1、 REVISIONS LT DESCRIPTION DATE APPROVED A Add new paragraph on resistance. Editorial changes throughout. 21 AUG 89 D. Moore B Separate RTC into specific resistance ranges. Change voltage rating to 75 volts. Revise power conditioning test method. Change vendors PIN. Editorial changes throughout. 15 J
2、AN 91 D. Moore C Partial inactivation of resistance range for characteristics K and M. Editorial changes throughout. 22 SEP 94 D. Moore D Add new source of supply; add resistance tolerances 0.1 percent and 5.0 percent; add characteristic E; dimension changes in accordance with MIL-PRF-55342/10. Edit
3、orial changes throughout. 5 APR 99 J. Crum E Lower resistance range value to 1 ohm for characteristics K and M. Editorial changes throughout. 5 MAY 00 K. Cottongim F Table 1 correction. 5 year review cycle. Editorial and procedural changes throughout 6 APR 05 K. Cottongim G Inactivation for new desi
4、gn. Vendor part number addition. Editorial and procedural changes throughout. 26 MAR 10 M. Radecki Notice of Inactivation for New Design DSCC Drawing 88033 is inactive for new design and is no longer used, except for replacement purposes. Use MIL-PRF-55342/10. Prepared in accordance with ASME Y14.10
5、0 Source control drawing REV STATUS OF PAGES REV G G G G G G G G PAGES 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY ALLAN R. KNOX DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OH Original date of drawing 4 May 1988 CHECKED BY DAVID WITHROW TITLE RESISTOR, CHIP, FIXED, FILM, STYLE 1010 APPROVED BY DAVID E. MOORE
6、 SIZE A CODE IDENT. NO. 14933 DWG NO. 88033 REV G PAGE 1 OF 8 AMSC N/A 5905-E669 CURRENT DESIGN ACTIVITY CAGE CODE 037Z3 DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
7、-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 88033 REV G PAGE 2 1. SCOPE 1.1 Scope. This drawing describes the requirements for a fixed, film, chip resistor, style 1010. 1.2 Part or Identifying Number (PIN). The complete PIN is as follows: 88033 - * * Drawing n
8、umber Characteristic (see 3.3.6) Resistance and resistance tolerance (see 3.3.1 and 3.3.3) 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications and standards. The following specifications, standards and handbooks form a part of this document to the extent specified herein. Unless o
9、therwise specified, the issues of these documents are those listed in the cited in the solicitation or contract (see 6.2). DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-55342 - Resistors, Chip, Fixed, Film, Nonestablished Reliability, Established Reliability, Space Level, General Specification For DE
10、PARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Method Standard Electronic and Electrical Component Parts. MIL-STD-790 - Standard Practice for Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications. MIL-STD
11、-1285 - Marking of Electrical and Electronic Parts. * (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) * 2.2 Order of precedence. Unless otherwise
12、 noted herein or in the event of a conflict between the text of this document and the references cited herein (except for related specification sheets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exempti
13、on has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-55342, and as specified herein. 3.2 Interface and physical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-55342 and herein (see figure
14、 1). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 88033 REV G PAGE 3 A B C D E 0.105 0.007 .100 .005 .015/.033 .015 .005 .015 .005 NOTES: 1. Dimensions are in inche
15、s. Metric equivalents are given for general information only. 2. The pictorial view is representative of the envelope of the item. Slight deviations from the outline shown, which are contained within the envelope, and do not alter the functional aspect of the device are acceptable. FIGURE 1. Chip re
16、sistor. 3.3 Electrical characteristics. 3.3.1 Resistance and resistance tolerance. The nominal resistance expressed in ohms is identified by four characters consisting of three digits and a letter. The letter is used simultaneously as a decimal point, multiplier, and resistance tolerance designator
17、in accordance with MIL-PRF-55342 and herein (see table I). Minimum and maximum resistance values available shall be as specified in 3.3.2, 3.3.6, and 6.8. Resistance values not listed in the “10 to 100“ decade table of MIL-PRF-55342 for the appropriate resistance tolerance shall be considered as not
