1、 INCH-POUND MIL-M-38510/113C October 3, 2011 SUPERSEDING MIL-M-38510/113B 21 June 2005 MILITARY SPECIFICATION MICROCIRCUITS, LINEAR, 8 BIT, DIGITAL-TO-ANALOG CONVERTERS, MONOLITHIC SILICON This specification is approved for use by all Departments and Agencies of the Department of Defense. Reactivate
2、d for new design as of 10 February 2005. May be used for either new or existing design acquisition. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silic
3、on, 8 bit, digital-to-analog converters. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.4). 1.2 Par
4、t or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as follows: Device type Circuit 01 D/A Converter, 8 bit, 0.19% linearity 02 D/A Converter, 8 bit, 0.11% linearity 1.2.2 Device class. The device class is the
5、product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outline. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 1.3 Absolute maximum ratings. Supply voltage +VCC (-VCC)
6、 . 36 Vdc Voltage, digital input to negative supply Vlogic (-VCC) . 0 to 36 Vdc Voltage, logic control (VLC) . -VCCto +VCCReference voltage input (V14, V15) -VCCto +VCCReference input current (I14) 5.0 mA Reference input differential voltage (V14 V15) 18 Vdc Lead temperature (soldering, 60 sec) . +3
7、00C. Junction temperature (TJ) +175C Storage temperature -65C to +150C Comments, suggestions, or questions on this document should be addressed to: DLA Land Maritime, ATTN: DLA Land Maritime -VAS, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to lineardscc.dla.mil . Since contact information ca
8、n change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.daps.dla.mil . AMSC N/A FSC 5962 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/113C 2 1.4 Recommended operating
9、conditions. Supply voltage range . 5 Vdc to 15 Vdc 1/ 2/ Ambient temperature range . -55C to +125C 1.5 Power and thermal characteristics. Case outline Package Maximum allowable maximum JCmaximum JApower dissipation E Dual-in-line 400 mW TA= 125C 35C/W 120C/W 2. APPLICABLE DOCUMENTS 2.1 General. The
10、documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of
11、this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications and standards
12、 form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMEN
13、T OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard for Microelectronics. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbin
14、s Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein the text of this document shall takes precedence. Nothing in this document, however, supersedes applicable laws and regulati
15、ons unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before con
16、tract award (see 4.3 and 6.3). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or functio
17、n as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. _ 1/ A slight degradation in linearity can occur when the supply is near the 5 V end of the recommended operating range. 2/ S
18、equence of power supply turn-on must be -VCC prior to +VCC unless the positive supply has current limiting resistance of 100 10%. If a current limiting resistance is used, a slight degradation in linearity will occur. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
19、se from IHS-,-,-MIL-M-38510/113C 3 3.3.1 Terminal connections and functional block diagram. The terminal connections and functional block diagram shall be as specified on figure 1. 3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qual
20、ifying activity and the preparing activity upon request. 3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical p
21、erformance characteristics are as specified in table I, and apply over the full recommended ambient operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The electric
22、al tests for each subgroup are described in table III. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 56 (see MIL-PRF-38535, appendix A). 4. VERIFICATION. 4.1 Sampling
23、and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as function as described herein. 4.2 Screening. Screening
24、shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specifie
25、d in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity up
26、on request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. NOTE: If accelerated high-temperature test conditions are used, the device manufacturer shall ensure that at least
27、 85 percent of the applied voltage is dropped across the device at temperature. The device is not considered functional under accelerated test conditions. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is
28、optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535. 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformanc
29、e inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/113C 4 TABLE I. Electrical performance characteristics. Lim
30、its Characteristics Symbol Conditions 1/ -55C TA +125C (table III and figures 2, 3, and 4 unless otherwise indicated) Device type Min Max Units Supply current from +VCCICC+ All input bits high All 0.4 3.8 mA Supply current from -VCCICC- All input bits high All -7.8 -0.8 mA Full scale current IFS All
31、 input bits high, Measure IO01 1.94 2.04 mA 02 1.984 2.000 FSI All input bits low, Measure OI 01 1.94 2.04 mA 02 1.984 2.000 Zero scale current IZS All input bits low, measure IO 01 -2.0 2.0 A 02 -1.0 1.0 ZSI All input bits high, measure OI 01 -2.0 2.0 A 02 -1.0 1.0 Power supply sensitivity from +VC
32、CPSSIFS+1 All input bits high, measure IO +VCC= 4.5 V to +5.5 V, -VCC= -18 V All -4.0 4.0 A 1IP FSSS +All input bits low, measure OI+VCC= 4.5 V to +5.5 V, -VCC= -18 V All -4.0 4.0 A Power supply sensitivity from +VCCPSSIFS+2 All input bits high, measure IO +VCC= 12 V to 18 V, -VCC= -18 V All -8.0 8.
