1、 REVISIONS LTR DESCRIPTION DATE APPROVED A Editorial changes throughout. 4 Aug 2000 K. A. Cottongim B Editorial changes throughout. 12 July 2005 K. A. Cottongim C Added pure tin prohibition paragraph. Table I: deleted requirement to measure noise reduction at 1kHz and 5 MHz. Editorial changes. 10 De
2、c 2008 Michael A. RadeckiTHE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. Prepared in accordance with Y14.100-2000 Source control drawingREV C C C C C C C C C REV STATUS OF PAGES PAGES 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Patrick Kyne DESIGN ACTIVITY DEFENSE ELECTRONICS SUPPLY CENTER, DA
3、YTON, OH Original date of drawing 24 February 1995 CHECKED BY Andrew R. Ernst TITLE FILTER, EMI, HYBRID APPROVED BY Bud Boulter SIZE A CODE IDENT. NO. 14933 DWG NO. 95003 REV C PAGE 1 OF 9 AMSC N/A 5915-E080 CURRENT DESIGN ACTIVITY CAGE CODE 037Z3 DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER COLUM
4、BUS COLUMBUS, OHIO 43218-3990 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 2 1. SCOPE 1.1 Scope. This drawing describes the requirements for hybri
5、d microcircuit electromagnetic interference (EMI) suppression filters to be processed in accordance with MIL-PRF-38534. Two product assurance classes consisting of class H (military high reliability) and class K (space application) and a choice of case outlines and lead finishes are available and ar
6、e reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance (RHA) levels, are reflected in the PIN. 1.2 Part or Identifying Number (PIN). The PIN is shown in the following example: 95003 - 01 H X X Drawing RHA Device type Device class Case Lead numbe
7、r designator (See 1.2.2) designator outline finish (See 1.2.1) (See 1.2.3) (See 1.2.4) (See 1.2.5) 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices meet the MIL-PRF-38534 specified RHA levels and should be marked with the appropriate RHA designator. A da
8、sh (-) indicates a non-RHA device. 1.2.2 Device types. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 FMH-461 EMI filter, 1.5 A 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance
9、level as follows: Device class Device requirements documentation K Highest reliability class available. This level is intended for use in space applications. Certification and qualification to MIL-PRF-38534 is required. H Standard military reliability level. This level is intended for use in applica
10、tions where non-space high reliability devices are required. Certification and qualification to MIL-PRF-38534 is required. 1.2.4 Case outline. The case outline is designated in MIL-STD-1835, and as follows: Outline letter Case outline X 1.460” x 1.130” x .330” (see figure 1) Z 2.00” x 1.130” x .330”
11、 flanged case (see figure 2) 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38534 for classes H and K. Finish letter “X” will not be marked on the filter or its packaging. The “X” designation is used when lead finish A, B, or C is considered acceptable and interchangeable without pref
12、erence. 1.3 Absolute maximum ratings. 1/ Input voltage - +50 V dc Input current - 1.5 A Power dissipation - 0.8 W Lead temperature (soldering, 10 seconds) - +300C Storage temperature - -65C to +150C 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended ope
13、ration at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 3 1.4 Recommended operat
14、ing conditions. Input voltage - +16 to +40 V dc Case operating temperature range - -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this drawing. This section does not include documents cited in other sections of this drawin
15、g or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents in sections 3 and 4 of this drawing whether or not they are listed here. 2.2
16、Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract (see 6.2
17、). DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines. (Copies of these documents are available online at http:
18、/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, Building 4D, 700 Robbins Avenue, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes prece
19、dence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38534 and as specified herein. 3.2 Design, construction, and
20、 physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and as specified herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figures 1 and 2. 3.2.2 Terminal connections. The terminal connections shall be as
21、specified on figure 3. 3.3 Pure tin prohibition. The use of pure tin as an underplate or final finish in the internal or external construction of the filter and the terminations is prohibited. This includes the discrete devices and solders used internal to the case. The use of tin alloys other than
22、lead is permissible as specified in APPENDIX E of MIL-PRF-38534 3.4 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.5 Electrical te
23、st requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup is defined in table I. 3.6 Marking. Marking shall be in accordance with MIL-PRF-38534. The part shall be marked with the PIN listed in 1.2 herein. In addition, the m