18、 conforming to this drawing. The standard values for every decade shall follow the sequence demonstrated for the “10 to 100“ decade table specified in MIL-PRF-55342. Inches mm 0.005 0.13 0.007 0.18 0.015 0.38 0.033 0.84 0.100 2.54 0.105 2.67 Provided by IHSNot for ResaleNo reproduction or networking
19、 permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 88033 REV G PAGE 4 TABLE I. Designator of resistance values for resistance tolerances. Designator for 0.1 percent tolerance Resistance (ohms) 1A00 to 9A88 inclusive 1.00 to 9.88
20、 inclusive 10A0 to 98A8 inclusive 10.0 to 98.8 inclusive 100A to 988A inclusive 100 to 988 inclusive 1B00 to 9B88 inclusive 1,000 to 9,880 inclusive 10B0 to 98B8 inclusive 10,000 to 98,800 inclusive 100B to 988B inclusive 100,000 to 988,000 inclusive 1C00 to 9C88 inclusive 1,000,000 to 9,880,000 inc
21、lusive 10C0 to 22C0 inclusive 10,000,000 to 22,000,000 inclusive Designator for 1.0 percent tolerance Resistance (ohms) 1D00 to 9D76 inclusive 1.00 to 9.76 inclusive 10D0 to 97D6 inclusive 10.0 to 97.6 inclusive 100D to 976D inclusive 100 to 976 inclusive 1E00 to 9E76 inclusive 1,000 to 9,760 inclus
22、ive 10E0 to 97E6 inclusive 10,000 to 97,600 inclusive 100E to 976E inclusive 100,000 to 976,000 inclusive 1F00 to 9F76 inclusive 1,000,000 to 9,760,000 inclusive 10F0 to 22F0 inclusive 10,000,000 to 22,000,000 inclusive Designator for 5.0 percent tolerance Resistance (ohms) 1J00 to 9J10 inclusive 1.
23、00 to 9.10 inclusive 10J0 to 91J0 inclusive 10.0 to 91.0 inclusive 100J to 910J inclusive 100 to 910 inclusive 1K00 to 9K10 inclusive 1,000 to 9,100 inclusive 10K0 to 91K1 inclusive 10,000 to 91,000 inclusive 100K to 910K inclusive 100,000 to 910,000 inclusive 1L00 to 9L10 inclusive 1,000,000 to 9,1
24、00,000 inclusive 10L0 to 22L0 inclusive 10,000,000 to 22,000,000 inclusive 3.3.2 Resistance range. The resistance range shall be from 1 ohm to 22 megohms. 3.3.3 Resistance tolerance. The resistance tolerance for chip resistors shall be 0.1 percent, 1 percent, and 5 percent in accordance with MIL-PRF
25、-55342 and table I herein. 3.3.4 Power rating. The power rating for chip resistors shall be 0.50 watt at +70OC derated to zero power at +150OC (see figure 2). 3.3.5 Voltage rating. The maximum continuous working voltage shall not exceed 75 volts. 3.3.6 Resistance temperature coefficient. The resista
26、nce temperature coefficient shall be in accordance with MIL-PRF-55342 and not exceed the values specified in table II. 3.3.7 Termination. Termination material shall be in accordance with MIL-PRF-55342, code letter B. * 3.3.8 Pure tin. The use of pure tin, as an underplate or final finish, is prohibi
27、ted both internally and externally. Tin content of resistor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see 6.3). 3.3.9 DC resistance. When resistors are tested as specified in 4.6, the dc resistance shall be within the
28、specified tolerance of the nominal resistance. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 88033 REV G PAGE 5 FIGURE 2. Derating curve. TABLE II. Resistance temper
29、ature coefficient * Characteristic Resistance range Resistance tolerance E and H 100 thru 1.5M 0.1 percent 1 thru 10M 1.0 percent K and M 1 thru 22M 1.0 and 5.0 percent 3.3.10 Thermal shock. When resistors are tested as specified in 4.7, there shall be no evidence of mechanical damage. 3.3.11 Power
30、conditioning. When resistors are tested as specified in 4.8, there shall be no evidence of mechanical damage. The change in resistance between initial and final measurements shall not exceed (0.5 percent 0.01 ohm). 3.3.12 Solderability. When resistors are tested as specified in 4.9, they shall meet
31、the criteria for surface mount leadless components in the test method. 3.4 Marking. Marking of the individual chip resistors is not required; however, each unit package shall be marked in accordance with MIL-STD-1285 and include the PIN as specified herein (see 1.2), the manufacturers name or Commer
32、cial and Government Entity (CAGE) code, and date lot codes. 3.5 Recycled, recovered, or environmentally preferable materials. Recycled, recovered, or environmentally preferable materials should be used to the maximum extent possible provided that the material meets or exceeds the operational and mai
33、ntenance requirements, and promotes economically advantageous life cycle costs. * 3.6 Manufacturer eligibility. To be eligible for listing as a approved source of supply, a manufacturer shall be listed on the MIL-PRF-55342 Qualified Products List for at least one part, or perform the group A and gro
