1、 CISPR 17 Edition 2.0 2011-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Methods of measurement of the suppression characteristics of passive EMC filtering devices Mthodes de mesure des caractristiques dantiparasitage des dispositifs de filtrage CEM passifs CISPR 17:2011INTERNATIONAL SPECIAL COMMIT
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16、es commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 CISPR 17 Edition 2.0 2011-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Methods of measurement of the suppression ch
17、aracteristics of passive EMC filtering devices Mthodes de mesure des caractristiques dantiparasitage des dispositifs de filtrage CEM passifs INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XB ICS 33.100.01 PRICE CODE CODE PRIX ISBN 978-2-88912-526-5 INTERNATIONAL
18、 SPECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INTERNATIONAL SPCIAL DES PERTURBATIONS RADIOLECTRIQUES Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colourinside 2 CISPR 17 IEC:2011 CONTENTS FOREWORD . 6 INTRODUCTIO
19、N . 8 1 Scope . 9 2 Normative references . 9 3 Terms, definitions and abbreviations 9 3.1 Terms and definitions 9 3.2 Abbreviations 12 4 Classification of EMC filtering devices 12 4.1 Insertion loss . 14 4.1.1 Insertion loss calculation . 14 4.1.2 Asymmetrical (common) mode . 14 4.1.3 Symmetrical (d
20、ifferential) mode . 14 4.1.4 Unsymmetrical mode . 14 4.2 Impedance 14 4.3 S-parameters . 15 4.3.1 General . 15 4.3.2 Two-port S-parameters 15 4.3.3 Four-port S-parameters 16 5 Insertion loss measurement 17 5.1 General . 17 5.2 Measurement set-up 18 5.2.1 General . 18 5.2.2 Test equipment 18 5.2.3 As
21、ymmetrical (common mode) test circuit 19 5.2.4 Symmetrical (differential mode) test circuit 19 5.2.5 Unsymmetrical test circuit 20 5.3 Measurement methods (procedure) . 21 5.3.1 General . 21 5.3.2 Measurement without bias . 22 5.3.3 Measurement with bias 22 5.4 Calibration and verification 23 5.4.1
22、General . 23 5.4.2 Validation of test set-up without bias . 23 5.4.3 Validation of test set-up with bias 24 5.5 Uncertainty 26 6 Impedance measurement . 26 6.1 General . 26 6.2 Direct method 26 6.2.1 Measurement set-up and procedure 26 6.2.2 Calibrations of the test set-up 27 6.2.3 Measurement uncer
23、tainty 27 6.3 Indirect method . 27 6.3.1 Measurement set-up and procedure 27 6.3.2 Calibration of the test set-up 29 6.3.3 Measurement uncertainty 29 7 S-parameter measurement 30 CISPR 17 IEC:2011 3 7.1 Measurement set-up and procedure 30 7.1.1 General . 30 7.1.2 Test fixture 31 7.2 Calibration of t
24、est set-up . 36 7.3 Measurement uncertainties . 36 8 Presentation of results 36 8.1 General . 36 8.2 Insertion loss . 37 8.3 Impedance 37 8.4 S-parameters . 37 Annex A (normative) Uncertainty estimation for the measurement of the suppression characteristics of EMC filtering devices 38 Annex B (infor
25、mative) Examples of test boxes for insertion loss measurement . 43 Annex C (informative) Insertion loss test methods with non-50 systems . 47 Annex D (informative) Realization of the buffer-network for insertion loss measurement . 49 Annex E (informative) Insertion loss measurement General discussio
26、n . 51 Annex F (informative) Set-up for impedance measurement 54 Annex G (informative) S-parameter measurement of common-mode choke coils 59 Annex H (informative) Measurement set-up for S-parameters of a DUT without wire leads 64 Bibliography 66 Figure 1 Measurement arrangement for S-parameters of a
27、 two-terminal device 15 Figure 2 Measurement arrangement for S-parameters of a three-terminal device . 15 Figure 3 Measurement arrangement for four-port S-parameters 16 Figure 4 Test circuit for insertion loss measurement (example: 4-line-filter) . 18 Figure 5 Test circuit for asymmetrical insertion
