Beleuchtung angesehen. Auf diese Weise unterhlt sie eine bedeutende Stellung unter den internationalen Organisationen. Published by the COMMISSION I
21、NTERNATIONALE DE LECLAIRAGE CIE Central Bureau Kegelgasse 27, A-1030 Vienna, AUSTRIA Tel: +43 1 714 31 87 0, Fax: +43 1 714 31 87 18 e-mail: ciecbcie.co.at WWW: http:/www.cie.co.at/ CIE 2010 Proceedings of the CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry 30-31 A
22、ugust 2010 Bern, Switzerland CIE x036:2010 CD-ROM INCLUDED ISBN 978 3 901906 89 3 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry II CIE x036:2010 Any mention of organisations or products does not imply endorsement by the CIE. Whilst every care has been taken
23、in the compilation of any list, up to the time of going to press, these may not be comprehensive. CIE 2010 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and micr
24、ofilm, without the permission in writing from the CIE Central Bureau at the address below. Commission Internationale de lEclairage CIE Central Bureau Kegelgasse 27 A-1030 Vienna AUSTRIA Tel.: +43 1 714 31 87 0 Fax: +43 1 714 31 87 18 e-mail: ciecbcie.co.at WWW: http:/www.cie.co.at/ 2010 CIE Expert S
25、ymposium on Spectral and Imaging Methods for Photometry and Radiometry CIE x036:2010 III Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry CIE thanks for their generous sponsorship of this CIE Conference 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photo
26、metry and Radiometry IV CIE x036:2010 Symposium Co-Chairs Peter Blattner (CIE Division 2 Member Switzerland) Yoshi Ohno (CIE Division 2 Director) Symposium Secretariat Marlise Hhni (SLG) Reto Abcherli (SLG) Organizing Committee Tony Bergen (CIE Division 2 Member Australia) Jim Gardner (CIE Division
27、2 Editor) Teresa Goodman (CIE Vice-President Publicaitons) Norb Johnson (CIE Division 2 Associate Director) Martina Paul (CIE Central Bureau) Georg Sauter (CIE Division 2 Associate Director) Armin Sperling (CIE Division 2 Secretary) Guy Vandermeersch (CIE Division 2 Associate Director) Other Contrib
28、utors Leena-Louise Martinez (CIE Central Bureau) Exhibitors INSTRUMENT SYSTEMS GmbH, Germany SPHEREOPTICS, Germany EVERFINE, China KONICA MINOLTA, Japan WESTBORO PHOTONICS, Canada TECHNOTEAM BILDVERARBEITUNG GmbH, Germany 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and R
29、adiometry CIE x036:2010 V INTRODUCTION This Symposium was organised by CIE Division 2 in cooperation with the Swiss Lighting Society (SLG), and was hosted by the Federal Office of Metrology (METAS), Bern, Switzerland. The two-day Symposium included a one day tutorial presenting the state-of-the-art
30、techniques in the field of photometry. Invited experts provided eight lectures from basic concepts to advanced techniques in photometric and colorimetric measurements, aiming at optical measurement engineers in a wide range of fields including LED and solid state lighting. On the second day, a Scien
31、tific Symposium featured 35 contributed papers presenting recent research in photometry, colorimetry, and radiometry with a focus on the methods using spectral and imaging techniques. The Symposium had four sessions, Session I: Goniophotometry and Spatial Methods, Session II: Imaging and Spectral Me
32、thods, Session III: Metrology for LEDs, and Session IV: Advances in Radiometry, with 16 oral presentations and 19 poster presentations. The Symposium was followed by CIE Division 2 Technical Committee meetings and annual Division meeting for three days. 2010 CIE Expert Symposium on Spectral and Imag
33、ing Methods for Photometry and Radiometry VI CIE x036:2010 Contents The following table provides an overview of the Papers and Posters presented at the Conference. The papers are published in the Proceedings in consecutive order of presentation. The authors are responsible for the contents of their
34、papers Oral Presentations Page OP01 R. Rykowski SPECTRAL RAY TRACING FROM NEAR FIELD GONIOPHOTOMETER MEASUREMENTS 1 OP02 J. Quintero, S. Forment and P. Hanselaer A COMPARISON BETWEEN NEAR FIELD AND FAR FIELD GONIOPHOTOMETER MEASUREMENTS 9 OP03 C. Schwanengel LUMINOUS INTENSITY DISTRIBUTION AND RAY D
35、ATA MEASUREMENT 14 OP04 Q. Li, H. Shen and J. Pan 2D SPECTRAL AND LUMINANCE MEASUREMENT DEVICE 16 OP05 M. Pisani, M. Zucco and P. Bianco HYPERSPECTRAL IMAGING DEVICE FOR COLOUR MEASUREMENTS 21 OP06 U. Krger, K. Anhalt, D.R. Taubert, F. Schmidt and J. Hartmann CCD-CAMERA FOR MEASURING TEMPERATURE AND
36、 SPECTRAL RADIANCE 26 OP07 *E. Perret, T. Balmer and M. Heuberger HIGH ACCURACY CALIBRATION OF OPTICAL SPECTROMETER (HICALOS) 33 OP08 S. Nevas, G. Wbbeler, A. Sperling, A. Teuber, C. Elster and K. Stock PRACTICAL METHOD FOR BANDPASS AND STRAY LIGHT CORRECTION OF ARRAY SPECTRORADIOMETER DATA 35 *Full
37、 paper was not received. Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry CIE x036:2010 VII Oral Presentations Page OP09 A. Keppens, Y. Zong, Y. Ohno, G. Deconick and P. Hanselaer DE
38、TERMINING PHOSPHORS EFFECTIVE QUANTUM EFFICIENCY FOR REMOTE PHOSPHOR TYPE OF LED MODULES 39 OP10 D. Konjhodzic and R. Distl METROLOGY FOR LED LAMPS AND MODULES 43 OP11 T. Mou, Y. Zong and Y. Ohno MEASUREMENT OF WEIGHTED LED RADIANCE RELATED TO PHOTOBIOLOGICAL SAFETY 47 OP12 Yuqin Zong UNCERTAINTY AN
39、ALYSIS OF STRAY-LIGHT CORRECTION 50 OP13 J. Decuypere, J-L. Capron, T. Dutoit, M.Renglet INFLUENCE OF MATERIAL SPECTRAL REFLECTANCE ON VISION IN MESOPIC CONDITIONS 55 OP14 * K-G. Lee, X. Chen, H. Eghlidi, E. Ikonen, S. Gtzinger and V. Sandoghdar A PREDICTABLE BRIGHT SINGLE PHOTON SOURCE 60 OP15 K.M.
40、 Nield, G. Porrovecchio and M. Smid EVALUATION OF THE LINEARITY PERFORMANCE OF SILICON TRAP DETECTORS WITH SWITCH INTEGRATOR AMPLIFIERS AT LOW OPTICAL POWERS 62 OP16 G.P. Eppeldauer, J. Zeng, H.W. Yoon and T.C. Larason EXTENSION OF THE NIST SPECTRAL POWER AND IRRADIANCE RESPONSITIVITY CALIBRATIONS T
41、O 2.5 MICROMETERS 66 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry VIII CIE x036:2010 Poster Presentations Page P01 A. Bartsey, R. Belyaev and R. Stolyarevskaya NEAR FIELD GONIOPHOTOMETER: EXPERIENCE OF RESEARCH AND USE 72 P02 T. Moggridge IMAGING BRDF: MEAS
42、URING REFLECTANCE AND CHROMATICITY AS A FUNCTION OF ANGLE USING AN IMAGING SYSTEM 76 P03 A.M. Rabal, A. Ferrero, J.L. Fontecha, A. Pons, J. Campos, A. Corrns and A.M. Rubio GONIO-SPECTROPHOTOMETER FOR LOW-UNCERTAINTY MEASUREMENTS OF BIDIRECTIONAL SCATTERING DISTRIBUTION FUNCTION (BSDF) 79 P04 *P. Bo
43、her, T. Bignon and T. Leroux NEAR FIELD CHARACTERIZATION OF LED SOURCES WITH FOURIER OPTICS INSTRUMENT 85 P05 D. Crespo, J. Campos, A. Pons and A. Ferrero CMOS CAMERA RESPONSE NONLINEARITY 87 P06 * D-H. Lee, S. Park, G. Zaid and S-N. Park BANDWIDTH CORRECTION IN SPECTRAL RESPONSITIVITY MEASUREMENT U
44、SING LEDS 92 P07 Y.J. Liu, G. Xu, X.B. Huang, F. Manoochen and E. Ikonen APPLICATION OF INGAAS TRAP DETECTOR IN THE MULTI-WAVELENGTH FILTER RADIOMETER FOR SPECTRAL IRRADIANCE MEASUREMENT 94 P08 G. Bizjak, M. Lindemann, A. Sperling and G. Sauter TUNABLE LED COLOUR SOURCE 99 P09 Y.C. Lee OPTICAL CHARA
45、CTERISTICS OF CONVENTIONAL AND LED FLUORESCENT TUBES 103 *Full paper was not received. 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry CIE x036:2010 IX P10 M. Lpez, Ma. Lindemann, C. Vern, N. Betzhold, M. Dmmig and A. Sperling LONG-TERM STABILITY AND ANGULAR D
46、EPENDANCY OF THE CHROMATICITY OF HIGH-POWER WHITE LEDs 105 P11 *J. Wang, Y. Liu and W. Wang IMPROVEMENT OF SPATIAL CHROMATICITY MEASUREMENT OF WHITE LED LUMINAIRES 109 P12 T. Gerloff, K. Diekmann and A. Sperling LUMINANCE HOMOGENEITY OF OLEDs 110 P13 N. Cariou INTEGRATING SPHERE THEORY FOR MEASURING
47、 OPTICAL RADIATION 115 P14 W. Jordan, W. Halbritter, W. Steudtner, U. Binder and N. Wagner ABSOLUTE LUMINOUS FLUX MEASUREMENT OF LAMPS USING THE ULBRICHT SPHERE 119 P15 S. Park, D-H. Lee and S-N Park INTEGRATING SPHERE PHOTOMETER WITH AN ADDITIONAL OPENING FOR TEST LAMP MOUNTING 126 P16 * T. Poikkon
48、en, P. Blattner and E. Ikonen MEASUREMENTS OF PHOTOMETER DIRECTIONAL RESPONSE INDEX f2AT MIKES AND AT METAS 129 P17 S.K. Kim, S. Park and J. Hwang SPATIALLY UNIFORM COLOUR GENERATOR FOR DISPLAYS 130 P18 G.P Eppeldauer, C.C. Miller, T.C. Larason and Y. Ohno CONCLUSIONS OF SPECTRAL RESPONSITIVITY BASE
49、D TRISTIMULUS COLORIMETER CALIBRATIONS AT NIST 134 P19 T. Saito, H. Shitomi and I. Saito ANGULAR DEPENDENCE OF PHOTODETECTOR RESPONSIVITY 141 LIST OF PARTICIPANTS 147 *Full paper was not received. 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry X CIE x036:2010 2010 CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry CIE x036:2010 1 SPECTRAL RAY TRACING FROM NEAR FIELD GONIOPHOT
