DLA A-A-59331 VALID NOTICE 1-2005 STUD WELDING SYSTEMS INTEGRAL POWER SOURCE AND CONTROL UNIT MANUAL [Superseded DLA MIL-W-23680 E CANC NOTICE 1 DLA MIL-W-23680 E DLA MIL-W-23680 D.pdf

上传人:brainfellow396 文档编号:687263 上传时间:2018-12-30 格式:PDF 页数:1 大小:9.39KB
下载 相关 举报
DLA A-A-59331 VALID NOTICE 1-2005 STUD WELDING SYSTEMS INTEGRAL POWER SOURCE AND CONTROL UNIT MANUAL [Superseded DLA MIL-W-23680 E CANC NOTICE 1 DLA MIL-W-23680 E DLA MIL-W-23680 D.pdf_第1页
第1页 / 共1页
亲,该文档总共1页,全部预览完了,如果喜欢就下载吧!
资源描述

1、INCH-POUNDNOTICE OFVALIDATIONA-A-59331NOTICE 131 May 2005COMMERCIAL ITEM DESCRIPTIONS (CIDS)STUD WELDING SYSTEMS, INTEGRAL POWER SOURCE AND CONTROL UNIT, MANUALA-A-59331, dated 28 September 1999, has been reviewed anddetermined to be valid for use in acquisitionCustodians: Preparing activity:DLA - G

2、S6Army - ARNavy - SHAir Force - 99DLA - GS6Review Activities:Army - AV, CENavy - CGAir Force - 84NOTE: The activities above were interested in this document as ofthe date of this document. Since organizations andresponsibilities can change, you should verify the currency ofthe information above using the ASSIST Online database athttp:/assist.daps.dla.mil_AMSC N/A FSC 3431DISTRIBUTION STATEMENT A: Approved for public release; distributionis unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

展开阅读全文
相关资源
猜你喜欢
  • BS IEC 60692-2000 Nuclear instrumentation - Density gauges utilizing ionizing radiation - Definitions and test methods《核仪器法 利用电离辐射的密度计 定义和试验方法》.pdf BS IEC 60692-2000 Nuclear instrumentation - Density gauges utilizing ionizing radiation - Definitions and test methods《核仪器法 利用电离辐射的密度计 定义和试验方法》.pdf
  • BS IEC 60736-2001 Testing equipment for electrical energy meters《电子能量计的试验设备》.pdf BS IEC 60736-2001 Testing equipment for electrical energy meters《电子能量计的试验设备》.pdf
  • BS IEC 60737-2010 Nuclear power plants - Instrumentation important to safety Temperature sensors (in-core and primary coolant circuit) - Characteristics and test methods《核电站 重要安全性温.pdf BS IEC 60737-2010 Nuclear power plants - Instrumentation important to safety Temperature sensors (in-core and primary coolant circuit) - Characteristics and test methods《核电站 重要安全性温.pdf
  • BS IEC 60747-10-1991 Semiconductor devices Generic specification for discrete devices and integrated circuits《半导体装置 分离元件和集成电路通用规范》.pdf BS IEC 60747-10-1991 Semiconductor devices Generic specification for discrete devices and integrated circuits《半导体装置 分离元件和集成电路通用规范》.pdf
  • BS IEC 60747-14-1-2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors《半导体器件 半导体传感器 传感器用一般规范》.pdf BS IEC 60747-14-1-2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors《半导体器件 半导体传感器 传感器用一般规范》.pdf
  • BS IEC 60747-14-3-2009 Semiconductor devices - Semiconductor sensors - Pressure sensors《半导体设备 半导体传感器 压力传感器》.pdf BS IEC 60747-14-3-2009 Semiconductor devices - Semiconductor sensors - Pressure sensors《半导体设备 半导体传感器 压力传感器》.pdf
  • BS IEC 60747-14-4-2011 Semiconductor devices Discrete devices Semiconductor accelerometers《半导体器件 分立器件 半导体加速器》.pdf BS IEC 60747-14-4-2011 Semiconductor devices Discrete devices Semiconductor accelerometers《半导体器件 分立器件 半导体加速器》.pdf
  • BS IEC 60747-14-5-2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor《半导体器件 半导体传感器 PN-结点半导体温度传感器》.pdf BS IEC 60747-14-5-2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor《半导体器件 半导体传感器 PN-结点半导体温度传感器》.pdf
  • BS IEC 60747-16-2-2001 Semiconductor devices - Microwave integrated circuits - Frequency prescalers《半导体装置 微波集成电路 频率预定标器》.pdf BS IEC 60747-16-2-2001 Semiconductor devices - Microwave integrated circuits - Frequency prescalers《半导体装置 微波集成电路 频率预定标器》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1