24、anufacturers PIN may also be marked as listed on QML-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 4 3.7 Manufacturer eligibility. To be eli
25、gible for listing as an approved source of supply, the manufacturer shall be certified and qualified to MIL-PRF-38534. In addition to the general requirements of MIL-PRF-38534, the manufacturer of the part described herein shall maintain the electrical test data (variables format) from the initial q
26、uality conformance inspection group A lot sample, produced on the certified line, for each device type listed herein. The data should also include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level con
27、trol by the manufacturer and be made available to the preparing activity DSCC-VA upon request. 3.8 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance submitted to DSCC-VA shall affirm that the
28、 manufacturers product meets the requirements of MIL-PRF-38534 and the requirements herein. 3.9 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of filters delivered to this drawing. 3.10 Recycled, recovered, or environmentally pre
29、ferable materials. Recycled, recovered, or environmentally preferable materials should be used to the maximum extent possible provided that the material meets or exceeds the operational and maintenance requirements, and promotes economically advantageous life cycle costs. 3.11 Workmanship. Filters s
30、hall be processed in such a manner as to be uniform in quality and shall be free from cold soldering, corrosion, pits, dents, cracks, rough or sharp edges, misalignments, and other defects that will affect life, serviceability, or appearance. TABLE I. Electrical performance characteristics. Limits T
31、est Symbol Conditions -55C TC 125C unless otherwise specified Group A subgroups Device types Min Max Units Input voltage VIN 1, 2, 3 01 0 40 V f = 500 kHz 4, 5, 6 01 50 Noise reduction NO f = 1 MHz 4, 5, 6 01 55 dB DC resistance RDC 1 01 .35 Isolation ISO Any pin to case, 500 V dc 1 01 100 M Capacit
32、ance CAP Any pin to case 1 01 24,000 pF Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 5 NOTES: 1. Dimensions are in inches. 2. Metric equivalents a
33、re for general information only. 3. Unless otherwise specified, tolerance is .005 for three place decimals and .01 for two place decimals. FIGURE 1. Case outline X. Inches mm .003 0.08 .005 0.13 .01 0.3 .020 0.51 .030 0.76 .060 1.52 .160 4.06 .205 5.21 .260 6.60 .330 8.38 .560 14.22 .960 24.38 1.130
34、 28.70 1.205 30.61 1.460 37.08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 6 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are for ge
35、neral information only. 3. Unless otherwise specified, tolerance is .005 for three place decimals and .01 for two place decimals. FIGURE 2. Case outline Z. Inches mm .002 0.05 .003 0.08 .005 0.13 .01 0.3 .015 0.38 .030 0.76 .050 1.27 .128 3.25 .130 3.30 .260 6.60 .330 8.38 .345 8.76 .400 10.16 1.130
36、 28.70 1.345 34.16 2.000 50.80 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 7 Device type 01 Case outline X and Z Terminal number Terminal symbol
37、1 +Vin 2 +Vout 3 case ground 4 output return 5 input return FIGURE 3. Terminal connections. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following add
38、itional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to DSCC-VA or the acquiring activity upon request. Also, the test ci
39、rcuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as
40、specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. Test requirements Subgroups (per MIL-PRF-38534 group A test table) Interim electrical parameters Final electrical param
41、eters 1*, 2, 3, 4 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1 Post irradiation end-point electrical parameters for RHA devices 1, 2, 3, 4, 5, 6 *PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
42、om IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER, DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 95003 REV C PAGE 8 4.3 Conformance inspection. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Gro
43、up A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 of MIL-PRF-38534, group A shall be omitted. 4.3 2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3
44、 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test conditions A, B, C, or D. The test circuit sh
45、all be maintained by the manufacturer under document revision level control and shall be made available to DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified i
46、n test method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiat
47、ion Hardness Assurance (RHA). RHA qualification is required only for those devices with the RHA designator as specified herein: RHA level H Units Total ionizing dose tolerance level 1,000 kRad (Si) Single event upset survival level (LET) 100 MeV a. Radiation dose rate in accordance with condition C
48、of method 1019 of MIL-STD-883. b. The manufacturer shall perform a worst-case and radiation susceptibility analysis on the device. This analysis shall show that the minimum performance requirements of each component has adequate design margin under worst-case operating conditions (extremes of line voltage, temperature, load, frequency, radiat