33、0 A 2IP FSSS +All input bits low, measure OI+VCC= 12 V to 18 V, -VCC= -18 V All -8.0 8.0 A Power supply sensitivity from -VCCPSSIFS-1 All input bits high, measure IO +VCC= 18 V, -VCC= -12 V to -18 V All -8.0 8.0 A 1IP FSSS All input bits low, measure OI+VCC= 18 V, -VCC= -12 V to -18 V All -8.0 8.0 A
34、 Power supply sensitivity from -VCCPSSIFS-2 All input bits high, measure IO +VCC= 18 V, -VCC= -4.5 V to -5.5 V, IREF= 1 mA All -2.0 2.0 A 2IP FSSS All input bits low, measure OI , +VCC= 18 V, -VCC= -4.5 V to -5.5 V All -2.0 2.0 A Output current range IFSR1 All input bits high, measure IO -VCC= -10 V
35、, VREF= 15 V All 2.1 - mA 1FSRI All input bits low, measure OI-VCC= -10 V, VREF= 15 V All 2.1 - mA Output current range IFSR2 All input bits high, measure IO -VCC= -12 V, VREF= 25 V All 4.2 - mA 2FSRI All input bits low, measure OI-VCC= -12 V, VREF= 25 V All 4.2 - mA See footnote at end of table. Pr
36、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/113C 5 TABLE I. Electrical performance characteristics Continued. Limits Characteristics Symbol Conditions 1/ -55C TA +125C (table III and figures 2, 3, and 4 unless otherwise indicated) Devic
37、e type Min Max Units Reference bias current IREF- All input bits low All -3.0 0 A High level input current IIH All input bits VIN = 18 V, each input measured separately All -0.05 10.0 A Low level input current IIL All input bits VIN = -10 V, each input measured separately All -10.0 - A Full scale cu
38、rrent at +18 V compliance IFS+ All input bits high, measure IO, VIO= 18 V 01 1.90 2.08 mA 02 1.94 2.04 FSI + All input bits low, measure OI , IOV = 18 V 01 1.90 2.08 mA 02 1.94 2.04 Full scale current at -10 V compliance IFS- All input bits high, measure IO, VIO= -10 V 01 1.90 2.08 mA 02 1.94 2.04 F
39、SI - All input bits low, measure OI , IOV = -10 V 01 1.90 2.08 mA 02 1.94 2.04 Change in full scale current due to voltage compliance IFSCAll input bits high, measure IO, VIO= 18 V to -10 V 25C TA 125C All -4.0 4.0 A TA= -55C -8.0 8.0 FSCI All input bits low, measure OI , IOV = 18 V to -10 V 25C TA
40、125C All -4.0 4.0 A TA= -55C -8.0 8.0 Positive bit errors +NL Measure IO, IFSerrors bit Positive01 0 0.19 % 02 0 0.11 +NL Measure OI , IFSerrors bit Positive01 0 0.19 % 02 0 0.11 Negative bit errors NL Measure IO, IFSerrors bit Negative01 -0.19 0 % 02 -0.11 0 NL Measure OI , IFSerrors bit Negative01
41、 -0.19 0 % 02 -0.11 0 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-38510/113C 6 TABLE I. Electrical performance characteristics Continued. Limits Characteristics Symbol Conditions 1/ -55C TA +125C (table III and
42、 figures 2, 3, and 4 unless otherwise indicated) Device type Min Max Units Positive and negative bit error difference NL Measure IO, + NLNL 01 -0.05 0.05 % 02 -0.033 0.033 NL Measure OI , + NLNL 01 -0.05 0.05 % 02 -0.033 0.033 Positive relative accuracy NL+ Measure IO, NLNL + 01 0 0.19 % 02 0 0.11 +
43、NL Measure OI , NLNL + 01 0 0.19 % 02 0 0.11 Negative relative accuracy NL- Measure IO, NLNL + 01 0 0.19 % 02 0 0.11 NL Measure OI , NLNL + 01 0 0.19 % 02 0 0.11 Monotonicity (i) Measure IO, (ION-ION-1) 0 at each major carry point All 0 16.0 A )i( Measure OI , )II( 1ONON 0 at each major carry point
44、All 0 16.0 A Output symmetry IFSFSFS II 01 -8.0 8.0 A 02 -4.0 4.0 Full scale current temperature coefficient TC(IFS) All input bits high, measure IOAll -50.0 50.0 ppm/C )(IT FSC All input bits low, measure OI All -50.0 50.0 ppm/C Propagation delay time, high-to-low level tPHLFigure 3, measure VOAll
45、6.0 60.0 ns Propagation delay time, low-to-high level tPLHFigure 3, measure VOAll 6.0 60.0 ns Reference amplifier input slew rate dIO/dt Figure 4, measure VO, TA= 25C All 1.5 - mA/s Settling time high-to-low tSHL Figure 3, output within 1/2 LSB of final value of IO,TA= 25C All 10 135 ns Settling tim
46、e low-to-high tSLH Figure 3, output within 1/2 LSB of final value of IO,TA= 25C All 10 135 ns 1/ The following electrical performance characteristics apply unless otherwise stated in table I: VCC= 15 Vdc, source resistance = 50 , IREF= 2.0 mA. Provided by IHSNot for ResaleNo reproduction or networki
47、ng permitted without license from IHS-,-,-MIL-M-38510/113C 7 TABLE II. Electrical test requirements. Subgroups (see table III) MIL-PRF-38535 test requirements Class S devices Class B devices Interim electrical parameters 1 1 Final electrical test parameters 1*, 2, 3 1*, 2, 3 Group A test requirement
48、s 1, 2, 3, 9, 10, 11, 12 1, 2, 3, 9, 10, 11, 12 Group B electrical test parameters when using the method 5005 QCI option 1, 2, 3 and table IV delta limits N/A Group C end-point electrical parameters 1, 2, 3 and table IV delta limits 1 and table IV delta limits Group D end-point electrical parameters 1, 2, 3 1 *PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