34、up B inspections specified herein on a sample agreed upon by the manufacturer and DSCC-VA. * 3.6.1 Certificate of compliance. A certificate of compliance shall be required from manufacturers requesting to be listed as an approved source of supply. 3.7 Workmanship. Resistors shall be uniform in quali
35、ty and free from any defects that will affect life, serviceability, or appearance. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 88033 REV G PAGE 6 4. VERIFICATION 4
36、.1 Product assurance program. The product assurance program specified in MIL-PRF-55342 and maintained in accordance with MIL-STD-790 is not applicable to this document. 4.2 Qualification inspection. Qualification inspection is not applicable to this document. 4.3 Product level qualification. The pro
37、duct level qualification specified in MIL-PRF-55342 is not applicable to this document. 4.4 Conformance inspection. 4.4.1 Inspection of product for delivery. Inspection of product for delivery shall consist of the groups A and B inspections. 4.4.1.1 Group A inspection. Group A inspection shall consi
38、st of the inspections specified in table III, and shall be made on the same set of sample units, in the order shown. TABLE III. Group A inspection. Inspection Requirement Method Sampling procedure Subgroup 1 DC resistance Thermal shock Power conditioning DC resistance 3.3.9 3.3.10 3.3.11 3.3.9 4.6 4
39、.7 4.8 4.6 100 percent Subgroup 2 Visual inspection 3.2, 3.4, 3.7 4.5 13 samples, 0 failures Subgroup 3 Solderability 3.3.12 4.9 See 4.4.1.1.3 4.4.1.1.1 Subgroup 1. Subgroup 1 tests shall be performed on a production lot basis on 100 percent of the product supplied under this document. Resistors tha
40、t are out of resistance tolerance, or which experience a change in resistance greater than that permitted for the tests of this subgroup shall be removed from the lot. Lots having more than 5 percent total rejects, due to exceeding the specified resistance change limit shall not be furnished on cont
41、racts. 4.4.1.1.2 Subgroup 2. Subgroup 2 tests shall be performed on an inspection lot basis. A sample of 13 parts shall be randomly selected; if one or more defects are found, the lot shall be rescreened and defects removed. A new sample of 13 parts shall then be randomly selected. If one or more de
42、fects are found in this second sample, the lot shall be rejected and shall not be supplied against the document. 4.4.1.1.3 Subgroup 3. Subgroup 3 tests shall be performed as specified in MIL-PRF-55342. 4.4.2 Group B inspection. Group B inspection shall be in accordance with MIL-PRF-55342. 4.4.2.1 Ce
43、rtification. The acquiring activity, at its discretion, may accept a certificate of compliance with group B requirements in lieu of performing group B tests (see 6.2d). 4.5 Visual and mechanical examination. Resistors shall be examined to verify that the materials, design, construction, physical dim
44、ensions, marking, and workmanship are in accordance with the applicable requirements of MIL-PRF-55342. 4.6 DC resistance. DC resistance shall be tested in accordance with MIL-PRF-55342. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRON
45、ICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 88033 REV G PAGE 7 4.7 Thermal shock. Thermal shock shall be tested in accordance with MIL-PRF-55342. 4.8 Power conditioning. Resistors shall be tested in accordance with method 108 of MIL-STD-202. The following details and exception
46、s shall apply: a. Method of mounting: Chip resistor sample units shall be mounted on a test fixture. b. Test temperature: +70OC 5OC. c. Operating conditions: Rated dc continuous working voltage or filtered full wave rectified ac voltage shall be applied intermittently, 1.5 hours “on“, and 0.5 hour “
47、off“, for the applicable number of hours and applicable test temperature. “On time“ shall be three quarters of the total elapsed time. During the “on“ cycle, the voltage shall be regulated and controlled to maintain 5 percent of the rated continuous working voltage. d. Duration: 100 hours 4 hours. e
48、. Stabilization and final dc resistance measurement: Resistors shall be removed from chambers for a minimum of 45 minutes and stabilized prior to final resistance measurement. f. Examination after test: Resistors shall be examined for evidence of mechanical damage. 4.9 Solderability. Solderability s
49、hall be tested in accordance with MIL-PRF-55342. 5. PACKAGING 5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascert
