DLA MIL-PRF-19500 632 B VALID NOTICE 1-2011 Semiconductor Device Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistors N-Channel Silicon Types 2N7399 2N.pdf

1、PERFORMANCE SPECIFICATIONSemiconductor Device, Field Effect Radiation Hardened (TotalDose and Single Event Effects) Transistors, N-Channel SiliconTypes 2N7399, 2N7400, 2N7401, and 2N7402, JANSD and JANSRMIL-PRF-19500/632B, dated 16 March 2004, has been reviewed anddetermined to be valid for use in a

2、cquisition.Reviewer Activities: Army - AV, MINOTICE OFVALIDATIONINCH-POUNDMIL-PRF-19500/632BNOTICE 115 July 2011NOTE: The activities above were interested in this document asof the date of this document. Since organizations andresponsibilities can change, you should verify the currency ofthe information above using the ASSIST Online database athttps:/assist.daps.dla.mil.AMSC N/A FSC 5961Custodians:Army - CRNavy - ECAir Force - 85DLA - CCOther - NAPreparing Activity:DLA - CCProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-