28、 loss measurement (example: 4-line-filter) . 19 Figure 6 Test circuit for symmetrical insertion loss measurement (example: 4-line-filter) . 20 Figure 7 Test circuit for unsymmetrical insertion loss measurement (example: 4-line filter) . 21 Figure 8 Test circuit for insertion loss measurement without
29、 bias . 22 Figure 9 Test circuit for insertion loss measurement with bias 22 Figure 10 Test circuit for verification of measurement circuit without bias 23 Figure 11 Test circuit for verification of measurement circuit with bias . 25 Figure 12 One-port measurement of a two-terminal device 28 Figure
30、13 S-parameter measurements for evaluating the impedance of a device in a series connection 28 Figure 14 S-parameter measurements for evaluating the impedance of a device in a shunt connection. 28 Figure 15 Two-port S-parameter measurement set-up 30 Figure 16 An alternative measurement system specif
31、ically for the insertion loss of a DUT (using a combination of tracking generator and measuring receiver) 31 Figure 17 Symbolic expressions . 32 Figure 18 Test fixture for a two-terminal device (series connection) . 32 4 CISPR 17 IEC:2011 Figure 19 Test fixture for a two-terminal device (shunt conne
32、ction) 33 Figure 20 Test fixture for a three-terminal filter 33 Figure 21 Test fixture for a two-terminal device with leads . 34 Figure 22 Test fixture for a three-terminal filter with leads 35 Figure 23 Test fixture for a core device 35 Figure 24 Example of the standards for TRL calibration . 36 Fi
33、gure B.1 Design of typical test box for general-purpose filters . 43 Figure B.2 3D view of typical test box for general purpose filters . 44 Figure B.3 Design of typical test box for feedthrough components . 45 Figure B.4 3D view of typical test box for feedthrough components 45 Figure C.1 Test circ
34、uit 47 Figure D.1 Example of connecting buffer-networks for test with bias 49 Figure E.1 Test circuit for insertion loss measurement, reference measurement (filter replaced by a short circuit) . 51 Figure E.2 Test circuit for insertion loss measurement, measurement of filter under test . 52 Figure F
35、.1 Measurement set-up for a leaded device (DUT) 54 Figure F.2 Four-terminal test fixture for a leaded device (DUT) 55 Figure F.3 Measurement set-up for an SMD . 55 Figure F.4 Clamp-type test fixture 56 Figure F.5 Coaxial test fixture for an SMD . 56 Figure F.6 Press-type test fixture for an SMD. 57
36、Figure F.7 Connection for CMCC measurement . 57 Figure F.8 Test fixture and measurement set-up for an SMD common-mode choke coil 58 Figure G.1 Common-mode choke coil 59 Figure G.2 Set-up for measurements of common-mode characteristics 59 Figure G.3 Test fixture for an SMD. 60 Figure G.4 Test fixture
37、 for a leaded device 60 Figure G.5 Set-up for measurements of differential-mode characteristics . 61 Figure G.6 Test fixture for an SMD. 61 Figure G.7 Test fixture for a leaded device . 61 Figure G.8 Set-up for measurement of four-port S-parameters . 62 Figure G.9 Test fixture for the four-port S-pa
38、rameters of an SMD . 62 Figure G.10 Test fixture for the four-port S-parameters of a leaded device . 63 Figure H.1 S-parameters measurement of a DUT without leads 64 Figure H.2 Procedure for TRL calibration . 65 Table 1 Examples of EMC filtering devices 13 Table 2 Conditions and target values for va
39、lidation of test set-up without bias . 24 Table 3 Conditions and target values for validation of test set-up with bias 25 Table A.1 Measurement uncertainty of insertion loss (example) . 40 Table A.2 Measurement uncertainty of impedance (example) . 41 Table A.3 Measurement uncertainties of |S21| and
40、|S12| (example) 41 Table A.4 Measurement uncertainties of |S11| and |S22| (example) 41 CISPR 17 IEC:2011 5 Table D.1 Specifications of the elements of buffer-networks 50 6 CISPR 17 IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSI
41、VE EMC FILTERING DEVICES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerni
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